JP2008211090A5 - - Google Patents
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- JP2008211090A5 JP2008211090A5 JP2007048065A JP2007048065A JP2008211090A5 JP 2008211090 A5 JP2008211090 A5 JP 2008211090A5 JP 2007048065 A JP2007048065 A JP 2007048065A JP 2007048065 A JP2007048065 A JP 2007048065A JP 2008211090 A5 JP2008211090 A5 JP 2008211090A5
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- JP
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- Prior art keywords
- manufacturing
- semi
- reliability
- solve
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- 238000004519 manufacturing process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 1
Priority Applications (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007048065A JP2008211090A (ja) | 2007-02-27 | 2007-02-27 | 半導体装置の製造方法及び半導体装置の製造装置 |
CN2008800062867A CN101627459B (zh) | 2007-02-27 | 2008-02-25 | 半导体器件制造方法以及半导体器件制造设备 |
KR1020097020079A KR101181389B1 (ko) | 2007-02-27 | 2008-02-25 | 반도체 소자의 제조 방법 및 반도체 소자의 제조 장치 |
KR1020117019031A KR20110099064A (ko) | 2007-02-27 | 2008-02-25 | 반도체 소자의 제조 방법 및 반도체 소자의 제조 장치 |
PCT/JP2008/053163 WO2008105360A1 (ja) | 2007-02-27 | 2008-02-25 | 半導体装置の製造方法及び半導体装置の製造装置 |
CN2011102702679A CN102290372A (zh) | 2007-02-27 | 2008-02-25 | 半导体器件制造方法以及半导体器件制造设备 |
US12/528,811 US8043963B2 (en) | 2007-02-27 | 2008-02-25 | Semiconductor device manufacturing method and semiconductor device manufacturing apparatus |
TW097106539A TWI392025B (zh) | 2007-02-27 | 2008-02-26 | 半導體裝置之製造方法及半導體裝置之製造裝置 |
US13/273,612 US8367542B2 (en) | 2007-02-27 | 2011-10-14 | Semiconductor device manufacturing method and semiconductor device manufacturing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007048065A JP2008211090A (ja) | 2007-02-27 | 2007-02-27 | 半導体装置の製造方法及び半導体装置の製造装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008211090A JP2008211090A (ja) | 2008-09-11 |
JP2008211090A5 true JP2008211090A5 (ru) | 2010-04-02 |
Family
ID=39787121
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007048065A Pending JP2008211090A (ja) | 2007-02-27 | 2007-02-27 | 半導体装置の製造方法及び半導体装置の製造装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2008211090A (ru) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5766098B2 (ja) * | 2011-11-17 | 2015-08-19 | 株式会社アルバック | 絶縁膜形成方法及び絶縁膜形成装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4239536A (en) * | 1977-09-09 | 1980-12-16 | Sumitomo Electric Industries, Ltd. | Surface-coated sintered hard body |
JP4350337B2 (ja) * | 2001-04-27 | 2009-10-21 | 富士通マイクロエレクトロニクス株式会社 | 半導体装置 |
DE10258282A1 (de) * | 2002-12-13 | 2004-07-08 | Walter Ag | CVD-Beschichtungsverfarhen für ZrBx CyNz-Schichten (x+y+z = 1) sowie beschichtetes Schneidwerkzeug |
JP2004259753A (ja) * | 2003-02-24 | 2004-09-16 | Fujitsu Ltd | 半導体装置およびその製造方法 |
JP4879509B2 (ja) * | 2004-05-21 | 2012-02-22 | 株式会社アルバック | 真空成膜装置 |
JP4480516B2 (ja) * | 2004-08-23 | 2010-06-16 | 株式会社アルバック | バリア膜の形成方法 |
TWI412080B (zh) * | 2006-11-09 | 2013-10-11 | Ulvac Inc | The method of forming a barrier film |
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2007
- 2007-02-27 JP JP2007048065A patent/JP2008211090A/ja active Pending
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