JP2010519520A5 - - Google Patents

Download PDF

Info

Publication number
JP2010519520A5
JP2010519520A5 JP2009549885A JP2009549885A JP2010519520A5 JP 2010519520 A5 JP2010519520 A5 JP 2010519520A5 JP 2009549885 A JP2009549885 A JP 2009549885A JP 2009549885 A JP2009549885 A JP 2009549885A JP 2010519520 A5 JP2010519520 A5 JP 2010519520A5
Authority
JP
Japan
Prior art keywords
radiation
polarization
reflected
optical
guide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009549885A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010519520A (ja
JP4796652B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/IB2008/050575 external-priority patent/WO2008102294A2/en
Publication of JP2010519520A publication Critical patent/JP2010519520A/ja
Publication of JP2010519520A5 publication Critical patent/JP2010519520A5/ja
Application granted granted Critical
Publication of JP4796652B2 publication Critical patent/JP4796652B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2009549885A 2007-02-20 2008-02-18 サンプル中の光学的な深さを評価する光学装置 Expired - Fee Related JP4796652B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US89069507P 2007-02-20 2007-02-20
US60/890,695 2007-02-20
US90842207P 2007-03-28 2007-03-28
US60/908,422 2007-03-28
PCT/IB2008/050575 WO2008102294A2 (en) 2007-02-20 2008-02-18 An optical device for assessing optical depth in a sample

Publications (3)

Publication Number Publication Date
JP2010519520A JP2010519520A (ja) 2010-06-03
JP2010519520A5 true JP2010519520A5 (enExample) 2011-04-21
JP4796652B2 JP4796652B2 (ja) 2011-10-19

Family

ID=39710588

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009549885A Expired - Fee Related JP4796652B2 (ja) 2007-02-20 2008-02-18 サンプル中の光学的な深さを評価する光学装置

Country Status (8)

Country Link
US (1) US8175690B2 (enExample)
EP (1) EP2112901B1 (enExample)
JP (1) JP4796652B2 (enExample)
CN (1) CN101616627B (enExample)
AT (1) ATE505130T1 (enExample)
DE (1) DE602008006170D1 (enExample)
RU (1) RU2469639C2 (enExample)
WO (1) WO2008102294A2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103037751B (zh) * 2010-11-30 2015-06-10 松下电器产业株式会社 图像处理装置
BR112014020895B1 (pt) * 2012-02-28 2022-03-03 Koninklijke Philips N.V. Dispositivo para tratamento de pele à base de energia; e método para determinar uma profundidade de tratamento dentro de uma camada de colágeno de uma pele
CN104280350B (zh) * 2013-07-03 2018-06-01 庞小峰 一种特殊锐化的癌症早期诊断和治疗效果检查的装置
EP3451060A1 (en) * 2017-08-28 2019-03-06 ASML Netherlands B.V. Substrate, metrology apparatus and associated methods for a lithographic process

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2235772C (en) * 1995-10-23 2002-12-31 Cytometrics, Inc. Method and apparatus for reflected imaging analysis
US5719399A (en) * 1995-12-18 1998-02-17 The Research Foundation Of City College Of New York Imaging and characterization of tissue based upon the preservation of polarized light transmitted therethrough
US6353226B1 (en) * 1998-11-23 2002-03-05 Abbott Laboratories Non-invasive sensor capable of determining optical parameters in a sample having multiple layers
US6404497B1 (en) * 1999-01-25 2002-06-11 Massachusetts Institute Of Technology Polarized light scattering spectroscopy of tissue
JP2002535645A (ja) * 1999-01-25 2002-10-22 ニユートン・ラボラトリーズ・インコーポレーテツド 偏光を使用する組織の画像形成
US6563105B2 (en) * 1999-06-08 2003-05-13 University Of Washington Image acquisition with depth enhancement
JP4845318B2 (ja) 2000-03-28 2011-12-28 ボード・オブ・リージエンツ，ザ・ユニバーシテイ・オブ・テキサス・システム 診断用マルチスペクトルデジタル画像化のための方法および装置
US6640116B2 (en) * 2000-08-18 2003-10-28 Masimo Corporation Optical spectroscopy pathlength measurement system
US7404929B2 (en) * 2002-01-18 2008-07-29 Newton Laboratories, Inc. Spectroscopic diagnostic methods and system based on scattering of polarized light
WO2003062798A1 (en) * 2002-01-18 2003-07-31 Newton Laboratories, Inc. Spectroscopic diagnostic methods and system
RU2234242C2 (ru) * 2002-03-19 2004-08-20 Федеральное государственное унитарное предприятие Научно-исследовательский институт "Полюс" Способ определения состояния биологической ткани и диагностическая система для его реализации
JP4242633B2 (ja) * 2002-11-27 2009-03-25 オリンパス株式会社 判別方法及び判別装置
WO2005017495A2 (en) 2003-08-14 2005-02-24 University Of Central Florida Interferometric sensor for characterizing materials
CA2540110A1 (en) * 2003-09-23 2005-03-31 Stichting Voor De Technische Wetenschappen Method and apparatus for backscatter spectroscopy
US7587236B2 (en) * 2004-01-08 2009-09-08 Lawrence Livermore National Security, Llc Optical spectroscopy for the detection of ischemic tissue injury
WO2006086579A2 (en) 2005-02-09 2006-08-17 Inlight Solutions, Inc. Methods and apparatus for noninvasive determinations of analytes

Similar Documents

Publication Publication Date Title
NZ593860A (en) Side illuminated multi point multi parameter optical fiber sensor
US9612394B2 (en) Fibre-optic sensor and use thereof
US7599049B2 (en) Apparatus for testing light transmission through lens
JP6205346B2 (ja) 光学測定装置およびファイババンドルの対応付け方法
JP2016537999A5 (enExample)
RU2012133682A (ru) Апарат для неинвазивного анализа in vito посредством спектроскопии комбинационного рассеяния
EA032547B1 (ru) Оптоволоконная система для измерения вибраций в многофазных потоках и соответствующий способ контроля многофазных потоков
JP2010519520A5 (enExample)
TWI292030B (en) High density multi-channel detecting device
ATE492796T1 (de) Vorrichtung und verfahren zur optischen ermittlung der anwesenheit von kohlendioxid
ITPI20090147A1 (it) Metodo di imaging spettrale in profondita' e attrezzatura che attua tale metodo
JP5467875B2 (ja) 光導波路の検査装置
US20110157590A1 (en) Surface plasmon resonance sensing device
RU2009135012A (ru) Оптическое устройство для оценки оптической глубины в образце
JP6364305B2 (ja) 水素ガス濃度計測装置および方法
CN204255844U (zh) 多通道无标记生物传感光纤系统
CN105651733B (zh) 材料散射特性测量装置及方法
US10768095B2 (en) Optical sensor
CN103926221A (zh) 一种基于光纤传感的分布式瓦斯监测系统及监测方法
US9377300B2 (en) Photoreflectance device
CN106491141B (zh) 判定样本的光学特性之光学装置及方法
JP2011196766A (ja) 光透過性を有する被測定物の形状測定方法
JP2015081779A (ja) 光検出方法および光伝送損失測定方法
KR102256979B1 (ko) 광학식 유류성분 센서 및 이를 이용한 센싱 방법
CN204188523U (zh) 一种基于菲涅耳反射的溶液浓度实时测量光纤传感器