JP2008227103A - GaN系半導体発光素子 - Google Patents
GaN系半導体発光素子 Download PDFInfo
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- JP2008227103A JP2008227103A JP2007062426A JP2007062426A JP2008227103A JP 2008227103 A JP2008227103 A JP 2008227103A JP 2007062426 A JP2007062426 A JP 2007062426A JP 2007062426 A JP2007062426 A JP 2007062426A JP 2008227103 A JP2008227103 A JP 2008227103A
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Abstract
【解決手段】サファイア基板1の上に、n型GaNコンタクト層2、AlInGaN/AlGaN超格子層3、活性層4、p型AlGaNブロック層8、p型GaNコンタクト層5が積層されている。活性層4は、井戸層をAlX1InY1GaZ1N(X1+Y1+Z1=1、0<X1<1、0<Y1<1)、バリア層をAlX2InY2GaZ2N(X2+Y2+Z2=1、0≦X2<1、0≦Y2<1、Y1>Y2)で構成し、井戸層のAl組成比率を5%以下にする。また、p型AlGaNブロック層8とp型GaNコンタクト層5との合計膜厚を0.4μm以上に構成する。
【選択図】 図1
Description
2 n型GaNコンタクト層
3 AlInGaN/AlGaN超格子層
4 活性層
4a バリア層
4b 井戸層
5 p型GaNコンタクト層
6 p電極
7 n電極
8 p型AlGaNブロック層
Claims (2)
- 量子井戸構造を有する活性層と該活性層形成後に成長させるp型GaN系半導体層を備えたGaN系半導体発光素子であって、
前記活性層はAlX1InY1GaZ1N(X1+Y1+Z1=1、0<X1<1、0<Y1<1)井戸層とAlX2InY2GaZ2Nバリア層(X2+Y2+Z2=1、0≦X2<1、0≦Y2<1、Y1>Y2)とで構成されており、前記井戸層のAl組成は5%以下で、前記p型GaN系半導体層の膜厚は0.4μm以上に構成されたことを特徴とするGaN系半導体発光素子。 - 前記井戸層のAl組成は1%以下に構成されていることを特徴とする請求項1記載のGaN系半導体発光素子。
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JP2007062426A JP2008227103A (ja) | 2007-03-12 | 2007-03-12 | GaN系半導体発光素子 |
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JP2007062426A JP2008227103A (ja) | 2007-03-12 | 2007-03-12 | GaN系半導体発光素子 |
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JP2008227103A true JP2008227103A (ja) | 2008-09-25 |
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JP2007062426A Pending JP2008227103A (ja) | 2007-03-12 | 2007-03-12 | GaN系半導体発光素子 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8362459B2 (en) | 2010-02-25 | 2013-01-29 | Lg Innotek Co., Ltd. | Light emitting device, light emitting device package, and lighting system |
US8907321B2 (en) | 2009-12-16 | 2014-12-09 | Lehigh Univeristy | Nitride based quantum well light-emitting devices having improved current injection efficiency |
JP2018513557A (ja) * | 2015-03-31 | 2018-05-24 | ソウル バイオシス カンパニー リミテッドSeoul Viosys Co.,Ltd. | 紫外線発光素子 |
Citations (8)
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JPH1051074A (ja) * | 1996-08-02 | 1998-02-20 | Fujitsu Ltd | 半導体発光素子 |
JPH10335757A (ja) * | 1997-01-09 | 1998-12-18 | Nichia Chem Ind Ltd | 窒化物半導体素子 |
JP2000031591A (ja) * | 1998-07-08 | 2000-01-28 | Toshiba Corp | 半導体発光素子 |
JP2002305323A (ja) * | 2000-07-03 | 2002-10-18 | Nichia Chem Ind Ltd | n型窒化物半導体積層体およびそれを用いる半導体素子 |
JP2004134787A (ja) * | 2002-09-18 | 2004-04-30 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子 |
JP2005136421A (ja) * | 2003-10-28 | 2005-05-26 | Sharp Corp | 半導体デバイスの製造 |
JP2005197293A (ja) * | 2003-12-26 | 2005-07-21 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子及びその製造方法 |
JP2005197292A (ja) * | 2003-12-26 | 2005-07-21 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子及びその製造方法 |
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2007
- 2007-03-12 JP JP2007062426A patent/JP2008227103A/ja active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1051074A (ja) * | 1996-08-02 | 1998-02-20 | Fujitsu Ltd | 半導体発光素子 |
JPH10335757A (ja) * | 1997-01-09 | 1998-12-18 | Nichia Chem Ind Ltd | 窒化物半導体素子 |
JP2000031591A (ja) * | 1998-07-08 | 2000-01-28 | Toshiba Corp | 半導体発光素子 |
JP2002305323A (ja) * | 2000-07-03 | 2002-10-18 | Nichia Chem Ind Ltd | n型窒化物半導体積層体およびそれを用いる半導体素子 |
JP2004134787A (ja) * | 2002-09-18 | 2004-04-30 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子 |
JP2005136421A (ja) * | 2003-10-28 | 2005-05-26 | Sharp Corp | 半導体デバイスの製造 |
JP2005197293A (ja) * | 2003-12-26 | 2005-07-21 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子及びその製造方法 |
JP2005197292A (ja) * | 2003-12-26 | 2005-07-21 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子及びその製造方法 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8907321B2 (en) | 2009-12-16 | 2014-12-09 | Lehigh Univeristy | Nitride based quantum well light-emitting devices having improved current injection efficiency |
US8362459B2 (en) | 2010-02-25 | 2013-01-29 | Lg Innotek Co., Ltd. | Light emitting device, light emitting device package, and lighting system |
JP2018513557A (ja) * | 2015-03-31 | 2018-05-24 | ソウル バイオシス カンパニー リミテッドSeoul Viosys Co.,Ltd. | 紫外線発光素子 |
CN113314649A (zh) * | 2015-03-31 | 2021-08-27 | 首尔伟傲世有限公司 | Uv发光二极管 |
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