JP2008506118A - 原子間力顕微鏡で高周波力成分を検出するためのねじれ調波片持ち梁 - Google Patents

原子間力顕微鏡で高周波力成分を検出するためのねじれ調波片持ち梁 Download PDF

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Publication number
JP2008506118A
JP2008506118A JP2007520499A JP2007520499A JP2008506118A JP 2008506118 A JP2008506118 A JP 2008506118A JP 2007520499 A JP2007520499 A JP 2007520499A JP 2007520499 A JP2007520499 A JP 2007520499A JP 2008506118 A JP2008506118 A JP 2008506118A
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Prior art keywords
cantilever
torsional
arm
resonance frequency
fundamental
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JP2007520499A
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Japanese (ja)
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JP2008506118A5 (enExample
Inventor
カルヴィン エフ クォート
オズグル サヒン
オラフ ソルガールド
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Leland Stanford Junior University
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Leland Stanford Junior University
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Publication of JP2008506118A5 publication Critical patent/JP2008506118A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/32—AC mode
    • G01Q60/34—Tapping mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper

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  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Power Engineering (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Micromachines (AREA)
JP2007520499A 2004-07-08 2005-07-07 原子間力顕微鏡で高周波力成分を検出するためのねじれ調波片持ち梁 Pending JP2008506118A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/887,608 US7089787B2 (en) 2004-07-08 2004-07-08 Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy
PCT/US2005/024098 WO2006014542A1 (en) 2004-07-08 2005-07-07 Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy

Publications (2)

Publication Number Publication Date
JP2008506118A true JP2008506118A (ja) 2008-02-28
JP2008506118A5 JP2008506118A5 (enExample) 2008-08-28

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JP2007520499A Pending JP2008506118A (ja) 2004-07-08 2005-07-07 原子間力顕微鏡で高周波力成分を検出するためのねじれ調波片持ち梁

Country Status (6)

Country Link
US (3) US7089787B2 (enExample)
EP (1) EP1782431A1 (enExample)
JP (1) JP2008506118A (enExample)
KR (1) KR20070074543A (enExample)
CN (1) CN101010751A (enExample)
WO (1) WO2006014542A1 (enExample)

Cited By (1)

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JP2017508156A (ja) * 2014-02-28 2017-03-23 インフィニテシマ リミテッド 複数の作動場所を有するプローブ・システム

Families Citing this family (57)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2480440A1 (en) * 2002-04-16 2003-10-30 John D. Redmond Composite sprocket
US7168301B2 (en) * 2002-07-02 2007-01-30 Veeco Instruments Inc. Method and apparatus of driving torsional resonance mode of a probe-based instrument
US7155964B2 (en) * 2002-07-02 2007-01-02 Veeco Instruments Inc. Method and apparatus for measuring electrical properties in torsional resonance mode
US7089787B2 (en) * 2004-07-08 2006-08-15 Board Of Trustees Of The Leland Stanford Junior University Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy
JP4979229B2 (ja) * 2005-01-13 2012-07-18 インターナショナル・ビジネス・マシーンズ・コーポレーション 基板に亘って走査するプローブ
EP1877753A2 (en) * 2005-02-10 2008-01-16 Universität Karlsruhe (TH) Forschungsuniversität Method and device for determining material properties
US8067169B2 (en) * 2005-04-22 2011-11-29 The Board Of Trustees Of The Leland Stanford Junior University Detection of macromolecular complexes on ultraflat surfaces with harmonic cantilevers
US7989164B2 (en) * 2005-04-22 2011-08-02 The Board Of Trustees Of The Leland Stanford Junior University Detection of macromolecular complexes with harmonic cantilevers
US20060260388A1 (en) * 2005-04-26 2006-11-23 Chanmin Su Probe and method for a scanning probe microscope
WO2007024711A2 (en) 2005-08-19 2007-03-01 Arthur Beyder Oscillator and method of making for atomic force microscope and other applications
US8646111B2 (en) * 2006-02-14 2014-02-04 The Regents Of The University Of California Coupled mass-spring systems and imaging methods for scanning probe microscopy
US7603891B2 (en) * 2006-04-25 2009-10-20 Asylum Research Corporation Multiple frequency atomic force microscopy
US7555940B2 (en) * 2006-07-25 2009-07-07 Veeco Instruments, Inc. Cantilever free-decay measurement system with coherent averaging
US8024963B2 (en) 2006-10-05 2011-09-27 Asylum Research Corporation Material property measurements using multiple frequency atomic force microscopy
US7617719B2 (en) * 2006-11-30 2009-11-17 The Dow Chemical Company Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging
US7607344B2 (en) * 2007-04-23 2009-10-27 Frederick Sachs Factory-alignable compact cantilever probe
US8849611B2 (en) * 2007-11-27 2014-09-30 Intermodulation Products Ab Intermodulation scanning force spectroscopy
US7928343B2 (en) * 2007-12-04 2011-04-19 The Board Of Trustees Of The University Of Illinois Microcantilever heater-thermometer with integrated temperature-compensated strain sensor
JP2009150696A (ja) * 2007-12-19 2009-07-09 Hitachi Kenki Fine Tech Co Ltd 走査プローブ顕微鏡
WO2009097487A1 (en) * 2008-01-31 2009-08-06 The Board Of Trustees Of The University Of Illinois Temperature-dependent nanoscale contact potential measurement technique and device
US7979916B2 (en) * 2008-05-23 2011-07-12 Bede Pittenger Preamplifying cantilever and applications thereof
WO2010022285A1 (en) 2008-08-20 2010-02-25 The Board Of Trustees Of The University Of Illinois Device for calorimetric measurement
EP2163907A3 (en) 2008-09-15 2010-09-29 Karlsruher Institut für Technologie Cantilever with paddle for operation in dual-frequency mode
KR101569960B1 (ko) * 2008-12-11 2015-11-27 인피니트시마 리미티드 다이나믹 탐침 검출 시스템
CN101451946B (zh) * 2008-12-26 2010-12-22 中国科学院上海微系统与信息技术研究所 利用单根微机械悬臂梁实现多种物质检测的方法
US20100175155A1 (en) * 2009-01-06 2010-07-08 President And Fellows Of Harvard College Measurement and Mapping of Molecular Stretching and Rupture Forces
US8214916B2 (en) * 2009-01-26 2012-07-03 Nanoink, Inc. Large area, homogeneous array fabrication including leveling with use of bright spots
US8082593B2 (en) * 2009-02-25 2011-12-20 The Board Of Trustees Of The Leland Stanford Junior University Atomic force microscopy devices, arrangements and systems
WO2010105584A1 (de) * 2009-03-16 2010-09-23 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Rasterkraftmikroskop
US20110041224A1 (en) * 2009-08-06 2011-02-17 Purdue Research Foundation Atomic force microscope including accelerometer
US8387443B2 (en) * 2009-09-11 2013-03-05 The Board Of Trustees Of The University Of Illinois Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer
US8250668B2 (en) * 2009-09-16 2012-08-21 Forschungszentrum Karlsruhe Gmbh Cantilever with paddle for operation in dual-frequency mode
WO2012057723A1 (en) 2009-10-22 2012-05-03 Proksch, Roger Thermal measurements using multiple frequency atomic force microscopy
USD626027S1 (en) * 2010-01-08 2010-10-26 Akbik Mouwafa S Hanging ornament
US8923595B2 (en) * 2010-01-26 2014-12-30 Clarkson University Method of identification of cancerous and normal cells
US8686358B2 (en) * 2010-09-14 2014-04-01 University Of Washington Through Its Center For Commercialization Sub-microsecond-resolution probe microscopy
US8533861B2 (en) 2011-08-15 2013-09-10 The Board Of Trustees Of The University Of Illinois Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
US8914911B2 (en) 2011-08-15 2014-12-16 The Board Of Trustees Of The University Of Illinois Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
USD681500S1 (en) 2012-06-20 2013-05-07 Mouwafa S. Akbik Hanging ornament
USD677195S1 (en) 2012-06-20 2013-03-05 Mouwafa S. Akbik Hanging ornament
US9267963B2 (en) 2012-11-08 2016-02-23 The Board Of Trustees Of The Leland Stanford Junior University Interferometric atomic-force microscopy device and method
JP6588278B2 (ja) * 2015-09-01 2019-10-09 株式会社日立ハイテクサイエンス 走査プローブ顕微鏡および走査プローブ顕微鏡の光軸調整方法
USD805949S1 (en) 2015-12-28 2017-12-26 Mouwafa S. Akbik Hanging ornament
USD805950S1 (en) 2015-12-28 2017-12-26 Mouwafa S. Akbik Hanging ornament
JP2017181135A (ja) * 2016-03-29 2017-10-05 株式会社日立ハイテクサイエンス 走査型プローブ顕微鏡及びそのプローブ接触検出方法
CN110574502B (zh) 2016-09-12 2023-04-18 麦斯卓微电子(南京)有限公司 Mems致动系统和方法
US11407634B2 (en) 2016-09-12 2022-08-09 MEMS Drive (Nanjing) Co., Ltd. MEMS actuation systems and methods
US11261081B2 (en) 2016-09-12 2022-03-01 MEMS Drive (Nanjing) Co., Ltd. MEMS actuation systems and methods
US10794930B2 (en) 2017-01-26 2020-10-06 Ozgur Sahin AFM with suppressed parasitic signals
CN106895930A (zh) * 2017-02-22 2017-06-27 深圳市中葛科技有限公司 一种悬臂梁结构微力及微小位移传感装置
CN114026438B (zh) * 2019-05-03 2024-09-24 布鲁克纳米公司 扭转翼探针组件
CN110441551B (zh) * 2019-08-09 2021-10-12 合肥工业大学 一种基于石英圆环谐振器的原子力探针式传感器
CN110763873B (zh) * 2019-11-18 2021-04-13 中国科学院沈阳自动化研究所 基于原子力显微镜技术的峰值力轻敲与扭转共振复合方法
CN110907663B (zh) * 2019-12-18 2021-12-21 哈尔滨工业大学 基于t状悬臂梁探针的开尔文探针力显微镜测量方法
CN111473895B (zh) * 2020-03-16 2021-06-29 吉林大学 一种触觉传感器
CN115524037A (zh) * 2022-08-26 2022-12-27 青岛歌尔智能传感器有限公司 一种微机电系统传感器及电子设备
US20250277809A1 (en) * 2024-02-29 2025-09-04 Bruker Nano, Inc. Probe-Based Instrument and Method Using Torsional Oscillation Sensing

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1090289A (ja) * 1996-07-25 1998-04-10 Nikon Corp カンチレバー及びその製造方法、並びに、先鋭化部を有する部材の製造方法
JPH10123154A (ja) * 1996-10-18 1998-05-15 Kagaku Gijutsu Shinko Jigyodan 走査型プローブ顕微鏡用のプローブおよびその製造方法
JP2001228074A (ja) * 2000-02-17 2001-08-24 Seiko Instruments Inc マイクロプローブおよび試料表面測定装置
JP2001255257A (ja) * 2000-03-13 2001-09-21 Seiko Instruments Inc マイクロプローブおよびそれを用いた走査型プローブ装置
JP2001289768A (ja) * 2000-04-07 2001-10-19 Japan Science & Technology Corp 試料の物性分布のマッピング方法及びその装置

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05196458A (ja) * 1991-01-04 1993-08-06 Univ Leland Stanford Jr 原子力顕微鏡用ピエゾ抵抗性片持ばり構造体
US5412980A (en) * 1992-08-07 1995-05-09 Digital Instruments, Inc. Tapping atomic force microscope
US5519212A (en) * 1992-08-07 1996-05-21 Digital Instruments, Incorporated Tapping atomic force microscope with phase or frequency detection
USRE36488E (en) * 1992-08-07 2000-01-11 Veeco Instruments Inc. Tapping atomic force microscope with phase or frequency detection
US5444244A (en) * 1993-06-03 1995-08-22 Park Scientific Instruments Corporation Piezoresistive cantilever with integral tip for scanning probe microscope
US5646339A (en) * 1994-02-14 1997-07-08 International Business Machines Corporation Force microscope and method for measuring atomic forces in multiple directions
US5742377A (en) * 1994-04-12 1998-04-21 The Board Of Trustees Of The Leland Stanford, Jr. University Cantilever for scanning probe microscope including piezoelectric element and method of using the same
US5883705A (en) * 1994-04-12 1999-03-16 The Board Of Trustees Of The Leland Stanford, Jr. University Atomic force microscope for high speed imaging including integral actuator and sensor
US6075585A (en) * 1994-04-12 2000-06-13 The Board Of Trustees Of The Leland Stanford, Jr. University Vibrating probe for a scanning probe microscope
US5866805A (en) * 1994-05-19 1999-02-02 Molecular Imaging Corporation Arizona Board Of Regents Cantilevers for a magnetically driven atomic force microscope
JP3370527B2 (ja) * 1996-03-08 2003-01-27 セイコーインスツルメンツ株式会社 原子間力顕微鏡用プローブとその製造方法および原子間力顕微鏡
DE69618627T2 (de) * 1996-03-13 2002-09-12 International Business Machines Corp., Armonk Auslegerstrukturen
AU2870700A (en) 1999-02-05 2000-08-25 Xidex Corporation System and method of multi-dimensional force sensing for atomic force microscopy
US6452170B1 (en) * 1999-04-08 2002-09-17 University Of Puerto Rico Scanning force microscope to determine interaction forces with high-frequency cantilever
EP1221179A4 (en) * 1999-09-10 2006-12-13 Starmega Corp STRONG TEXTURED ATOMIC EDGES AND POINTS
US6298715B1 (en) * 1999-12-22 2001-10-09 Mfi Technologies Corporation Scanning force microscope probe cantilever with reflective structure
US6349591B1 (en) * 2000-01-13 2002-02-26 Universite Pierre & Marie Curie Device and method for controlling the interaction of a tip and a sample, notably for atomic force microscopy and nano-indentation
DE10027060B4 (de) * 2000-06-05 2006-11-30 Nanosurf Ag Abtastspitzen,Verfahren zur Herstellung und Verwendung derselben, insbesondere für die Rastersondenmikroskopie
US6578410B1 (en) * 2001-08-10 2003-06-17 Jacob Israelachvili Resistive cantilever spring for probe microscopy
US6945099B1 (en) 2002-07-02 2005-09-20 Veeco Instruments Inc. Torsional resonance mode probe-based instrument and method
US6935167B1 (en) * 2004-03-15 2005-08-30 The Board Of Trustees Of The Leland Stanford Junior University Harmonic cantilevers and imaging methods for atomic force microscopy
US7089787B2 (en) * 2004-07-08 2006-08-15 Board Of Trustees Of The Leland Stanford Junior University Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1090289A (ja) * 1996-07-25 1998-04-10 Nikon Corp カンチレバー及びその製造方法、並びに、先鋭化部を有する部材の製造方法
JPH10123154A (ja) * 1996-10-18 1998-05-15 Kagaku Gijutsu Shinko Jigyodan 走査型プローブ顕微鏡用のプローブおよびその製造方法
JP2001228074A (ja) * 2000-02-17 2001-08-24 Seiko Instruments Inc マイクロプローブおよび試料表面測定装置
JP2001255257A (ja) * 2000-03-13 2001-09-21 Seiko Instruments Inc マイクロプローブおよびそれを用いた走査型プローブ装置
JP2001289768A (ja) * 2000-04-07 2001-10-19 Japan Science & Technology Corp 試料の物性分布のマッピング方法及びその装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017508156A (ja) * 2014-02-28 2017-03-23 インフィニテシマ リミテッド 複数の作動場所を有するプローブ・システム

Also Published As

Publication number Publication date
CN101010751A (zh) 2007-08-01
US20080041143A1 (en) 2008-02-21
US20060236757A1 (en) 2006-10-26
US20060005614A1 (en) 2006-01-12
EP1782431A1 (en) 2007-05-09
US7404314B2 (en) 2008-07-29
KR20070074543A (ko) 2007-07-12
WO2006014542A1 (en) 2006-02-09
US7302833B2 (en) 2007-12-04
US7089787B2 (en) 2006-08-15

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