JP2009109492A - 複合構造の作製中に累積異物指標を求めるための方法およびシステム - Google Patents

複合構造の作製中に累積異物指標を求めるための方法およびシステム Download PDF

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Publication number
JP2009109492A
JP2009109492A JP2008270661A JP2008270661A JP2009109492A JP 2009109492 A JP2009109492 A JP 2009109492A JP 2008270661 A JP2008270661 A JP 2008270661A JP 2008270661 A JP2008270661 A JP 2008270661A JP 2009109492 A JP2009109492 A JP 2009109492A
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Prior art keywords
composite structure
foreign
detected
foreign matter
cumulative
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Pending
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JP2008270661A
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English (en)
Japanese (ja)
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JP2009109492A5 (enExample
Inventor
Roger W Engelbart
ロジャー・ダブリュ・エンゲルバート
Reed Hannebaum
リード・ハンネボーム
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Boeing Co
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Boeing Co
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Publication of JP2009109492A publication Critical patent/JP2009109492A/ja
Publication of JP2009109492A5 publication Critical patent/JP2009109492A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C70/00—Shaping composites, i.e. plastics material comprising reinforcements, fillers or preformed parts, e.g. inserts
    • B29C70/04—Shaping composites, i.e. plastics material comprising reinforcements, fillers or preformed parts, e.g. inserts comprising reinforcements only, e.g. self-reinforcing plastics
    • B29C70/28—Shaping operations therefor
    • B29C70/30—Shaping by lay-up, i.e. applying fibres, tape or broadsheet on a mould, former or core; Shaping by spray-up, i.e. spraying of fibres on a mould, former or core
    • B29C70/38—Automated lay-up, e.g. using robots, laying filaments according to predetermined patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8874—Taking dimensions of defect into account
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2008270661A 2007-10-29 2008-10-21 複合構造の作製中に累積異物指標を求めるための方法およびシステム Pending JP2009109492A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/927,115 US8068659B2 (en) 2003-12-02 2007-10-29 Method and system for determining cumulative foreign object characteristics during fabrication of a composite structure

Publications (2)

Publication Number Publication Date
JP2009109492A true JP2009109492A (ja) 2009-05-21
JP2009109492A5 JP2009109492A5 (enExample) 2011-10-13

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JP2008270661A Pending JP2009109492A (ja) 2007-10-29 2008-10-21 複合構造の作製中に累積異物指標を求めるための方法およびシステム

Country Status (3)

Country Link
US (1) US8068659B2 (enExample)
EP (1) EP2056095B1 (enExample)
JP (1) JP2009109492A (enExample)

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KR20150006822A (ko) * 2012-05-15 2015-01-19 더 보잉 컴파니 오염 식별 시스템

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US7289656B2 (en) 2003-12-02 2007-10-30 The Boeing Company Systems and methods for determining inconsistency characteristics of a composite structure
US8934702B2 (en) 2003-12-02 2015-01-13 The Boeing Company System and method for determining cumulative tow gap width
DE102010044175A1 (de) * 2010-11-19 2012-05-24 Mag Ias Gmbh Verfahren und Fertigungseinheit zur Herstellung von Faserverbundmaterial-Bauteilen
US9889613B2 (en) 2012-11-01 2018-02-13 Israel Aerospace Industries Ltd. Manufacture of integrated structures formed of composite materials
US8983171B2 (en) 2012-12-26 2015-03-17 Israel Aerospace Industries Ltd. System and method for inspecting structures formed of composite materials during the fabrication thereof
US9595092B2 (en) 2013-05-10 2017-03-14 The Boeing Company Methods and systems for inspection of composite irregularities
US9595096B2 (en) 2014-03-10 2017-03-14 The Boeing Company Composite inspection and structural check of multiple layers
GB2528963B (en) 2014-08-07 2018-07-25 Artform Int Ltd Product display shelf, system and method
US9645095B2 (en) 2014-10-06 2017-05-09 The Boeing Company System and method for inspecting a composite part during manufacture
US10668673B2 (en) 2015-05-18 2020-06-02 Flightware, Inc. Systems and methods for automated composite layup quality assurance
US9618459B2 (en) 2015-05-18 2017-04-11 Flightware, Inc. Systems and methods for automated composite layup quality assurance
US10702076B2 (en) 2016-01-18 2020-07-07 Atlas Bolt & Screw Company Llc Sensors, devices, adapters and mating structures for merchandisers and related methods
EP3432766A1 (en) 2016-03-23 2019-01-30 DCI Marketing, Inc. dba DCI - Artform Low product indicator for self facing merchandiser and related methods
US10952548B2 (en) 2016-10-18 2021-03-23 Retail Space Solutions Llc Illuminated merchandiser, retrofit kit and related methods
US10661512B2 (en) 2017-04-25 2020-05-26 The Boeing Company Measurement of ply boundaries
US10737446B2 (en) 2017-04-28 2020-08-11 The Boeing Company Process control of a composite fabrication process

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JP2002057195A (ja) * 2000-08-15 2002-02-22 Hitachi Ltd 電子デバイスの検査における欠陥解析用データ作成方法、および、電子デバイスの検査データ解析システム
JP2002257533A (ja) * 2001-03-01 2002-09-11 Hitachi Ltd 欠陥検査装置およびその方法
JP2003077972A (ja) * 2001-09-04 2003-03-14 Hitachi Ltd 半導体装置の製造方法
JP2004111674A (ja) * 2002-09-19 2004-04-08 Toshiba Corp 異物除去装置および異物除去方法
JP2004286532A (ja) * 2003-03-20 2004-10-14 Olympus Corp 外観検査方法及びその装置
JP2005049344A (ja) * 2003-07-28 2005-02-24 Boeing Co:The 複合構造の製造の際に、欠陥ならびに異物および破片を識別するためのシステムおよび方法
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US20060109454A1 (en) * 2004-11-24 2006-05-25 The Boeing Company In-process vision detection of flaw and fod characteristics
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JP2007273581A (ja) * 2006-03-30 2007-10-18 Toray Eng Co Ltd 半導体ウエーハ検査方法およびその装置

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JPH03108735A (ja) * 1989-09-22 1991-05-08 Hitachi Ltd 比較検査方法および装置
JP2001110867A (ja) * 1999-10-07 2001-04-20 Hitachi Ltd 電子デバイスの製造方法および電子デバイスの品質管理システム
JP2002057195A (ja) * 2000-08-15 2002-02-22 Hitachi Ltd 電子デバイスの検査における欠陥解析用データ作成方法、および、電子デバイスの検査データ解析システム
JP2002257533A (ja) * 2001-03-01 2002-09-11 Hitachi Ltd 欠陥検査装置およびその方法
JP2003077972A (ja) * 2001-09-04 2003-03-14 Hitachi Ltd 半導体装置の製造方法
JP2004111674A (ja) * 2002-09-19 2004-04-08 Toshiba Corp 異物除去装置および異物除去方法
JP2004286532A (ja) * 2003-03-20 2004-10-14 Olympus Corp 外観検査方法及びその装置
JP2005049344A (ja) * 2003-07-28 2005-02-24 Boeing Co:The 複合構造の製造の際に、欠陥ならびに異物および破片を識別するためのシステムおよび方法
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JP2007256119A (ja) * 2006-03-23 2007-10-04 Fujitsu Ltd 検査装置、積層装置、及び検査方法
JP2007273581A (ja) * 2006-03-30 2007-10-18 Toray Eng Co Ltd 半導体ウエーハ検査方法およびその装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150006822A (ko) * 2012-05-15 2015-01-19 더 보잉 컴파니 오염 식별 시스템
JP2015519568A (ja) * 2012-05-15 2015-07-09 ザ・ボーイング・カンパニーＴｈｅＢｏｅｉｎｇ Ｃｏｍｐａｎｙ 汚染特定システム
RU2629881C2 (ru) * 2012-05-15 2017-09-04 Зе Боинг Компани Система идентифицирования загрязняющих веществ
JP2017203781A (ja) * 2012-05-15 2017-11-16 ザ・ボーイング・カンパニーＴｈｅ Ｂｏｅｉｎｇ Ｃｏｍｐａｎｙ 汚染特定システム
KR102004571B1 (ko) * 2012-05-15 2019-10-01 더 보잉 컴파니 오염 식별 시스템

Also Published As

Publication number Publication date
US20090148030A1 (en) 2009-06-11
US8068659B2 (en) 2011-11-29
EP2056095A1 (en) 2009-05-06
EP2056095B1 (en) 2018-06-06

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