JP2008539549A5 - - Google Patents

Download PDF

Info

Publication number
JP2008539549A5
JP2008539549A5 JP2008508867A JP2008508867A JP2008539549A5 JP 2008539549 A5 JP2008539549 A5 JP 2008539549A5 JP 2008508867 A JP2008508867 A JP 2008508867A JP 2008508867 A JP2008508867 A JP 2008508867A JP 2008539549 A5 JP2008539549 A5 JP 2008539549A5
Authority
JP
Japan
Prior art keywords
chamber
voltage
voltage pulse
applying
conductive surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008508867A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008539549A (ja
JP5268634B2 (ja
Filing date
Publication date
Priority claimed from US11/114,481 external-priority patent/US7291845B2/en
Application filed filed Critical
Publication of JP2008539549A publication Critical patent/JP2008539549A/ja
Publication of JP2008539549A5 publication Critical patent/JP2008539549A5/ja
Application granted granted Critical
Publication of JP5268634B2 publication Critical patent/JP5268634B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2008508867A 2005-04-26 2006-03-31 電子衝撃イオン源におけるイオン不安定性の制御方法及びイオン化装置 Expired - Fee Related JP5268634B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/114,481 2005-04-26
US11/114,481 US7291845B2 (en) 2005-04-26 2005-04-26 Method for controlling space charge-driven ion instabilities in electron impact ion sources
PCT/US2006/011719 WO2006115686A2 (en) 2005-04-26 2006-03-31 Method for controlling space charge-driven ion instabilities in electron impact ion sources

Publications (3)

Publication Number Publication Date
JP2008539549A JP2008539549A (ja) 2008-11-13
JP2008539549A5 true JP2008539549A5 (https=) 2009-05-14
JP5268634B2 JP5268634B2 (ja) 2013-08-21

Family

ID=37038391

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008508867A Expired - Fee Related JP5268634B2 (ja) 2005-04-26 2006-03-31 電子衝撃イオン源におけるイオン不安定性の制御方法及びイオン化装置

Country Status (4)

Country Link
US (1) US7291845B2 (https=)
EP (1) EP1875486B1 (https=)
JP (1) JP5268634B2 (https=)
WO (1) WO2006115686A2 (https=)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7323682B2 (en) * 2004-07-02 2008-01-29 Thermo Finnigan Llc Pulsed ion source for quadrupole mass spectrometer and method
EP1995763A4 (en) * 2006-03-07 2011-09-28 Shimadzu Corp mass
US8720728B2 (en) 2007-03-09 2014-05-13 Simplehuman, Llc Trash can
EP2413346B1 (en) * 2009-03-27 2022-05-04 Osaka University Ion source, and mass spectroscope provided with same
US9434538B2 (en) 2010-03-12 2016-09-06 Simplehuman, Llc Trash can
US9048080B2 (en) * 2010-08-19 2015-06-02 Leco Corporation Time-of-flight mass spectrometer with accumulating electron impact ion source
US10279996B2 (en) 2011-09-16 2019-05-07 Simplehuman, Llc Receptacle with low friction and low noise motion damper for lid
US9790025B2 (en) 2012-03-09 2017-10-17 Simplehuman, Llc Trash can with clutch mechanism
CA2808725C (en) 2012-03-09 2020-03-24 Simplehuman, Llc Trash cans with features to aid in actuation
CN205752093U (zh) * 2012-11-19 2016-11-30 魄金莱默保健科学有限公司 光学系统、光检测器、光电倍增器检测器及其系统
WO2014164198A1 (en) * 2013-03-11 2014-10-09 David Rafferty Automatic gain control with defocusing lens
US9293312B2 (en) * 2013-03-15 2016-03-22 Thermo Finnigan Llc Identifying the occurrence and location of charging in the ion path of a mass spectrometer
US8969794B2 (en) 2013-03-15 2015-03-03 1St Detect Corporation Mass dependent automatic gain control for mass spectrometer
US9117617B2 (en) 2013-06-24 2015-08-25 Agilent Technologies, Inc. Axial magnetic ion source and related ionization methods
US20140374583A1 (en) * 2013-06-24 2014-12-25 Agilent Technologies, Inc. Electron ionization (ei) utilizing different ei energies
US9847214B2 (en) * 2013-11-26 2017-12-19 Perkinelmer Health Sciences, Inc. Detectors and methods of using them
US10279997B2 (en) 2014-03-14 2019-05-07 Simplehuman, Llc Trash can assembly
US9751692B2 (en) 2014-03-14 2017-09-05 Simplehuman, Llc Dual sensing receptacles
US9856080B2 (en) 2014-03-14 2018-01-02 Simplehuman, Llc Containers with multiple sensors
WO2016054109A1 (en) 2014-10-01 2016-04-07 Frank Yang Trash cans
JP6508215B2 (ja) * 2014-12-12 2019-05-08 株式会社島津製作所 質量分析装置
US10176977B2 (en) 2014-12-12 2019-01-08 Agilent Technologies, Inc. Ion source for soft electron ionization and related systems and methods
USD771344S1 (en) 2015-03-05 2016-11-08 Simplehuman, Llc Trash can
USD759934S1 (en) * 2015-03-05 2016-06-21 Simplehuman, Llc Trash can trim component
US12351390B2 (en) 2015-09-16 2025-07-08 Simplehuman, Llc Containers with multiple sensors
US11242198B2 (en) 2015-11-10 2022-02-08 Simplehuman, Llc Household goods with antimicrobial coatings and methods of making thereof
USD804133S1 (en) 2015-12-09 2017-11-28 Simplehuman, Llc Trash can
CA2959905C (en) 2016-03-03 2026-01-20 Simplehuman, Llc Receptacle assemblies with motion dampers
USD793642S1 (en) 2016-03-04 2017-08-01 Simplehuman, Llc Trash can
USD798016S1 (en) 2016-03-04 2017-09-19 Simplehuman, Llc Trash can
US9721777B1 (en) * 2016-04-14 2017-08-01 Bruker Daltonics, Inc. Magnetically assisted electron impact ion source for mass spectrometry
USD835376S1 (en) 2016-11-14 2018-12-04 Simplehuman, Llc Trash can
US10692712B2 (en) * 2017-04-03 2020-06-23 Perkinelmer Health Sciences, Inc. Ion transfer from electron ionization sources
USD855919S1 (en) 2017-06-22 2019-08-06 Simplehuman, Llc Trash can
USD858024S1 (en) 2018-01-12 2019-08-27 Simplehuman, Llc Trash can
USD858923S1 (en) 2018-01-12 2019-09-03 Simplehuman, Llc Trash can
CA3035674C (en) 2018-03-07 2026-01-20 Simplehuman, Llc Trash can assembly
US10622200B2 (en) * 2018-05-18 2020-04-14 Perkinelmer Health Sciences Canada, Inc. Ionization sources and systems and methods using them
USD901815S1 (en) 2019-05-16 2020-11-10 Simplehuman, Llc Slim trash can
USD969291S1 (en) 2020-08-26 2022-11-08 Simplehuman, Llc Odor pod
USD963277S1 (en) 2020-08-26 2022-09-06 Simplehuman, Llc Waste receptacle
CN114566420B (zh) * 2020-11-27 2025-08-08 株式会社岛津制作所 质量分析装置
USD1094941S1 (en) 2022-06-03 2025-09-23 Simplehuman, Llc Waste receptacle
USD1072411S1 (en) 2023-03-02 2025-04-22 Simplehuman, Llc Trash can
USD1072412S1 (en) 2023-03-02 2025-04-22 Simplehuman, Llc Trash can

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2784317A (en) * 1954-10-28 1957-03-05 Cons Electrodynamics Corp Mass spectrometry
US3553452A (en) * 1969-02-17 1971-01-05 Us Air Force Time-of-flight mass spectrometer operative at elevated ion source pressures
JPS56145647A (en) * 1980-04-11 1981-11-12 Hitachi Ltd Ion source for mass spectrometer
US5107109A (en) * 1986-03-07 1992-04-21 Finnigan Corporation Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer
DE4108462C2 (de) * 1991-03-13 1994-10-13 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung zum Erzeugen von Ionen aus thermisch instabilen, nichtflüchtigen großen Molekülen
US5572022A (en) * 1995-03-03 1996-11-05 Finnigan Corporation Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer
US6080985A (en) * 1997-09-30 2000-06-27 The Perkin-Elmer Corporation Ion source and accelerator for improved dynamic range and mass selection in a time of flight mass spectrometer
JP3750386B2 (ja) * 1998-12-09 2006-03-01 株式会社島津製作所 四重極質量分析装置
US6294780B1 (en) * 1999-04-01 2001-09-25 Varian, Inc. Pulsed ion source for ion trap mass spectrometer
DE10027545C1 (de) * 2000-06-02 2001-10-31 Bruker Daltonik Gmbh Regelung der Ionenfüllung in Ionenfallenmassenspektrometern
US6576897B1 (en) 2000-09-13 2003-06-10 Varian, Inc. Lens-free ion collision cell
JP2003257360A (ja) * 2002-02-27 2003-09-12 Jeol Ltd 電子衝撃型イオン源
JP2004234893A (ja) * 2003-01-28 2004-08-19 Hitachi High-Technologies Corp 高周波誘導結合プラズマイオントラップ質量分析装置
US7323682B2 (en) * 2004-07-02 2008-01-29 Thermo Finnigan Llc Pulsed ion source for quadrupole mass spectrometer and method

Similar Documents

Publication Publication Date Title
JP2008539549A5 (https=)
WO2006115686B1 (en) Method for controlling space charge-driven ion instabilities in electron impact ion sources
Leeuwenburgh et al. High-order harmonic generation spectroscopy of correlation-driven electron hole dynamics
JP6423615B2 (ja) 軸方向磁気イオン源及び関連するイオン化方法
WO2008106448A3 (en) Ion sources and methods of operating an electromagnet of an ion source
TW200503589A (en) Method and device for producing extreme ultraviolet radiation or soft X-ray radiation
JP2009529765A5 (https=)
CA2333721A1 (en) Pulsed ion source for ion trap mass spectrometer
WO2004081556A3 (en) Pulsed discharge ionization source for miniature ion mobility spectrometers
WO2008126383A1 (ja) イオントラップ質量分析装置
US20070045527A1 (en) Laser irradiation mass spectrometer
CN103713001B (zh) 介质薄膜的二次电子发射系数的测量系统及其测量方法
Wagenaars et al. Measurements of electric-field strengths in ionization fronts during breakdown
CN103874312A (zh) 一种面向z箍缩的壳层等离子体柱产生方法及其装置
KR101319926B1 (ko) 자외선 다이오드와 ｍｃｐ를 이용한 질량분석기의 이온화원 획득장치
Schaeffer et al. A platform for high-repetition-rate laser experiments on the large plasma device
Schins et al. Laser-assisted Auger decay as free-free transitions in a high-intensity laser field
Wells et al. Ionization of Atoms by the Spatial Gradient of the Pondermotive Potential<? format?> in a Focused Laser Beam
Tholin et al. Images of a nanosecond repetitively pulsed glow discharge between two point electrodes in air at 300 K and at atmospheric pressure
Morales et al. Dielectric surface flashover at atmospheric conditions with unipolar pulsed voltage excitation
RU2002128192A (ru) Способ генерации короткоимпульсного рентгеновского и корпускулярного излучения и осуществления перехода вещества в экстремальные состояния при инициировании низковольтных вакуумных разрядов
Kolacek et al. Amplification of spontaneous emission of neon-like argon in a fast gas-filled capillary discharge
JP6104126B2 (ja) 皮膜形成装置及び皮膜形成方法
Andreev et al. Study of the development of relativistic plasma bunches in a long mirror trap by optical and X-ray imaging and numerical simulations
CN201653907U (zh) 激光诱导放电增强等离子体光谱检测装置