AU2870700A - System and method of multi-dimensional force sensing for atomic force microscopy - Google Patents

System and method of multi-dimensional force sensing for atomic force microscopy

Info

Publication number
AU2870700A
AU2870700A AU28707/00A AU2870700A AU2870700A AU 2870700 A AU2870700 A AU 2870700A AU 28707/00 A AU28707/00 A AU 28707/00A AU 2870700 A AU2870700 A AU 2870700A AU 2870700 A AU2870700 A AU 2870700A
Authority
AU
Australia
Prior art keywords
dimensional
atomic force
microscopy
force sensing
sensing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU28707/00A
Inventor
Juricic Davor
Vladimir Mancevski
Paul Mcclure
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xidex Corp
Original Assignee
Xidex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xidex Corp filed Critical Xidex Corp
Publication of AU2870700A publication Critical patent/AU2870700A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/26—Friction force microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • G01Q70/12—Nanotube tips
AU28707/00A 1999-02-05 2000-02-04 System and method of multi-dimensional force sensing for atomic force microscopy Abandoned AU2870700A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11875699P 1999-02-05 1999-02-05
US60118756 1999-02-05
PCT/US2000/002952 WO2000046569A1 (en) 1999-02-05 2000-02-04 System and method of multi-dimensional force sensing for atomic force microscopy

Publications (1)

Publication Number Publication Date
AU2870700A true AU2870700A (en) 2000-08-25

Family

ID=22380552

Family Applications (1)

Application Number Title Priority Date Filing Date
AU28707/00A Abandoned AU2870700A (en) 1999-02-05 2000-02-04 System and method of multi-dimensional force sensing for atomic force microscopy

Country Status (2)

Country Link
AU (1) AU2870700A (en)
WO (1) WO2000046569A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101206555B1 (en) 2004-04-14 2012-11-29 비코 인스트루먼츠 인코포레이티드 Method and apparatus for obtaining quantitative measurements using a probe based instrument
US7089787B2 (en) 2004-07-08 2006-08-15 Board Of Trustees Of The Leland Stanford Junior University Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy
US7607342B2 (en) * 2006-04-26 2009-10-27 Vecco Instruments, Inc. Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument
US9562927B2 (en) 2014-10-06 2017-02-07 The Curators Of The University Of Missouri Force detection for microscopy based on direct tip trajectory observation
EP3447504A1 (en) 2017-08-24 2019-02-27 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Atomic force microscopy cantilever, system and method
KR102637073B1 (en) * 2017-11-01 2024-02-15 네덜란제 오르가니자티에 포오르 토에게파스트-나투우르베텐샤펠리즈크 온데르조에크 테엔오 Probe, method of manufacturing probe and scanning probe microscope system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5267471A (en) * 1992-04-30 1993-12-07 Ibm Corporation Double cantilever sensor for atomic force microscope
US5519212A (en) * 1992-08-07 1996-05-21 Digital Instruments, Incorporated Tapping atomic force microscope with phase or frequency detection
JP2500373B2 (en) * 1993-11-09 1996-05-29 工業技術院長 Atomic force microscope and sample observation method in atomic force microscope
JP3523688B2 (en) * 1994-07-06 2004-04-26 オリンパス株式会社 Probe device for sample measurement
JP2730673B2 (en) * 1995-12-06 1998-03-25 工業技術院長 Method and apparatus for measuring physical properties using cantilever for introducing ultrasonic waves
US5918274A (en) * 1997-06-02 1999-06-29 International Business Machines Corporation Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope

Also Published As

Publication number Publication date
WO2000046569A1 (en) 2000-08-10

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase