JP2019021625A5 - - Google Patents

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Publication number
JP2019021625A5
JP2019021625A5 JP2018130470A JP2018130470A JP2019021625A5 JP 2019021625 A5 JP2019021625 A5 JP 2019021625A5 JP 2018130470 A JP2018130470 A JP 2018130470A JP 2018130470 A JP2018130470 A JP 2018130470A JP 2019021625 A5 JP2019021625 A5 JP 2019021625A5
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JP
Japan
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target
axis
sample
electron beam
flaky
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JP2018130470A
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Japanese (ja)
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JP7046746B2 (ja
JP2019021625A (ja
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JP2018130470A 2017-07-11 2018-07-10 Ｘ線生成のための薄片成形されたターゲット Active JP7046746B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762531097P 2017-07-11 2017-07-11
US62/531,097 2017-07-11

Publications (3)

Publication Number Publication Date
JP2019021625A JP2019021625A (ja) 2019-02-07
JP2019021625A5 true JP2019021625A5 (enExample) 2021-05-13
JP7046746B2 JP7046746B2 (ja) 2022-04-04

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JP2018130470A Active JP7046746B2 (ja) 2017-07-11 2018-07-10 Ｘ線生成のための薄片成形されたターゲット

Country Status (4)

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US (1) US10746672B2 (enExample)
EP (1) EP3428928A1 (enExample)
JP (1) JP7046746B2 (enExample)
CN (1) CN109243947B (enExample)

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US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
JP6937380B2 (ja) 2017-03-22 2021-09-22 シグレイ、インコーポレイテッド Ｘ線分光を実施するための方法およびｘ線吸収分光システム
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
DE112019002822T5 (de) 2018-06-04 2021-02-18 Sigray, Inc. Wellenlängendispersives röntgenspektrometer
CN112470245B (zh) 2018-07-26 2025-03-18 斯格瑞公司 高亮度x射线反射源
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
US11152183B2 (en) 2019-07-15 2021-10-19 Sigray, Inc. X-ray source with rotating anode at atmospheric pressure
WO2021168686A1 (en) * 2020-02-26 2021-09-02 Shenzhen Xpectvision Technology Co., Ltd. Imaging systems and methods of operating the same
CN113764246B (zh) * 2020-06-03 2025-04-18 宁波伯锐锶电子束科技有限公司 一种显微镜
CN112213343B (zh) * 2020-12-03 2021-03-16 中国科学院自动化研究所 塑料条带承载生物超薄切片快速成像方法、系统、装置
DE112023000574T5 (de) 2022-01-13 2024-10-24 Sigray, Inc. Mikrofokus-röntgenquelle zur erzeugung von röntgenstrahlen mit hohem fluss und niedriger energie
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources

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JPS5515250Y2 (enExample) * 1975-07-29 1980-04-08
US5044001A (en) * 1987-12-07 1991-08-27 Nanod Ynamics, Inc. Method and apparatus for investigating materials with X-rays
JPH03273200A (ja) * 1990-03-23 1991-12-04 Elionix Kk 端部放出型ｘ線顕微鏡
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JP4954526B2 (ja) * 2005-10-07 2012-06-20 浜松ホトニクス株式会社 Ｘ線管
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JP5317120B2 (ja) * 2009-05-22 2013-10-16 独立行政法人産業技術総合研究所 Ｘ線顕微鏡用試料収容セル、ｘ線顕微鏡、およびｘ線顕微鏡像の観察方法
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