JP2007134406A - Printing solder inspection apparatus - Google Patents

Printing solder inspection apparatus Download PDF

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JP2007134406A
JP2007134406A JP2005323753A JP2005323753A JP2007134406A JP 2007134406 A JP2007134406 A JP 2007134406A JP 2005323753 A JP2005323753 A JP 2005323753A JP 2005323753 A JP2005323753 A JP 2005323753A JP 2007134406 A JP2007134406 A JP 2007134406A
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solder
inspection
printed
substrate
correction
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Norihiko Masuda
紀彦 益田
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Anritsu Corp
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Anritsu Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To inspect a printing mode of printed cream solder before heating and to perform correction work in the position in a rejected case. <P>SOLUTION: A printing solder inspection apparatus is provided with an inspecting means having an inspection head 20 which is arranged to freely move an upper part of a substrate 12 and detects a position and height of cream solder 13 printed on the substrate 12, a printed solder removing means 24 which is integrally disposed with the inspection head 20, and a cream solder supplementing means 26 which is integrally arranged with the inspection head 20. Cream solder 13 before heating printed on the substrate 12 is inspected and it can be corrected. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、印刷されたはんだを検査して、修正が必要な場合には直接不良個所の修正を行えるようにした印刷はんだ検査装置に関する。   The present invention relates to a printed solder inspection apparatus in which printed solder is inspected, and when a correction is necessary, a defective portion can be directly corrected.

回路基板上に各種電子部品を実装し、はんだにより電気的接続を行う方法の1つに、印刷手法により基板の電気的接続位置に予め所定のパターンでクリームはんだ(ペースト状フラックスに低温溶融形はんだ粒子を所定の配合比で混合分散した組成物)を形成配置しておき、この配置個所に各種電子部品の接続端子を配置した後、前記クリームはんだを加熱溶融することによって、電子部品の回路基板上への固定と同時に、電気的接続を行う方法がある。   One method of mounting various electronic components on a circuit board and making electrical connection with solder is a solder paste in a predetermined pattern at the electrical connection position of the board by a printing method (low temperature fusion solder to paste flux) A composition in which particles are mixed and dispersed at a predetermined blending ratio) is formed and disposed, and after connecting terminals of various electronic components are disposed at the disposed locations, the cream solder is heated and melted, whereby the circuit board of the electronic component is formed. There is a method of making an electrical connection simultaneously with fixing to the top.

この方法においては、前記クリームはんだの印刷工程と部品実装工程の間に検査工程を設け、はんだの印刷位置や、印刷したはんだの体積、高さの良否、ブリッジ(隣接する独立したはんだ同士が接合してしまうこと)の生成などの印刷欠陥の有無を検査し、合格品のみ次工程である部品実装工程に送るようにしている。   In this method, an inspection process is provided between the cream solder printing process and the component mounting process, and the printing position of the solder, the volume of the printed solder, the quality of the height, the bridge (adjacent independent solders are joined together) In other words, it is inspected whether or not there is a printing defect such as generation, and only acceptable products are sent to the component mounting process which is the next process.

ところでこの種はんだの検査システムとしては、従来では、下記特許文献に示すはんだの検査修正システムが知られている。このシステムでは、検査装置で検査された基板のうち半田不良と判定された基板を自動修正装置または修正台に送り、それぞれの位置で自動または人手によって修正後、再度検査装置に戻して再検査を行っている。
特開平6−1523123号公報
By the way, as this kind of solder inspection system, conventionally, a solder inspection correction system shown in the following patent document is known. In this system, out of the boards inspected by the inspection device, the board determined to be defective in solder is sent to the automatic correction device or correction table, corrected automatically or manually at each position, then returned to the inspection device and re-inspected. Is going.
Japanese Unexamined Patent Publication No. 6-1523123

しかし、前記検査システムでは、検査と修正とが別個の場所で行われるため、検査修正毎の基板の搬送に手数がかかり、かつ再び検査位置に戻した際における修正位置の再現精度も低下する原因となる。   However, in the inspection system, since inspection and correction are performed at different locations, it takes time to transport the substrate for each inspection correction, and the reason why the reproducibility of the correction position when returning to the inspection position again decreases. It becomes.

また、該検査システムでは、既に部品を実装した後のはんだ位置を判定するものであって、はんだも固まっているため、はんだを加熱し再溶融しなければ修正が出来ず、加熱時における電子部品への熱的影響のおそれも生じていた。   Also, in this inspection system, the position of the solder after mounting the component is already determined, and since the solder is hardened, it cannot be corrected unless the solder is heated and remelted. There was also a risk of thermal effects on

本発明は、以上の課題を解決するものであり、その目的とするところは、予め印刷されたクリームはんだの合否判定を順次行い、不合格の場合には直接修復作業を行えるようにした印刷はんだ検査装置を提供するものである。   The present invention solves the above-mentioned problems, and its object is to sequentially perform pass / fail judgment of pre-printed cream solder, and in the case of failure, the printed solder can be directly repaired. An inspection apparatus is provided.

前記目的を達成するため請求項1の発明は、基板12上に予め印刷されたはんだ13を検査して修正を行うための印刷はんだ検査装置1において、前記基板12の上方で移動自在となるように設けられて前記基板12上に印刷されたはんだ13の位置と高さを検出する検査ヘッド20を備えた検査手段と、前記基板12の上方で移動自在となるように設けられたはんだの除去手段24と、前記基板12の上方で移動自在となるように設けられたはんだの補充手段26とを備えたことを特徴としている。   In order to achieve the above object, the invention of claim 1 is such that the printed solder inspection apparatus 1 for inspecting and correcting the solder 13 printed in advance on the substrate 12 is movable above the substrate 12. And an inspection means provided with an inspection head 20 for detecting the position and height of the solder 13 printed on the substrate 12 and removal of the solder provided so as to be movable above the substrate 12 Means 24 and solder replenishing means 26 provided so as to be movable above the substrate 12 are provided.

請求項2の発明は、前記はんだ13の検査と修正を前記はんだ13の印刷箇所ごとに連続して行うこと特徴としている。   The invention of claim 2 is characterized in that the inspection and correction of the solder 13 are continuously performed for each printed portion of the solder 13.

請求項3の発明は、前記はんだ13の修正を行った箇所ごとに続けて再検査を行うことを特徴としている。   The invention of claim 3 is characterized in that re-inspection is continuously performed for each portion where the solder 13 is corrected.

請求項4の発明は、前記はんだ13を拡大して撮像する撮像手段と、前記撮像手段によるはんだ13の映像から修正の要否を目視で判断して必要に応じて修正の指示を行う手動モードと、前記検査ヘッドにより検出した前記はんだの高さが予め定めた基準値から所定の量だけ外れた場合に自動的に修正を行う自動モードとを任意に選択できる制御手段とをさらに有することを特徴としている。   According to a fourth aspect of the present invention, there is provided an imaging unit for enlarging and imaging the solder 13, and a manual mode in which the necessity of correction is visually determined from an image of the solder 13 by the imaging unit and a correction instruction is issued as necessary. And a control means capable of arbitrarily selecting an automatic mode for automatically correcting when the height of the solder detected by the inspection head deviates by a predetermined amount from a predetermined reference value. It is a feature.

請求項1の発明によれば、従来のような検査−修正毎の基板の移送の手間や、再検査時における基準位置ずれの誤差による不具合の発生も未然に防止できる。また、本発明では部品実装前であって、加熱前のはんだの検査・修正を行うため、加熱除去などに伴う部品の熱的影響もない。   According to the first aspect of the present invention, it is possible to prevent the troubles caused by the error of the reference position deviation at the time of re-inspection and the trouble of transferring the substrate for each inspection-correction as in the prior art. Further, in the present invention, since the solder is inspected / corrected before the component is mounted before being heated, there is no thermal influence on the component due to heat removal or the like.

請求項2の発明によれば、不合格と判定されたはんだ位置を直ちに修復できる。   According to the invention of claim 2, the solder position determined to be unacceptable can be repaired immediately.

請求項3の発明によれば、修復状態における合否判定も行えるため、より確実な検査結果を得ることが出来る。   According to the invention of claim 3, since the pass / fail determination in the repaired state can be performed, a more reliable inspection result can be obtained.

請求項4の発明によれば、合否判定の境界が不明瞭の場合等に、熟練工の目視確認により確実な合否判定が可能となる。   According to the invention of claim 4, when the boundary of the pass / fail determination is unclear, the pass / fail determination can be made surely by the visual confirmation of a skilled worker.

以下、本発明の最良の実施形態につき図面を参照して説明する。まず図1(a)〜(d)は、基板上に印刷された加熱前のクリームはんだ(以下、単に「はんだ」と呼ぶ)において、修正前の問題のある印刷態様及び修正後における基板に対する付着態様を示している。   DESCRIPTION OF EXEMPLARY EMBODIMENTS Hereinafter, preferred embodiments of the invention will be described with reference to the drawings. First, FIG. 1A to FIG. 1D show a problem of printing before correction and adhesion to the substrate after correction in cream solder before heating (hereinafter simply referred to as “solder”) printed on the substrate. An embodiment is shown.

図1(a)では、はんだの印刷中心が設定位置(x軸とy軸の交点位置)から外れたものを、これの印刷中心を設定位置に修正した場合、(b)でははんだの印刷量が設定された量より少ないものを、これを設定量まで増量した場合、(c)では前記とは逆にはんだの印刷量が多いものを、これを設定量までに減量した場合、(d)でははんだの印刷位置が込入っている箇所において、ブリッジ現象により隣合うはんだ同士が付着接続している場合に、これを分離した場合をそれぞれ示している。本発明は、以上述べた加熱前の印刷不具合箇所に対する検査と、その結果に基づく修正を行うものである。   In FIG. 1A, when the solder printing center deviates from the setting position (intersection position of the x-axis and y-axis), the printing center is corrected to the setting position. When the amount less than the set amount is increased up to the set amount, (c) Contrary to the above, when the amount of printed solder is reduced to the set amount, (d) FIG. 4 shows a case where adjacent solders are adhered and connected to each other by a bridging phenomenon at a place where a solder printing position is involved. In the present invention, the above-described inspection for a printing defect portion before heating and correction based on the result are performed.

図2は本実施形態に係る印刷はんだ検査装置と、該印刷はんだ検査装置と周辺機器との関係を示している。図において、印刷はんだ検査装置1の前段には印刷機2が設けられており、印刷機2で後述の基板表面にはんだを所定パターンで印刷した後、当該基板をコンベア3を介して印刷はんだ検査装置1に搬入し、ここで印刷状態を検査し、不具合箇所があればここで修正される。検査修正後の基板はコンベア4を介して後段のチップマウンタ5内に導入され、ここで各種電子部品の実装とはんだの加熱溶融による固定と電気的接続が同時に行われる。   FIG. 2 shows a printed solder inspection apparatus according to the present embodiment, and the relationship between the printed solder inspection apparatus and peripheral devices. In the figure, a printing machine 2 is provided in the front stage of the printed solder inspection apparatus 1, and after the solder is printed in a predetermined pattern on the surface of the board described later by the printing machine 2, the printed board is inspected via the conveyor 3. It is carried into the apparatus 1 and the printing state is inspected here, and if there is a defective part, it is corrected here. The board after the inspection and correction is introduced into the subsequent chip mounter 5 via the conveyor 4, where mounting of various electronic components, fixing by heating and melting of solder, and electrical connection are performed simultaneously.

前記検査装置1は、図示は省略するが、前記コンベア3により前記検査装置1の内部に搬入された基板の上方所定高さ位置でx軸及びy軸方向に移動するxy移動テーブルに支持されて前記基板の原点位置を基点に順次xy方向に移動しつつはんだの印刷位置、形状を検出する後述する検査ヘッドと、はんだ除去装置(はんだ除去手段)及び補充装置(はんだ補充手段)とを備えている。   Although not shown, the inspection apparatus 1 is supported by an xy moving table that moves in the x-axis and y-axis directions at a predetermined height above the substrate carried into the inspection apparatus 1 by the conveyor 3. An inspection head (to be described later) for detecting the printing position and shape of the solder while sequentially moving in the xy direction from the origin position of the substrate as a base point, and a solder removal device (solder removal means) and a replenishment device (solder replenishment means) are provided. Yes.

また、印刷はんだ検査装置1には図示しない制御部(制御手段)も内蔵されており、前記基板の搬入から排出動作、検査ヘッドの移動制御などを行うとともに、この制御部には前記印刷機2で印刷されたはんだの印刷パターンを表す印刷データが転送され、この印刷データと前記検査ヘッドで検出した測定データとを比較し、この比較結果を元に合否判定を行うとともに、検査装置1に設けられたディスプレイ6にその内容を表示することができる。また、ディスプレイ6の横には、検査ヘッドに設けたCCDカメラなどの撮像手段で撮像された修正必要箇所を表示するモニタ7が配置されている。さらに、図中符号8は、印刷はんだ検査装置1上にあって、検査−修正の進行状況を段階表示するための表示灯である。   The printed solder inspection apparatus 1 also includes a control unit (control means) (not shown) that performs operations such as loading and unloading of the substrate, movement control of the inspection head, and the like. The print data representing the solder print pattern printed in step 1 is transferred, the print data is compared with the measurement data detected by the inspection head, and pass / fail judgment is made based on the comparison result, and the inspection apparatus 1 is provided. The contents can be displayed on the displayed display 6. Further, a monitor 7 for displaying a correction-necessary portion imaged by an imaging means such as a CCD camera provided in the inspection head is arranged beside the display 6. Further, reference numeral 8 in the figure is an indicator lamp on the printed solder inspection apparatus 1 for displaying the progress of the inspection-correction step by step.

なお、図1では前記ディスプレイ6には図1(d)に示すブリッジ現象の発生位置がグラフィック表示されているとともに、モニタ7にはその拡大映像が表示されている場合を示している。   Note that FIG. 1 shows a case where the display position of the bridge phenomenon shown in FIG. 1D is graphically displayed on the display 6 and an enlarged image thereof is displayed on the monitor 7.

図3は、前述する検査ヘッド並びにこれと一体に配置された除去装置及び補充装置の第1の実施形態を示している。図において、前述の基板10の表面には絶縁層11に囲われた金属導電層12が形成され、この金属導電層12の表面には前工程ではんだ層13が印刷により所定の盛りつけ高さに形成されている。本実施形態ではこのはんだ層13の高さが設定値より小さい場合を例示して説明する。   FIG. 3 shows a first embodiment of the above-described inspection head, and a removing device and a replenishing device arranged integrally therewith. In the figure, a metal conductive layer 12 surrounded by an insulating layer 11 is formed on the surface of the substrate 10 described above, and a solder layer 13 is printed on the surface of the metal conductive layer 12 at a predetermined height by printing in the previous step. Is formed. In the present embodiment, the case where the height of the solder layer 13 is smaller than a set value will be described as an example.

図において、符号20は前記基板10上において、所定高さを保持しつつxy方向に移動自在な検査ヘッドであり、この検査ヘッド20の側方には水平な支持アーム22を介してはんだの除去手段としての除去装置24及びはんだの補充手段としての補充装置26がその先端を基板10側に向けて昇降可能に並列配置されている。   In the figure, reference numeral 20 denotes an inspection head which can move in the xy direction while maintaining a predetermined height on the substrate 10. The solder is removed to the side of the inspection head 20 via a horizontal support arm 22. A removing device 24 as a means and a replenishing device 26 as a solder replenishing means are arranged in parallel so that their tips can be moved up and down toward the substrate 10 side.

前記検査ヘッド20には、レーザ測距手段及び当該検査位置の拡大表示用のCCDカメラなどの計測手段が内蔵され、同図3(a)に示すように、検査位置直上ではんだ層13の基準面(導電層12)からの高さを計測し、そのデータを制御部に送出する。   The inspection head 20 incorporates measurement means such as laser distance measurement means and a CCD camera for enlarging the inspection position, and as shown in FIG. 3A, the reference of the solder layer 13 is directly above the inspection position. The height from the surface (conductive layer 12) is measured, and the data is sent to the control unit.

前記除去装置24は先端先細りのスポイト状をなし、かつその先細り状先端外周にはヒータ28が設けられているとともに、上部は吸引チューブ30を介して図示しない吸引ポンプなどに接続している。   The removal device 24 has a tapered shape with a tip tapered, and a heater 28 is provided on the outer periphery of the tapered tip, and the upper portion is connected to a suction pump (not shown) through a suction tube 30.

前記補充装置26は前記と同様に先端先細りのスポイト状をなし、その上部には供給チューブ32を介して図示しないはんだの定量吐出用ポンプなどに接続されている。   The replenishing device 26 has a tapered shape with a tapered tip as described above, and is connected to a top portion of the refilling device 26 via a supply tube 32 to a solder dispensing pump or the like (not shown).

以上において、図3(a)で示す検査ヘッド20の測定結果が想像線で示す設定高さを満たさず、不合格と判定された場合に、図3(b)に示すように、横移動により除去装置24が検査位置の直上に配置され、図示しない昇降機構によって下降してその先端がはんだ層13の内部に突刺さる。次いで、ヒータ28により加熱されてはんだ層13は溶融しつつ、吸引ポンプの駆動により除去装置24を通じて吸引除去される。   In the above, when the measurement result of the inspection head 20 shown in FIG. 3A does not satisfy the set height indicated by the imaginary line and is determined to be rejected, as shown in FIG. The removing device 24 is disposed immediately above the inspection position, and is lowered by an elevating mechanism (not shown) so that the tip of the removing device 24 sticks into the solder layer 13. Next, the solder layer 13 is heated by the heater 28 and melted, and is sucked and removed through the removing device 24 by driving the suction pump.

その後は図3(c)に示すように、除去装置24を上部待機位置に位置させるとともに、さらに横移動させて補充装置26を検査位置直上に配置し、下降により適当な高さに配置した後にポンプを通じてはんだを供給することにより、図示のごとくはんだ層13を再び導電層12上に盛上げる。   After that, as shown in FIG. 3 (c), the removal device 24 is positioned at the upper standby position, and further moved laterally so that the replenishment device 26 is disposed immediately above the inspection position, and is disposed at an appropriate height by lowering. By supplying the solder through the pump, the solder layer 13 is raised again on the conductive layer 12 as shown.

このとき前記制御部では、印刷データを参照して当該位置のはんだの吐出量を決定し、それに応じてポンプを駆動する。したがって、補充後のはんだ層13の量及び高さは設定値とほぼ同一となる。   At this time, the control unit determines the solder discharge amount at the position with reference to the print data, and drives the pump accordingly. Therefore, the amount and height of the solder layer 13 after replenishment are substantially the same as the set values.

図4は前記基板10の印刷はんだ検査装置1内に対する搬入から搬出までの一連の手順を示しており、前記制御部によって統轄的に制御される。まず装置1のシャッタが開き、コンベアを通じてはんだが印刷された基板10が搬入され、基板10は位置決め用ストッパに度当りし、クランパによりその位置に位置決め状態に固定される(ステップST1,2)。   FIG. 4 shows a series of procedures from loading to unloading of the board 10 into the printed solder inspection apparatus 1 and is controlled by the control unit. First, the shutter of the apparatus 1 is opened, and the board 10 on which the solder is printed is carried through the conveyor. The board 10 hits the positioning stopper and is fixed to the position by the clamper (steps ST1 and ST2).

基板1の固定後、検査ヘッド20による計測が開始され、検査ヘッド20は、基板上10の基準位置を原点としてxy軸方向に順次移動しつつ、はんだ位置と、その高さ等を検出し、そのデータを制御部に送る。制御部では、同測定データと印刷データとを照合して合否判定を行う(ステップST3)。   After the substrate 1 is fixed, measurement by the inspection head 20 is started. The inspection head 20 detects the solder position and its height while sequentially moving in the xy-axis direction with the reference position on the substrate 10 as the origin, The data is sent to the control unit. In the control unit, the measurement data and the print data are collated to make a pass / fail decision (step ST3).

なお、検査・修正手順としては、逐次全はんだ位置を連続的に検出して不合格位置を特定し、その後当該不合格位置毎に連続的に修正動作が実行されるようになっている。   As an inspection / correction procedure, all solder positions are successively detected to identify a reject position, and thereafter, a correction operation is continuously executed for each fail position.

したがって、検査ヘッド20を終点位置までスキャンした後、ディスプレイ6にその判定結果が表示されると同時に、全ての検査箇所で合格判定されたなら、測定終了処理がなされ、基板10に対するクランプの解除と、装置1内からの排出動作により全処理を終了する(ステップST4,5,13〜15)。   Therefore, after scanning the inspection head 20 to the end point position, the determination result is displayed on the display 6 and, at the same time, if all the inspection points are determined to pass, a measurement end process is performed, and the clamp on the substrate 10 is released. Then, the entire process is terminated by the discharging operation from the inside of the apparatus 1 (steps ST4, 5, 13-15).

これに対し、不合格箇所があると判定された場合(ステップST5でYES)、その箇所の修正の要不要が判断される。この場合の判定は、前記制御部において設定値と計測値の差から自動的に判定し、後述する修正も自動的に行う自動モードで行われる。   On the other hand, when it is determined that there is a rejected part (YES in step ST5), it is determined whether or not the part needs to be corrected. The determination in this case is performed in an automatic mode in which the control unit automatically determines from the difference between the set value and the measured value, and the correction described later is also automatically performed.

しかし、モニタ7を介して監視員の目視によって判定し、これによって修正走査も行う手動モードとすることもできる。この場合には監視員がYES,NOを選択する釦などを装置1のパネルに設けておくことで、人手による判定を行うことができる。この判定結果で全ての箇所について修正が不要と判定されたなら(ステップST6でNO)、前記と同様ステップST13〜15にジャンプし、全処理を終了する。   However, it is also possible to make a manual mode in which the determination is made by visual observation of the monitoring person via the monitor 7 and the correction scanning is thereby performed. In this case, it is possible to make a manual determination by providing a button for the monitor to select YES or NO on the panel of the apparatus 1. If it is determined from this determination result that correction is not necessary for all locations (NO in step ST6), the process jumps to steps ST13 to ST15 in the same manner as described above, and all the processes are terminated.

これに対し、修正が必要(ステップST6でYES)と判定された場合には、検査ヘッド20はその不合格箇所に移動し、図3(b),(c)に示すように、はんだの除去と補充作業を行い、修正後の形状をモニタ7に表示した後、再び検査ヘッド20が測定動作し、そのデータを受けて制御部ではその結果をディスプレイ6に表示する(ステップST7,8,9,10)。   On the other hand, if it is determined that correction is necessary (YES in step ST6), the inspection head 20 moves to the rejected portion, and the solder is removed as shown in FIGS. 3 (b) and 3 (c). Then, after the corrected shape is displayed on the monitor 7, the inspection head 20 performs the measurement operation again, and the control unit receives the data and displays the result on the display 6 (steps ST7, 8, 9). , 10).

これと同時に制御部ではその測定データと印刷データを比較し、不合格(ステップST11でNO)であるなら、再びステップST6で再度合否判定がなされ、不合格である場合には再度同一手順で除去、補充、再検査がなされる。   At the same time, the control unit compares the measured data with the print data, and if it is rejected (NO in step ST11), the pass / fail determination is made again in step ST6. , Replenishment and re-inspection.

また合格(ステップST11でYES)であるなら、検査ヘッド20は次の不合格位置に移動し、前記と同一手順で合否判定と修正、再検査がなされる。   If it is acceptable (YES in step ST11), the inspection head 20 moves to the next failure position, and a pass / fail determination, correction, and re-inspection are performed in the same procedure as described above.

このようにして全ての不合格位置の修正と再検査終了後(ステップST12でYES)はステップST13〜15にジャンプし、全処理を終了することになる。   In this way, after correction of all rejected positions and completion of re-examination (YES in step ST12), the process jumps to steps ST13 to ST15 and completes all processes.

なお、以上の説明では、1つの基板の全印刷箇所について一連に検査し、その後に判定して修正にかかっていたが、各印刷箇所を検査する度に判定を行い、直ちに必要な修正及び再検査を行い、その後、次の印刷箇所に移って再び検査・修正・再検査を行うという手順をとることもできる。   In the above description, all the printed portions of one substrate are inspected in series, and then the determination is made and the correction is made. However, the determination is made every time each printed portion is inspected, and the necessary correction and re-use are immediately performed. It is also possible to take a procedure of inspecting, and then moving to the next printing place and inspecting, correcting, and reinspecting again.

図5は検査ヘッド部分の第2実施形態を示す。なお、図において前記第1実施形態と実質的に同一の箇所には同一符号を付して説明を省略し、異なる箇所のみ異なる符号を用いて説明する。   FIG. 5 shows a second embodiment of the inspection head portion. In the figure, substantially the same parts as those in the first embodiment are denoted by the same reference numerals and description thereof is omitted, and only different parts are described using different reference numerals.

図5において、検査ヘッド20の側部には支持アーム22を介してはんだの除去手段と補充手段を兼用する除去補充装置40が並列配置されている。この除去補充装置40は前記実施形態と同様に先端が先細りのスポイト形状をなし、その先端外周にヒータ28を備え、上部には吸引チューブ30及び供給チューブ32が二股状に接続され、それぞれの他端側を吸引ポンプ及びはんだの吐出ポンプに接続している。   In FIG. 5, a removal and replenishment device 40, which serves as both solder removal means and replenishment means, is arranged in parallel on the side of the inspection head 20 via a support arm 22. This removal and replenishment device 40 has a dropper shape with a tapered tip as in the above-described embodiment, and is provided with a heater 28 on the outer periphery of the tip, and a suction tube 30 and a supply tube 32 are connected in a bifurcated shape on the top. The end side is connected to a suction pump and a solder discharge pump.

この構成において、図5(a)に示すように、検査ヘッド20の測定による結果が基準高さを満たさず、不合格であった場合には、(b)に示すように、横移動により除去補充装置40が検査位置の直上に配置され、図示しない昇降機構によって下降してその先端がはんだ層13の内部に突刺さる。次いで、ヒータ28により加熱されてはんだ層13は溶融しつつ、吸引ポンプの駆動により除去装置24及び吸引チューブを通じて吸引除去される。   In this configuration, as shown in FIG. 5 (a), when the result of the measurement of the inspection head 20 does not satisfy the reference height and fails, it is removed by lateral movement as shown in (b). The replenishing device 40 is disposed immediately above the inspection position, and is lowered by an elevating mechanism (not shown) so that the tip of the replenishing device pierces into the solder layer 13. Next, while being heated by the heater 28, the solder layer 13 is melted and sucked and removed through the removing device 24 and the suction tube by driving the suction pump.

その後は図5(c)に示すように、その位置において除去補充装置40を再下降させ、その先端が導電層12上に接した直後より、引上げつつポンプを通じてはんだを供給することにより、図示のごとく規定量のはんだを供給してはんだ層13を所定高さで導電層12上に盛上げることができる。   Thereafter, as shown in FIG. 5 (c), the removal and replenishment device 40 is lowered again at that position, and the solder is supplied through the pump while being pulled up immediately after its tip contacts the conductive layer 12, so that Thus, a prescribed amount of solder can be supplied, and the solder layer 13 can be raised on the conductive layer 12 at a predetermined height.

本実施形態では、修正動作毎の横移動が一回で良いため、制御が簡単となり、しかも吸引と補充の2つを兼用するため、構成も簡単である。   In the present embodiment, the lateral movement for each correction operation may be performed only once, so that the control is simple, and the configuration is also simple because both the suction and the replenishment are used.

なお、本実施形態では、はんだの除去手段と補充手段が除去補充装置40として一つの装置で兼用されているので、個々のはんだ層13毎に除去と補充を連続して行う操作を繰り返すのではなく、基板上の対象となるすべてのはんだ層13について、まず除去を行い、その後に一連の動作で補充を行うこととした方が作業効率はより高まる。   In this embodiment, since the solder removing means and the replenishing means are used as a single device as the removal replenishing device 40, the operation of continuously removing and replenishing each solder layer 13 is not repeated. Instead, it is more efficient to remove all the target solder layers 13 on the substrate first and then replenish them with a series of operations.

図6は検査ヘッド部分の第3実施形態を示す。本実施形態では第1実施形態の吸引による除去装置24に替えてはんだ除去手段としてのレーザヘッド50を備えた点が異なるのみで、その他は第1実施形態と同様である。   FIG. 6 shows a third embodiment of the inspection head portion. The present embodiment is the same as the first embodiment except that a laser head 50 as a solder removing means is provided instead of the removal device 24 by suction of the first embodiment.

この構成において、図6(a)に示すように、検査ヘッド20の測定結果が設定高さを満たさず、不合格であった場合には、(b)に示すように、横移動によりレーザヘッド50を検査位置の直上に配置し、レーザをはんだ層13に照射することで、はんだ層13は加熱蒸発して導電層12状から消滅する。その後は前記と同様(c)に示すように補充装置26を検査位置の直上に配置し、下降によりその先端が導電層12上に接した直後より引上げつつポンプを通じて所定量のはんだを供給することにより、図示のごとく規定量のはんだを供給してはんだ層13を所定高さで導電層12上に盛上げることができる。   In this configuration, as shown in FIG. 6A, when the measurement result of the inspection head 20 does not satisfy the set height and fails, the laser head is moved laterally as shown in FIG. By placing 50 directly above the inspection position and irradiating the solder layer 13 with a laser, the solder layer 13 is evaporated by heating and disappears from the conductive layer 12 shape. Thereafter, as shown in (c), the replenishing device 26 is disposed immediately above the inspection position, and a predetermined amount of solder is supplied through the pump while being pulled up immediately after the tip contacts the conductive layer 12 by lowering. Thus, as shown in the figure, a prescribed amount of solder can be supplied, and the solder layer 13 can be raised on the conductive layer 12 at a predetermined height.

本実施形態では、瞬時に規定外のはんだを除去することができるので、除去処理時間が短縮され、全体の工程時間の短縮につながる。なお、以上の説明では、検査ヘッド、除去装置及び補充装置が一体であったが、これに限らずそれぞれがX,Y軸の移動手段を持つ構造でもよい。このようにすれば、検査ヘッドが計測している間に合否判定をして、修正が必要である場合には直ちに修正を行うことができる。   In the present embodiment, unspecified solder can be removed instantaneously, so that the removal processing time is shortened and the entire process time is shortened. In the above description, the inspection head, the removing device, and the replenishing device are integrated. However, the present invention is not limited to this, and each may have a structure having X and Y axis moving means. In this way, it is possible to make a pass / fail judgment while the inspection head is measuring, and to make correction immediately if correction is necessary.

さらに他のはんだ除去手段としては、図7(a)に示すように、除去アーム60を用い、スイング動作によりその先端に設けたナイフエッジ状の除去板部60aをはんだ層13に当て、はんだをすくい取って導電層12上より除去する構成としてもよいし、図7(b)に示すように、はんだ吸着性のある金属加熱棒70をはんだ層13に押し当て、これを溶融させて加熱棒70の先端外周に表面張力で吸着して除去する手段も用いることができる。   As another solder removal means, as shown in FIG. 7A, a removal arm 60 is used, and a knife edge-shaped removal plate portion 60a provided at the tip of the removal arm 60 is applied to the solder layer 13 by a swing operation, and solder is applied. It is good also as a structure scraped off and remove | eliminating from on the conductive layer 12, and as shown in FIG.7 (b), the metal heating rod 70 with solder adsorption property is pressed against the solder layer 13, this is melted, and a heating rod A means for adsorbing and removing the outer periphery of the tip of the 70 by surface tension can also be used.

(a)〜(d)は、はんだの修正前、修正後における基板に対する印刷形態を示す説明図である。(A)-(d) is explanatory drawing which shows the printing form with respect to the board | substrate before and after correction of a solder. 本発明に係る検査装置と、該検査装置と周辺機器の関係を示す外観説明図である。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is an external appearance explanatory view showing an inspection apparatus according to the present invention and the relationship between the inspection apparatus and peripheral devices. (a)〜(c)は検査ヘッドとこれに附属する除去装置及び補充装置の動作説明図である。(A)-(c) is operation | movement explanatory drawing of a test | inspection head, the removal apparatus attached to this, and a replenishment apparatus. 印刷基板の装置内搬入から搬出までの一連の手順を示すフローチャートである。It is a flowchart which shows a series of procedures from carrying in of a printed circuit board in an apparatus to carrying out. (a)〜(c)は第2実施形態による検査ヘッドとこれに附属する除去補充装置の動作説明図である。(A)-(c) is operation | movement explanatory drawing of the inspection head by 2nd Embodiment, and the removal replenishment apparatus attached to this. (a)〜(c)は第3実施形態による検査ヘッドとこれに附属する除去装置及び補充装置の動作説明図である。(A)-(c) is operation | movement explanatory drawing of the test | inspection head by 3rd Embodiment, the removal apparatus attached to this, and a replenishment apparatus. (a),(b)は除去手段のさらに他の例を示す説明図である。(A), (b) is explanatory drawing which shows the further another example of a removal means.

符号の説明Explanation of symbols

1 印刷はんだ検査装置
7 モニター
10 基板
13 はんだ層
20 検査ヘッド
24 除去手段としての除去装置
50 除去手段としてのレーザヘッド
60 除去手段としての除去アーム
70 除去手段としての金属加熱棒
26 補充手段としての補充装置
40 除去手段と補充手段を兼ねる除去補充装置
DESCRIPTION OF SYMBOLS 1 Print solder inspection apparatus 7 Monitor 10 Board | substrate 13 Solder layer 20 Inspection head 24 Removal apparatus as removal means 50 Laser head as removal means 60 Removal arm as removal means 70 Metal heating rod as removal means 26 Supplementation as replenishment means Device 40 Removal and replenishment device serving as removal means and replenishment means

Claims (4)

基板(12)上に印刷されたはんだ(13)を検査して修正を行うための印刷はんだ検査装置において、
前記基板の上方で移動自在となるように設けられて前記基板上に印刷されたはんだの位置と高さを検出する検査ヘッド(20)を備えた検査手段と、前記基板の上方で移動自在となるように設けられたはんだの除去手段(24)と、前記基板の上方で移動自在となるように設けられたはんだの補充手段(26)とを備えたことを特徴とする印刷はんだ検査装置(1)。
In the printed solder inspection apparatus for inspecting and correcting the solder (13) printed on the substrate (12),
Inspection means provided with an inspection head (20) for detecting the position and height of the solder printed on the substrate, which is provided so as to be movable above the substrate, and movable above the substrate And a solder replenishing means (26) provided so as to be movable above the substrate. 1).
前記はんだの検査と修正を前記はんだの印刷箇所ごとに連続して行うこと特徴とする請求項1記載の印刷はんだ検査装置(1)。 The printed solder inspection apparatus (1) according to claim 1, wherein the inspection and correction of the solder are continuously performed for each printed portion of the solder. 前記はんだの修正を行った箇所ごとに続けて再検査を行うことを特徴とする請求項1記載の印刷はんだ検査装置(1)。 The printed solder inspection apparatus (1) according to claim 1, wherein re-inspection is continuously performed for each portion where the solder is corrected. 前記はんだを拡大して撮像する撮像手段と、
前記撮像手段によるはんだの映像から修正の要否を目視で判断して必要に応じて修正の指示を行う手動モードと、前記検査ヘッドにより検出した前記はんだの高さが予め定めた基準値から所定の量だけ外れた場合に自動的に修正を行う自動モードとを任意に選択できる制御手段と、
をさらに有することを特徴とする請求項1記載の印刷はんだ検査装置(1)。
Imaging means for enlarging and imaging the solder;
A manual mode for visually determining whether or not correction is necessary from the image of the solder by the imaging means and instructing correction as necessary, and the height of the solder detected by the inspection head is predetermined from a predetermined reference value A control means capable of arbitrarily selecting an automatic mode in which correction is automatically performed when the amount deviates by
The printed solder inspection apparatus (1) according to claim 1, further comprising:
JP2005323753A 2005-11-08 2005-11-08 Printing solder inspection apparatus Pending JP2007134406A (en)

Priority Applications (1)

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JP2010064380A (en) * 2008-09-11 2010-03-25 Toppan Printing Co Ltd Printing method
JP2010064381A (en) * 2008-09-11 2010-03-25 Toppan Printing Co Ltd Printing method
US7870991B2 (en) * 2006-09-11 2011-01-18 Panasonic Corporation Electronic component mounting system and electronic component mounting method
JP2012044012A (en) * 2010-08-20 2012-03-01 Hitachi Ltd Production system
WO2012124260A1 (en) 2011-03-14 2012-09-20 パナソニック株式会社 Solder height detection method and solder height detection device
US20150050418A1 (en) * 2013-08-19 2015-02-19 Mathew GREER Changing printing control parameters based on measured solder paste deposits in certain subareas of a printed circuit board
CN104718808A (en) * 2012-11-19 2015-06-17 松下知识产权经营株式会社 Electronic component mounting system
WO2015182877A1 (en) * 2014-05-30 2015-12-03 주식회사 파미 Three-dimensional measuring device with built-in dispenser
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US7870991B2 (en) * 2006-09-11 2011-01-18 Panasonic Corporation Electronic component mounting system and electronic component mounting method
JP2010064380A (en) * 2008-09-11 2010-03-25 Toppan Printing Co Ltd Printing method
JP2010064381A (en) * 2008-09-11 2010-03-25 Toppan Printing Co Ltd Printing method
JP2012044012A (en) * 2010-08-20 2012-03-01 Hitachi Ltd Production system
WO2012124260A1 (en) 2011-03-14 2012-09-20 パナソニック株式会社 Solder height detection method and solder height detection device
US8428338B1 (en) 2011-03-14 2013-04-23 Panasonic Corporation Method of determining solder paste height and device for determining solder paste height
US9332681B2 (en) 2012-11-19 2016-05-03 Panasonic Intellectual Property Management Co., Ltd. Electronic component mounting system
CN104718808A (en) * 2012-11-19 2015-06-17 松下知识产权经营株式会社 Electronic component mounting system
CN104718808B (en) * 2012-11-19 2017-10-24 松下知识产权经营株式会社 Electronic component mounting system
US20150050418A1 (en) * 2013-08-19 2015-02-19 Mathew GREER Changing printing control parameters based on measured solder paste deposits in certain subareas of a printed circuit board
US9681553B2 (en) * 2013-08-19 2017-06-13 Asm Assembly Systems Gmbh & Co. Kg Changing printing control parameters based on measured solder paste deposits in certain subareas of a printed circuit board
WO2015182877A1 (en) * 2014-05-30 2015-12-03 주식회사 파미 Three-dimensional measuring device with built-in dispenser
KR102305775B1 (en) * 2020-04-09 2021-09-30 주식회사 에스에프에이 A laser repair device and method

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