CA2650479C - System and method for improved field of view x-ray imaging using a non-stationary anode - Google Patents
System and method for improved field of view x-ray imaging using a non-stationary anode Download PDFInfo
- Publication number
- CA2650479C CA2650479C CA2650479A CA2650479A CA2650479C CA 2650479 C CA2650479 C CA 2650479C CA 2650479 A CA2650479 A CA 2650479A CA 2650479 A CA2650479 A CA 2650479A CA 2650479 C CA2650479 C CA 2650479C
- Authority
- CA
- Canada
- Prior art keywords
- anode
- ray
- ray beam
- collimator
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 28
- 238000000034 method Methods 0.000 title claims description 12
- 230000010355 oscillation Effects 0.000 claims description 5
- 238000010408 sweeping Methods 0.000 claims 2
- 230000001939 inductive effect Effects 0.000 claims 1
- 238000001816 cooling Methods 0.000 description 5
- 238000007689 inspection Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000002828 fuel tank Substances 0.000 description 1
- 231100001261 hazardous Toxicity 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/10—Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
- G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- X-Ray Techniques (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US74648106P | 2006-05-04 | 2006-05-04 | |
| US60/746,481 | 2006-05-04 | ||
| US11/744,115 US7529343B2 (en) | 2006-05-04 | 2007-05-03 | System and method for improved field of view X-ray imaging using a non-stationary anode |
| US11/744,115 | 2007-05-03 | ||
| PCT/US2007/010843 WO2007130576A2 (en) | 2006-05-04 | 2007-05-04 | System and method for improved field of view x-ray imaging using a non-stationary anode |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2650479A1 CA2650479A1 (en) | 2007-11-15 |
| CA2650479C true CA2650479C (en) | 2017-01-10 |
Family
ID=38668332
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2650479A Active CA2650479C (en) | 2006-05-04 | 2007-05-04 | System and method for improved field of view x-ray imaging using a non-stationary anode |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7529343B2 (enExample) |
| EP (1) | EP2013643B2 (enExample) |
| JP (1) | JP5175841B2 (enExample) |
| AT (1) | ATE534921T1 (enExample) |
| AU (1) | AU2007248520B2 (enExample) |
| CA (1) | CA2650479C (enExample) |
| ES (1) | ES2374316T5 (enExample) |
| WO (1) | WO2007130576A2 (enExample) |
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| US7609816B2 (en) * | 2006-05-19 | 2009-10-27 | Colorado State University Research Foundation | Renewable laser target |
| US7599471B2 (en) * | 2007-10-24 | 2009-10-06 | The Boeing Company | Method and apparatus for rotating an anode in an x-ray system |
| DE102008050102B4 (de) * | 2008-10-06 | 2010-11-04 | Phoenix Contact Gmbh & Co. Kg | Kommunikationsentität zur Kommunikation über ein busorientiertes Kommunikationsnetzwerk |
| US8033724B2 (en) * | 2009-06-30 | 2011-10-11 | The Boeing Company | Rapid assembly and operation of an X-ray imaging system |
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| US8761338B2 (en) | 2011-06-20 | 2014-06-24 | The Boeing Company | Integrated backscatter X-ray system |
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| US9390881B2 (en) | 2013-09-19 | 2016-07-12 | Sigray, Inc. | X-ray sources using linear accumulation |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| US9594036B2 (en) | 2014-02-28 | 2017-03-14 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US9823203B2 (en) | 2014-02-28 | 2017-11-21 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US9305344B2 (en) | 2014-04-22 | 2016-04-05 | The Boeing Company | Method for improving linear feature detectability in digital images |
| US9398676B2 (en) | 2014-05-05 | 2016-07-19 | The Boeing Company | System and method for quantifying X-ray backscatter system performance |
| US9851312B2 (en) | 2014-05-07 | 2017-12-26 | The Boeing Company | Backscatter inspection systems, and related methods |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| US9658173B2 (en) | 2014-07-30 | 2017-05-23 | The Boeing Company | Portable x-ray backscattering imaging system including a radioactive source |
| HK1245499A1 (zh) | 2015-01-20 | 2018-08-24 | American Science And Engineering, Inc. | 动态可调整的焦点 |
| US9739727B2 (en) | 2015-01-21 | 2017-08-22 | The Boeing Company | Systems and methods for aligning an aperture |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| US9501838B1 (en) | 2015-08-24 | 2016-11-22 | The Boeing Company | Systems and methods for determining boundaries of features in digital images |
| US10317349B2 (en) | 2015-11-30 | 2019-06-11 | The Boeing Company | X-ray scatter systems and methods for detecting structural variations |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| JP6937380B2 (ja) | 2017-03-22 | 2021-09-22 | シグレイ、インコーポレイテッド | X線分光を実施するための方法およびx線吸収分光システム |
| US10983074B2 (en) | 2017-05-11 | 2021-04-20 | The Boeing Company | Visual light calibrator for an x-ray backscattering imaging system |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| CN108419356B (zh) * | 2018-05-16 | 2023-09-22 | 中国工程物理研究院流体物理研究所 | 用于提升回旋加速器内离子源寿命的方法及离子源设备 |
| DE112019002822T5 (de) | 2018-06-04 | 2021-02-18 | Sigray, Inc. | Wellenlängendispersives röntgenspektrometer |
| CN112470245B (zh) | 2018-07-26 | 2025-03-18 | 斯格瑞公司 | 高亮度x射线反射源 |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| US10962491B2 (en) | 2018-09-04 | 2021-03-30 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| WO2020051221A2 (en) | 2018-09-07 | 2020-03-12 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| US11315751B2 (en) * | 2019-04-25 | 2022-04-26 | The Boeing Company | Electromagnetic X-ray control |
| US11152183B2 (en) | 2019-07-15 | 2021-10-19 | Sigray, Inc. | X-ray source with rotating anode at atmospheric pressure |
| US11554544B2 (en) * | 2019-09-20 | 2023-01-17 | The Boeing Company | Additive manufacturing system with x-ray backscatter imaging system and method of inspecting a structure during additive manufacturing of the structure |
| US11293884B2 (en) | 2020-01-07 | 2022-04-05 | The Boeing Company | Multi source backscattering |
| US11257653B2 (en) * | 2020-03-27 | 2022-02-22 | The Boeing Company | Integrated aperture shield for x-ray tubes |
| US11169098B2 (en) | 2020-04-02 | 2021-11-09 | The Boeing Company | System, method, and apparatus for x-ray backscatter inspection of parts |
| US12163903B2 (en) * | 2021-05-12 | 2024-12-10 | The Boeing Company | System, method, and apparatus for x-ray backscatter inspection of parts |
| US12253479B1 (en) * | 2021-12-08 | 2025-03-18 | Jaywant Philip Parmar | Space-based x-ray imaging system |
| DE112023000574T5 (de) | 2022-01-13 | 2024-10-24 | Sigray, Inc. | Mikrofokus-röntgenquelle zur erzeugung von röntgenstrahlen mit hohem fluss und niedriger energie |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US12209977B2 (en) | 2023-02-16 | 2025-01-28 | Sigray, Inc. | X-ray detector system with at least two stacked flat Bragg diffractors |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
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-
2007
- 2007-05-03 US US11/744,115 patent/US7529343B2/en active Active
- 2007-05-04 JP JP2009509743A patent/JP5175841B2/ja active Active
- 2007-05-04 CA CA2650479A patent/CA2650479C/en active Active
- 2007-05-04 AU AU2007248520A patent/AU2007248520B2/en active Active
- 2007-05-04 WO PCT/US2007/010843 patent/WO2007130576A2/en not_active Ceased
- 2007-05-04 ES ES07756210.6T patent/ES2374316T5/es active Active
- 2007-05-04 AT AT07756210T patent/ATE534921T1/de active
- 2007-05-04 EP EP07756210.6A patent/EP2013643B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP2013643B1 (en) | 2011-11-23 |
| JP5175841B2 (ja) | 2013-04-03 |
| JP2009535788A (ja) | 2009-10-01 |
| ES2374316T3 (es) | 2012-02-15 |
| WO2007130576A3 (en) | 2008-02-07 |
| WO2007130576A2 (en) | 2007-11-15 |
| US20070269014A1 (en) | 2007-11-22 |
| ES2374316T5 (es) | 2015-10-22 |
| EP2013643A2 (en) | 2009-01-14 |
| ATE534921T1 (de) | 2011-12-15 |
| AU2007248520B2 (en) | 2013-08-29 |
| AU2007248520A1 (en) | 2007-11-15 |
| EP2013643B2 (en) | 2015-08-26 |
| US7529343B2 (en) | 2009-05-05 |
| CA2650479A1 (en) | 2007-11-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request |