JP2009198375A5 - - Google Patents

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Publication number
JP2009198375A5
JP2009198375A5 JP2008041465A JP2008041465A JP2009198375A5 JP 2009198375 A5 JP2009198375 A5 JP 2009198375A5 JP 2008041465 A JP2008041465 A JP 2008041465A JP 2008041465 A JP2008041465 A JP 2008041465A JP 2009198375 A5 JP2009198375 A5 JP 2009198375A5
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JP
Japan
Prior art keywords
component
transport hand
unit
test socket
index
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008041465A
Other languages
English (en)
Japanese (ja)
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JP5035013B2 (ja
JP2009198375A (ja
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Publication date
Application filed filed Critical
Priority to JP2008041465A priority Critical patent/JP5035013B2/ja
Priority claimed from JP2008041465A external-priority patent/JP5035013B2/ja
Publication of JP2009198375A publication Critical patent/JP2009198375A/ja
Publication of JP2009198375A5 publication Critical patent/JP2009198375A5/ja
Application granted granted Critical
Publication of JP5035013B2 publication Critical patent/JP5035013B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2008041465A 2008-02-22 2008-02-22 部品試験装置 Expired - Fee Related JP5035013B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008041465A JP5035013B2 (ja) 2008-02-22 2008-02-22 部品試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008041465A JP5035013B2 (ja) 2008-02-22 2008-02-22 部品試験装置

Publications (3)

Publication Number Publication Date
JP2009198375A JP2009198375A (ja) 2009-09-03
JP2009198375A5 true JP2009198375A5 (enExample) 2011-04-07
JP5035013B2 JP5035013B2 (ja) 2012-09-26

Family

ID=41142014

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008041465A Expired - Fee Related JP5035013B2 (ja) 2008-02-22 2008-02-22 部品試験装置

Country Status (1)

Country Link
JP (1) JP5035013B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013053991A (ja) 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置
KR102243278B1 (ko) 2014-09-18 2021-04-23 삼성전자주식회사 핸들러 및 그의 관리 방법
KR101965356B1 (ko) * 2017-12-21 2019-04-03 주식회사 한화 컨버터 검사 장치 및 이를 이용한 컨버터 검사 방법

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS649378A (en) * 1987-07-01 1989-01-12 Mitsubishi Electric Corp Semiconductor testing apparatus
JPH11326451A (ja) * 1998-05-22 1999-11-26 Matsushita Electron Corp 電子部品の測定装置及びそれを用いた測定方法及び電子部品の搬送方法
US6518745B2 (en) * 2000-10-10 2003-02-11 Mirae Corporation Device test handler and method for operating the same
JP4406592B2 (ja) * 2004-09-21 2010-01-27 セイコーエプソン株式会社 デバイス検査装置及びデバイス検査方法

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