JP2007507897A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2007507897A5 JP2007507897A5 JP2006534012A JP2006534012A JP2007507897A5 JP 2007507897 A5 JP2007507897 A5 JP 2007507897A5 JP 2006534012 A JP2006534012 A JP 2006534012A JP 2006534012 A JP2006534012 A JP 2006534012A JP 2007507897 A5 JP2007507897 A5 JP 2007507897A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- annealing
- image
- radiation beam
- preheating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims 55
- 230000005855 radiation Effects 0.000 claims 38
- 238000000137 annealing Methods 0.000 claims 22
- 238000010438 heat treatment Methods 0.000 claims 15
- 238000000034 method Methods 0.000 claims 14
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 3
- 229910052710 silicon Inorganic materials 0.000 claims 3
- 239000010703 silicon Substances 0.000 claims 3
- 230000001678 irradiating effect Effects 0.000 claims 2
- 230000002745 absorbent Effects 0.000 claims 1
- 239000002250 absorbent Substances 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/674,106 US7148159B2 (en) | 2003-09-29 | 2003-09-29 | Laser thermal annealing of lightly doped silicon substrates |
| US10/674,106 | 2003-09-29 | ||
| PCT/US2004/031783 WO2005043696A2 (en) | 2003-09-29 | 2004-09-28 | Laser thermal annealing of lightly doped silicon substrates |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012143310A Division JP2012231158A (ja) | 2003-09-29 | 2012-06-26 | 低濃度ドープシリコン基板のレーザー熱アニール |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007507897A JP2007507897A (ja) | 2007-03-29 |
| JP2007507897A5 true JP2007507897A5 (enExample) | 2009-01-29 |
| JP5517396B2 JP5517396B2 (ja) | 2014-06-11 |
Family
ID=34376795
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006534012A Expired - Fee Related JP5517396B2 (ja) | 2003-09-29 | 2004-09-28 | 低濃度ドープシリコン基板のレーザー熱アニール |
| JP2012143310A Pending JP2012231158A (ja) | 2003-09-29 | 2012-06-26 | 低濃度ドープシリコン基板のレーザー熱アニール |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012143310A Pending JP2012231158A (ja) | 2003-09-29 | 2012-06-26 | 低濃度ドープシリコン基板のレーザー熱アニール |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US7148159B2 (enExample) |
| JP (2) | JP5517396B2 (enExample) |
| TW (1) | TWI246119B (enExample) |
| WO (1) | WO2005043696A2 (enExample) |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004128421A (ja) * | 2002-10-07 | 2004-04-22 | Semiconductor Energy Lab Co Ltd | レーザ照射方法およびレーザ照射装置、並びに半導体装置の作製方法 |
| DE602004020538D1 (de) * | 2003-02-28 | 2009-05-28 | Semiconductor Energy Lab | Verfahren und Vorrichtung zur Laserbestrahlung, sowie Verfahren zur Herstellung von Halbleiter. |
| JP4373115B2 (ja) * | 2003-04-04 | 2009-11-25 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US7176405B2 (en) * | 2005-04-22 | 2007-02-13 | Ultratech, Inc. | Heat shield for thermal processing |
| US7767927B2 (en) * | 2005-05-16 | 2010-08-03 | Ultratech, Inc. | Methods and apparatus for remote temperature measurement of a specular surface |
| US7482254B2 (en) | 2005-09-26 | 2009-01-27 | Ultratech, Inc. | Apparatus and methods for thermally processing undoped and lightly doped substrates without pre-heating |
| FR2893873B1 (fr) * | 2005-11-25 | 2008-12-12 | Air Liquide | Procede de coupage avec un laser a fibre d'acier inoxydable |
| US20070221640A1 (en) | 2006-03-08 | 2007-09-27 | Dean Jennings | Apparatus for thermal processing structures formed on a substrate |
| DE102006018801A1 (de) * | 2006-04-22 | 2007-10-25 | Carl Zeiss Laser Optics Gmbh | Vorrichtung sowie Verfahren zum Erhitzen eines Substrats |
| US7514305B1 (en) * | 2006-06-28 | 2009-04-07 | Ultratech, Inc. | Apparatus and methods for improving the intensity profile of a beam image used to process a substrate |
| US7790636B2 (en) | 2006-06-29 | 2010-09-07 | International Business Machines Corporation | Simultaneous irradiation of a substrate by multiple radiation sources |
| US7635656B2 (en) | 2006-06-29 | 2009-12-22 | International Business Machines Corporation | Serial irradiation of a substrate by multiple radiation sources |
| US7619227B2 (en) * | 2007-02-23 | 2009-11-17 | Corning Incorporated | Method of reducing radiation-induced damage in fused silica and articles having such reduction |
| US7744274B1 (en) * | 2007-06-20 | 2010-06-29 | Ultratech, Inc. | Methods and apparatus for temperature measurement and control on a remote substrate surface |
| US7847213B1 (en) | 2007-09-11 | 2010-12-07 | Ultratech, Inc. | Method and apparatus for modifying an intensity profile of a coherent photonic beam |
| FR2921752B1 (fr) * | 2007-10-01 | 2009-11-13 | Aplinov | Procede de chauffage d'une plaque par un flux lumineux. |
| US8674257B2 (en) * | 2008-02-11 | 2014-03-18 | Applied Materials, Inc. | Automatic focus and emissivity measurements for a substrate system |
| US8071908B1 (en) | 2008-03-26 | 2011-12-06 | Ultratech, Inc. | Edge with minimal diffraction effects |
| US20090278287A1 (en) | 2008-05-12 | 2009-11-12 | Yun Wang | Substrate processing with reduced warpage and/or controlled strain |
| US20100068898A1 (en) * | 2008-09-17 | 2010-03-18 | Stephen Moffatt | Managing thermal budget in annealing of substrates |
| US8314369B2 (en) * | 2008-09-17 | 2012-11-20 | Applied Materials, Inc. | Managing thermal budget in annealing of substrates |
| US20100084744A1 (en) * | 2008-10-06 | 2010-04-08 | Zafiropoulo Arthur W | Thermal processing of substrates with pre- and post-spike temperature control |
| FR2938116B1 (fr) * | 2008-11-04 | 2011-03-11 | Aplinov | Procede et dispositif de chauffage d'une couche d'une plaque par amorcage et flux lumineux. |
| US20100304527A1 (en) * | 2009-03-03 | 2010-12-02 | Peter Borden | Methods of thermal processing a solar cell |
| JP2011003630A (ja) * | 2009-06-17 | 2011-01-06 | Sumitomo Heavy Ind Ltd | レーザ照射装置、及びレーザ照射方法 |
| US8014427B1 (en) | 2010-05-11 | 2011-09-06 | Ultratech, Inc. | Line imaging systems and methods for laser annealing |
| KR101009296B1 (ko) * | 2010-05-14 | 2011-01-18 | 김진숙 | 곡률반경을 조절 생산할 수 있는 엘리베이터 보정 체인의 제조방법 및 그 방법으로 제조된 엘리베이터 보정 체인 |
| JP5617421B2 (ja) * | 2010-08-06 | 2014-11-05 | Jfeスチール株式会社 | 電子ビーム照射装置 |
| US8026519B1 (en) | 2010-10-22 | 2011-09-27 | Ultratech, Inc. | Systems and methods for forming a time-averaged line image |
| US8652974B2 (en) * | 2011-06-22 | 2014-02-18 | Ipg Photonics Corporation | Method and system for pre-heating of semiconductor material for laser annealing and gas immersion laser doping |
| JP5537615B2 (ja) | 2011-08-10 | 2014-07-02 | ウルトラテック インク | 時間平均化ライン像を形成するシステム及び方法 |
| US8753904B2 (en) * | 2012-06-07 | 2014-06-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and system for semiconductor device pattern loading effect characterization |
| US9482518B2 (en) | 2012-06-07 | 2016-11-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Systems and methods for semiconductor device process determination using reflectivity measurement |
| SG195515A1 (en) | 2012-06-11 | 2013-12-30 | Ultratech Inc | Laser annealing systems and methods with ultra-short dwell times |
| US9558973B2 (en) | 2012-06-11 | 2017-01-31 | Ultratech, Inc. | Laser annealing systems and methods with ultra-short dwell times |
| US20140158578A1 (en) * | 2012-12-06 | 2014-06-12 | Jason Varan | Folding apparatus for the containment and transport of bottles and method of use |
| KR102090708B1 (ko) * | 2013-01-22 | 2020-04-16 | 삼성디스플레이 주식회사 | 레이저 어닐링 장치 |
| US20150111341A1 (en) * | 2013-10-23 | 2015-04-23 | Qualcomm Incorporated | LASER ANNEALING METHODS FOR INTEGRATED CIRCUITS (ICs) |
| US9373512B2 (en) | 2013-12-03 | 2016-06-21 | GlobalFoundries, Inc. | Apparatus and method for laser heating and ion implantation |
| US9343307B2 (en) | 2013-12-24 | 2016-05-17 | Ultratech, Inc. | Laser spike annealing using fiber lasers |
| US20150343560A1 (en) * | 2014-06-02 | 2015-12-03 | Fracturelab, Llc | Apparatus and method for controlled laser heating |
| CN105793960B (zh) * | 2014-06-12 | 2018-09-11 | 富士电机株式会社 | 杂质添加装置、杂质添加方法以及半导体元件的制造方法 |
| US9559023B2 (en) | 2014-06-23 | 2017-01-31 | Ultratech, Inc. | Systems and methods for reducing beam instability in laser annealing |
| JP6439297B2 (ja) * | 2014-07-04 | 2018-12-19 | 富士電機株式会社 | 不純物導入方法、不純物導入装置及び半導体素子の製造方法 |
| US9613815B2 (en) * | 2014-11-24 | 2017-04-04 | Ultratech, Inc. | High-efficiency line-forming optical systems and methods for defect annealing and dopant activation |
| US10083843B2 (en) | 2014-12-17 | 2018-09-25 | Ultratech, Inc. | Laser annealing systems and methods with ultra-short dwell times |
| US9859121B2 (en) * | 2015-06-29 | 2018-01-02 | International Business Machines Corporation | Multiple nanosecond laser pulse anneal processes and resultant semiconductor structure |
| JP6772258B2 (ja) | 2015-12-30 | 2020-10-21 | マトソン テクノロジー インコーポレイテッドMattson Technology, Inc. | ミリ秒アニールシステムのための予熱方法 |
| US11045906B2 (en) * | 2017-12-07 | 2021-06-29 | Gkn Aerospace St. Louis Llc | Coaxial wire feed multi-laser metal deposition device |
| KR102546719B1 (ko) | 2018-09-04 | 2023-06-21 | 삼성전자주식회사 | 모니터링 장치 및 모니터링 방법 |
| DE102022107595A1 (de) * | 2022-03-30 | 2023-10-05 | Infineon Technologies Ag | Verfahren zum herstellen einer halbleitervorrichtung |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4926456A (enExample) * | 1972-07-11 | 1974-03-08 | ||
| JPS5629323A (en) * | 1979-08-17 | 1981-03-24 | Nec Corp | Two-wavelength laser surface treating apparatus |
| JPS577125A (en) * | 1980-06-17 | 1982-01-14 | Fujitsu Ltd | Laser heater |
| US4356375A (en) | 1980-07-10 | 1982-10-26 | Avery International Corporation | Process for producing lines of weakness in the protective backing of an adhesive laminate |
| JPS57104217A (en) * | 1980-12-22 | 1982-06-29 | Toshiba Corp | Surface heat treatment |
| JPS57183024A (en) * | 1981-05-02 | 1982-11-11 | Fujitsu Ltd | Laser annealing |
| JPS57183023A (en) * | 1981-05-02 | 1982-11-11 | Fujitsu Ltd | Laser annealing |
| JPS57111020A (en) * | 1981-11-16 | 1982-07-10 | Hitachi Ltd | Manufacture of semiconductor device |
| US4761786A (en) | 1986-12-23 | 1988-08-02 | Spectra-Physics, Inc. | Miniaturized Q-switched diode pumped solid state laser |
| US4734912A (en) | 1986-06-06 | 1988-03-29 | Lightwave Electronics Corp. | Laser diode end pumped Nd:YAG single mode laser |
| JPS6380521A (ja) * | 1986-09-24 | 1988-04-11 | Furukawa Electric Co Ltd:The | 半導体薄膜結晶層の製造方法 |
| US4908493A (en) | 1988-05-31 | 1990-03-13 | Midwest Research Institute | Method and apparatus for optimizing the efficiency and quality of laser material processing |
| US5057664A (en) | 1989-10-20 | 1991-10-15 | Electro Scientific Industries, Inc. | Method and apparatus for laser processing a target material to provide a uniformly smooth, continuous trim profile |
| JPH03266424A (ja) * | 1990-03-16 | 1991-11-27 | Sony Corp | 半導体基板のアニール方法 |
| JPH0521340A (ja) * | 1991-07-10 | 1993-01-29 | Ricoh Co Ltd | 薄膜半導体装置、その製法および製造装置 |
| US6326248B1 (en) * | 1994-06-02 | 2001-12-04 | Semiconductor Energy Laboratory Co., Ltd. | Process for fabricating semiconductor device |
| JP2000036464A (ja) * | 1998-07-17 | 2000-02-02 | Sony Corp | 薄膜半導体装置の製造方法 |
| US6208673B1 (en) | 1999-02-23 | 2001-03-27 | Aculight Corporation | Multifunction solid state laser system |
| US6366308B1 (en) | 2000-02-16 | 2002-04-02 | Ultratech Stepper, Inc. | Laser thermal processing apparatus and method |
| US7015422B2 (en) * | 2000-12-21 | 2006-03-21 | Mattson Technology, Inc. | System and process for heating semiconductor wafers by optimizing absorption of electromagnetic energy |
| JP2002217125A (ja) * | 2001-01-23 | 2002-08-02 | Sumitomo Heavy Ind Ltd | 表面処理装置及び方法 |
| JP4068813B2 (ja) * | 2001-04-06 | 2008-03-26 | セイコーエプソン株式会社 | 薄膜半導体装置の製造方法 |
| SG108878A1 (en) * | 2001-10-30 | 2005-02-28 | Semiconductor Energy Lab | Laser irradiation method and laser irradiation apparatus, and method for fabricating semiconductor device |
| JP3992976B2 (ja) * | 2001-12-21 | 2007-10-17 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US6767799B2 (en) * | 2001-12-28 | 2004-07-27 | Semiconductor Energy Laboratory Co., Ltd. | Laser beam irradiation method |
| US6849831B2 (en) * | 2002-03-29 | 2005-02-01 | Mattson Technology, Inc. | Pulsed processing semiconductor heating methods using combinations of heating sources |
| JP2003347237A (ja) * | 2002-05-30 | 2003-12-05 | Mitsubishi Electric Corp | 半導体装置の製造方法およびその製造装置 |
| US6747245B2 (en) | 2002-11-06 | 2004-06-08 | Ultratech Stepper, Inc. | Laser scanning apparatus and methods for thermal processing |
-
2003
- 2003-09-29 US US10/674,106 patent/US7148159B2/en not_active Expired - Lifetime
-
2004
- 2004-09-22 TW TW093128701A patent/TWI246119B/zh not_active IP Right Cessation
- 2004-09-28 WO PCT/US2004/031783 patent/WO2005043696A2/en not_active Ceased
- 2004-09-28 JP JP2006534012A patent/JP5517396B2/ja not_active Expired - Fee Related
-
2006
- 2006-06-29 US US11/478,171 patent/US7879741B2/en not_active Expired - Fee Related
-
2012
- 2012-06-26 JP JP2012143310A patent/JP2012231158A/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2007507897A5 (enExample) | ||
| JP5517396B2 (ja) | 低濃度ドープシリコン基板のレーザー熱アニール | |
| US7098155B2 (en) | Laser thermal annealing of lightly doped silicon substrates | |
| JP5094825B2 (ja) | 低濃度ドープされたシリコン基板のレーザ熱アニール | |
| US10857623B2 (en) | Annealing apparatus using two wavelengths of radiation | |
| JP5103186B2 (ja) | レーザベースアニーリングシステムにおける高温測定用の多重バンドパスフィルタリング | |
| JP2008520096A5 (enExample) | ||
| KR20190017000A (ko) | 라인 빔들을 이용한 향상된 열처리 방법 | |
| KR102400217B1 (ko) | 결함 어닐링 및 도펀트 활성화를 위한 고효율 라인-형성 광학 시스템 및 방법 | |
| JP2008520004A (ja) | 高電力レーザダイオードベースアニーリングシステム用のオートフォーカス | |
| JPH10128772A5 (enExample) | ||
| KR100899321B1 (ko) | 저농도로 도핑된 실리콘 기판의 레이저 열 어닐링 |