JP2009139364A5 - - Google Patents

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Publication number
JP2009139364A5
JP2009139364A5 JP2008238995A JP2008238995A JP2009139364A5 JP 2009139364 A5 JP2009139364 A5 JP 2009139364A5 JP 2008238995 A JP2008238995 A JP 2008238995A JP 2008238995 A JP2008238995 A JP 2008238995A JP 2009139364 A5 JP2009139364 A5 JP 2009139364A5
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JP
Japan
Prior art keywords
test
marking
radiation
test elements
elements
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Application number
JP2008238995A
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English (en)
Japanese (ja)
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JP2009139364A (ja
JP5191848B2 (ja
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Publication date
Priority claimed from EP07116749A external-priority patent/EP2040079B1/de
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Publication of JP2009139364A publication Critical patent/JP2009139364A/ja
Publication of JP2009139364A5 publication Critical patent/JP2009139364A5/ja
Application granted granted Critical
Publication of JP5191848B2 publication Critical patent/JP5191848B2/ja
Active legal-status Critical Current
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JP2008238995A 2007-09-19 2008-09-18 テストエレメントの不合格品マーキングのマーキング方法、マーキング装置、テストエレメントを作製する製造装置、および分析テスト装置 Active JP5191848B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07116749A EP2040079B1 (de) 2007-09-19 2007-09-19 Markierungsverfahren zur Ausschussmarkierung von Testelementen
EP07116749.8 2007-09-19

Publications (3)

Publication Number Publication Date
JP2009139364A JP2009139364A (ja) 2009-06-25
JP2009139364A5 true JP2009139364A5 (enExample) 2010-02-12
JP5191848B2 JP5191848B2 (ja) 2013-05-08

Family

ID=38952104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008238995A Active JP5191848B2 (ja) 2007-09-19 2008-09-18 テストエレメントの不合格品マーキングのマーキング方法、マーキング装置、テストエレメントを作製する製造装置、および分析テスト装置

Country Status (7)

Country Link
US (2) US8618511B2 (enExample)
EP (1) EP2040079B1 (enExample)
JP (1) JP5191848B2 (enExample)
CN (1) CN101430328B (enExample)
AT (1) ATE431932T1 (enExample)
CA (1) CA2639480C (enExample)
DE (1) DE502007000757D1 (enExample)

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EP2506014B1 (en) 2011-03-30 2014-08-06 Kabushiki Kaisha Toshiba Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle
US9207181B2 (en) * 2012-03-01 2015-12-08 Quidel Corporation System and apparatus for point-of-care diagnostics
EP2820420B1 (en) 2012-03-01 2017-08-16 Quidel Corporation Interactive test device and apparatus with timing mechanism
US9951472B2 (en) 2014-04-15 2018-04-24 Gpcp Ip Holdings Llc Methods and apparatuses for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web
DE102014113159A1 (de) * 2014-09-12 2016-03-17 Scherdel Innotec Forschungs- Und Entwicklungs-Gmbh Vorrichtung und Verfahren zum Herstellen eines Federdrahts, Vorrichtung und Verfahren zum Markieren eines Federdrahts, Vorrichtung und Verfahren zum Herstellen von Federn aus einem Federdraht sowie Federdraht
US10180248B2 (en) 2015-09-02 2019-01-15 ProPhotonix Limited LED lamp with sensing capabilities
AT518369B1 (de) * 2016-02-11 2023-06-15 Zkw Group Gmbh Verfahren und ICT-Einrichtung zum Überprüfen von zumindest zwei LEDs enthaltenden Modulen einer Beleuchtungseinrichtung
JP6539371B1 (ja) * 2018-03-14 2019-07-03 Ckd株式会社 検査装置、ｐｔｐ包装機、及び、検査方法
CN110001221B (zh) * 2019-04-11 2021-04-02 淮安信息职业技术学院 喷码位置偏移的检测方法及装置
CN110579171A (zh) * 2019-08-22 2019-12-17 广州昱奕智能自动化设备有限公司 一种零件加工检测监控装置及系统
WO2024005695A1 (en) * 2022-06-29 2024-01-04 Delaval Holding Ab A quality determining arrangement and a quality check method
CN115219685A (zh) * 2022-07-18 2022-10-21 马鞍山钢铁股份有限公司 一种同时确定多个影响带钢表面质量的泄漏辐射管的方法

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