JP2008249729A - 周波数測定装置 - Google Patents

周波数測定装置 Download PDF

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Publication number
JP2008249729A
JP2008249729A JP2008176520A JP2008176520A JP2008249729A JP 2008249729 A JP2008249729 A JP 2008249729A JP 2008176520 A JP2008176520 A JP 2008176520A JP 2008176520 A JP2008176520 A JP 2008176520A JP 2008249729 A JP2008249729 A JP 2008249729A
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JP
Japan
Prior art keywords
frequency
rotation vector
value
signal
angular velocity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2008176520A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008249729A5 (enExample
Inventor
Nobuo Tsukamoto
信夫 塚本
Kazuo Akaike
和男 赤池
Tsukasa Furuhata
司 古幡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DSP TECHNOLOGY ASSOCIATES Inc
Nihon Dempa Kogyo Co Ltd
Original Assignee
DSP TECHNOLOGY ASSOCIATES Inc
Nihon Dempa Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DSP TECHNOLOGY ASSOCIATES Inc, Nihon Dempa Kogyo Co Ltd filed Critical DSP TECHNOLOGY ASSOCIATES Inc
Priority to JP2008176520A priority Critical patent/JP2008249729A/ja
Publication of JP2008249729A publication Critical patent/JP2008249729A/ja
Publication of JP2008249729A5 publication Critical patent/JP2008249729A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N11/00—Investigating flow properties of materials, e.g. viscosity, plasticity; Analysing materials by determining flow properties
    • G01N11/10—Investigating flow properties of materials, e.g. viscosity, plasticity; Analysing materials by determining flow properties by moving a body within the material
    • G01N11/16—Investigating flow properties of materials, e.g. viscosity, plasticity; Analysing materials by determining flow properties by moving a body within the material by measuring damping effect upon oscillatory body
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G3/00—Weighing apparatus characterised by the use of elastically-deformable members, e.g. spring balances
    • G01G3/12—Weighing apparatus characterised by the use of elastically-deformable members, e.g. spring balances wherein the weighing element is in the form of a solid body stressed by pressure or tension during weighing
    • G01G3/13—Weighing apparatus characterised by the use of elastically-deformable members, e.g. spring balances wherein the weighing element is in the form of a solid body stressed by pressure or tension during weighing having piezoelectric or piezoresistive properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02—Analysing fluids
    • G01N29/036—Analysing fluids by measuring frequency or resonance of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4472—Mathematical theories or simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0256—Adsorption, desorption, surface mass change, e.g. on biosensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02809—Concentration of a compound, e.g. measured by a surface mass change

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Mathematical Analysis (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Algebra (AREA)
  • Mathematical Optimization (AREA)
  • Acoustics & Sound (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
JP2008176520A 2004-08-11 2008-07-07 周波数測定装置 Pending JP2008249729A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008176520A JP2008249729A (ja) 2004-08-11 2008-07-07 周波数測定装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2004234735 2004-08-11
JP2005038205 2005-02-15
JP2008176520A JP2008249729A (ja) 2004-08-11 2008-07-07 周波数測定装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2005233149A Division JP4177361B2 (ja) 2004-08-11 2005-08-11 感知装置

Publications (2)

Publication Number Publication Date
JP2008249729A true JP2008249729A (ja) 2008-10-16
JP2008249729A5 JP2008249729A5 (enExample) 2009-10-01

Family

ID=35839466

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008176520A Pending JP2008249729A (ja) 2004-08-11 2008-07-07 周波数測定装置

Country Status (4)

Country Link
US (2) US7398163B2 (enExample)
EP (1) EP1788377B1 (enExample)
JP (1) JP2008249729A (enExample)
WO (1) WO2006016721A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014009979A (ja) * 2012-06-28 2014-01-20 Nippon Dempa Kogyo Co Ltd 周波数測定装置
JP2017502269A (ja) * 2013-12-02 2017-01-19 コミッサリア ア レネルジ アトミック エ オー エネルジス アルテルナティヴスＣｏｍｍｉｓｓａｒｉａｔ Ａ Ｌ‘Ｅｎｅｒｇｉｅ Ａｔｏｍｉｑｕｅ Ｅｔ Ａｕｘ Ｅｎｅｒｇｉｅｓ Ａｌｔｅｒｎａｔｉｖｅｓ ガスを分析するためのシステム及び方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4713459B2 (ja) * 2006-12-25 2011-06-29 日本電波工業株式会社 感知装置
US9214945B2 (en) * 2012-02-27 2015-12-15 Realtek Semiconductor Corp. Digital phase lock loop and method thereof
US10599988B2 (en) 2016-03-02 2020-03-24 D-Wave Systems Inc. Systems and methods for analog processing of problem graphs having arbitrary size and/or connectivity
US10859471B2 (en) * 2016-10-03 2020-12-08 Epro Gmbh Synchronization of machine vibration data after collection
US11481354B2 (en) 2018-04-24 2022-10-25 D-Wave Systems Inc. Systems and methods for calculating the ground state of non-diagonal Hamiltonians
US11593174B2 (en) 2018-10-16 2023-02-28 D-Wave Systems Inc. Systems and methods for scheduling programs for dedicated execution on a quantum processor
CN113544711B (zh) 2019-01-17 2024-08-02 D-波系统公司 用于使用聚类收缩的混合算法系统和方法
US11593695B2 (en) 2019-03-26 2023-02-28 D-Wave Systems Inc. Systems and methods for hybrid analog and digital processing of a computational problem using mean fields
US11714730B2 (en) 2019-08-20 2023-08-01 D-Wave Systems Inc. Systems and methods for high availability, failover and load balancing of heterogeneous resources
KR102189395B1 (ko) * 2020-04-27 2020-12-11 구성모 주소형 화재감지장치 및 이를 포함하는 주소형 화재감지시스템

Family Cites Families (24)

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US4090145A (en) * 1969-03-24 1978-05-16 Webb Joseph A Digital quadrature demodulator
US4100512A (en) * 1976-08-11 1978-07-11 Office National D'etudes Et De Recherches Aerospatiales Crystal oscillator compensated against frequency shift due to acceleration
US4318063A (en) * 1979-05-03 1982-03-02 The United States Of America As Represented By The Secretary Of The Air Force Crystal oscillator compensated for g-sensitivity
US4453141A (en) * 1982-01-28 1984-06-05 The United States Of America As Represented By The Secretary Of The Army Suppression of vibration effects on piezoelectric crystal resonators
FR2554992A1 (fr) * 1983-11-15 1985-05-17 Cepe Dispositif de compensation de la sensibilite a l'acceleration d'un oscillateur
US4588969A (en) * 1984-08-17 1986-05-13 Frequency And Time Systems, Inc. Adjustable crystal oscillator with acceleration compensation
CA1227357A (en) * 1985-02-12 1987-09-29 Minister Of National Defence Method and apparatus for detecting presence and concentration of vapours in gaseous fluids
ATE87777T1 (de) * 1985-04-04 1993-04-15 Motorola Inc Digitale zero-mf selektive stufe.
US4750214A (en) * 1986-06-11 1988-06-07 Rockwell International Corporation Digital FM demodulator using delayed signal product with arctangent
DE3629588A1 (de) * 1986-08-30 1988-03-03 Franz Dipl Ing Leitl Kristalloszillator-kompensationsschaltung
US4891611A (en) * 1989-03-09 1990-01-02 Rockwell International Corporation Vibration compensated crystal oscillator
JPH03140838A (ja) 1989-10-26 1991-06-14 Brother Ind Ltd ガスセンサ
JP2675733B2 (ja) 1993-02-17 1997-11-12 日本電信電話株式会社 化学センシング装置
JP3139656B2 (ja) * 1993-04-20 2001-03-05 横河電機株式会社 信号変換回路
JP2666709B2 (ja) * 1993-12-24 1997-10-22 日本電気株式会社 発振装置
US6033852A (en) * 1996-09-27 2000-03-07 University Of Maine Monolithic piezoelectric sensor (MPS) for sensing chemical, biochemical and physical measurands
US5786735A (en) * 1997-02-27 1998-07-28 The United States Of America As Represented By The Secretary Of The Army Phase and magnitude compensated tuning for suppression of vibration induced phase noise of crystal oscillator with varying vibration frequencies
JP2001000435A (ja) * 1999-06-16 2001-01-09 Toshiba Corp 超音波診断装置
US7098748B2 (en) * 2001-09-21 2006-08-29 Schmidt Dominik J Integrated CMOS high precision piezo-electrically driven clock
US6707346B2 (en) * 2001-12-19 2004-03-16 The Boeing Company Apparatus and method for improved crystal time reference
JP3729181B2 (ja) 2003-03-14 2005-12-21 セイコーエプソン株式会社 測定方法及び測定信号出力回路並びに測定装置
US7106143B2 (en) * 2004-03-31 2006-09-12 Frequency Electronics, Inc. Method for achieving highly reproducible acceleration insensitive quartz crystal oscillators
WO2006038367A1 (ja) * 2004-10-04 2006-04-13 Niigata University 物質吸着検知方法およびセンサ
JP4128191B2 (ja) * 2005-05-19 2008-07-30 国立大学法人名古屋大学 デジタルデータ記録装置、及び、そのサンプリングデータ特定方法並びにサンプリングデータ特定用プログラム

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014009979A (ja) * 2012-06-28 2014-01-20 Nippon Dempa Kogyo Co Ltd 周波数測定装置
JP2017502269A (ja) * 2013-12-02 2017-01-19 コミッサリア ア レネルジ アトミック エ オー エネルジス アルテルナティヴスＣｏｍｍｉｓｓａｒｉａｔ Ａ Ｌ‘Ｅｎｅｒｇｉｅ Ａｔｏｍｉｑｕｅ Ｅｔ Ａｕｘ Ｅｎｅｒｇｉｅｓ Ａｌｔｅｒｎａｔｉｖｅｓ ガスを分析するためのシステム及び方法

Also Published As

Publication number Publication date
US7398163B2 (en) 2008-07-08
EP1788377A4 (en) 2014-04-02
US20070251322A1 (en) 2007-11-01
EP1788377A1 (en) 2007-05-23
WO2006016721A1 (ja) 2006-02-16
EP1788377B1 (en) 2015-11-04
US7899633B2 (en) 2011-03-01
US20090055112A1 (en) 2009-02-26

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