JP2008159768A - Baking apparatus, and substrate treating apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To improve the throughput or the cycle time, simplify the apparatus construction, and reduce the cost in a baking apparatus and a substrate treating apparatus. <P>SOLUTION: In this baking apparatus, a pre-bake unit (PRE-BAKE) 48 sets two heating zones along a roller conveying path 104, makes the first half heating zone a preliminary heating zone 144 and makes the second half heating zone a main heating zone or a rapid heating zone 146. In the rapid heating zone 146, tubular carbon heaters 150 are arranged at lower part of the roller conveying path 104 in the transfer direction in one stage or multiple stages. The far infrared rays IR<SB>F</SB>radiated from the carbon heaters 150 are reflected upwardly by plane reflecting plates 154, and incident on the backside of a substrate G on the roller conveying path 104 through between adjacent rollers 106, and absorbed by the substrate G as thermal energy. A protective cover 156 having an arc-shaped cross section is attached to the carbon heater 150. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a baking apparatus for performing heat treatment on a substrate to be processed by photolithography, and a substrate processing apparatus for performing a series of processes before exposure on a resist applied on the substrate.

  In the manufacture of semiconductor devices and flat panel displays (FPDs), many of the structural members are created using photolithography. In general, the photolithography process is a coating process for applying a resist on a substrate to be processed (semiconductor wafer, glass substrate, etc.), an exposure process for transferring a photomask pattern to a resist film, and developing a latent image pattern of the resist film. The three development steps to be converted into basic steps are performed, and various heat treatments are performed as auxiliary steps before, after, or between these basic steps. For example, before the coating process, heat treatment (dehydration baking) for removing moisture from the substrate is performed. Between the coating process and the exposure process, heat treatment (pre-baking) for evaporating the residual solvent of the resist film is performed. After the development step, a heat treatment (post-bake) is performed to evaporate and remove the developer and cleaning solution remaining in the resist pattern.

A conventional baking apparatus generally has a configuration of a so-called hot plate oven. A substrate is placed on a hot plate, a cover is formed from above, a chamber is formed, and the substrate is heated in the chamber. The volatile solvent (generally thinner) is exhausted from the resist film. This type of processing equipment includes a lift pin mechanism that lifts and lowers a substrate by moving a plurality of lift pins from the through hole of the hot plate to transfer the substrate to and from an external transfer robot, and a lid is placed on the hot plate. A lid opening / closing mechanism that opens upward is provided. Alternatively, the type in which the upper lid is fixed and the substrate loading / unloading port is provided on one side wall includes a gate mechanism for opening and closing the substrate loading / unloading port (see, for example, Patent Documents 1 and 2).
JP-A-8-313855 JP-A-11-204428

  However, the conventional baking apparatus has a problem that it takes a lot of time to carry in and out the substrate and the throughput is low. That is, when one heat treatment is completed by the single wafer method, the lid opening / closing mechanism or the gate mechanism opens the lid or the gate, while the lift pin mechanism raises the lift pin to lift the substrate above the hot plate. Immediately thereafter, an external transfer robot receives the processed substrate from the lift pin and passes a new unprocessed substrate to the lift pin instead. Immediately after the new substrate is placed on the lift pins, the lift pin mechanism lowers the lift pins to transfer the substrate onto the hot plate, and the lid opening / closing mechanism or gate mechanism closes the lid or gate after the transfer robot is retracted. This series of substrate carry-out / carry-in operations requires a considerable time (for example, about several tens of seconds). Furthermore, when the lid or gate is opened, the atmosphere in the chamber changes and the temperature of the hot plate decreases, and after the lid or gate is closed, the temperature of the atmosphere and hot plate in the chamber recovers to the reference state or reference value. It takes a considerable time (for example, about 10 seconds). Accordingly, assuming that the tact time of one apparatus is 60 seconds, for example, about half (around 30 seconds) is spent on loading / unloading the substrate and restoring the atmosphere as described above. For this reason, when the tact time of the entire system is shorter than the tact time of one apparatus, a plurality of baking apparatuses are operated in parallel at a constant time difference. In that case, a plurality of exhaust systems are required depending on the number of baking apparatuses.

  The present invention has been made in view of the above-described problems of the prior art, and provides a baking apparatus and a substrate processing apparatus capable of improving throughput or tact and simplifying and reducing the cost of the apparatus configuration. For the purpose.

  In order to achieve the above object, a baking apparatus according to the present invention includes a transport path that transports a substrate to be processed in a flat flow in a predetermined transport direction and a heat source that is disposed below the transport path. Or a plurality of far infrared heaters, a protective cover that is disposed under the transport path, and covers the far infrared heater overhead to protect the far infrared heater from falling objects, and is disposed under the transport path. A first reflector that reflects the far-infrared light from the far-infrared heater toward the transport path so that far-infrared light emitted from the far-infrared heater irradiates the back surface of the substrate moving on the transport path; Have

  In the above configuration, the desired heat treatment is efficiently performed by irradiating the back surface of the substrate with the far infrared rays emitted by the far infrared heater disposed below the conveyance route while moving the substrate in a flat flow on the conveyance route. Can be done in a short time. And even if a board | substrate cracks and falls when passing over the far-infrared heater, it does not hit a far-infrared heater only by colliding with a protective cover, and the failure by damage of a far-infrared heater can be prevented. Further, the heat treatment apparatus eliminates the need for a chamber, a hot plate, a lift pin mechanism, a transfer robot, and the like, and can greatly simplify and reduce the cost of the apparatus configuration.

  In a preferred embodiment of the present invention, a carbon heater can be suitably used as the far infrared heater.

  In a preferred aspect of the present invention, the substrate having a perforated plate disposed substantially horizontally above a section where the far-infrared ray of the transport path irradiates the back surface of the substrate, and heated by a far-infrared heater. An exhaust section is provided for sucking and exhausting a substance that volatilizes from the front surface through the perforated plate.

  Further, as a preferred embodiment, in order to pre-heat the substrate moving on the conveyance path, one or a plurality of heating heaters disposed below or above the conveyance path on the upstream side in the conveyance direction with respect to the far infrared heater is provided. Provided. Alternatively, in order to keep the substrate moving on the conveyance path warm, one or a plurality of heaters disposed below or above the conveyance path is provided on the downstream side of the far infrared heater in the conveyance direction. A sheathed heater can be suitably used as the heater.

  Further, according to a preferred aspect, the transport path has a large number of rollers laid at a constant pitch, and the far-infrared light reflected by the first reflector passes through the gaps between the rollers and the back surface of the substrate on the transport path. The far-infrared light path is set so as to irradiate the light. Preferably, a second reflecting plate that reflects far infrared rays emitted from the far infrared heater toward the first reflecting plate may be provided on the inner surface of the protective cover.

  The substrate processing apparatus of the present invention includes a coating unit that applies a resist on a substrate to be processed, a conveyance path that conveys the substrate coated with the resist in the coating unit in a substantially horizontal predetermined conveyance direction, In order to dry the surface of the resist on the substrate, the drying unit disposed in the first section of the transport path, and the first section of the transport path to heat the substrate with far infrared rays A far-infrared heater disposed in the second section on the downstream side and cooling disposed in the third section on the downstream side of the second section of the transport path in order to cool the substrate to a predetermined temperature. Part.

  In said structure, the drying part, the far-infrared heater, and the cooling part are provided in a line in order of the process along one conveyance path. While the substrate moves downstream on the transport path, a flat-flow type drying process is performed in the section of the drying section, and a flat-flow type far-infrared heating process is performed in the section of the far-infrared heater, and the cooling section Then, flat-flow cooling or substrate temperature stabilization is performed. That is, three processing steps of drying, far-infrared heating, and cooling are continuously and efficiently performed while the substrate is moved in a flat flow on the transfer path.

  According to a preferred aspect of the present invention, the far-infrared heater is disposed under the conveyance path, and a protective cover for covering the overhead of the far-infrared heater from the falling object is disposed under the conveyance path, A reflector that reflects far-infrared rays from the far-infrared heater to the conveyance path side is disposed below the conveyance path so that far-infrared rays emitted from the infrared heater irradiate the back surface of the substrate moving on the conveyance path. In such a configuration, even if the substrate breaks and falls when passing over the far infrared heater, it only hits the protective cover and does not hit the far infrared heater, preventing failure due to breakage of the far infrared heater Can do.

  In a preferred aspect of the present invention, the drying unit has a dry air injection nozzle that blows dry air from above on the substrate moving on the transport path. In addition, the cooling unit includes a temperature-controlled air injection nozzle that blows air whose temperature is controlled from above on the substrate moving on the conveyance path.

  According to a preferred aspect, in order to crosslink the surface of the resist on the substrate, an ultraviolet irradiation unit that irradiates ultraviolet rays having a predetermined wavelength from above is provided on the substrate moving on the conveyance path. Preferably, the ultraviolet irradiation unit may be arranged at a position upstream of the first section of the conveyance path. By irradiating the resist on the substrate with ultraviolet rays having a predetermined wavelength, the resin can be cross-linked to form an altered layer (hard layer) on the resist surface layer.

  According to the baking apparatus and the substrate processing apparatus of the present invention, it is possible to realize an improvement in throughput or tact and simplification and cost reduction of the apparatus configuration by the configuration and operation as described above.

  Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings.

  FIG. 1 shows a coating and developing treatment system as one configuration example to which the baking apparatus and the substrate processing apparatus of the present invention can be applied. This coating and developing processing system 10 is installed in a clean room. For example, a rectangular glass substrate is used as a substrate to be processed, and a series of processes such as cleaning, resist coating, pre-baking, developing, and post-baking in a photolithography process in an LCD manufacturing process. The processing is performed. The exposure process is performed by an external exposure apparatus 12 installed adjacent to this system.

  In the coating and developing system 10, a horizontally long process station (P / S) 16 is disposed at the center, and a cassette station (C / S) 14 and an interface station (I / F) are disposed at both ends in the longitudinal direction (X direction). ) 18.

  The cassette station (C / S) 14 is a cassette loading / unloading port of the system 10, and arranges up to four cassettes C that can accommodate a plurality of substrates C in a horizontal direction (Y direction) by stacking substrates G in multiple stages. A cassette stage 20 that can be placed, and a transport mechanism 22 that takes in and out the substrate G to and from the cassette C on the stage 20 are provided. The transport mechanism 22 has a transport arm 22a that can hold the substrate G in units of one sheet, can be operated with four axes of X, Y, Z, and θ, and is adjacent to the adjacent process station (P / S) 16 side and the substrate. G can be delivered.

  In the process station (P / S) 16, the processing units are arranged in the order of the process flow or the process on a pair of parallel and opposite lines A and B extending in the horizontal system longitudinal direction (X direction).

  More specifically, the upstream process line A from the cassette station (C / S) 14 side to the interface station (I / F) 18 side includes a carry-in unit (IN PASS) 24, a cleaning process unit 26, a first The thermal processing unit 28, the coating process unit 30, and the second thermal processing unit 32 are arranged in a line in this order from the upstream side along the first flat flow path 34.

  More specifically, the carry-in unit (IN PASS) 24 receives the unprocessed substrate G from the transfer mechanism 22 of the cassette station (C / S) 14 and inputs it into the first flat flow transfer path 34 at a predetermined tact. It is configured. The cleaning process section 26 is provided with an excimer UV irradiation unit (E-UV) 36 and a scrubber cleaning unit (SCR) 38 in order from the upstream side along the first flat flow path 34. The first thermal processing unit 28 includes an adhesion unit (AD) 40 and a cooling unit (COL) 42 in order from the upstream side. The coating process unit 30 includes a resist coating unit (COT) 44 and a drying unit (CD) 46 in order from the upstream side. The second thermal processing unit 32 includes a pre-bake unit (PRE-BAKE) 48 and a cooling unit (COL) 50 in order from the upstream side. A pass unit (PASS) 52 is provided at the end point of the first flat flow conveyance path 34 located adjacent to the downstream side of the second thermal processing unit 32. The substrate G that has been transported in a flat flow on the first flat flow transport path 34 is transferred from the pass unit (PASS) 52 at the end point to the interface station (I / F) 18.

  On the other hand, in the downstream process line B from the interface station (I / F) 18 side to the cassette station (C / S) 14 side, a development unit (DEV) 54, a post-bake unit (POST-BAKE) 56, a cooling unit are provided. A unit (COL) 58, an inspection unit (AP) 60 and a carry-out unit (OUT-PASS) 62 are arranged in a line in this order from the upstream side along the second flat flow path 64. Here, the post-bake unit (POST-BAKE) 56 and the cooling unit (COL) 58 constitute a third thermal processing unit 66. The carry-out unit (OUT PASS) 62 is configured to receive the processed substrates G one by one from the second flat flow transfer path 64 and pass them to the transfer mechanism 22 of the cassette station (C / S) 14. .

  An auxiliary transfer space 68 is provided between the process lines A and B, and a shuttle 70 capable of placing the substrate G horizontally in units of one sheet is both in the process line direction (X direction) by a drive mechanism (not shown). You can move in the direction.

  The interface station (I / F) 18 includes a transfer device 72 for exchanging the substrate G with the first and second flat flow transfer paths 34 and 64 and the adjacent exposure device 12. A rotary stage (R / S) 74 and a peripheral device 76 are arranged around the periphery. The rotary stage (R / S) 74 is a stage that rotates the substrate G in a horizontal plane, and is used to change the orientation of the rectangular substrate G when it is transferred to the exposure apparatus 12. The peripheral device 76 connects, for example, a titler (TITLER), a peripheral exposure device (EE), and the like to the second flat flow path 64.

  FIG. 2 shows a processing procedure of all steps for one substrate G in this coating and developing processing system. First, in the cassette station (C / S) 14, the transport mechanism 22 takes out one substrate G from any one of the cassettes C on the stage 20, and removes the taken substrate G in the process station (P / S) 16. It is carried into the carry-in unit (IN PASS) 24 on the process line A side (step S1). The substrate G is transferred or loaded onto the first flat flow path 34 from the carry-in unit (IN PASS) 24.

  The substrate G put into the first flat transport path 34 is first subjected to an ultraviolet cleaning process and a scrubbing cleaning process by the excimer UV irradiation unit (E-UV) 36 and the scrubber cleaning unit (SCR) 38 in the cleaning process unit 26. Sequentially applied (steps S2, S3). The scrubber cleaning unit (SCR) 38 removes particulate dirt from the substrate surface by performing brushing cleaning and blow cleaning on the substrate G that moves horizontally on the flat flow path 34, and then rinses. Finally, the substrate G is dried using an air knife or the like. When a series of cleaning processes in the scrubber cleaning unit (SCR) 38 is completed, the substrate G passes through the first thermal processing section 28 as it is down the first flat flow path 34.

  In the first thermal processing unit 28, the substrate G is first subjected to an adhesion process using vapor HMDS in the adhesion unit (AD) 40, and the surface to be processed is hydrophobized (step S4). After the completion of this adhesion process, the substrate G is cooled to a predetermined substrate temperature by the cooling unit (COL) 42 (step S5). Thereafter, the substrate G is carried into the coating process unit 30 along the first flat flow path 34.

  In the coating process section 30, the substrate G is first coated with a resist solution on the upper surface (surface to be processed) by a spinless method using a slit nozzle while being flown flat in a resist coating unit (COT) 44, and immediately after that, adjacent to the downstream side. The drying unit (CD) 46 receives a drying process at room temperature (step S6).

  The substrate G that has left the coating process unit 30 passes through the second thermal processing unit 32 through the first flat flow path 34. In the second thermal processing section 32, the substrate G is first pre-baked by the pre-bake unit (PRE-BAKE) 48 as a heat treatment after resist coating or a heat treatment before exposure (step S7). By this pre-baking, the solvent (generally thinner) remaining in the resist film on the substrate G is evaporated and removed, and the adhesion of the resist film to the substrate is enhanced. Next, the substrate G is cooled to a predetermined substrate temperature by the cooling unit (COL) 50 (step S8). Thereafter, the substrate G is taken from the pass unit (PASS) 52 at the end point of the first flat flow transport path 34 to the transport device 72 of the interface station (I / F) 18.

  In the interface station (I / F) 18, the substrate G is subjected to, for example, a 90-degree direction change by the rotary stage 74 and then carried into the peripheral exposure device (EE) of the peripheral device 76, where it adheres to the peripheral portion of the substrate G. After receiving the exposure for removing the resist to be developed, the resist is sent to the adjacent exposure apparatus 12 (step S9).

  In the exposure device 12, a predetermined circuit pattern is exposed to the resist on the substrate G. Then, when the substrate G that has undergone pattern exposure is returned from the exposure apparatus 12 to the interface station (I / F) 18 (step S9), it is first carried into a titler (TITLER) of the peripheral device 76, where a predetermined value on the substrate is obtained. Predetermined information is written in the part (step S10). Thereafter, the substrate G is carried from the transfer device 72 to the starting point of the developing unit (DEV) 54 of the second flat flow transfer path 64 laid on the process line B side of the process station (P / S) 16. .

  In this way, the substrate G is transferred on the second flat flow transfer path 64 toward the downstream side of the process line B. In the first development unit (DEV) 54, the substrate G is subjected to a series of development processes of development, rinsing, and drying while being conveyed in a flat flow (step S11).

  The substrate G that has undergone a series of development processes in the development unit (DEV) 54 is sequentially passed through the third thermal processing unit 66 and the inspection unit (AP) 60 while being put on the second flat flow path 64 as it is. To do. In the third thermal processing section 66, the substrate G is first subjected to post-baking as post-development heat treatment in the post-bake unit (POST-BAKE) 56 (step S12). By this post-baking, the developing solution and the cleaning solution remaining in the resist film on the substrate G are removed by evaporation, and the adhesion of the resist pattern to the substrate is enhanced. Next, the substrate G is cooled to a predetermined substrate temperature by the cooling unit (COL) 58 (step S13). In the inspection unit (AP) 60, non-contact line width inspection, film quality / film thickness inspection, and the like are performed on the resist pattern on the substrate G (step S14).

  The carry-out unit (OUT PASS) 62 receives the substrate G that has been processed in all steps from the second flat-carrying conveyance path 64 and transfers it to the conveyance mechanism 22 of the cassette station (C / S) 14. On the cassette station (C / S) 14 side, the transfer mechanism 22 stores the processed substrate G received from the carry-out unit (OUT PASS) 62 in any one (usually the original) cassette C (step S1). ).

  In the coating and developing treatment system 10, the present invention can be applied to, for example, the coating process unit 30 and the second thermal processing unit 32. Hereinafter, the configurations and operations of the coating process unit 30 and the second thermal processing unit 32 according to preferred embodiments of the present invention will be described in detail with reference to FIGS.

  FIG. 3 is a plan view showing the overall configuration of the coating process unit 30 in this embodiment.

  In FIG. 3, the resist coating unit (COT) 44 floats in the air on the floating stage 80 that constitutes a part or one section of the first flat flow path 34 (FIG. 1). A substrate transport mechanism 82 for transporting the substrate G in the longitudinal direction of the stage (X direction), a resist nozzle 84 for supplying a resist solution to the upper surface of the substrate G transported on the stage 80, and a resist nozzle 84 between the coating processes. And a nozzle refresh unit 86 for refreshing.

  A large number of gas injection holes 88 for injecting a predetermined gas (for example, air) upward are provided on the upper surface of the stage 80, and the substrate G is removed from the upper surface of the stage by the pressure of the gas injected from the gas injection holes 88. It is configured to rise to a certain height.

  The substrate transport mechanism 82 includes a pair of guide rails 90A and 90B extending in the X direction across the stage 80, a slider 92 that can reciprocate along the guide rails 90A and 90B, and both sides of the substrate G on the stage 80. And a substrate holding member (not shown) such as a suction pad provided on the slider 92 so as to detachably hold the end, and the slider 92 is moved in the transport direction (X) by a linear movement mechanism (not shown). The substrate G is floated and conveyed on the stage 80 by being moved in the direction).

  The resist nozzle 84 is an elongate nozzle extending across the stage 80 in a horizontal direction (Y direction) orthogonal to the transport direction (X direction), and the resist nozzle 84 of the substrate G that passes directly below the predetermined application position. The resist solution is discharged in a strip shape from the slit-shaped discharge port with respect to the upper surface. Further, the resist nozzle 84 is configured to be movable in the X direction integrally with the nozzle support member 94 that supports the nozzle, and is movable up and down in the Z direction, and moves between the application position and the nozzle refreshing portion 86. It can be done.

  The nozzle refresh unit 86 is held by the support member 96 at a predetermined position above the stage 80, and as a preparation for the coating process, a priming processing unit 98 for causing the resist nozzle 84 to discharge a resist solution, and a resist nozzle A nozzle bath 100 for keeping the resist discharge port 84 in a solvent vapor atmosphere for the purpose of preventing drying and a nozzle cleaning mechanism 102 for removing the resist adhering to the vicinity of the resist discharge port of the resist nozzle 84 are provided. .

  Here, main actions in the resist coating unit (COT) 44 will be described. First, the substrate G sent by, for example, roller conveyance from the first thermal processing unit 28 (FIG. 1) in the previous stage is carried into a carry-in unit set on the front end side on the stage 80, and is in a standby state there. 92 holds and receives the substrate G. On the stage 80, the substrate G receives the pressure of the gas (air) injected from the gas injection port 88 and keeps the floating state in a substantially horizontal posture.

  Then, the slider 92 moves in the transport direction (X direction) toward the drying unit (CD) 46 side while holding the substrate, and when the substrate G passes under the resist nozzle 84, the resist nozzle 84 moves to the substrate G. By discharging the liquid resist R in a strip shape toward the upper surface of the substrate, a liquid film of the resist R is formed on one surface so that a carpet is laid on the substrate G from the front end of the substrate toward the rear end. The substrate G thus coated with the resist solution is then levitated and conveyed on the stage 80 by the slider 92, passes over the rear end of the stage 80, and moves onto a roller conveyance path 104 described later, where the holding by the slider 92 is released. . The substrate G transferred to the roller transport path 104 is then transported on the roller transport path 104 by roller transport, as will be described later, and is carried into the subsequent drying unit (CD) 46.

  After the coated substrate G is sent to the drying unit (CD) 46 side as described above, the slider 92 returns to the carry-in portion on the front end side of the stage 80 in order to receive the next substrate G. The resist nozzle 84 moves from the coating position (resist liquid discharge position) to the nozzle refresh unit 86 after completing one or a plurality of coating processes, and performs refreshing or preparatory processing such as nozzle cleaning and priming. Then return to the application position.

  As shown in FIG. 3, on the extended line (downstream side) of the stage 80 of the resist coating unit (COT) 44, the roller transport that constitutes a part or one section of the first flat flow transport path 34 (FIG. 1). A road 104 is laid. The roller transport path 104 is formed by laying rollers 106 for transporting the substrate G in a flat flow at a constant pitch in the direction of the process line A (X direction), and continues to the interface station (I / F) 18. . As shown in FIGS. 3 and 4, along this roller conveyance path 104, the drying unit (CD) 46 of the coating process unit 30, the pre-bake unit (PRE-BAKE) 48 of the second thermal processing unit 32, and the cooling unit. (COL) 50 is provided. Each roller 106 is connected to a conveyance drive unit (not shown) using, for example, an electric motor as a drive source via a transmission mechanism such as a gear mechanism or a belt mechanism.

  FIG. 5 shows the configuration of the drying unit (CD) 46 in one embodiment. The drying unit (CD) 46 includes a long dry air injection nozzle 110 disposed in the vicinity of the unit outlet, and a constant distance (gap) from the transport surface of the roller transport path 104 from a position near the lower end of the nozzle 110. ) And a gas guide (ceiling) plate 112 extending horizontally to the upstream side in the transport direction, and a slit-like exhaust suction port 114 provided at the other end (upstream side end) of the gas guide plate 112. ing.

  The dry air injection nozzle 110 has a slit-like discharge port extending in the horizontal direction (Y direction) orthogonal to the transport direction (X direction), and the air supply pipe 120 is connected to the compressed gas supply source 116 and the dehumidifier 118. The room-temperature / high-pressure air DA that has been dried is introduced, and the introduced high-pressure dry air DA is passed through the perforated plate 110a in the nozzle and ejected in a uniform laminar flow from the slit-like discharge port.

  The exhaust suction port 114 communicates with an exhaust device 122 having an exhaust pump or an exhaust fan through an exhaust pipe 124, and gas (air) that stays or is generated in the gap between the gas guide plate 112 and the substrate G during the drying process. , Solvent vapor or the like) is sucked and sent to the exhaust device 122. The exhaust gas collected in the exhaust device 122 is sent to a solvent regeneration unit 126, where a recycling solvent (thinner) is regenerated by a regeneration process such as filtering or liquefaction.

  In this embodiment, a UV irradiation unit (X-UV) 128 for resist surface treatment is arranged at the first stage or the front stage of the drying unit (CD) 46. This UV irradiation unit (X-UV) 128 accommodates one or a plurality of ultraviolet lamps 132 in a lamp chamber 130 disposed above the conveyance path 104. The ultraviolet lamp 132 is made of, for example, a dielectric barrier discharge lamp. Ultraviolet light having a wavelength (for example, 172 nm) suitable for forming a deteriorated layer (hard layer) on the resist surface as will be described later is applied to the substrate G on the transport path 104 directly below. Irradiation is through a quartz glass window 134. A concave reflecting mirror 136 having a circular arc cross section is provided behind or above the ultraviolet lamp 130.

  In the lamp chamber 130, for example, a cooling jacket (not shown) for cooling the ultraviolet lamp 132 by, for example, a water-cooling method, or oxygen that absorbs ultraviolet rays (thus degrading the lamp luminous efficiency) is prevented. A gas distribution mechanism (not shown) for introducing and filling an inert gas such as N2 gas may be provided. Further, on both the front and rear sides of the lamp chamber 130, an inert gas injection nozzle 138 and an inert gas for flowing an inert gas such as N2 gas for exhausting oxygen or air along the lower surface of the ultraviolet irradiation 134 during the ultraviolet cleaning process. A suction port 140 may be provided.

  Here, with reference to FIG. 6, the operation in the drying unit (CD) 46 will be described. In FIG. 6, a base film 142 of the resist R is a film to be processed by photolithography (a film to be subjected to circuit pattern formation).

  As described above, the substrate G coated with the resist R by the resist coating unit (COT) 44 adjacent on the upstream side moves from the floating conveyance path on the stage 80 to the roller conveyance path 104. The substrate G first passes under the UV irradiation unit (X-UV) 128 on the roller conveyance path 104. Here, the resist R on the substrate G is irradiated with ultraviolet rays UV of a specific wavelength perpendicularly from above, and this ultraviolet irradiation causes a cross-linking reaction on the surface layer of the resist R on the substrate G, and the resin is polymerized. In this way, as shown in FIG. 6, a thin and hard film, that is, an altered layer RF is formed on the surface of the resist R from the front end to the rear end of the substrate G. This kind of deteriorated layer RF has the function of suppressing the flow of the bulk resist and thus suppressing the generation of transfer traces and unevenness on the surface of the resist R, and also improving the insolubility during the development process. is there.

  The substrate G that moves by roller conveyance on the conveyance path 104 enters the drying unit (CD) 46 immediately after passing through the UV irradiation unit (X-UV) 128, and here, the drying air DA from the upper drying air injection nozzle 110. Is sprayed in a laminar flow (down flow). Thus, when the laminar flow of the dry air DA hits the substrate G that is being transported from above, the wind pressure of the dry air DA acts on the resist R on the substrate G as a physical force and promotes the evaporation of the solvent. As shown in FIG. 6, the altered layer RF on the resist surface grows further (thickens). The solvent evaporated from the resist R on the substrate G flows under the gas guide plate 112 in the direction opposite to the transport direction so as to be caught in the air flow, and is sucked into the exhaust suction port 114.

  As described above, the drying unit (CD) 46 of this embodiment irradiates the substrate G that has been subjected to the resist coating process in the previous resist coating unit (COT) 44 with ultraviolet rays UV having a specific wavelength in the atmosphere. And by applying the dry air DA, the altered layer RF having the same film thickness (for example, about 3000 mm) as the case where the entire surface of the resist R on the substrate G is dried under reduced pressure can be formed. Whereas the vacuum drying apparatus requires a large vacuum chamber and a transfer robot, the drying unit (CD) 46 of this embodiment has a UV irradiation unit (on the roller transport path 104 common to other adjacent units). X-UV) 128, a dry air injection nozzle 110 and an exhaust suction port 114 are simply arranged, and the throughput is remarkably improved.

  FIG. 7 shows the configuration of the pre-bake unit (PRE-BAKE) 48 in one embodiment. This pre-bake unit (PRE-BAKE) 48 sets two heating sections along the conveyance path 104, the first heating section is a preheating zone 144, and the second heating section is a main heating section or a rapid heating zone 146. Yes.

  In the preheating zone 144, a flat sheet heater 148 is arranged in one or more stages in the transport direction as a preheating heater between the rollers 106 adjacent to each other in the vicinity of the transport path 104. . Each sheathed heater 148 has, for example, a ceramic coating on the surface, and the heater itself generates heat when energized, and heat radiated from the high temperature surface is applied to the substrate G on the transport path 104.

  In the rapid heating zone 146, tubular carbon heaters 150 are arranged in a single stage or multiple stages in the conveyance direction as heaters for rapid heating below the roller conveyance path 104. Each carbon heater 150 is a quartz tube in which, for example, a rod-like, string-like, or coil-like carbon wire is incorporated, and the base 152 extends in a direction extending in a horizontal direction (Y direction) perpendicular to the transport direction (X direction). It is detachably attached to and radiates far infrared rays of a predetermined wavelength when energized. For each carbon heater 150, for example, a long flat reflector 154 is horizontally attached to the base 152 at a predetermined angle (for example, 45 degrees) in an upward inclined posture in front of the downstream side in the transport direction, and downstream in the transport direction. A long protective cover 156 having an arcuate cross section is horizontally attached to the rear side. Here, the protective cover 156 is made of a rigid body such as metal or resin, and its upper end extends to a position that completely covers the top of the carbon heater 150. A concave reflector 158 may be formed or attached inside the protective cover 156. The planar reflecting plate 154 may be disposed immediately below the rollers 106 adjacent to each other (preferably at an intermediate position).

Of the far-infrared IR _F generated by the carbon heater 150, the one radiated to the front is directly incident on the flat reflector 154, and the one radiated behind is reflected by the concave reflector 158 and then reflected to the flat reflector 154. Incident. All the far-infrared IR _F incident on the plane reflecting plate 154 is folded back upward, passes between the adjacent rollers 106 and 106, enters the back surface of the substrate G on the conveyance path 104, and heats the substrate G. It is efficiently absorbed as energy.

  In the preheating zone 144 and the rapid heating zone 146, an exhaust suction ceiling plate (perforated plate) 160 made of, for example, a grating panel is provided along the transport path 104. The exhaust suction ceiling plate 160 is disposed horizontally with a gap of a predetermined distance from the conveyance surface of the conveyance path 104, and a buffer chamber 162 is formed on the back thereof. The buffer chamber 162 communicates with an exhaust device 166 having an exhaust pump or an exhaust fan through an exhaust pipe 164. As will be described later, the solvent evaporating from the substrate G (resist R) on the conveyance path 104 is sucked into the exhaust suction ceiling plate 160 together with the surrounding air and sent to the exhaust device 166. . Also in the pre-bake unit (PRE-BAKE) 48, a solvent regeneration unit (not shown) may be provided in the exhaust device 166.

  FIG. 9 shows the substrate temperature characteristics in the pre-bake unit (PRE-BAKE) 48. The substrate G has been subjected to the resist surface treatment (treatment for forming the altered layer RF on the surface of the resist R) by the drying unit (CD) 46 in the preceding stage while moving on the conveyance path 104 by roller conveyance. Then, it is carried into a pre-bake unit (PRE-BAKE) 48.

When the substrate G is carried into the pre-bake unit (PRE-BAKE) 48, the substrate G first enters the preheating zone 144 on the conveyance path 104, and receives the radiant heat of the sheathed heater 148 from below while passing through this section. As a result, as shown in FIG. 9, the temperature of the substrate G rises from the room temperature T _{n at a} relatively moderate rate while moving on the transfer path 104 by roller transfer, and a predetermined value near the end of the preheating zone 144 is obtained. The preheating temperature T _s (for example, about 50 to 70 ° C.) is reached. Next, the substrate G enters the rapid heating zone 146 by roller conveyance, and while passing through this section, the far-infrared IR _F of a predetermined wavelength from the carbon heater 150 is received on the back surface of the substrate and heated. As shown in FIG. 9, the heating of the far-infrared irradiation raises the temperature of the substrate G at a high speed and reaches a considerably high maximum temperature T _M (for example, about 180 to 200 ° C.) near the end of the rapid heating zone 146. After exiting the rapid heating zone 146, the heating is released and the substrate temperature decreases monotonously.

  By such heating in the pre-bake unit (PRE-BAKE) 48, particularly rapid heating in the far-infrared irradiation in the rapid heating zone 146, most of the residual solvent in the resist R evaporates from the substrate G in a short time. The film of R becomes thin and hard, and the adhesion with the substrate G is improved.

  As a modification of the pre-bake unit (PRE-BAKE) 48 in this embodiment, as shown in FIG. 8, a heating section layout in which a rapid heating zone 146 is provided in the previous stage and a heat insulation heating zone 168 is provided in the subsequent stage is possible. Here, the heat-retaining and heating zone 168 can be configured with a sheathed heater 148 as with the preheating zone 144.

FIG. 10 shows substrate temperature characteristics in the pre-bake unit (PRE-BAKE) 48 having the configuration of FIG. In this case, the substrate G first enters the rapid heating zone 146 on the transport path 104, and while passing through this section, the far-infrared IR _F having a predetermined wavelength from the carbon heater 150 is received on the back surface of the substrate and heated. As shown in FIG. 4, the temperature of the substrate G rises at high speed (at a stretch) from the normal temperature T _n to the maximum temperature T _M. Immediately thereafter, the substrate G receives the radiant heat from the sheathed heater 148 and passes through the thermal insulation heating zone 168 while keeping the substrate temperature substantially constant. After exiting the heat insulation heating zone 168, the heating is released and the temperature of the substrate G decreases.

As described above, the pre-bake unit (PRE-BAKE) 48 according to this embodiment has a predetermined wavelength generated by the carbon heater 150 disposed below the roller transport path 104 while moving the substrate G on the roller transport path 104. The far-infrared IR _F is irradiated on the back surface of the substrate G so that the pre-bake heat treatment is performed in a short time. Even if the substrate G breaks and falls when passing over the carbon heater 150, it only hits the protective cover 156 and does not hit the carbon heater 150. The carbon heater 150 can be operated stably for a long period of time without any damage caused by falling objects. The baking apparatus having such a configuration does not require a chamber, a hot plate, a lift pin mechanism, a transfer robot, or the like, and can greatly simplify and reduce the cost of the apparatus configuration.

  In addition, the pre-bake unit (PRE-BAKE) 48 can smoothly and smoothly respond to the coated substrate G which is successively sent from the previous resist coating unit (COT) 44 at a constant tact time. There is an advantage that the throughput can be improved and the variation in the heat treatment quality due to the difference in the baking apparatus is eliminated.

  In the pre-bake unit (PRE-BAKE) 48 of this embodiment, the rapid heating zone 146 is the main heating unit, and the auxiliary preheating zone 144 or the heat insulation heating zone 168 can be omitted. In that case, although the degree of freedom of heating temperature control is reduced, the entire heating section or the total heating time can be further shortened. In the case where the preheating zone 144 or the heat insulation heating zone 168 is provided, a configuration in which the sheathed heater 148 is disposed above the conveyance path 104 is also possible.

As described above, the rapid heating zone 146 is preferably disposed below the transport path 104 and irradiates the substrate G from below. In this case, when a part of the far-infrared IR _F radiated from the carbon heater 150 is incident on the roller 106 of the transport path 104, the roller 106 may be warmed and the substrate G may be thermally affected. To solve this problem, as shown in FIG. 11, a flow path is formed inside the roller 106, and cooling water or temperature-controlled water CW is supplied to the flow path through an external pipe 170. The temperature can be kept constant. Alternatively, as shown in FIG. 12, by attaching a circular arc cross sectional shape of the light-shielding or reflecting cover 172 covering the lower half portion in roller 106 disposed in rapid interval within the heating zone 146, the roller from far infrared IR _F 106 A configuration in which the light is shielded is also possible.

FIG. 13 shows a configuration of a cooling unit (COL) 50 in one embodiment. The cooling unit (COL) 50 has one or a plurality of (three in the illustrated example) cooling gas nozzles 174A, 174B, and 174C disposed at regular intervals above the conveyance path 104. . Each of the cooling gas nozzles 174A, 174B, and 174C has a slit-like discharge port extending in the width direction (Y direction) of the transport path 104, and is supplied from the compressed gas supply source 176 through the air supply pipes 178A, 178B, and 178C. High-pressure, temperature-controlled air (cooling gas) DJ _A , DJ _B , DJ _C is introduced, and the introduced high-pressure air DJ _A , DJ _B , DJ _C is passed through the perforated plates 174a, 174b, 174c in the nozzle and the slits The jet is ejected from the discharge port in a uniform laminar flow. In the middle of each air supply pipe 178A, 178B, 178C, flow rate regulators 180A, 180B, 180C and temperature controllers 182A, 182B, 182C are provided, and the temperature-controlled air DJ _A , DJ _B , DJ _C is provided. The flow rate (discharge pressure) and temperature can be individually controlled.

The substrate G that has undergone the pre-baking heat treatment as described above in the pre-bake unit (PRE-BAKE) 48 adjacent to the upstream side moves as it is on the transport path 104 by roller transport and enters the cooling unit (COL) 50. In the cooling unit (COL) 50, the first cooling gas nozzle 174A first blows the temperature-controlled air DJ _A having the first set temperature onto the substrate G on the transport path 104 that passes directly below, and then the second cooling gas DJ _A The cooling gas nozzle 174B blows the temperature-controlled air DJ _B at the second set temperature, and finally the third cooling gas nozzle 174C blows the temperature-controlled air DJ _C at the third set temperature. Usually, the set temperature of the temperature-controlled air DJ _A , DJ _B , DJ _C is selected so as to decrease stepwise as it goes to the subsequent stage.

  Thus, the substrate G is cooled to a predetermined temperature by the cooling unit (COL) 50. After exiting the cooling unit (COL) 50, the substrate G is moved on the transfer path 104 by roller transfer and sent to the interface station (I / F) 18, and the interface station (I / F) 18 to the exposure apparatus 12. It is carried in (FIGS. 1 and 2).

  In addition, as shown in FIG. 13, the structure which arrange | positions the ultraviolet irradiation unit (X-UV) 128 for resist surface treatment in this cooling unit (COL) 50 is also possible. As described above, the altered layer (hard layer) RF can be formed on the surface layer portion of the resist R by irradiating the resist R on the substrate G with ultraviolet rays having a specific wavelength (FIG. 6). Such a deteriorated layer RF not only effectively suppresses the generation of transfer marks and unevenness during the drying process and pre-baking process, but also has a function of improving the insolubility during the development process. For the purpose of obtaining the latter effect (non-solubility), an ultraviolet irradiation unit (X-UV) 128 is provided in the drying unit (CD) 46, the pre-bake unit (PRE-BAKE) 48 or the cooling unit (COL) 50. It is also possible to arrange.

  The cooling unit (COL) 46 of this embodiment also has a simple configuration in which one or a plurality of cooling gas nozzles 174 are arranged on the roller conveyance path 104 common to other adjacent units. In addition, since the substrate G immediately after the heat treatment, which is successively sent from the pre-bake unit (PRE-BAKE) 48, can be dealt with smoothly without interruption, throughput can be improved.

  As described above, in this embodiment, the processing units of the drying unit (CD) 50, the pre-bake unit (PRE-BAKE) 48, and the cooling unit (COL) 50 are arranged in a line in the order of the process along one transport path 104. Is provided. While the substrate G moves toward the downstream side by roller conveyance at a constant speed on the conveyance path 104, the drying unit (CD) 42 performs a flat-flow type drying process, and the pre-bake unit (PRE-BAKE) 48 performs A flat-flow type pre-baking process is performed, and the cooling unit (COL) 50 performs flat-flow type cooling or substrate temperature stabilization. That is, three processes of drying (CD), pre-baking (PRE-BAKE), and substrate temperature stabilization (COL) while the substrate G moves in the direction of the process line A in the direction of the flat roller transport on the transport path 104. The process is performed continuously and efficiently.

  No transfer robot or transfer mechanism for individually transferring or transferring the substrate G within or between the processing units 46, 48, 50 is used, and an opening / closing mechanism for opening and closing a part of the unit housing is also used. It is not done. For this reason, there is little possibility that particles will be generated in each unit and between adjacent units or adhere to the substrate.

  In addition, there is no scene where the substrate G is stopped for some processing or transport in the middle of the transport path 104, and the processing units 46, 48, and 50 are sequentially sent to the substrate G that is sequentially sent from the upstream side of the process line at a certain tact time. However, each one can handle smoothly without interruption. In other words, the tact for each of the processing units 46, 48, 50 is in agreement with the tact of the entire system, and there is no need to operate a plurality of units of the same model in parallel. This not only reduces the cost of hardware and transport software in the processing unit, but also eliminates processing quality variations due to machine differences between processing units.

  The preferred embodiments of the present invention have been described above, but the present invention is not limited to the above-described embodiments, and various modifications and changes can be made within the scope of the technical idea. For example, the roller transport path 104 can be replaced with another flat transport path such as a belt transport path or a floating transport path. The configuration and type of the tool such as the nozzle and heater in each unit is also an example, and other tools having the same function can be substituted.

  The above-described embodiment relates to the drying unit (CD) 46, the pre-bake unit (PRE-BAKE) 48, and the cooling unit (COL) 50. However, the present invention can be applied to other baking units and cooling units. is there. For example, in the coating and developing treatment system (FIG. 1) of the above embodiment, the adhesion unit (AD) 40 and the cooling unit (COL) 42 of the first thermal processing unit 28, or the third thermal processing unit. The present invention can also be applied to 66 post-bake units (POST-BAKE) 56 and cooling units (COL) 58.

  The substrate to be processed in the present invention is not limited to a glass substrate for LCD, and other flat panel display substrates, semiconductor wafers, CD substrates, photomasks, printed substrates and the like are also possible. The coating liquid to be dried under reduced pressure is not limited to a resist liquid, and for example, a processing liquid such as an interlayer insulating material, a dielectric material, or a wiring material is also possible.

It is a top view which shows the structure of the application | coating development processing system which can apply this invention. It is a flowchart which shows the process sequence in the said application | coating development processing system. It is a top view which shows the whole structure of the application | coating process part in embodiment. It is a top view which shows the arrangement configuration of the prebaking unit and cooling unit in embodiment. The structure of the drying unit in embodiment is shown. It is board | substrate sectional drawing for demonstrating the effect | action of the drying unit in embodiment. The structure of the prebaking unit in embodiment is shown. It is a board | substrate temperature characteristic view for demonstrating the effect | action of the prebaking unit in embodiment. The structure of the modification of the prebaking unit in embodiment is shown. It is a substrate temperature characteristic view for demonstrating the effect | action of the prebaking unit in the modification of FIG. It is a schematic perspective view which shows an example of the roller temperature control mechanism in the prebaking unit in embodiment. It is a schematic perspective view which shows an example of the ultraviolet light shielding mechanism in the prebaking unit in embodiment. The structure of the cooling unit in embodiment is shown.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Application | coating development system 30 Application | coating process part 32 2nd thermal processing part 44 Resist application unit (COT)
46 Drying unit (CD)
48 Pre-baking unit (PRE-BAKE)
50 Cooling unit (CD)
104 Roller transport path 106 Roller 110 Dry air injection nozzle 114 Suction port for exhaust 128 UV irradiation unit (X-UV)
144 Preheating zone 146 Rapid heating zone 148 Seed heater 150 Carbon heater 154 Planar reflector 156 Protective cover 158 Concave reflector 160 Exhaust suction ceiling plate 168 Thermal insulation heating zone 174A, 174B, 174C Cooling gas nozzle

Claims (14)

A transport path for transporting the substrate to be processed in a flat flow in a substantially horizontal predetermined transport direction;
One or a plurality of far-infrared heaters disposed as heat sources below the conveyance path;
A protective cover disposed under the transport path and covering the far infrared heater overhead to protect the far infrared heater from falling objects;
The far-infrared ray from the far-infrared heater is placed on the side of the conveyance path so that the far-infrared ray emitted from the far-infrared heater is irradiated on the back surface of the substrate moving on the conveyance path. And a first reflecting plate for reflecting.   The baking apparatus according to claim 1, wherein the far infrared heater is a carbon heater.   A substance that has a perforated plate disposed substantially horizontally above a section where the far-infrared ray of the transport path irradiates the back surface of the substrate, and volatilizes from the front surface of the substrate heated by the far-infrared heater. The baking apparatus according to claim 1, further comprising an exhaust unit that sucks and exhausts the air through the perforated plate.   2. One or more heat generating heaters are disposed below or above the transport path upstream of the far-infrared heater in the transport direction in order to preheat the substrate moving on the transport path. The baking apparatus as described in any one of -3.   2. One or a plurality of heating heaters disposed below or above the transport path on the downstream side of the far-infrared heater in the transport direction in order to insulate and heat the substrate moving on the transport path. The baking apparatus as described in any one of -5.   The baking apparatus according to claim 4 or 5, wherein the heating heater is a sheathed heater. The transport path is laid with a large number of rollers at a constant pitch,
The optical path of the far infrared ray is set so that the far infrared ray reflected by the first reflecting plate irradiates the back surface of the substrate on the transport path through a gap between the rollers. The baking apparatus as described in any one of Claims.   8. The second reflection plate for reflecting far infrared rays emitted from the far infrared heater toward the first reflection plate is provided on an inner surface of the protective cover. Baking equipment. An application part for applying a resist on a substrate to be processed;
A transport path for transporting the substrate coated with the resist in the coating section in a substantially horizontal predetermined transport direction;
In order to dry the surface of the resist on the substrate, a drying unit disposed in the first section of the transport path;
A far-infrared heater disposed in a second section downstream of the first section of the transport path to heat the substrate with far-infrared rays;
A substrate processing apparatus comprising: a cooling unit disposed in a third section on the downstream side of the second section of the transport path to cool the substrate to a predetermined temperature. The far-infrared heater is disposed under the transport path;
In order to protect the far-infrared heater from falling objects, a protective cover that covers the overhead is disposed under the conveyance path,
A reflector that reflects the far infrared rays from the far infrared heater toward the conveyance path side is provided on the conveyance path so that the far infrared rays emitted from the far infrared heater irradiate the back surface of the substrate moving on the conveyance path. The substrate processing apparatus of Claim 9 arrange | positioned under.   The substrate processing apparatus according to claim 10, wherein the drying unit includes a dry air injection nozzle that blows dry air from above on the substrate moving on the transport path.   The substrate processing apparatus according to claim 10, wherein the cooling unit includes a temperature-controlled air injection nozzle that blows air whose temperature is controlled from above on the substrate moving on the transport path.   13. The method according to claim 9, further comprising: an ultraviolet irradiation unit configured to irradiate the substrate moving on the conveyance path with ultraviolet rays having a predetermined wavelength from above in order to crosslink a surface layer portion of the resist on the substrate. Substrate processing equipment.   The substrate processing apparatus according to claim 13, wherein the ultraviolet irradiation unit is disposed at a position upstream of the first section of the transport path.

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