JP2009131564A - X線測定装置 - Google Patents
X線測定装置 Download PDFInfo
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- JP2009131564A JP2009131564A JP2007312033A JP2007312033A JP2009131564A JP 2009131564 A JP2009131564 A JP 2009131564A JP 2007312033 A JP2007312033 A JP 2007312033A JP 2007312033 A JP2007312033 A JP 2007312033A JP 2009131564 A JP2009131564 A JP 2009131564A
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- 238000005259 measurement Methods 0.000 claims abstract description 42
- 210000000988 bone and bone Anatomy 0.000 claims description 11
- 230000037182 bone density Effects 0.000 claims description 11
- 238000001514 detection method Methods 0.000 claims description 9
- 230000007423 decrease Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 4
- 230000009977 dual effect Effects 0.000 abstract description 3
- 230000005540 biological transmission Effects 0.000 description 7
- 238000012545 processing Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000020169 heat generation Effects 0.000 description 5
- 210000004872 soft tissue Anatomy 0.000 description 5
- 230000003247 decreasing effect Effects 0.000 description 2
- 210000003205 muscle Anatomy 0.000 description 2
- 230000001054 cortical effect Effects 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- 210000004705 lumbosacral region Anatomy 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
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Abstract
【解決手段】DXA法においては、高エネルギーX線と低エネルギーX線の二種類のエネルギーのX線11が利用される。制御部20は、被検体30の体格に応じて、X線発生器10が交互に繰り返し発生する高エネルギーX線と低エネルギーX線の発生時間の比率を制御する。制御部20は、X線発生器10内に設けられたX線発生管に対して、例えば管電圧を変化させて高エネルギーX線と低エネルギーX線を交互に発生させ、高エネルギーX線と低エネルギーX線の発生時間の比率(管電圧デューティー比)を制御する。
【選択図】図1
Description
Claims (5)
- 高エネルギーX線と低エネルギーX線とを交互に繰り返し発生するX線発生部と、
前記X線発生部から発生して被検体を透過したX線を検出するX線検出部と、
前記高エネルギーX線を介して得られるX線の検出結果と前記低エネルギーX線を介して得られるX線の検出結果とに基づいて、前記被検体内の骨に関する測定量を算出する測定量演算部と、
前記被検体の体格に応じて、前記X線発生部が交互に繰り返し発生する高エネルギーX線と低エネルギーX線の発生時間の比率を制御する制御部と、
を有する、
ことを特徴とするX線測定装置。 - 請求項1に記載のX線測定装置において、
前記制御部は、X線が透過し易い体格の被検体を対象とした測定に比べてX線が透過し難い体格の被検体を対象とした測定において、前記低エネルギーX線の発生時間の比率を増加させて前記高エネルギーX線の発生時間の比率を減少させる、
ことを特徴とするX線測定装置。 - 請求項2に記載のX線測定装置において、
前記制御部は、前記被検体に対するX線の走査速度を制御して前記X線発生部が高エネルギーX線と低エネルギーX線とを交互に繰り返し発生する測定時間を調整する、
ことを特徴とするX線測定装置。 - 請求項3に記載のX線測定装置において、
前記制御部は、前記被検体に対する事前測定によって得られる骨を透過したX線の検出値に応じて、前記発生時間の比率と前記測定時間とを決定する、
ことを特徴とするX線測定装置。 - 請求項1から4のいずれか1項に記載のX線測定装置において、
前記測定量演算部は、前記測定量として、腰椎から得られる骨密度を算出する、
ことを特徴とするX線測定装置。
Priority Applications (1)
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JP2007312033A JP4980862B2 (ja) | 2007-12-03 | 2007-12-03 | X線測定装置 |
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JP2007312033A JP4980862B2 (ja) | 2007-12-03 | 2007-12-03 | X線測定装置 |
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JP2009131564A true JP2009131564A (ja) | 2009-06-18 |
JP4980862B2 JP4980862B2 (ja) | 2012-07-18 |
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JP2007312033A Active JP4980862B2 (ja) | 2007-12-03 | 2007-12-03 | X線測定装置 |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012018188A2 (ko) * | 2010-08-06 | 2012-02-09 | 라드텍 주식회사 | 이중 에너지 x-선 흡광분석을 이용한 x-선 영상장치 |
US8766202B2 (en) | 2011-02-18 | 2014-07-01 | Samsung Electronics Co., Ltd. | X-ray detectors including diffusion barrier films |
US8963096B2 (en) | 2010-03-30 | 2015-02-24 | Samsung Electronics Co., Ltd. | X-ray detector including oxide semiconductor transistor |
US9348037B2 (en) | 2010-04-01 | 2016-05-24 | Samsung Electronics Co., Ltd. | X-ray pixels including double photoconductors and X-ray detectors including the X-ray pixels |
WO2019026409A1 (ja) | 2017-08-04 | 2019-02-07 | キヤノン株式会社 | 放射線撮像装置および放射線撮像システム |
Citations (7)
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JPS6349142A (ja) * | 1986-08-19 | 1988-03-01 | 株式会社東芝 | X線ct装置 |
JPH09262228A (ja) * | 1995-09-08 | 1997-10-07 | Hologic Inc | X線骨密度測定システム及び方法 |
JPH10118056A (ja) * | 1996-10-21 | 1998-05-12 | Fuji Photo Film Co Ltd | エネルギーサブトラクション処理方法および装置 |
JP2001252267A (ja) * | 2000-03-08 | 2001-09-18 | Ge Yokogawa Medical Systems Ltd | スキャン条件設定方法およびx線ct装置 |
JP2006320464A (ja) * | 2005-05-18 | 2006-11-30 | Hitachi Medical Corp | 放射線撮影装置、画像処理方法 |
JP2007160077A (ja) * | 2005-11-16 | 2007-06-28 | Shimadzu Corp | 放射線撮像装置 |
JP2007236766A (ja) * | 2006-03-10 | 2007-09-20 | Shimadzu Corp | X線撮影装置 |
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2007
- 2007-12-03 JP JP2007312033A patent/JP4980862B2/ja active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6349142A (ja) * | 1986-08-19 | 1988-03-01 | 株式会社東芝 | X線ct装置 |
JPH09262228A (ja) * | 1995-09-08 | 1997-10-07 | Hologic Inc | X線骨密度測定システム及び方法 |
JPH10118056A (ja) * | 1996-10-21 | 1998-05-12 | Fuji Photo Film Co Ltd | エネルギーサブトラクション処理方法および装置 |
JP2001252267A (ja) * | 2000-03-08 | 2001-09-18 | Ge Yokogawa Medical Systems Ltd | スキャン条件設定方法およびx線ct装置 |
JP2006320464A (ja) * | 2005-05-18 | 2006-11-30 | Hitachi Medical Corp | 放射線撮影装置、画像処理方法 |
JP2007160077A (ja) * | 2005-11-16 | 2007-06-28 | Shimadzu Corp | 放射線撮像装置 |
JP2007236766A (ja) * | 2006-03-10 | 2007-09-20 | Shimadzu Corp | X線撮影装置 |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8963096B2 (en) | 2010-03-30 | 2015-02-24 | Samsung Electronics Co., Ltd. | X-ray detector including oxide semiconductor transistor |
US9348037B2 (en) | 2010-04-01 | 2016-05-24 | Samsung Electronics Co., Ltd. | X-ray pixels including double photoconductors and X-ray detectors including the X-ray pixels |
WO2012018188A2 (ko) * | 2010-08-06 | 2012-02-09 | 라드텍 주식회사 | 이중 에너지 x-선 흡광분석을 이용한 x-선 영상장치 |
WO2012018188A3 (ko) * | 2010-08-06 | 2012-05-03 | 라드텍 주식회사 | 이중 에너지 x-선 흡광분석을 이용한 x-선 영상장치 |
US8766202B2 (en) | 2011-02-18 | 2014-07-01 | Samsung Electronics Co., Ltd. | X-ray detectors including diffusion barrier films |
WO2019026409A1 (ja) | 2017-08-04 | 2019-02-07 | キヤノン株式会社 | 放射線撮像装置および放射線撮像システム |
US11185301B2 (en) | 2017-08-04 | 2021-11-30 | Canon Kabushiki Kaisha | Radiation imaging apparatus and radiation imaging system |
EP3662836B1 (en) * | 2017-08-04 | 2023-11-15 | Canon Kabushiki Kaisha | Radiation image pickup device and radiation image pickup system |
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