JP2008544337A5 - - Google Patents
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- JP2008544337A5 JP2008544337A5 JP2008507729A JP2008507729A JP2008544337A5 JP 2008544337 A5 JP2008544337 A5 JP 2008544337A5 JP 2008507729 A JP2008507729 A JP 2008507729A JP 2008507729 A JP2008507729 A JP 2008507729A JP 2008544337 A5 JP2008544337 A5 JP 2008544337A5
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- trigger
- logic
- representation
- selecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000010076 replication Effects 0.000 claims 2
- 230000003362 replicative effect Effects 0.000 claims 2
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/112,092 US7213216B2 (en) | 2002-08-09 | 2005-04-22 | Method and system for debugging using replicated logic and trigger logic |
| US11/112,092 | 2005-04-22 | ||
| PCT/US2006/013910 WO2006115812A2 (en) | 2005-04-22 | 2006-04-12 | Method and system for debugging using replicated logic and trigger logic |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008544337A JP2008544337A (ja) | 2008-12-04 |
| JP2008544337A5 true JP2008544337A5 (enExample) | 2009-05-28 |
| JP4989629B2 JP4989629B2 (ja) | 2012-08-01 |
Family
ID=37067503
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008507729A Active JP4989629B2 (ja) | 2005-04-22 | 2006-04-12 | 複製ロジック及びトリガロジックを用いたデバッグのための方法及びシステム |
Country Status (4)
| Country | Link |
|---|---|
| US (3) | US7213216B2 (enExample) |
| EP (1) | EP1872288A2 (enExample) |
| JP (1) | JP4989629B2 (enExample) |
| WO (1) | WO2006115812A2 (enExample) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7222315B2 (en) * | 2000-11-28 | 2007-05-22 | Synplicity, Inc. | Hardware-based HDL code coverage and design analysis |
| US7213216B2 (en) * | 2002-08-09 | 2007-05-01 | Synplicity, Inc. | Method and system for debugging using replicated logic and trigger logic |
| US6904576B2 (en) * | 2002-08-09 | 2005-06-07 | Synplicity, Inc. | Method and system for debugging using replicated logic |
| US7302659B2 (en) * | 2005-02-10 | 2007-11-27 | International Business Machines Corporation | System and method for unfolding/replicating logic paths to facilitate propagation delay modeling |
| US20070005322A1 (en) * | 2005-06-30 | 2007-01-04 | Patzer Aaron T | System and method for complex programmable breakpoints using a switching network |
| US20070005323A1 (en) * | 2005-06-30 | 2007-01-04 | Patzer Aaron T | System and method of automating the addition of programmable breakpoint hardware to design models |
| US8117255B2 (en) * | 2005-09-07 | 2012-02-14 | Sap Ag | Systems and methods for smart client remote data monitoring |
| US7447620B2 (en) * | 2006-02-23 | 2008-11-04 | International Business Machines Corporation | Modeling asynchronous behavior from primary inputs and latches |
| US7490305B2 (en) * | 2006-07-17 | 2009-02-10 | International Business Machines Corporation | Method for driving values to DC adjusted/untimed nets to identify timing problems |
| US7908574B2 (en) | 2007-05-09 | 2011-03-15 | Synopsys, Inc. | Techniques for use with automated circuit design and simulations |
| US7984400B2 (en) * | 2007-05-09 | 2011-07-19 | Synopsys, Inc. | Techniques for use with automated circuit design and simulations |
| US7904859B2 (en) * | 2007-05-09 | 2011-03-08 | Synopsys, Inc. | Method and apparatus for determining a phase relationship between asynchronous clock signals |
| US8756557B2 (en) * | 2007-05-09 | 2014-06-17 | Synopsys, Inc. | Techniques for use with automated circuit design and simulations |
| US7882473B2 (en) * | 2007-11-27 | 2011-02-01 | International Business Machines Corporation | Sequential equivalence checking for asynchronous verification |
| JP2009193165A (ja) * | 2008-02-12 | 2009-08-27 | Toshiba Corp | デバッグ装置およびデバッグ方法 |
| US8122410B2 (en) | 2008-11-05 | 2012-02-21 | International Business Machines Corporation | Specifying and validating untimed nets |
| WO2010137063A1 (ja) * | 2009-05-26 | 2010-12-02 | 株式会社日立製作所 | 管理サーバ及び管理システム |
| US8638792B2 (en) * | 2010-01-22 | 2014-01-28 | Synopsys, Inc. | Packet switch based logic replication |
| US8397195B2 (en) * | 2010-01-22 | 2013-03-12 | Synopsys, Inc. | Method and system for packet switch based logic replication |
| US8966319B2 (en) * | 2011-02-22 | 2015-02-24 | Apple Inc. | Obtaining debug information from a flash memory device |
| US9158661B2 (en) | 2012-02-15 | 2015-10-13 | Apple Inc. | Enhanced debugging for embedded devices |
| US9495492B1 (en) * | 2015-01-05 | 2016-11-15 | Cadence Design Systems, Inc. | Implementing synchronous triggers for waveform capture in an FPGA prototyping system |
| US9430358B1 (en) * | 2015-06-23 | 2016-08-30 | Ca, Inc. | Debugging using program state definitions |
| US9672135B2 (en) | 2015-11-03 | 2017-06-06 | Red Hat, Inc. | System, method and apparatus for debugging of reactive applications |
| EP3244326B1 (de) * | 2016-05-10 | 2021-07-07 | dSPACE digital signal processing and control engineering GmbH | Verfahren zum erstellen einer fpga-netzliste |
Family Cites Families (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0358365B1 (en) * | 1988-09-07 | 1998-10-21 | Texas Instruments Incorporated | Testing buffer/register |
| US5056094A (en) * | 1989-06-09 | 1991-10-08 | Texas Instruments Incorporated | Delay fault testing method and apparatus |
| US5272390A (en) * | 1991-09-23 | 1993-12-21 | Digital Equipment Corporation | Method and apparatus for clock skew reduction through absolute delay regulation |
| US5452239A (en) * | 1993-01-29 | 1995-09-19 | Quickturn Design Systems, Inc. | Method of removing gated clocks from the clock nets of a netlist for timing sensitive implementation of the netlist in a hardware emulation system |
| US5706473A (en) | 1995-03-31 | 1998-01-06 | Synopsys, Inc. | Computer model of a finite state machine having inputs, outputs, delayed inputs and delayed outputs |
| US5923567A (en) * | 1996-04-10 | 1999-07-13 | Altera Corporation | Method and device for test vector analysis |
| JPH1010196A (ja) * | 1996-06-21 | 1998-01-16 | Hitachi Ltd | 論理エミュレーション装置 |
| US6120550A (en) | 1996-10-28 | 2000-09-19 | Altera Corporation | Design file templates for implementation of logic designs |
| US6014510A (en) * | 1996-11-27 | 2000-01-11 | International Business Machines Corporation | Method for performing timing analysis of a clock circuit |
| JPH10177590A (ja) * | 1996-12-18 | 1998-06-30 | Toshiba Corp | 論理回路モデルのデバッグ装置およびデバッグ方法 |
| US5923676A (en) * | 1996-12-20 | 1999-07-13 | Logic Vision, Inc. | Bist architecture for measurement of integrated circuit delays |
| EP0920637A4 (en) * | 1997-01-31 | 2002-05-29 | Greenfield Entpr Inc | NAVIGATION METHOD AND SYSTEM |
| US6286128B1 (en) * | 1998-02-11 | 2001-09-04 | Monterey Design Systems, Inc. | Method for design optimization using logical and physical information |
| BR9914200A (pt) | 1998-09-30 | 2002-01-22 | Cadence Design Systems Inc | Métodos para projetar um sistema de circuito, para expandir uma metodologia existente para avaliar a viabilidade de um projeto de circuito, para realizar uma avaliação de viabilidade para um projeto de circuito, para refinar uma primeira regra de decisão para um projeto de circuito, para formar uma segunda regra de decisão para um projeto de circuito, para organizar os dados de experiência de um projetista relativos a uma pluralidade de blocos de circuito pré-projetados, para aumentar a eficiência de distribuição de lógica de cola e para distribuir uma pluralidade de elementos lógicos de cola entre os blocos de projeto e distribuir lógica de cola para execução em um esquema de projeto de dispositivo de circuito integrado, para converter uma interface especìfica de um bloco de circuito, para selecionar um coletor de circuito, para projetar um dispositivo que incorpora o projeto e habilitar um teste do dispositivo, para verificar o correto funcionamento de um projeto de circuito e para desenvolver uma bancada de teste de nìvel comportamental, interface de colar e sistema de interface |
| US6438735B1 (en) * | 1999-05-17 | 2002-08-20 | Synplicity, Inc. | Methods and apparatuses for designing integrated circuits |
| US6519754B1 (en) * | 1999-05-17 | 2003-02-11 | Synplicity, Inc. | Methods and apparatuses for designing integrated circuits |
| WO2001001245A1 (en) * | 1999-06-26 | 2001-01-04 | Yang Sei Yang | Input/output probing apparatus and input/output probing method using the same, and mixed emulation/simulation method based on it |
| KR20010006983A (ko) | 1999-06-26 | 2001-01-26 | 양세양 | 신속 프로토타이핑 장치와 그것의 입출력 탐침방법 및그것을 이용한 혼합 검증 방법 |
| KR100710972B1 (ko) | 1999-06-26 | 2007-04-24 | 양세양 | 혼합된 에뮬레이션과 시뮬레이션이 가능한 혼합 검증 장치및 이를 이용한 혼합 검증 방법 |
| AU1727901A (en) | 1999-11-29 | 2001-06-04 | Cellot Inc. | Universal hardware device and method and tools for use therewith |
| US7065481B2 (en) | 1999-11-30 | 2006-06-20 | Synplicity, Inc. | Method and system for debugging an electronic system using instrumentation circuitry and a logic analyzer |
| DE10030349A1 (de) | 2000-06-20 | 2002-01-10 | Kuratorium Offis E V | Verfahren zum Analysieren der Verlustleistung bzw. der Energieaufnahme einer elektrischen Schaltung bzw. eines elektrischen Bauelementes |
| US6725406B2 (en) * | 2001-01-09 | 2004-04-20 | Intel Corporation | Method and apparatus for failure detection utilizing functional test vectors and scan mode |
| US6634011B1 (en) * | 2001-02-15 | 2003-10-14 | Silicon Graphics, Inc. | Method and apparatus for recording program execution in a microprocessor based integrated circuit |
| US7191373B2 (en) * | 2001-03-01 | 2007-03-13 | Syntest Technologies, Inc. | Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques |
| US6516449B2 (en) * | 2001-04-02 | 2003-02-04 | Sun Microsystems, Inc. | Methodology to create integrated circuit designs by replication maintaining isomorphic input output and fault behavior |
| US6580299B2 (en) | 2001-04-05 | 2003-06-17 | Parthus Ireland Limited | Digital circuit for, and a method of, synthesizing an input signal |
| US6530073B2 (en) * | 2001-04-30 | 2003-03-04 | Lsi Logic Corporation | RTL annotation tool for layout induced netlist changes |
| KR100794916B1 (ko) | 2001-09-14 | 2008-01-14 | 양세양 | 에뮬레이션과 시뮬레이션을 혼용한 점진적 설계 검증을위한 설계검증 장치 및 이를 이용한 설계 검증 방법 |
| JP2003099495A (ja) * | 2001-09-25 | 2003-04-04 | Fujitsu Ltd | 集積回路の設計システム、集積回路の設計方法およびプログラム |
| US6651227B2 (en) * | 2001-10-22 | 2003-11-18 | Motorola, Inc. | Method for generating transition delay fault test patterns |
| US6687882B1 (en) * | 2002-01-31 | 2004-02-03 | Synplicity, Inc. | Methods and apparatuses for non-equivalence checking of circuits with subspace |
| JP2003337845A (ja) * | 2002-05-21 | 2003-11-28 | Matsushita Electric Ind Co Ltd | エミュレーション装置、及び、エミュレーション方法 |
| US7398445B2 (en) * | 2002-08-09 | 2008-07-08 | Synplicity, Inc. | Method and system for debug and test using replicated logic |
| US7213216B2 (en) * | 2002-08-09 | 2007-05-01 | Synplicity, Inc. | Method and system for debugging using replicated logic and trigger logic |
| US6904576B2 (en) | 2002-08-09 | 2005-06-07 | Synplicity, Inc. | Method and system for debugging using replicated logic |
| JP2004280426A (ja) * | 2003-03-14 | 2004-10-07 | Mitsubishi Electric Corp | 論理集積回路の内部信号トレース装置 |
| US7266489B2 (en) * | 2003-04-28 | 2007-09-04 | International Business Machines Corporation | Method, system and program product for determining a configuration of a digital design by reference to an invertible configuration database |
| US7055117B2 (en) * | 2003-12-29 | 2006-05-30 | Agere Systems, Inc. | System and method for debugging system-on-chips using single or n-cycle stepping |
-
2005
- 2005-04-22 US US11/112,092 patent/US7213216B2/en not_active Expired - Lifetime
-
2006
- 2006-04-12 EP EP06750071A patent/EP1872288A2/en not_active Ceased
- 2006-04-12 WO PCT/US2006/013910 patent/WO2006115812A2/en not_active Ceased
- 2006-04-12 JP JP2008507729A patent/JP4989629B2/ja active Active
-
2007
- 2007-04-03 US US11/732,784 patent/US7665046B2/en not_active Expired - Lifetime
-
2010
- 2010-01-14 US US12/687,809 patent/US8392859B2/en not_active Expired - Lifetime
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