JP5191848B2 - テストエレメントの不合格品マーキングのマーキング方法、マーキング装置、テストエレメントを作製する製造装置、および分析テスト装置 - Google Patents

テストエレメントの不合格品マーキングのマーキング方法、マーキング装置、テストエレメントを作製する製造装置、および分析テスト装置 Download PDF

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JP5191848B2
JP5191848B2 JP2008238995A JP2008238995A JP5191848B2 JP 5191848 B2 JP5191848 B2 JP 5191848B2 JP 2008238995 A JP2008238995 A JP 2008238995A JP 2008238995 A JP2008238995 A JP 2008238995A JP 5191848 B2 JP5191848 B2 JP 5191848B2
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test
marking
test element
radiation
defect
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JP2009139364A (ja
JP2009139364A5 (enExample
Inventor
カー レーパー ヨーゼフ
フィンケ ヴェルナー
フランク マルチン
シュミット ギュンター
ディック ジークフリート
シュトゥーベンボルト ペーター
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エフ ホフマン−ラ ロッシュ アクチェン ゲゼルシャフト
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/483—Physical analysis of biological material
    • G01N33/487—Physical analysis of biological material of liquid biological material
    • G01N33/4875—Details of handling test elements, e.g. dispensing or storage, not specific to a particular test method
    • G01N33/48764—Test tape taken off a spool
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00732—Identification of carriers, materials or components in automatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00168—Manufacturing or preparing test elements
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/53022—Means to assemble or disassemble with means to test work or product

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Biomedical Technology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Urology & Nephrology (AREA)
  • Food Science & Technology (AREA)
  • Optics & Photonics (AREA)
  • Biophysics (AREA)
  • Hematology (AREA)
  • Molecular Biology (AREA)
  • Medicinal Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Apparatus Associated With Microorganisms And Enzymes (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
JP2008238995A 2007-09-19 2008-09-18 テストエレメントの不合格品マーキングのマーキング方法、マーキング装置、テストエレメントを作製する製造装置、および分析テスト装置 Active JP5191848B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07116749A EP2040079B1 (de) 2007-09-19 2007-09-19 Markierungsverfahren zur Ausschussmarkierung von Testelementen
EP07116749.8 2007-09-19

Publications (3)

Publication Number Publication Date
JP2009139364A JP2009139364A (ja) 2009-06-25
JP2009139364A5 JP2009139364A5 (enExample) 2010-02-12
JP5191848B2 true JP5191848B2 (ja) 2013-05-08

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JP2008238995A Active JP5191848B2 (ja) 2007-09-19 2008-09-18 テストエレメントの不合格品マーキングのマーキング方法、マーキング装置、テストエレメントを作製する製造装置、および分析テスト装置

Country Status (7)

Country Link
US (2) US8618511B2 (enExample)
EP (1) EP2040079B1 (enExample)
JP (1) JP5191848B2 (enExample)
CN (1) CN101430328B (enExample)
AT (1) ATE431932T1 (enExample)
CA (1) CA2639480C (enExample)
DE (1) DE502007000757D1 (enExample)

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US9207181B2 (en) * 2012-03-01 2015-12-08 Quidel Corporation System and apparatus for point-of-care diagnostics
EP2820420B1 (en) 2012-03-01 2017-08-16 Quidel Corporation Interactive test device and apparatus with timing mechanism
US9951472B2 (en) 2014-04-15 2018-04-24 Gpcp Ip Holdings Llc Methods and apparatuses for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web
DE102014113159A1 (de) * 2014-09-12 2016-03-17 Scherdel Innotec Forschungs- Und Entwicklungs-Gmbh Vorrichtung und Verfahren zum Herstellen eines Federdrahts, Vorrichtung und Verfahren zum Markieren eines Federdrahts, Vorrichtung und Verfahren zum Herstellen von Federn aus einem Federdraht sowie Federdraht
US10180248B2 (en) 2015-09-02 2019-01-15 ProPhotonix Limited LED lamp with sensing capabilities
AT518369B1 (de) * 2016-02-11 2023-06-15 Zkw Group Gmbh Verfahren und ICT-Einrichtung zum Überprüfen von zumindest zwei LEDs enthaltenden Modulen einer Beleuchtungseinrichtung
JP6539371B1 (ja) * 2018-03-14 2019-07-03 Ckd株式会社 検査装置、ｐｔｐ包装機、及び、検査方法
CN110001221B (zh) * 2019-04-11 2021-04-02 淮安信息职业技术学院 喷码位置偏移的检测方法及装置
CN110579171A (zh) * 2019-08-22 2019-12-17 广州昱奕智能自动化设备有限公司 一种零件加工检测监控装置及系统
WO2024005695A1 (en) * 2022-06-29 2024-01-04 Delaval Holding Ab A quality determining arrangement and a quality check method
CN115219685A (zh) * 2022-07-18 2022-10-21 马鞍山钢铁股份有限公司 一种同时确定多个影响带钢表面质量的泄漏辐射管的方法

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Also Published As

Publication number Publication date
CN101430328B (zh) 2013-06-12
US10535442B2 (en) 2020-01-14
EP2040079A1 (de) 2009-03-25
DE502007000757D1 (de) 2009-07-02
ATE431932T1 (de) 2009-06-15
US20090090874A1 (en) 2009-04-09
JP2009139364A (ja) 2009-06-25
CA2639480C (en) 2016-03-22
EP2040079B1 (de) 2009-05-20
US20140096368A1 (en) 2014-04-10
US8618511B2 (en) 2013-12-31
HK1128762A1 (en) 2009-11-06
CA2639480A1 (en) 2009-03-19
CN101430328A (zh) 2009-05-13

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