CN101430328B - 测试元件的不合格标记的标记方法 - Google Patents

测试元件的不合格标记的标记方法 Download PDF

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Publication number
CN101430328B
CN101430328B CN2008101497209A CN200810149720A CN101430328B CN 101430328 B CN101430328 B CN 101430328B CN 2008101497209 A CN2008101497209 A CN 2008101497209A CN 200810149720 A CN200810149720 A CN 200810149720A CN 101430328 B CN101430328 B CN 101430328B
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China
Prior art keywords
test
marking
radiation
test element
production
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CN2008101497209A
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Chinese (zh)
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CN101430328A (zh
Inventor
J·K·罗帕
W·芬克
M·弗兰克
G·施米特
S·迪克
P·斯图本博德
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F Hoffmann La Roche AG
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F Hoffmann La Roche AG
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/483—Physical analysis of biological material
    • G01N33/487—Physical analysis of biological material of liquid biological material
    • G01N33/4875—Details of handling test elements, e.g. dispensing or storage, not specific to a particular test method
    • G01N33/48764—Test tape taken off a spool
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00732—Identification of carriers, materials or components in automatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00168—Manufacturing or preparing test elements
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/53022—Means to assemble or disassemble with means to test work or product

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Biomedical Technology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Urology & Nephrology (AREA)
  • Food Science & Technology (AREA)
  • Optics & Photonics (AREA)
  • Biophysics (AREA)
  • Hematology (AREA)
  • Molecular Biology (AREA)
  • Medicinal Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Apparatus Associated With Microorganisms And Enzymes (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
CN2008101497209A 2007-09-19 2008-09-19 测试元件的不合格标记的标记方法 Active CN101430328B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07116749A EP2040079B1 (de) 2007-09-19 2007-09-19 Markierungsverfahren zur Ausschussmarkierung von Testelementen
EP07116749.8 2007-09-19

Publications (2)

Publication Number Publication Date
CN101430328A CN101430328A (zh) 2009-05-13
CN101430328B true CN101430328B (zh) 2013-06-12

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CN2008101497209A Active CN101430328B (zh) 2007-09-19 2008-09-19 测试元件的不合格标记的标记方法

Country Status (7)

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US (2) US8618511B2 (enExample)
EP (1) EP2040079B1 (enExample)
JP (1) JP5191848B2 (enExample)
CN (1) CN101430328B (enExample)
AT (1) ATE431932T1 (enExample)
CA (1) CA2639480C (enExample)
DE (1) DE502007000757D1 (enExample)

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EP2228658A1 (de) * 2009-03-13 2010-09-15 Roche Diagnostics GmbH Verfahren zur Herstellung eines analytischen Verbrauchsmittels
CA3095919A1 (en) * 2009-07-27 2011-02-10 Meso Scale Technologies, Llc Assay information management methods and devices
EP2506014B1 (en) 2011-03-30 2014-08-06 Kabushiki Kaisha Toshiba Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle
US9207181B2 (en) * 2012-03-01 2015-12-08 Quidel Corporation System and apparatus for point-of-care diagnostics
EP2820420B1 (en) 2012-03-01 2017-08-16 Quidel Corporation Interactive test device and apparatus with timing mechanism
US9951472B2 (en) 2014-04-15 2018-04-24 Gpcp Ip Holdings Llc Methods and apparatuses for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web
DE102014113159A1 (de) * 2014-09-12 2016-03-17 Scherdel Innotec Forschungs- Und Entwicklungs-Gmbh Vorrichtung und Verfahren zum Herstellen eines Federdrahts, Vorrichtung und Verfahren zum Markieren eines Federdrahts, Vorrichtung und Verfahren zum Herstellen von Federn aus einem Federdraht sowie Federdraht
US10180248B2 (en) 2015-09-02 2019-01-15 ProPhotonix Limited LED lamp with sensing capabilities
AT518369B1 (de) * 2016-02-11 2023-06-15 Zkw Group Gmbh Verfahren und ICT-Einrichtung zum Überprüfen von zumindest zwei LEDs enthaltenden Modulen einer Beleuchtungseinrichtung
JP6539371B1 (ja) * 2018-03-14 2019-07-03 Ckd株式会社 検査装置、ｐｔｐ包装機、及び、検査方法
CN110001221B (zh) * 2019-04-11 2021-04-02 淮安信息职业技术学院 喷码位置偏移的检测方法及装置
CN110579171A (zh) * 2019-08-22 2019-12-17 广州昱奕智能自动化设备有限公司 一种零件加工检测监控装置及系统
WO2024005695A1 (en) * 2022-06-29 2024-01-04 Delaval Holding Ab A quality determining arrangement and a quality check method
CN115219685A (zh) * 2022-07-18 2022-10-21 马鞍山钢铁股份有限公司 一种同时确定多个影响带钢表面质量的泄漏辐射管的方法

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CN1940564A (zh) * 2005-10-01 2007-04-04 霍夫曼-拉罗奇有限公司 分析装置及其运作的方法

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Also Published As

Publication number Publication date
US10535442B2 (en) 2020-01-14
EP2040079A1 (de) 2009-03-25
DE502007000757D1 (de) 2009-07-02
ATE431932T1 (de) 2009-06-15
US20090090874A1 (en) 2009-04-09
JP2009139364A (ja) 2009-06-25
JP5191848B2 (ja) 2013-05-08
CA2639480C (en) 2016-03-22
EP2040079B1 (de) 2009-05-20
US20140096368A1 (en) 2014-04-10
US8618511B2 (en) 2013-12-31
HK1128762A1 (en) 2009-11-06
CA2639480A1 (en) 2009-03-19
CN101430328A (zh) 2009-05-13

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