JP2008089613A5 - - Google Patents
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- Publication number
- JP2008089613A5 JP2008089613A5 JP2007335609A JP2007335609A JP2008089613A5 JP 2008089613 A5 JP2008089613 A5 JP 2008089613A5 JP 2007335609 A JP2007335609 A JP 2007335609A JP 2007335609 A JP2007335609 A JP 2007335609A JP 2008089613 A5 JP2008089613 A5 JP 2008089613A5
- Authority
- JP
- Japan
- Prior art keywords
- sample
- chamber
- cartridge
- atmosphere
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010884 ion-beam technique Methods 0.000 claims 12
- 230000001678 irradiating effect Effects 0.000 claims 11
- 230000003287 optical effect Effects 0.000 claims 7
- 238000002360 preparation method Methods 0.000 claims 7
- 238000010894 electron beam technology Methods 0.000 claims 4
- 239000002245 particle Substances 0.000 claims 2
- 238000003860 storage Methods 0.000 claims 2
- 230000005540 biological transmission Effects 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007335609A JP4508239B2 (ja) | 2007-12-27 | 2007-12-27 | 試料作製装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007335609A JP4508239B2 (ja) | 2007-12-27 | 2007-12-27 | 試料作製装置 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005362596A Division JP4135013B2 (ja) | 2005-12-16 | 2005-12-16 | 試料作製装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008089613A JP2008089613A (ja) | 2008-04-17 |
| JP2008089613A5 true JP2008089613A5 (enExample) | 2008-11-13 |
| JP4508239B2 JP4508239B2 (ja) | 2010-07-21 |
Family
ID=39373888
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007335609A Expired - Lifetime JP4508239B2 (ja) | 2007-12-27 | 2007-12-27 | 試料作製装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4508239B2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113804909B (zh) * | 2020-06-12 | 2023-12-12 | 中国科学院苏州纳米技术与纳米仿生研究所 | 真空互联样品转移组件 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3553318B2 (ja) * | 1997-05-20 | 2004-08-11 | 日本電子株式会社 | ホルダ保持装置 |
| JP3633325B2 (ja) * | 1998-11-25 | 2005-03-30 | 株式会社日立製作所 | 試料作製装置および試料作製方法 |
| JP3851464B2 (ja) * | 1999-03-04 | 2006-11-29 | 株式会社日立製作所 | マニピュレータおよびそれを用いたプローブ装置、試料作製装置 |
-
2007
- 2007-12-27 JP JP2007335609A patent/JP4508239B2/ja not_active Expired - Lifetime
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