JP2008157971A - サンプリングタイミング信号発生器 - Google Patents

サンプリングタイミング信号発生器 Download PDF

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Publication number
JP2008157971A
JP2008157971A JP2008075855A JP2008075855A JP2008157971A JP 2008157971 A JP2008157971 A JP 2008157971A JP 2008075855 A JP2008075855 A JP 2008075855A JP 2008075855 A JP2008075855 A JP 2008075855A JP 2008157971 A JP2008157971 A JP 2008157971A
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JP
Japan
Prior art keywords
signal
circuit
chip
voltage
signal waveform
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Ceased
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JP2008075855A
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English (en)
Japanese (ja)
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JP2008157971A5 (OSRAM
Inventor
Makoto Nagata
真 永田
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Semiconductor Technology Academic Research Center
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Semiconductor Technology Academic Research Center
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Application filed by Semiconductor Technology Academic Research Center filed Critical Semiconductor Technology Academic Research Center
Priority to JP2008075855A priority Critical patent/JP2008157971A/ja
Publication of JP2008157971A publication Critical patent/JP2008157971A/ja
Publication of JP2008157971A5 publication Critical patent/JP2008157971A5/ja
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2008075855A 2005-03-03 2008-03-24 サンプリングタイミング信号発生器 Ceased JP2008157971A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008075855A JP2008157971A (ja) 2005-03-03 2008-03-24 サンプリングタイミング信号発生器

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005059282 2005-03-03
JP2008075855A JP2008157971A (ja) 2005-03-03 2008-03-24 サンプリングタイミング信号発生器

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2006056374A Division JP4150402B2 (ja) 2005-03-03 2006-03-02 信号波形測定装置及び信号波形測定システム

Publications (2)

Publication Number Publication Date
JP2008157971A true JP2008157971A (ja) 2008-07-10
JP2008157971A5 JP2008157971A5 (OSRAM) 2009-07-02

Family

ID=36943640

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008075855A Ceased JP2008157971A (ja) 2005-03-03 2008-03-24 サンプリングタイミング信号発生器

Country Status (2)

Country Link
US (2) US7332916B2 (OSRAM)
JP (1) JP2008157971A (OSRAM)

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US7936153B2 (en) * 2007-02-06 2011-05-03 International Business Machines Corporation On-chip adaptive voltage compensation
US7865750B2 (en) 2007-02-06 2011-01-04 International Business Machines Corporation Fan speed control from adaptive voltage supply
US8615767B2 (en) 2007-02-06 2013-12-24 International Business Machines Corporation Using IR drop data for instruction thread direction
US7895454B2 (en) 2007-02-06 2011-02-22 International Business Machines Corporation Instruction dependent dynamic voltage compensation
US7714635B2 (en) * 2007-02-06 2010-05-11 International Business Machines Corporation Digital adaptive voltage supply
US7560945B2 (en) 2007-02-06 2009-07-14 International Business Machines Corporation Integrated circuit failure prediction
US7573307B2 (en) * 2007-08-01 2009-08-11 Texas Instruments Incorporated Systems and methods for reduced area delay locked loop
US8005880B2 (en) * 2007-08-24 2011-08-23 International Business Machines Corporation Half width counting leading zero circuit
US7797131B2 (en) * 2007-08-24 2010-09-14 International Business Machines Corporation On-chip frequency response measurement
US8185572B2 (en) * 2007-08-24 2012-05-22 International Business Machines Corporation Data correction circuit
US7495479B1 (en) * 2007-09-13 2009-02-24 Faraday Technology Corp. Sample and hold circuit and related data signal detecting method utilizing sample and hold circuit
JP4773549B2 (ja) 2009-07-01 2011-09-14 株式会社半導体理工学研究センター タイミング信号発生回路
US8365024B2 (en) * 2010-02-26 2013-01-29 Honeywell International Inc. High integrity data bus fault detection using multiple signal components
US8054208B2 (en) 2010-03-30 2011-11-08 Honeywell International Inc. Re-configurable multipurpose analog interface
US8782299B2 (en) 2010-04-27 2014-07-15 Honeywell International Inc. Re-configurable multi-purpose digital interface
US8390324B2 (en) 2010-09-20 2013-03-05 Honeywell International Inc. Universal functionality module
JP5743063B2 (ja) 2011-02-09 2015-07-01 ラピスセミコンダクタ株式会社 半導体集積回路、半導体チップ、及び半導体集積回路の設計手法
US8614571B2 (en) 2011-11-18 2013-12-24 Taiwan Semiconductor Manufacturing Co., Ltd. Apparatus and method for on-chip sampling of dynamic IR voltage drop
US8953364B2 (en) 2012-09-18 2015-02-10 Micron Technology, Inc. Voltage rail noise sensing circuit and method
US9316734B2 (en) * 2012-10-19 2016-04-19 The Curators Of The University Of Missouri Free-hand scanning and imaging
CN102928774B (zh) * 2012-11-15 2014-12-10 福建一丁芯光通信科技有限公司 用于混合信号集成电路的可测性电路
WO2014108742A1 (en) 2013-01-09 2014-07-17 Freescale Semiconductor, Inc. Method and apparatus for sampling a signal
US8981982B2 (en) * 2013-04-05 2015-03-17 Maxlinear, Inc. Multi-zone data converters
US8928506B2 (en) 2013-04-09 2015-01-06 Maxlinear, Inc. Successive approximation analog-to-digital converter (ADC) with dynamic search algorithm
US9083376B2 (en) 2013-04-25 2015-07-14 Maxlinear, Inc. Successive approximation register analog-to-digital converter
US9599645B2 (en) * 2013-05-28 2017-03-21 Oracle International Corporation High speed clock cycle rate digital voltage monitor with triggered tracing for integrated circuits
KR101478920B1 (ko) * 2013-08-22 2015-01-02 인제대학교 산학협력단 탐침을 구비한 다기능 측정 및 파형발생 장치
US10135394B2 (en) * 2014-11-24 2018-11-20 Imec Vzw Low voltage supply amplifier and amplification method
US10161967B2 (en) * 2016-01-09 2018-12-25 Taiwan Semiconductor Manufacturing Co., Ltd. On-chip oscilloscope
US10305541B2 (en) * 2016-09-09 2019-05-28 Marvell World Trade Ltd. Reduction of far-end crosstalk in high-speed single-ended receivers
US10312892B2 (en) 2017-01-31 2019-06-04 International Business Machines Corporation On-chip waveform measurement
CN107255748A (zh) * 2017-06-16 2017-10-17 江苏理工学院 一种数字信号测量与发生仪
CN108061850A (zh) * 2017-12-19 2018-05-22 许昌学院 一种片上信号监测系统
CN111752794B (zh) * 2020-06-04 2022-08-12 Oppo广东移动通信有限公司 供电信息的采集方法、系统以及芯片
US10979059B1 (en) * 2020-10-26 2021-04-13 Ciena Corporation Successive approximation register analog to digital converter based phase-locked loop with programmable range
CN113467565B (zh) * 2021-07-08 2025-05-30 海宁奕斯伟计算技术有限公司 驱动系统、驱动方法、计算机系统和可读介质
CN118068063B (zh) * 2024-04-22 2024-06-21 普源精电科技股份有限公司 示波器

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Also Published As

Publication number Publication date
US20060197697A1 (en) 2006-09-07
US20070262799A1 (en) 2007-11-15
US7609100B2 (en) 2009-10-27
US7332916B2 (en) 2008-02-19

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