JP2007173365A - System and method for processing application drying - Google Patents

System and method for processing application drying Download PDF

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JP2007173365A
JP2007173365A JP2005366394A JP2005366394A JP2007173365A JP 2007173365 A JP2007173365 A JP 2007173365A JP 2005366394 A JP2005366394 A JP 2005366394A JP 2005366394 A JP2005366394 A JP 2005366394A JP 2007173365 A JP2007173365 A JP 2007173365A
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Prior art keywords
substrate
coating
drying
processing unit
glass substrate
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Yoshiharu Ota
義治 太田
Kimio Motoda
公男 元田
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Priority to KR1020060129888A priority patent/KR20070065811A/en
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05BSPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
    • B05B1/00Nozzles, spray heads or other outlets, with or without auxiliary devices such as valves, heating means
    • B05B1/005Nozzles or other outlets specially adapted for discharging one or more gases
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C11/00Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
    • B05C11/10Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/6715Apparatus for applying a liquid, a resin, an ink or the like

Abstract

<P>PROBLEM TO BE SOLVED: To improve throughput of an application drying processing of a substrate. <P>SOLUTION: A resist application processing unit 24 and two reduced pressure drying units 25 and 26 are continuously installed on a linear conveyance line A. In the resist application processing unit 24, resist liquid is continuously applied to two glass substrates G1 and G2 continuously passing a lower part of a nozzle 80 forward and backward and. The glass substrate G1 where application of resist liquid is terminated at first is roller-conveyed along the conveyance line A, passes through the reduced pressure drying unit 25, and is reduced pressure-dried in the reduced pressure drying unit 26. The glass substrate G2 where application of resist liquid is terminated next is roller-conveyed along the conveyance line A, and is reduced pressure-dried in the reduced pressure drying unit 25. The glass substrate G1 where reduced pressure drying is terminated is conveyed to a heating processing unit on a down stream-side along the conveyance line A. The glass substrate G2 passes through the reduced pressure drying unit 26 and is conveyed to the heating processing unit. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は,基板に塗布液を塗布し,その基板を乾燥する塗布乾燥処理システムと,塗布乾燥処理方法に関する。   The present invention relates to a coating / drying processing system for coating a substrate with a coating liquid and drying the substrate, and a coating / drying processing method.

例えば,液晶ディスプレイの製造プロセスのフォトリソグラフィ工程では,ガラス基板上にレジスト液を塗布するレジスト塗布処理と,そのレジスト液が塗布されたガラス基板を乾燥させる乾燥処理が順に行われている。   For example, in a photolithography process of a liquid crystal display manufacturing process, a resist coating process for coating a resist solution on a glass substrate and a drying process for drying the glass substrate coated with the resist solution are sequentially performed.

上述のレジスト塗布処理と乾燥処理は,例えばレジスト塗布処理装置と減圧乾燥処理装置を隣接して備えた基板搬送ラインにおいて,連続的に行われている(特許文献1参照)。   The resist coating process and the drying process described above are continuously performed, for example, in a substrate transfer line provided with a resist coating processing apparatus and a vacuum drying processing apparatus adjacent to each other (see Patent Document 1).

しかしながら,この場合,レジスト塗布処理よりも時間の長い乾燥処理に律束され,基板搬送ラインおける処理タクトが短縮できず,スループットを十分に上げることができなかった。この問題を解決するために,例えば塗布処理ユニットの周囲に隣接するように複数の乾燥処理ユニットを配置し,専用の垂直搬送ユニットによって塗布処理ユニットの基板を各乾燥処理ユニットに搬送することが提案されている(特許文献2参照)。   However, in this case, the drying process has a longer time than the resist coating process, the processing tact in the substrate transfer line cannot be shortened, and the throughput cannot be sufficiently increased. In order to solve this problem, for example, it is proposed to arrange a plurality of drying processing units adjacent to the periphery of the coating processing unit and transport the substrate of the coating processing unit to each drying processing unit by a dedicated vertical transport unit. (See Patent Document 2).

特開2002−334918号公報JP 2002-334918 A 特開2005−142372号公報JP 2005-142372 A

しかしながら,上述の場合,塗布処理ユニットと乾燥処理ユニットの間に大型の専用の垂直搬送ユニットが必要になり,フットプリントが増大する。また,垂直搬送ユニットに対して,基板の搬送先の切り替えなどの厳格な搬送制御を行う必要があるため,その搬送制御のためのコストがかかる。   However, in the above case, a large dedicated vertical transfer unit is required between the coating processing unit and the drying processing unit, and the footprint increases. Further, since it is necessary to perform strict transfer control such as switching of the transfer destination of the substrate with respect to the vertical transfer unit, the cost for the transfer control is required.

本発明は,かかる点に鑑みてなされたものであり,ガラス基板などの基板にレジスト液などの塗布液を塗布し,その基板を乾燥する場合において,上述のような垂直搬送ユニットを用いずに,スループットを向上することをその目的とする。   The present invention has been made in view of such points, and when a coating solution such as a resist solution is applied to a substrate such as a glass substrate and the substrate is dried, the vertical transfer unit as described above is not used. The purpose is to improve the throughput.

上記目的を達成するための本発明は,基板に塗布液を塗布し,その基板を乾燥する塗布乾燥処理システムであって,基板を水平方向に搬送する基板搬送路を備え,前記基板搬送路上には,基板に塗布液を塗布する塗布処理部と,基板を乾燥させる複数の乾燥処理部が上流側から下流側に向けて直列的に設けられ,前記各乾燥処理部は,基板の乾燥処理を行わずに基板を基板搬送路の下流側に通過させる機能と,基板を停止させ基板の乾燥処理を行う機能を有することを特徴とする。   In order to achieve the above object, the present invention provides a coating / drying processing system for applying a coating solution to a substrate and drying the substrate, comprising a substrate transport path for transporting the substrate in a horizontal direction, and on the substrate transport path. Is provided with a coating processing unit for applying a coating solution to a substrate and a plurality of drying processing units for drying the substrate in series from the upstream side to the downstream side, and each of the drying processing units performs drying processing of the substrate. It has a function of passing the substrate to the downstream side of the substrate transport path without performing the process and a function of stopping the substrate and performing a drying process of the substrate.

本発明によれば,塗布処理部のある基板搬送路上に複数の乾燥処理部が設けられ,各乾燥処理部は,基板を通過させることができるので,塗布処理部で連続的に塗布された基板を順次別個の乾燥処理部に搬送して乾燥することができる。このため,基板搬送路における処理タクトを短縮して,スループットを向上できる。また,従来のように垂直搬送ユニットを用いないので,フットプリントを増大することがなく,また,垂直搬送ユニットのための搬送制御のコストも必要ない。   According to the present invention, a plurality of drying processing units are provided on the substrate transport path having the coating processing unit, and each drying processing unit can pass the substrate, so that the substrate coated continuously by the coating processing unit. Can be sequentially transferred to separate drying processing units for drying. For this reason, it is possible to shorten the processing tact in the substrate transport path and improve the throughput. Further, since the vertical transfer unit is not used as in the prior art, the footprint is not increased, and the transfer control cost for the vertical transfer unit is not required.

前記基板搬送路上の塗布処理部には,通過する基板に塗布液を吐出するノズルが設けられていてもよい。   The coating processing unit on the substrate transport path may be provided with a nozzle that discharges the coating liquid onto the substrate passing therethrough.

前記塗布処理部では,前記乾燥処理部の数以下の複数の基板を連続的に搬送し,前記ノズルによる吐出により前記複数の基板に連続的に塗布液を塗布できてもよい。   In the coating processing unit, a plurality of substrates equal to or less than the number of the drying processing units may be continuously conveyed, and the coating solution may be continuously applied to the plurality of substrates by ejection using the nozzles.

前記塗布乾燥処理システムにおいて,前記連続的に塗布液が塗布される複数の基板が,塗布の終了した基板から順に,空の乾燥処理部のうちの最も下流側にある乾燥処理部に搬送されるようにしてもよい。   In the coating / drying processing system, the plurality of substrates to which the coating solution is continuously applied are transported to the drying processing unit located on the most downstream side of the empty drying processing units in order from the substrate on which the coating has been completed. You may do it.

前記塗布処理部において基板に塗布液が塗布されてから前記乾燥処理部において基板の乾燥が開始されるまでの時間が,基板相互間において一定に制御されていてもよい。   The time from when the coating liquid is applied to the substrate in the coating processing unit until the drying of the substrate is started in the drying processing unit may be controlled to be constant between the substrates.

別の観点による本発明は,基板に塗布液を塗布し,その後基板を乾燥する塗布乾燥処理方法であって,基板を水平方向に搬送する基板搬送路上に,基板に塗布液を塗布する塗布処理部と,基板を乾燥させる複数の乾燥処理部が上流側から下流側に向けて直列的に設けられ,前記各乾燥処理部では,基板の乾燥処理を行わずに基板を基板搬送路の下流側に通過させたり,基板を停止させて基板の乾燥処理を行うことを特徴とする。   Another aspect of the present invention is a coating / drying method for applying a coating liquid to a substrate and then drying the substrate, wherein the coating liquid is applied to a substrate on a substrate conveyance path for conveying the substrate in a horizontal direction. And a plurality of drying processing units for drying the substrate are provided in series from the upstream side to the downstream side, and in each of the drying processing units, the substrate is disposed on the downstream side of the substrate transport path without performing the substrate drying process. Or the substrate is stopped and the substrate is dried.

前記塗布処理部において,通過する基板にノズルから塗布液を吐出することによって,基板に塗布液を塗布するようにしてもよい。   In the coating processing unit, the coating liquid may be applied to the substrate by discharging the coating liquid from a nozzle onto the substrate passing therethrough.

前記塗布処理部において,前記乾燥処理部の数以下の複数の基板を連続的に搬送し,前記ノズルによる吐出により前記複数の基板に連続的に塗布液を塗布し,その連続的に塗布液が塗布される複数の基板を,塗布の終了した基板から順に,空の乾燥処理部のうちの最も下流側にある乾燥処理部に搬送し,前記複数の基板をそれぞれ別の乾燥処理部において乾燥するようにしてもよい。   In the coating processing unit, a plurality of substrates equal to or less than the number of the drying processing units are continuously transported, and the coating liquid is continuously applied to the plurality of substrates by ejection by the nozzles. A plurality of substrates to be coated are transported to the drying processing unit located on the most downstream side of the empty drying processing units in order from the substrate on which coating has been completed, and the plurality of substrates are dried in separate drying processing units, respectively. You may do it.

前記塗布処理部において基板に塗布液が塗布されてから前記乾燥処理部において基板の乾燥が開始されるまでの時間を,基板相互間において一定にするようにしてもよい。   The time from when the coating solution is applied to the substrate in the coating processing unit until the drying of the substrate is started in the drying processing unit may be constant between the substrates.

本発明によれば,従来のように垂直搬送ユニットを用いる必要がないので,フットプリントを増大することなく,また搬送制御のためのコストをかけずに,基板処理のスループットを向上できる。   According to the present invention, since it is not necessary to use a vertical transfer unit as in the prior art, the throughput of substrate processing can be improved without increasing the footprint and without cost for transfer control.

以下,本発明の好ましい実施の形態について説明する。図1は,本実施の形態にかかる塗布乾燥処理システムが搭載された塗布現像処理装置1の構成の概略を示す平面図である。   Hereinafter, preferred embodiments of the present invention will be described. FIG. 1 is a plan view showing an outline of the configuration of a coating and developing treatment apparatus 1 equipped with a coating and drying treatment system according to the present embodiment.

塗布現像処理装置1は,図1に示すように例えば複数のガラス基板Gをカセット単位で外部に対して搬入出するためのカセットステーション2と,フォトリソグラフィ工程の中で枚葉式に所定の処理を施す各種処理ユニットが配置された処理ステーション3と,処理ステーションに3に隣接して設けられ,処理ステーション3と露光装置4との間でガラス基板Gの受け渡しを行うインターフェイスステーション5とを一体に接続した構成を有している。   As shown in FIG. 1, the coating and developing treatment apparatus 1 includes, for example, a cassette station 2 for loading and unloading a plurality of glass substrates G to the outside in units of cassettes, and a predetermined processing in a single wafer type in a photolithography process. A processing station 3 in which various processing units for performing the processing are arranged, and an interface station 5 provided adjacent to the processing station 3 for transferring the glass substrate G between the processing station 3 and the exposure apparatus 4 are integrated. It has a connected configuration.

カセットステーション2には,カセット載置台10が設けられ,当該カセット載置台10は,複数のカセットCをX方向(図1中の上下方向)に一列に載置自在になっている。カセットステーション2には,搬送路11上をX方向に向かって移動可能な基板搬送体12が設けられている。基板搬送体12は,カセットCに収容されたガラス基板Gの配列方向(Z方向;鉛直方向)にも移動自在であり,X方向に配列された各カセットC内のガラス基板Gに対して選択的にアクセスできる。   The cassette station 2 is provided with a cassette mounting table 10 that can mount a plurality of cassettes C in a row in the X direction (vertical direction in FIG. 1). The cassette station 2 is provided with a substrate transfer body 12 that can move in the X direction on the transfer path 11. The substrate carrier 12 is also movable in the arrangement direction (Z direction; vertical direction) of the glass substrates G accommodated in the cassette C, and is selected with respect to the glass substrates G in each cassette C arranged in the X direction. Accessible.

基板搬送体12は,Z軸周りのθ方向に回転可能であり,後述する処理ステーション3側のエキシマUV照射ユニット20や冷却処理ユニット33に対してもアクセスできる。   The substrate transport body 12 is rotatable in the θ direction around the Z axis, and can also access an excimer UV irradiation unit 20 and a cooling processing unit 33 on the processing station 3 side described later.

処理ステーション3は,例えばY方向(図1の左右方向)に延びる2列の搬送ラインA,Bを備えている。この搬送ラインA,Bは,コロ搬送やアームによる搬送などにより,ガラス基板Gを水平方向に直線的に搬送できる。処理ステーション3の正面側(X方向負方向側(図1の下側))にある基板搬送路としての搬送ラインAには,カセットステーション2側からインターフェイスステーション5側に向けて順に,例えばガラス基板G上の有機物を除去するエキシマUV照射ユニット20,ガラス基板Gを洗浄するスクラバ洗浄ユニット21,ガラス基板Gを加熱処理する加熱処理ユニット22,ガラス基板Gを冷却処理する冷却処理ユニット23,ガラス基板Gにレジスト液を塗布する塗布処理部としてのレジスト塗布処理ユニット24,ガラス基板Gを減圧乾燥する乾燥処理部としての減圧乾燥ユニット25,26,加熱処理ユニット27,冷却処理ユニット28及び,基板Gを一時的に待機させるアウトステージ29が直線的に一列に配置されている。   The processing station 3 includes, for example, two rows of transfer lines A and B extending in the Y direction (left and right direction in FIG. 1). The transfer lines A and B can linearly transfer the glass substrate G in the horizontal direction by roller transfer or transfer by an arm. A transfer line A as a substrate transfer path on the front side of the processing station 3 (the negative side in the X direction (the lower side in FIG. 1)) is, for example, a glass substrate in order from the cassette station 2 side to the interface station 5 side. Excimer UV irradiation unit 20 that removes organic matter on G, scrubber cleaning unit 21 that cleans glass substrate G, heat treatment unit 22 that heat-treats glass substrate G, cooling processing unit 23 that cools glass substrate G, glass substrate Resist coating processing unit 24 as a coating processing unit for applying a resist solution to G, reduced pressure drying units 25 and 26 as drying processing units for drying glass substrate G under reduced pressure, heating processing unit 27, cooling processing unit 28, and substrate G Are arranged in a line in a straight line.

処理ステーション3の背面側(X方向正方向側(図1の上方側))の搬送ラインBには,インターフェイスステーション5側からカセットステーション2側に向けて順に,例えばガラス基板Gを現像処理する現像処理ユニット30,ガラス基板Gの脱色処理を行うi線UV照射ユニット31,加熱処理ユニット32及び冷却処理ユニット33が直線状に一列に配置されている。   In the transfer line B on the back side of the processing station 3 (positive side in the X direction (upper side in FIG. 1)), for example, development for developing the glass substrate G in order from the interface station 5 side to the cassette station 2 side. A processing unit 30, an i-line UV irradiation unit 31, a heating processing unit 32, and a cooling processing unit 33 that perform decoloring processing of the glass substrate G are arranged in a straight line.

搬送ラインAのアウトステージ29と搬送ラインBの現像処理ユニット32との間には,この間のガラス基板Gの搬送を行う搬送体40が設けられている。この搬送体40は,後述するインターフェイスステーション5のエクステンション・クーリングユニット60に対してもガラス基板Gを搬送できる。   Between the outstage 29 of the transport line A and the development processing unit 32 of the transport line B, a transport body 40 that transports the glass substrate G in the meantime is provided. The transport body 40 can transport the glass substrate G to an extension / cooling unit 60 of the interface station 5 described later.

インターフェイスステーション5には,例えば冷却機能を有しガラス基板Gの受け渡しを行うエクステンション・クーリングユニット60と,ガラス基板Gを一時的に収容するバッファカセット61と,外部装置ブロック62が設けられている。外部装置ブロック62には,ガラス基板Gに生産管理用のコードを露光するタイトラーと,ガラス基板Gの周辺部を露光する周辺露光装置が設けられている。インターフェイスステーション5には,上記エクステンション・クーリングユニット60,バッファカセット61,外部装置ブロック62及び露光装置4に対して,ガラス基板Gを搬送可能な基板搬送体63が設けられている。   The interface station 5 is provided with, for example, an extension / cooling unit 60 that has a cooling function and transfers the glass substrate G, a buffer cassette 61 that temporarily stores the glass substrate G, and an external device block 62. The external device block 62 is provided with a titler that exposes a production management code to the glass substrate G and a peripheral exposure device that exposes the peripheral portion of the glass substrate G. The interface station 5 is provided with a substrate transport body 63 capable of transporting the glass substrate G to the extension / cooling unit 60, the buffer cassette 61, the external device block 62 and the exposure device 4.

次に,本実施の形態にかかる塗布乾燥処理システムを構成するレジスト塗布処理ユニット24と減圧乾燥ユニット25,26の構成について説明する。   Next, the configuration of the resist coating processing unit 24 and the reduced pressure drying units 25 and 26 constituting the coating and drying processing system according to the present embodiment will be described.

例えばレジスト塗布処理ユニット24には,例えば図2及び図3に示すように搬送ラインAに沿ったY方向に長いステージ70が設けられている。ステージ70の上面には,図3に示すように多数のガス噴出口71が形成されている。ステージ70の幅方向(X方向)の両側には,Y方向に延びる一対の第1のガイドレール72が形成されている。第1のガイドレール72には,ガラス基板Gの幅方向の両端部を保持して第1のガイドレール72上を移動する2つの保持アーム73,74がそれぞれ設けられている。ガス噴出口71からガスを噴出することにより,ガラス基板Gを浮上させ,その浮上したガラス基板Gを保持アーム73又は74により保持して,ガラス基板Gを搬送ラインAに沿って移動させることができる。2つの保持アーム73,74により,ステージ70上で2枚のガラス基板Gを同時に搬送できる。   For example, the resist coating unit 24 is provided with a stage 70 that is long in the Y direction along the transfer line A as shown in FIGS. A large number of gas jets 71 are formed on the upper surface of the stage 70 as shown in FIG. A pair of first guide rails 72 extending in the Y direction are formed on both sides of the stage 70 in the width direction (X direction). The first guide rail 72 is provided with two holding arms 73 and 74 that move on the first guide rail 72 while holding both ends of the glass substrate G in the width direction. By ejecting gas from the gas ejection port 71, the glass substrate G is levitated, the levitated glass substrate G is held by the holding arm 73 or 74, and the glass substrate G is moved along the transfer line A. it can. The two glass arms G can be simultaneously conveyed on the stage 70 by the two holding arms 73 and 74.

レジスト塗布処理ユニット24のステージ70上には,ガラス基板Gにレジスト液を吐出するノズル80が設けられている。ノズル80は,例えば図3及び図4に示すようにX方向に向けて長い略直方体形状に形成されている。ノズル80は,例えばガラス基板GのX方向の幅よりも長く形成されている。ノズル80の下端部には,図4に示すようにスリット状の吐出口80aが形成されている。ノズル80の上部には,レジスト液供給源81に通じるレジスト液供給管82が接続されている。   On the stage 70 of the resist coating unit 24, a nozzle 80 for discharging a resist solution onto the glass substrate G is provided. For example, as shown in FIGS. 3 and 4, the nozzle 80 is formed in a substantially rectangular parallelepiped shape that is long in the X direction. The nozzle 80 is formed longer than the width of the glass substrate G in the X direction, for example. A slit-like discharge port 80a is formed at the lower end of the nozzle 80 as shown in FIG. A resist solution supply pipe 82 communicating with the resist solution supply source 81 is connected to the upper portion of the nozzle 80.

図3に示すようにノズル80の両側には,Y方向に延びる第2のガイドレール83が形成されている。ノズル80は,第2のガイドレール83上を移動するノズルアーム84によって保持されている。ノズル80は,ノズルアーム84の駆動機構により,第2のガイドレール83に沿ってY方向に移動できる。また,例えばノズルアーム84には,昇降機構が設けられており,ノズル80は,所定の高さに昇降できる。かかる構成により,ノズル80は,ガラス基板Gにレジスト液を吐出する吐出位置Eと,それよりY方向負方向側にある後述する回転ロール90及び待機部91との間を移動できる。   As shown in FIG. 3, second guide rails 83 extending in the Y direction are formed on both sides of the nozzle 80. The nozzle 80 is held by a nozzle arm 84 that moves on the second guide rail 83. The nozzle 80 can be moved in the Y direction along the second guide rail 83 by the drive mechanism of the nozzle arm 84. For example, the nozzle arm 84 is provided with a lifting mechanism, and the nozzle 80 can be lifted to a predetermined height. With such a configuration, the nozzle 80 can move between a discharge position E for discharging the resist solution onto the glass substrate G and a later-described rotary roll 90 and a standby portion 91 on the negative side in the Y direction.

図2及び図3に示すようにノズル80の吐出位置Eよりも上流側,つまりノズル80の吐出位置EのY方向負方向側には,ノズル80の試し出しが行われる回転ロール90が設けられている。回転ロール90は,回転軸をX方向に向けて,例えばノズル80よりも長く形成されている。回転ロール90は,例えばこの回転ロール90を洗浄するための洗浄タンク91内に収容されている。回転ロール90の最上部にノズル80の吐出口80aを近接させ,回転ロール90を回転させながら,吐出口80aから回転ロール90にレジスト液を吐出することにより,ノズル80の吐出口80aにおけるレジスト液の付着状態を整えて,レジスト液の吐出状態を安定させることができる。   As shown in FIG. 2 and FIG. 3, a rotary roll 90 for performing trial ejection of the nozzle 80 is provided on the upstream side of the discharge position E of the nozzle 80, that is, on the Y direction negative direction side of the discharge position E of the nozzle 80. ing. The rotary roll 90 is formed longer than, for example, the nozzle 80 with the rotation axis directed in the X direction. The rotating roll 90 is accommodated in a cleaning tank 91 for cleaning the rotating roll 90, for example. The resist solution is discharged from the discharge port 80a to the rotary roll 90 while the discharge port 80a of the nozzle 80 is brought close to the uppermost part of the rotary roll 90 and rotated. It is possible to stabilize the discharge state of the resist solution.

回転ロール90のさらに上流側には,ノズル80の待機部92が設けられている。この待機部92には,例えばノズル80を洗浄する機能やノズル80の乾燥を防止する機能が設けられている。   A standby portion 92 of the nozzle 80 is provided further upstream of the rotary roll 90. For example, the standby unit 92 has a function of cleaning the nozzle 80 and a function of preventing the nozzle 80 from drying.

以上のように構成されたレジスト塗布処理ユニット24より下流側の搬送ラインA,つまりレジスト塗布処理ユニット24からアウトステージ29までの搬送ラインAには,複数のロールRが直線的に並べられており,ガラス基板Gをコロ搬送できる。   A plurality of rolls R are linearly arranged on the transport line A downstream from the resist coating unit 24 configured as described above, that is, the transport line A from the resist coating unit 24 to the outstage 29. The glass substrate G can be rolled.

減圧乾燥ユニット25,26は,図5に示すようにそのコロ搬送の搬送ラインA上に上流側から下流側に向けて直列的に並べて設けられている。減圧乾燥ユニット25は,ロールR上のガラス基板Gを収容する減圧チャンバ100を備えている。減圧チャンバ100の搬送ラインAの上流側(Y方向負方向側)の側壁には,搬入口101が形成されている。搬入口101には,ゲートバルブ102が設けられている。減圧チャンバ100の下流側(Y方向正方向側)の側壁には,搬出口103が形成されており,その搬出口103には,ゲートバルブ104が設けられている。減圧チャンバ100の上壁には,真空ポンプなどの負圧発生装置105に連通する排気管106が接続されている。ゲートバルブ102,104を閉じて,排気管106から排気することにより,減圧チャンバ100内を減圧して,減圧チャンバ100内のガラス基板Gを乾燥させることができる。また,ゲートバルブ102,104を開放することによって,搬入口101から入って減圧チャンバ100内を通り搬出口103から出る搬送通路を形成できる。   As shown in FIG. 5, the vacuum drying units 25 and 26 are arranged in series on the roller conveyance line A from the upstream side to the downstream side. The reduced pressure drying unit 25 includes a reduced pressure chamber 100 that accommodates the glass substrate G on the roll R. A carry-in port 101 is formed on the side wall on the upstream side (negative direction side in the Y direction) of the transfer line A of the decompression chamber 100. A gate valve 102 is provided at the carry-in port 101. A carry-out port 103 is formed on the side wall on the downstream side (Y-direction positive direction side) of the decompression chamber 100, and a gate valve 104 is provided at the carry-out port 103. An exhaust pipe 106 that communicates with a negative pressure generator 105 such as a vacuum pump is connected to the upper wall of the decompression chamber 100. By closing the gate valves 102 and 104 and exhausting from the exhaust pipe 106, the inside of the decompression chamber 100 can be decompressed, and the glass substrate G in the decompression chamber 100 can be dried. Further, by opening the gate valves 102 and 104, a transfer passage that enters from the carry-in port 101 and passes through the decompression chamber 100 and exits from the carry-out port 103 can be formed.

減圧乾燥ユニット26は,減圧乾燥ユニット25と同様の構成を有している。減圧乾燥ユニット26は,減圧チャンバ110を備え,その減圧チャンバ110の上流側の側壁に,搬入口111とゲートバルブ112を備え,下流側の側壁に搬出口113とゲートバルブ114を備えている。減圧チャンバ110の上壁には,負圧発生装置115に通じる排気管116が接続されている。   The vacuum drying unit 26 has the same configuration as the vacuum drying unit 25. The decompression drying unit 26 includes a decompression chamber 110, and includes a carry-in port 111 and a gate valve 112 on the upstream side wall of the decompression chamber 110, and a carry-out port 113 and a gate valve 114 on the downstream side wall. An exhaust pipe 116 communicating with the negative pressure generator 115 is connected to the upper wall of the decompression chamber 110.

以上のように減圧乾燥ユニット25,26は,搬送ラインAのロールRに沿って設けられているので,ガラス基板Gを搬入し停止させて乾燥処理を行うことができ,また,ガラス基板Gを乾燥処理せずに下流側に通過させることもできる。   As described above, since the reduced-pressure drying units 25 and 26 are provided along the roll R of the transport line A, the glass substrate G can be loaded and stopped to perform the drying process. It can also be passed downstream without drying.

なお,搬送アーム73,74の駆動などのレジスト塗布処理ユニット24の動作,減圧乾燥ユニット25,26のゲートバルブや負圧発生装置などの動作及びロールRの動作などは,例えば図1に示す制御部120により制御されている。制御部120は,これらのレジスト塗布ユニット24や減圧乾燥ユニット25,26,ロールRなどの動作を制御して,ガラス基板Gに所定の塗布乾燥処理を施すことができる。   The operation of the resist coating processing unit 24 such as driving of the transfer arms 73 and 74, the operation of the gate valve and the negative pressure generator of the reduced pressure drying units 25 and 26, the operation of the roll R, etc. are controlled by the control shown in FIG. Controlled by the unit 120. The control unit 120 can control the operations of the resist coating unit 24, the reduced pressure drying units 25 and 26, the roll R, and the like to perform a predetermined coating and drying process on the glass substrate G.

次に,以上のように構成された塗布乾燥処理システムにおける塗布乾燥処理のプロセスを,塗布現像処理装置1で行われるフォトリソグラフィー工程のプロセスと共に説明する。   Next, the process of the coating / drying process in the coating / drying processing system configured as described above will be described together with the process of the photolithography process performed in the coating and developing treatment apparatus 1.

先ず,カセットステーション2のカセットC内の複数のガラス基板Gが,基板搬送体12によって,順に処理ステーション3のエキシマUV照射ユニット20に搬送される。ガラス基板Gは,搬送ラインAに沿って,エキシマUV照射ユニット20,スクラバ洗浄ユニット21,加熱処理ユニット22,冷却処理ユニット23,レジスト塗布処理ユニット24及び減圧乾燥ユニット25又は26,加熱処理ユニット27及び冷却処理ユニット28に順に搬送され,各処理ユニットにおいて所定の処理が施される。冷却処理の終了したガラス基板Gは,アウトステージ29に搬送される。その後,ガラス基板Gは,搬送体40によって,インターフェイスステーション5に搬送され,基板搬送体63によって露光装置4に搬送される。   First, a plurality of glass substrates G in the cassette C of the cassette station 2 are sequentially transferred to the excimer UV irradiation unit 20 of the processing station 3 by the substrate transfer body 12. The glass substrate G is disposed along the transport line A with an excimer UV irradiation unit 20, a scrubber cleaning unit 21, a heat treatment unit 22, a cooling treatment unit 23, a resist coating treatment unit 24, a reduced pressure drying unit 25 or 26, and a heat treatment unit 27. And it is conveyed to the cooling processing unit 28 in order, and predetermined processing is performed in each processing unit. The glass substrate G that has been cooled is transferred to the outstage 29. Thereafter, the glass substrate G is transported to the interface station 5 by the transport body 40 and is transported to the exposure apparatus 4 by the substrate transport body 63.

露光装置4において露光処理の終了したガラス基板Gは,基板搬送体63によってインターフェイスステーション5に戻され,搬送体40によって処理ステーション3の現像処理ユニット30に搬送される。ガラス基板Gは,搬送ラインBに沿って,現像処理ユニット30,i線UV照射ユニット31,加熱処理ユニット32及び冷却処理ユニット33に順に搬送され,各処理ユニットにおいて所定の処理が施される。冷却処理ユニット33において冷却処理の終了したガラス基板Gは,基板搬送体12によってカセットステーション2のカセットCに戻されて,一連のフォトリソグラフィー工程が終了する。   The glass substrate G that has been subjected to the exposure processing in the exposure apparatus 4 is returned to the interface station 5 by the substrate transport body 63 and transported to the development processing unit 30 of the processing station 3 by the transport body 40. The glass substrate G is transferred along the transfer line B to the development processing unit 30, the i-line UV irradiation unit 31, the heating processing unit 32, and the cooling processing unit 33 in order, and predetermined processing is performed in each processing unit. The glass substrate G that has been subjected to the cooling process in the cooling processing unit 33 is returned to the cassette C of the cassette station 2 by the substrate carrier 12, and a series of photolithography steps is completed.

次に,塗布乾燥処理のプロセスについて説明する。図6〜図9は,かかる塗布乾燥処理の各段階における塗布乾燥処理システムの状態を示す説明図である。   Next, the process of coating and drying will be described. 6-9 is explanatory drawing which shows the state of the coating-drying processing system in each step of this coating-drying process.

先ず,図6(a)に示すように例えば2枚のガラス基板G1,G2が前後に繋がった状態でレジスト塗布処理ユニット24のステージ70上で待機する。このとき,ガラス基板G1,G2は,それぞれ保持アーム73,74によって保持されている。この待機中に,ノズル80は,図2に示すように待機部92から回転ロール90上に移動する。回転ロール90が回転した状態で,ノズル80から回転ロール90にレジスト液が吐出されて,レジスト液の試し出しが行われる。その後,ノズル80が,所定の吐出位置Eに移動する。そして,図6(b)に示すように前のガラス基板G0が減圧乾燥ユニット25から搬出された後に,ステージ70上の2枚のガラス基板G1,G2が,保持アーム73,74によって同時に一体となってY方向正方向側に搬送される。このとき,ノズル80からレジスト液が吐出され,ノズル80の下方を連続して通過するガラス基板G1,G2にレジスト液が連続して塗布される。   First, as shown in FIG. 6A, for example, the apparatus waits on the stage 70 of the resist coating unit 24 in a state where two glass substrates G1 and G2 are connected in the front-rear direction. At this time, the glass substrates G1 and G2 are held by holding arms 73 and 74, respectively. During this standby, the nozzle 80 moves from the standby unit 92 onto the rotary roll 90 as shown in FIG. In a state where the rotating roll 90 is rotated, the resist solution is discharged from the nozzle 80 to the rotating roll 90, and the resist solution is tried out. Thereafter, the nozzle 80 moves to a predetermined discharge position E. Then, after the previous glass substrate G0 is carried out from the vacuum drying unit 25 as shown in FIG. 6B, the two glass substrates G1 and G2 on the stage 70 are integrated together by the holding arms 73 and 74 at the same time. It is conveyed to the Y direction positive direction side. At this time, the resist solution is discharged from the nozzle 80, and the resist solution is continuously applied to the glass substrates G1 and G2 that pass continuously under the nozzle 80.

前方のガラス基板G1がノズル80の下方を通過し,レジスト液の塗布が終了した時点で,図7(a)に示すようにガラス基板G1は,搬送ラインA上をロールRによって下流側に搬送され,減圧乾燥ユニット25を通過し減圧乾燥ユニット26に搬送される。ガラス基板G1は,図7(b)に示すように減圧チャンバ110の中央のロールR上で停止され,出入口のゲートバルブ112,114が閉じられる。その後,排気管116から減圧チャンバ110内の雰囲気が真空引きされ,減圧チャンバ110内が減圧されて,ガラス基板G1上のレジスト液の乾燥が開始される。   When the front glass substrate G1 passes under the nozzle 80 and the application of the resist solution is completed, the glass substrate G1 is conveyed downstream on the conveyance line A by the roll R as shown in FIG. Then, it passes through the vacuum drying unit 25 and is conveyed to the vacuum drying unit 26. As shown in FIG. 7B, the glass substrate G1 is stopped on the roll R at the center of the decompression chamber 110, and the gate valves 112 and 114 at the entrance and exit are closed. Thereafter, the atmosphere in the decompression chamber 110 is evacuated from the exhaust pipe 116, the interior of the decompression chamber 110 is decompressed, and the drying of the resist solution on the glass substrate G1 is started.

後方のガラス基板G2は,ガラス基板G1に続いてノズル80の下方を通過する。ノズル80は,レジスト液の吐出を停止することなく,ガラス基板G2にレジスト液を塗布する。ノズル80の下方を通過してレジスト液が塗布されたガラス基板G2は,図8(a)に示すように搬送ラインA上をロールRによって減圧乾燥ユニット25に搬送される。ガラス基板G2の塗布後,ノズル80の吐出は停止され,ノズル80は,一旦待機部92に戻される。   The rear glass substrate G2 passes below the nozzle 80 following the glass substrate G1. The nozzle 80 applies the resist solution to the glass substrate G2 without stopping the discharge of the resist solution. The glass substrate G2 coated with the resist solution through the lower side of the nozzle 80 is transported to the vacuum drying unit 25 by the roll R on the transport line A as shown in FIG. After the application of the glass substrate G2, the discharge of the nozzle 80 is stopped, and the nozzle 80 is once returned to the standby unit 92.

減圧乾燥ユニット25に搬送されたガラス基板G2は,図8(b)に示すように減圧チャンバ100の中央で停止され,出入口のゲートバルブ102,104が閉じられる。その後,排気管106から減圧チャンバ100内の雰囲気が真空引きされ,減圧チャンバ100内が減圧されて,ガラス基板G2上のレジスト液の乾燥が開始される。なお,ガラス基板G2が減圧乾燥ユニット25に搬送されると,保持アーム73によって次のガラス基板G3がステージ70上に搬入される。   The glass substrate G2 conveyed to the vacuum drying unit 25 is stopped at the center of the vacuum chamber 100 as shown in FIG. 8B, and the gate valves 102 and 104 at the entrance and exit are closed. Thereafter, the atmosphere in the decompression chamber 100 is evacuated from the exhaust pipe 106, the interior of the decompression chamber 100 is decompressed, and the drying of the resist solution on the glass substrate G2 is started. When the glass substrate G2 is transferred to the reduced pressure drying unit 25, the next glass substrate G3 is transferred onto the stage 70 by the holding arm 73.

減圧乾燥ユニット26における所定時間の乾燥処理が終了すると,図9(a)に示すようにゲートバルブ112,114が開放され,ガラス基板G1が搬送ラインA上のロールRにより下流側の加熱処理ユニット27に搬送される。例えばこの時までに,次の2枚のガラス基板G3,G4が上述のガラス基板G1,G2と同様に前後に繋がった状態でステージ70上に待機する。また,ノズル80は,待機部92から回転ロール90上に移動し,試し出しを終えて,吐出位置に戻される。   When the drying process for a predetermined time in the reduced pressure drying unit 26 is completed, the gate valves 112 and 114 are opened as shown in FIG. 9A, and the glass substrate G1 is heated on the downstream side by the roll R on the transport line A. 27 is conveyed. For example, by this time, the next two glass substrates G3 and G4 are in a standby state on the stage 70 in a state where they are connected to each other in the same manner as the glass substrates G1 and G2. In addition, the nozzle 80 moves from the standby unit 92 onto the rotary roll 90, finishes trial ejection, and returns to the discharge position.

その後,減圧乾燥ユニット25において乾燥処理が終了すると,図9(b)に示すようにゲートバルブ102,104が開放され,ガラス基板G2が搬送ラインA上のロールRによって,減圧乾燥ユニット26を通過し,加熱処理ユニット27に搬送される。ガラス基板G2が減圧乾燥ユニット25から搬出されると,上述のガラス基板G1,G2と同様に次のガラス基板G3,G4がY方向正方向側に移動し,レジスト液が塗布される。このように,2枚のガラス基板Gの塗布乾燥処理が連続的に繰り返され,所定枚数のガラス基板Gが処理される。なお,この一連の塗布乾燥処理は,制御部120の制御により実現されている。   Thereafter, when the drying process is completed in the vacuum drying unit 25, the gate valves 102 and 104 are opened as shown in FIG. 9B, and the glass substrate G2 passes through the vacuum drying unit 26 by the roll R on the transport line A. Then, it is conveyed to the heat treatment unit 27. When the glass substrate G2 is unloaded from the reduced-pressure drying unit 25, the next glass substrates G3 and G4 move to the Y direction positive side in the same manner as the glass substrates G1 and G2, and the resist solution is applied. Thus, the coating and drying process of the two glass substrates G is continuously repeated, and a predetermined number of glass substrates G are processed. This series of coating and drying processes is realized by the control of the control unit 120.

以上の実施の形態によれば,2つの減圧乾燥ユニット25,26を搬送ラインA上に直列的に設けて,時にはガラス基板Gを乾燥処理せずに通過させ,時にはガラス基板Gを乾燥処理できるようにしたので,連続的に塗布処理された2枚のガラス基板G1,G2を,直列配置された各減圧乾燥ユニット26,25に搬送して同時期に乾燥させることができる。このため,乾燥処理時間が塗布処理時間よりも長くても,基板を短いタクトで処理でき,スループットを向上できる。また,従来のように垂直搬送ユニットを用いる必要がないので,装置のフットプリントが増大することがなく,また垂直搬送ユニットの搬送制御のためのコストもかからない。   According to the above embodiment, the two vacuum drying units 25 and 26 are provided in series on the transfer line A, and sometimes the glass substrate G is allowed to pass without being dried, and sometimes the glass substrate G can be dried. Since it did in this way, the two glass substrates G1 and G2 by which the coating process was carried out continuously can be conveyed to each decompression drying unit 26 and 25 arranged in series, and can be dried at the same time. For this reason, even if the drying processing time is longer than the coating processing time, the substrate can be processed with a short tact, and the throughput can be improved. Further, since it is not necessary to use a vertical transport unit as in the prior art, the footprint of the apparatus does not increase, and the cost for transport control of the vertical transport unit does not increase.

減圧乾燥ユニットと同じ数の2枚のガラス基板Gを,レジスト塗布処理ユニット24において連続して塗布処理したので,塗布処理終了後直ちに各ガラス基板Gをそれぞれの減圧乾燥ユニットに搬送できる。これにより,塗布処理から乾燥処理までの時間が短縮され,その間の例えば外乱の影響によりレジスト液の塗布状態が変動することが抑制される。   Since the two glass substrates G having the same number as the vacuum drying unit are continuously coated in the resist coating processing unit 24, each glass substrate G can be transported to the respective vacuum drying units immediately after the coating processing is completed. As a result, the time from the coating process to the drying process is shortened, and fluctuations in the coating state of the resist solution due to, for example, the influence of disturbance during that time are suppressed.

また,連続塗布されたガラス基板G1,G2を,空いている下流側の減圧乾燥ユニットから順に入れるようにしたので,総てのガラス基板を減圧乾燥ユニットに収容できる。   In addition, since the continuously applied glass substrates G1 and G2 are put in order from the vacant downstream vacuum drying unit, all the glass substrates can be accommodated in the vacuum drying unit.

以上の実施の形態では,塗布処理の終了したガラス基板G1,G2が順に減圧乾燥ユニット26,25に搬送され,各ガラス基板G1,G2は,減圧乾燥ユニットに搬入されると直ちに乾燥処理が開始されている。このような場合,ガラス基板G1の方がガラス基板G2よりも,減圧乾燥ユニットが遠くにある分,レジスト液が塗布されてから乾燥処理が開始されるまでに時間を要する。このようにレジスト液が塗布されてから乾燥処理が開始されるまでの時間が異なると,例えば乾燥するまでのレジスト液の流動状態や熱履歴が異なるため,最終的に形成されるレジスト膜の膜厚などが基板相互間でばらつくことが考えられる。そこで,このレジスト液が塗布されてから乾燥処理が開始されるまでの所要時間Tが基板相互間で一定になるように制御してもよい。この場合,例えばガラス基板G2が減圧乾燥ユニット25に搬入された後,所定時間待ってから減圧が開始される。例えばガラス基板G1の前記所要時間Tがガラス基板G2より5秒長い場合には,5秒間待ってからガラス基板G2の乾燥処理が開始される。こうすることによって,レジスト液が塗布されてから乾燥処理が開始されるまでの時間が一定になり,各ガラス基板Gに同様のレジスト膜が形成される。   In the above embodiment, the glass substrates G1 and G2 that have been subjected to the coating process are sequentially transferred to the vacuum drying units 26 and 25, and the glass substrate G1 and G2 starts drying immediately after being loaded into the vacuum drying unit. Has been. In such a case, the glass substrate G1 requires a longer time from the application of the resist solution to the start of the drying process because the reduced-pressure drying unit is farther away than the glass substrate G2. If the time from the application of the resist solution to the start of the drying process is different, for example, the flow state and thermal history of the resist solution until the drying process are different. It is conceivable that the thickness varies between the substrates. Therefore, the required time T from the application of the resist solution to the start of the drying process may be controlled to be constant between the substrates. In this case, for example, after the glass substrate G2 is carried into the vacuum drying unit 25, the vacuum is started after waiting for a predetermined time. For example, when the required time T of the glass substrate G1 is longer by 5 seconds than the glass substrate G2, the drying process of the glass substrate G2 is started after waiting for 5 seconds. By doing so, the time from the application of the resist solution to the start of the drying process becomes constant, and a similar resist film is formed on each glass substrate G.

以上,添付図面を参照しながら本発明の好適な実施の形態について説明したが,本発明はかかる例に限定されない。当業者であれば,特許請求の範囲に記載された思想の範疇内において,各種の変更例または修正例に相到し得ることは明らかであり,それらについても当然に本発明の技術的範囲に属するものと了解される。   The preferred embodiment of the present invention has been described above with reference to the accompanying drawings, but the present invention is not limited to such an example. It will be apparent to those skilled in the art that various changes and modifications can be made within the scope of the spirit described in the claims, and these are naturally within the technical scope of the present invention. It is understood that it belongs.

例えば以上の実施の形態では,搬送ラインAに2つの減圧乾燥ユニット25,26を直列的に配置していたが,3つ以上の減圧乾燥ユニットを直列的に配置してもよい。この場合,減圧乾燥ユニットの数に応じて,ノズル80による吐出により連続的に塗布されるガラス基板Gの数を設定してもよい。このガラス基板Gの数は,減圧乾燥ユニットの数と同じかそれより少なく設定される。   For example, in the above embodiment, the two vacuum drying units 25 and 26 are arranged in series on the transport line A, but three or more vacuum drying units may be arranged in series. In this case, the number of glass substrates G to be continuously applied by ejection from the nozzle 80 may be set according to the number of vacuum drying units. The number of glass substrates G is set equal to or less than the number of vacuum drying units.

また,レジスト塗布処理ユニット24において,ガラス基板Gは,保持アーム73,74により搬送されていたが,コロ搬送であってもよい。また,減圧乾燥ユニット25,26において,ガラス基板Gは,コロ搬送されていたが,搬送ラインAに沿って移動する搬送アームによって搬送されてもよい。また,ガラス基板Gがノズル80の下方を通過することによってガラス基板Gにレジスト液が塗布されていたが,ノズル80がガラス基板G上を移動することによってガラス基板Gにレジスト液が塗布されてもよい。   In the resist coating unit 24, the glass substrate G is transported by the holding arms 73 and 74, but it may be roller transported. Further, in the vacuum drying units 25 and 26, the glass substrate G is roller-transferred, but may be transferred by a transfer arm that moves along the transfer line A. Further, the resist solution is applied to the glass substrate G when the glass substrate G passes below the nozzle 80, but the resist solution is applied to the glass substrate G when the nozzle 80 moves on the glass substrate G. Also good.

以上の実施の形態では,減圧乾燥ユニットにおいて,減圧によりガラス基板Gを乾燥させていたが,加熱により乾燥させてもよい。上記実施の形態では,レジスト液の塗布乾燥処理であったが,他の塗布液の塗布乾燥処理にも本発明は適用できる。また,本発明は,ガラス基板G以外の他のFPD(フラットパネルディスプレイ)やフォトマスク用のマスクレチクル,半導体ウェハなどの他の基板に塗布液を塗布し乾燥する場合にも適用できる。   In the above embodiment, the glass substrate G is dried by reduced pressure in the reduced pressure drying unit, but may be dried by heating. In the embodiment described above, the resist solution is applied and dried. However, the present invention can also be applied to other application solutions. The present invention can also be applied to the case where the coating liquid is applied to and dried on other substrates such as an FPD (flat panel display) other than the glass substrate G, a mask reticle for a photomask, and a semiconductor wafer.

本発明は,基板に塗布液を塗布し乾燥させる処理のスループットを向上する際に有用である。   The present invention is useful for improving the throughput of a process of applying a coating liquid to a substrate and drying it.

本実施の形態における塗布現像処理装置の構成の概略を示す平面図である。It is a top view which shows the outline of a structure of the coating-and-development processing apparatus in this Embodiment. レジスト塗布処理ユニットの構成の概略を示す縦断面の説明図である。It is explanatory drawing of the longitudinal cross-section which shows the outline of a structure of a resist application | coating process unit. レジスト塗布処理ユニットの構成の概略を示す平面図である。It is a top view which shows the outline of a structure of a resist application | coating process unit. ノズルの説明図である。It is explanatory drawing of a nozzle. 減圧乾燥ユニットの構成の概略を示す縦断面の説明図である。It is explanatory drawing of the longitudinal cross-section which shows the outline of a structure of a reduced pressure drying unit. (a)は,2枚のガラス基板をレジスト塗布処理ユニットに待機させた状態の塗布乾燥処理システムを示す説明図である。(b)は,ガラス基板の塗布処理を開始した状態の塗布乾燥処理システムを示す説明図である。(A) is explanatory drawing which shows the coating-drying processing system of the state which made the resist coating processing unit wait for two glass substrates. (B) is explanatory drawing which shows the application | coating drying processing system of the state which started the coating process of the glass substrate. (a)は,塗布処理の終了した前方のガラス基板を減圧乾燥ユニットに搬送している状態の塗布乾燥処理システムを示す説明図である。(b)は,前方のガラス基板を減圧乾燥ユニットにおいて減圧乾燥させ,後方のガラス基板を塗布処理している状態の塗布乾燥処理システムを示す説明図である。(A) is explanatory drawing which shows the coating-drying processing system of the state which is conveying the front glass substrate which the coating process completed to the pressure reduction drying unit. (B) is an explanatory view showing a coating and drying treatment system in a state where a front glass substrate is dried under reduced pressure in a reduced pressure drying unit and a rear glass substrate is coated. (a)は,塗布処理の終了した後方のガラス基板を減圧乾燥ユニットに搬送している状態の塗布乾燥処理システムを示す説明図である。(b)は,2枚のガラス基板を減圧乾燥ユニットにおいて乾燥している状態の塗布乾燥処理システムを示す説明図である。(A) is explanatory drawing which shows the coating-drying processing system of the state which is conveying the back glass substrate after the coating process to the pressure reduction drying unit. (B) is explanatory drawing which shows the application | coating drying processing system of the state which dries the glass substrate of 2 sheets in a reduced pressure drying unit. (a)は,乾燥処理の終了した前方のガラス基板を減圧乾燥ユニットから搬出している状態の塗布乾燥処理システムを示す説明図である。(b)は,乾燥処理の終了した後方のガラス基板を減圧乾燥ユニットから搬出し,次の2枚のガラス基板の塗布処理を開始した状態の塗布乾燥処理システムを示す説明図である。(A) is explanatory drawing which shows the coating-drying processing system of the state which is carrying out the front glass substrate which the drying process complete | finished from the pressure reduction drying unit. (B) is explanatory drawing which shows the application | coating drying processing system of the state which carried out the application | coating process of the next two glass substrates after carrying out the back glass substrate which the drying process complete | finished from the reduced pressure drying unit.

符号の説明Explanation of symbols

1 塗布現像処理装置
24 レジスト塗布処理ユニット
25,26 減圧乾燥ユニット
80 ノズル
A 搬送ライン
R ロール
G,G1,G2 ガラス基板
DESCRIPTION OF SYMBOLS 1 Coating / development processing apparatus 24 Resist coating processing unit 25,26 Decompression drying unit 80 Nozzle A Conveyance line R Roll G, G1, G2

Claims (9)

基板に塗布液を塗布し,その基板を乾燥する塗布乾燥処理システムであって,
基板を水平方向に搬送する基板搬送路を備え,
前記基板搬送路上には,基板に塗布液を塗布する塗布処理部と,基板を乾燥させる複数の乾燥処理部が上流側から下流側に向けて直列的に設けられ,
前記各乾燥処理部は,基板の乾燥処理を行わずに基板を基板搬送路の下流側に通過させる機能と,基板を停止させ基板の乾燥処理を行う機能を有することを特徴とする,塗布現像処理システム。
A coating / drying processing system for applying a coating solution to a substrate and drying the substrate,
A board transfer path is provided to transfer the board in the horizontal direction.
On the substrate transport path, a coating processing unit that applies the coating liquid to the substrate and a plurality of drying processing units that dry the substrate are provided in series from the upstream side to the downstream side,
Each of the drying processing units has a function of passing the substrate downstream of the substrate transport path without performing the drying process of the substrate, and a function of stopping the substrate and performing the drying process of the substrate. Processing system.
前記基板搬送路上の塗布処理部には,通過する基板に塗布液を吐出するノズルが設けられていることを特徴とする,請求項1に記載の塗布乾燥処理システム。 The coating / drying processing system according to claim 1, wherein the coating processing unit on the substrate transport path is provided with a nozzle for discharging a coating liquid onto a substrate that passes therethrough. 前記塗布処理部では,前記乾燥処理部の数以下の複数の基板を連続的に搬送し,前記ノズルによる吐出により前記複数の基板に連続的に塗布液を塗布できることを特徴とする,請求項2に記載の塗布乾燥処理システム。 3. The coating processing unit can continuously transport a plurality of substrates equal to or less than the number of the drying processing units, and can continuously apply a coating solution to the plurality of substrates by discharging with the nozzle. The coating and drying treatment system described in 1. 前記連続的に塗布液が塗布される複数の基板が,塗布の終了した基板から順に,空の乾燥処理部のうちの最も下流側にある乾燥処理部に搬送されることを特徴とする,請求項3に記載の塗布乾燥処理システム。 The plurality of substrates to which the coating liquid is continuously applied are sequentially transported from a substrate on which coating has been completed to a drying processing unit on the most downstream side of empty drying processing units. Item 4. The coating and drying treatment system according to Item 3. 前記塗布処理部において基板に塗布液が塗布されてから前記乾燥処理部において基板の乾燥が開始されるまでの時間が,基板相互間において一定に制御されていることを特徴とする,請求項1〜4のいずれかに記載の塗布乾燥処理システム。 The time from when the coating liquid is applied to the substrate in the coating processing unit until the drying of the substrate is started in the drying processing unit is controlled to be constant between the substrates. The coating-drying processing system in any one of -4. 基板に塗布液を塗布し,その後基板を乾燥する塗布乾燥処理方法であって,
基板を水平方向に搬送する基板搬送路上に,基板に塗布液を塗布する塗布処理部と,基板を乾燥させる複数の乾燥処理部が上流側から下流側に向けて直列的に設けられ,
前記各乾燥処理部では,基板の乾燥処理を行わずに基板を基板搬送路の下流側に通過させたり,基板を停止させて基板の乾燥処理を行うことを特徴とする,塗布乾燥処理方法。
A coating / drying method of applying a coating solution to a substrate and then drying the substrate,
On the substrate transport path for transporting the substrate in the horizontal direction, a coating processing unit that applies the coating liquid to the substrate and a plurality of drying processing units that dry the substrate are provided in series from the upstream side to the downstream side.
In each of the drying processing sections, the substrate drying process is performed without passing the substrate drying process, or the substrate drying process is performed by stopping the substrate.
前記塗布処理部において,通過する基板にノズルから塗布液を吐出することによって,基板に塗布液を塗布することを特徴とする,請求項6に記載の塗布乾燥処理方法。 The coating / drying processing method according to claim 6, wherein in the coating processing unit, the coating liquid is applied to the substrate by discharging the coating liquid from the nozzle to the substrate passing therethrough. 前記塗布処理部において,前記乾燥処理部の数以下の複数の基板を連続的に搬送し,前記ノズルによる吐出により前記複数の基板に連続的に塗布液を塗布し,その連続的に塗布液が塗布される複数の基板を,塗布の終了した基板から順に,空の乾燥処理部のうちの最も下流側にある乾燥処理部に搬送し,前記複数の基板をそれぞれ別の乾燥処理部において乾燥することを特徴とする,請求項7に記載の塗布乾燥処理方法。 In the coating processing unit, a plurality of substrates equal to or less than the number of the drying processing units are continuously transported, and the coating liquid is continuously applied to the plurality of substrates by ejection by the nozzles. A plurality of substrates to be coated are transported to the drying processing unit located on the most downstream side of the empty drying processing units in order from the substrate on which coating has been completed, and the plurality of substrates are dried in separate drying processing units, respectively. The coating and drying treatment method according to claim 7, wherein: 前記塗布処理部において基板に塗布液が塗布されてから前記乾燥処理部において基板の乾燥が開始されるまでの時間を,基板相互間において一定にすることを特徴とする,請求項6〜8のいずれかに記載の塗布乾燥処理方法。 The time from when the coating solution is applied to the substrate in the coating processing unit until the drying of the substrate is started in the drying processing unit is made constant between the substrates. The coating and drying treatment method according to any one of the above.
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KR101021839B1 (en) * 2008-11-26 2011-03-17 세메스 주식회사 Apparatus for drying a photoresist layer on a substrate
JP2011103422A (en) * 2009-11-12 2011-05-26 Tokyo Electron Ltd Substrate processing apparatus
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