JP2009283642A - 半導体チップ及び装置、並びにこれらの製造方法 - Google Patents
半導体チップ及び装置、並びにこれらの製造方法 Download PDFInfo
- Publication number
- JP2009283642A JP2009283642A JP2008133784A JP2008133784A JP2009283642A JP 2009283642 A JP2009283642 A JP 2009283642A JP 2008133784 A JP2008133784 A JP 2008133784A JP 2008133784 A JP2008133784 A JP 2008133784A JP 2009283642 A JP2009283642 A JP 2009283642A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor chip
- semiconductor
- manufacturing
- management information
- main surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 76
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 25
- 238000000034 method Methods 0.000 claims description 13
- 238000005498 polishing Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 9
- 230000015572 biosynthetic process Effects 0.000 abstract description 7
- 230000007547 defect Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0657—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54413—Marks applied to semiconductor devices or parts comprising digital information, e.g. bar codes, data matrix
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
- H01L2223/5448—Located on chip prior to dicing and remaining on chip after dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06555—Geometry of the stack, e.g. form of the devices, geometry to facilitate stacking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
【解決手段】
半導体チップ1を構成する半導体基板20の例えば回路形成領域10が設けられた面の外縁部(回路形成領域10周辺のスクライブ線21で囲まれた領域)の少なくとも一部を切断又は研磨することにより、回路形成領域10に対して非平行且つ非垂直に面取りした平滑な斜面22を形成する。そして、斜面22に管理情報を示す符号23を付与する。また、半導体チップ1を複数積層し、半導体装置2を製造する。
【選択図】図1
Description
まず、図1(a)に示すように、ウェハ(図示せず)から半導体基板20をスクライブ線(稜線)21に沿ってダイシングし、半導体チップ1を切り出す。ここで、半導体基板20の側面は、図示の如く完全な平滑面にはなっていない。また、半導体基板20の表面に、図2(b)と同様にパッド11及び各種の回路部品(図示せず)が配置された回路形成領域10が設けられている一方、回路形成領域10には、図2(b)と異なりデータ領域12が配置されていない。
上記の工程(1)の後、図1(a)に示した半導体基板20の外縁部(より詳細には、回路形成領域10周辺のスクライブ線21で囲まれた領域)を回路形成領域10に対して斜めにカット又は研磨し、以て同図(b)に示す平滑な斜面22を形成する。
上記の工程(2)の後、図1(c)に示す如く、斜面22に半導体チップ1の管理情報(ロット番号や製造年月日等)を示す符号(以下、管理用符号と呼称する)23を付与する。ここで、斜面22は上記の工程(2)において平滑に形成されており、これに付与された管理用符号23を正確に読み取ることができる。
そして、図1(d)に示すように、上記の工程(3)により製造した半導体チップ1を、配線基板(図示せず)上に複数段(この例では2段)積み重ねて実装し、半導体装置2を製造する。
2 半導体装置
10 回路形成領域
11 パッド
20 半導体基板
21 スクライブ線
22 斜面
23 管理用符号
Claims (5)
- 互いに対向する第1及び第2の主面と、前記第1の主面の外縁部の少なくとも一部を面取りして設けた前記第1の主面に対して非平行且つ非垂直な斜面とを備え、
前記第1及び第2の主面の少なくとも一方に半導体回路が形成され、
前記斜面に情報が表示されている、
半導体チップ。 - 請求項1に記載の半導体チップと、
前記半導体チップの前記第1の主面上に積層された他の半導体チップと、
を備えた半導体装置。 - 互いに対向する第1及び第2の主面と、前記第1及び第2の主面の少なくとも一方に形成された半導体回路とを有する半導体チップの製造方法であって、
前記第1の主面の外縁部の少なくとも一部を、前記第1の主面に対して非平行且つ非垂直に面取りする第1工程と、
前記面取りにより形成した斜面に情報を付与する第2工程と、
を備えた半導体チップの製造方法。 - 前記第1工程が、前記外縁部の少なくとも一部を切断又は研磨して前記斜面を平滑に形成することを特徴とした請求項3に記載の半導体チップの製造方法。
- 請求項3に記載の第1及び第2工程と、
前記半導体チップの前記第1の主面上に他の半導体チップを積層する第3工程と、
を備えた半導体装置の製造方法。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008133784A JP5274893B2 (ja) | 2008-05-22 | 2008-05-22 | 半導体チップ及び装置、並びにこれらの製造方法 |
US12/385,880 US7892886B2 (en) | 2008-05-22 | 2009-04-22 | Semiconductor chip and semiconductor device, and method of manufacturing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008133784A JP5274893B2 (ja) | 2008-05-22 | 2008-05-22 | 半導体チップ及び装置、並びにこれらの製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009283642A true JP2009283642A (ja) | 2009-12-03 |
JP5274893B2 JP5274893B2 (ja) | 2013-08-28 |
Family
ID=41341467
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008133784A Expired - Fee Related JP5274893B2 (ja) | 2008-05-22 | 2008-05-22 | 半導体チップ及び装置、並びにこれらの製造方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7892886B2 (ja) |
JP (1) | JP5274893B2 (ja) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10256105A (ja) * | 1997-03-11 | 1998-09-25 | Super Silicon Kenkyusho:Kk | レーザマークを付けたウェーハ |
JP2002299547A (ja) * | 2001-03-29 | 2002-10-11 | Matsushita Electric Ind Co Ltd | 積層型半導体装置およびその製造方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5644102A (en) * | 1994-03-01 | 1997-07-01 | Lsi Logic Corporation | Integrated circuit packages with distinctive coloration |
US6204564B1 (en) * | 1997-11-21 | 2001-03-20 | Rohm Co., Ltd. | Semiconductor device and method for making the same |
JP2000228341A (ja) | 1999-02-08 | 2000-08-15 | Toshiba Corp | 半導体集積回路 |
US8187897B2 (en) * | 2008-08-19 | 2012-05-29 | International Business Machines Corporation | Fabricating product chips and die with a feature pattern that contains information relating to the product chip |
-
2008
- 2008-05-22 JP JP2008133784A patent/JP5274893B2/ja not_active Expired - Fee Related
-
2009
- 2009-04-22 US US12/385,880 patent/US7892886B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10256105A (ja) * | 1997-03-11 | 1998-09-25 | Super Silicon Kenkyusho:Kk | レーザマークを付けたウェーハ |
JP2002299547A (ja) * | 2001-03-29 | 2002-10-11 | Matsushita Electric Ind Co Ltd | 積層型半導体装置およびその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
US20090289331A1 (en) | 2009-11-26 |
JP5274893B2 (ja) | 2013-08-28 |
US7892886B2 (en) | 2011-02-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI355024B (en) | Scribe based bond pads for integrated circuits | |
JP5960389B2 (ja) | 半導体集積回路チップを分離および搬送する方法 | |
US6955976B2 (en) | Method for dicing wafer stacks to provide access to interior structures | |
JP2006286968A (ja) | 半導体装置の製造方法 | |
JP2006206344A (ja) | ドーナツ状ガラス基板を作成する方法 | |
US8410571B2 (en) | Layout of dummy patterns | |
JP2007081296A (ja) | 半導体部品製造システム、制御装置、およびコンピュータプログラム | |
US7211500B2 (en) | Pre-process before cutting a wafer and method of cutting a wafer | |
JP5274893B2 (ja) | 半導体チップ及び装置、並びにこれらの製造方法 | |
JP2008153312A (ja) | ダイシングブレード及びダイシング方法 | |
JP2015231005A (ja) | 配線基板およびその製造方法 | |
JP2006049419A (ja) | ダイシング方法 | |
US7510909B2 (en) | Fabricating method of wafer protection layers | |
CN102928764A (zh) | 定位半导体芯片长距离金属线间缺陷的方法 | |
US20100068832A1 (en) | Method for the protection of information in multi-project wafers | |
JP2017112317A (ja) | 電子部品およびその製造方法ならびに電子部品製造装置 | |
US7581666B2 (en) | Wire-bonding method for wire-bonding apparatus | |
US8866295B2 (en) | Semiconductor memory modules and methods of fabricating the same | |
JP2006269490A (ja) | ウェーハ識別方法および半導体装置の製造方法 | |
JP2017069274A (ja) | ウェハの製造方法および生産システム | |
US20060292828A1 (en) | Wafer and method of cutting the same | |
JP5309728B2 (ja) | レチクルデータ作成方法及びレチクルデータ作成装置 | |
JP2008294261A (ja) | 熱応力効果を抑制できるウェハ切断線形成構造 | |
US20160315024A1 (en) | Mechanical handling support for thin cores using photo-patternable material | |
JP2005166841A (ja) | 半導体装置の製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20110317 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20120315 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20121225 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130116 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20130423 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20130515 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
LAPS | Cancellation because of no payment of annual fees |