JP2008153402A5 - - Google Patents
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- Publication number
- JP2008153402A5 JP2008153402A5 JP2006339204A JP2006339204A JP2008153402A5 JP 2008153402 A5 JP2008153402 A5 JP 2008153402A5 JP 2006339204 A JP2006339204 A JP 2006339204A JP 2006339204 A JP2006339204 A JP 2006339204A JP 2008153402 A5 JP2008153402 A5 JP 2008153402A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- shutter
- exposure apparatus
- information
- control unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims 16
- 230000001276 controlling effect Effects 0.000 claims 2
- 230000002596 correlated effect Effects 0.000 claims 2
- 238000004519 manufacturing process Methods 0.000 claims 2
- 239000003795 chemical substances by application Substances 0.000 claims 1
- 238000002310 reflectometry Methods 0.000 claims 1
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006339204A JP5025250B2 (ja) | 2006-12-15 | 2006-12-15 | 露光装置及びデバイス製造方法 |
| TW096145155A TWI388938B (zh) | 2006-12-15 | 2007-11-28 | 曝光設備及裝置製造方法 |
| KR1020070130571A KR100972879B1 (ko) | 2006-12-15 | 2007-12-14 | 노광장치 및 디바이스 제조방법 |
| US11/956,597 US8223317B2 (en) | 2006-12-15 | 2007-12-14 | Exposure apparatus and device manufacturing method controlling shutter based on intensity of reflected light |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006339204A JP5025250B2 (ja) | 2006-12-15 | 2006-12-15 | 露光装置及びデバイス製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008153402A JP2008153402A (ja) | 2008-07-03 |
| JP2008153402A5 true JP2008153402A5 (https=) | 2010-02-12 |
| JP5025250B2 JP5025250B2 (ja) | 2012-09-12 |
Family
ID=39526727
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006339204A Expired - Fee Related JP5025250B2 (ja) | 2006-12-15 | 2006-12-15 | 露光装置及びデバイス製造方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8223317B2 (https=) |
| JP (1) | JP5025250B2 (https=) |
| KR (1) | KR100972879B1 (https=) |
| TW (1) | TWI388938B (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5100088B2 (ja) * | 2006-11-07 | 2012-12-19 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
| JP5173650B2 (ja) | 2008-07-29 | 2013-04-03 | キヤノン株式会社 | 露光装置およびデバイス製造方法 |
| KR101652887B1 (ko) | 2009-12-04 | 2016-09-02 | 삼성디스플레이 주식회사 | 기판의 노광방법, 이를 수행하기 위한 기판의 노광장치 및 이를 이용한 표시기판의 제조방법 |
| JP5221611B2 (ja) * | 2010-09-13 | 2013-06-26 | 株式会社東芝 | ドーズデータ生成装置、露光システム、ドーズデータ生成方法および半導体装置の製造方法 |
| WO2013023876A1 (en) | 2011-08-18 | 2013-02-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101633761B1 (ko) | 2012-01-17 | 2016-06-27 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치 및 디바이스 제조 방법 |
| JP6929142B2 (ja) * | 2017-06-19 | 2021-09-01 | キヤノン株式会社 | 露光装置、および物品の製造方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5771132A (en) | 1980-10-21 | 1982-05-01 | Canon Inc | Exposure controlling system |
| JPH0782981B2 (ja) * | 1986-02-07 | 1995-09-06 | 株式会社ニコン | 投影露光方法及び装置 |
| JPH0513292A (ja) * | 1991-07-02 | 1993-01-22 | Nikon Corp | 露光装置 |
| JPH0864510A (ja) * | 1994-08-19 | 1996-03-08 | Oki Electric Ind Co Ltd | 露光量制御方法及びその装置 |
| JPH08236429A (ja) * | 1995-02-23 | 1996-09-13 | Nikon Corp | 投影露光装置 |
| JPH08250398A (ja) * | 1995-03-14 | 1996-09-27 | Nikon Corp | 投影露光装置 |
| JPH0945604A (ja) * | 1995-07-28 | 1997-02-14 | Nec Corp | 露光方法及び露光装置 |
| JPH09213619A (ja) * | 1996-01-31 | 1997-08-15 | Nikon Corp | 露光方法及び露光装置 |
| JPH10294262A (ja) * | 1997-04-18 | 1998-11-04 | Nikon Corp | 投影露光装置 |
| KR20000050395A (ko) * | 1999-01-08 | 2000-08-05 | 윤종용 | 반사광 검출기를 포함하는 노광장치 및 이를 이용한 노광방법 |
| JP2001144004A (ja) * | 1999-11-16 | 2001-05-25 | Nikon Corp | 露光方法、露光装置、及びデバイス製造方法 |
| JP2001203137A (ja) * | 2000-01-19 | 2001-07-27 | Mitsubishi Electric Corp | レジストパターン形成方法およびそれを使用して製造される半導体装置 |
| JP3807933B2 (ja) * | 2000-12-14 | 2006-08-09 | 株式会社ルネサステクノロジ | 投影露光装置及び投影露光方法 |
| JP4622568B2 (ja) * | 2005-02-14 | 2011-02-02 | 株式会社ニコン | 露光方法、露光装置、反射板、反射率計測センサの校正方法及びマイクロデバイスの製造方法 |
-
2006
- 2006-12-15 JP JP2006339204A patent/JP5025250B2/ja not_active Expired - Fee Related
-
2007
- 2007-11-28 TW TW096145155A patent/TWI388938B/zh not_active IP Right Cessation
- 2007-12-14 US US11/956,597 patent/US8223317B2/en not_active Expired - Fee Related
- 2007-12-14 KR KR1020070130571A patent/KR100972879B1/ko not_active Expired - Fee Related
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