|
GB0321039D0
(en)
*
|
2003-09-09 |
2003-10-08 |
Council Cent Lab Res Councils |
Ionising particle analyser
|
|
JP2006313132A
(ja)
*
|
2005-05-09 |
2006-11-16 |
Fujitsu Ltd |
試料分析方法およびｘ線分析装置
|
|
JP4908119B2
(ja)
*
|
2005-10-19 |
2012-04-04 |
株式会社リガク |
蛍光ｘ線分析装置
|
|
CA2643894A1
(en)
*
|
2006-02-27 |
2007-09-07 |
University Of Rochester |
Phase contrast cone-beam ct imaging
|
|
JP5315251B2
(ja)
*
|
2006-11-16 |
2013-10-16 |
エックス−レイ オプティカル システムズ インコーポレーテッド |
それぞれの結晶方位を持つ多層を有するｘ線集束光学系及びこの光学系を形成する方法
|
|
US8068582B2
(en)
*
|
2007-02-23 |
2011-11-29 |
Passport Systems, Inc. |
Methods and systems for the directing and energy filtering of X-rays for non-intrusive inspection
|
|
JP5455904B2
(ja)
*
|
2007-08-03 |
2014-03-26 |
パルセータ，エルエルシー |
エネルギー分散型放射線分光分析システムにおけるパイルアップ検出方法、当該方法を実行するパルスプロセッサ、および、パイルアップを検出するエネルギー分散型放射線分光分析システム
|
|
WO2009020866A1
(en)
*
|
2007-08-03 |
2009-02-12 |
Pulsetor, Llc |
Adapting a high-performance pulse processor to an existing spectrometry system
|
|
CA2732754C
(en)
*
|
2007-08-03 |
2015-12-08 |
Pulsetor, Llc |
Digital pulse processor slope correction
|
|
US7807973B2
(en)
*
|
2008-08-01 |
2010-10-05 |
Pulsetor, Llc |
Pileup rejection in an energy-dispersive radiation spectrometry system
|
|
US8130904B2
(en)
|
2009-01-29 |
2012-03-06 |
The Invention Science Fund I, Llc |
Diagnostic delivery service
|
|
US8041008B2
(en)
*
|
2009-01-29 |
2011-10-18 |
The Invention Science Fund I, Llc |
Diagnostic delivery service
|
|
US20100310041A1
(en)
*
|
2009-06-03 |
2010-12-09 |
Adams William L |
X-Ray System and Methods with Detector Interior to Focusing Element
|
|
WO2011125829A1
(ja)
*
|
2010-03-31 |
2011-10-13 |
Hoya株式会社 |
レンズ形状測定装置
|
|
JP5256332B2
(ja)
|
2010-12-16 |
2013-08-07 |
住友ゴム工業株式会社 |
劣化解析方法
|
|
US8693626B2
(en)
*
|
2011-06-17 |
2014-04-08 |
Uop Llc |
Solid material characterization with X-ray spectra in both transmission and fluoresence modes
|
|
US9851342B2
(en)
|
2011-11-04 |
2017-12-26 |
Sumitomo Rubber Industries, Ltd. |
Deterioration analyzing method
|
|
US9364191B2
(en)
|
2013-02-11 |
2016-06-14 |
University Of Rochester |
Method and apparatus of spectral differential phase-contrast cone-beam CT and hybrid cone-beam CT
|
|
US10012606B1
(en)
*
|
2014-06-24 |
2018-07-03 |
Kla-Tencor Corporation |
X-ray based metrology with primary and secondary illumination sources
|
|
CN104267055B
(zh)
*
|
2014-10-10 |
2016-12-07 |
中国科学院高能物理研究所 |
同步辐射能量稳定装置及方法
|
|
JP6069609B2
(ja)
*
|
2015-03-26 |
2017-02-01 |
株式会社リガク |
二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法
|
|
US9494536B1
(en)
|
2015-06-01 |
2016-11-15 |
Chevron U.S.A. Inc. |
Methods for predicting corrosion rate of crude oil derived samples using X-ray absorption spectroscopy
|
|
MX2018002016A
(es)
*
|
2015-08-21 |
2018-08-23 |
Adcole Corp |
Perfilador optico y metodos de uso del mismo.
|
|
US10677744B1
(en)
*
|
2016-06-03 |
2020-06-09 |
U.S. Department Of Energy |
Multi-cone x-ray imaging Bragg crystal spectrometer
|
|
CN105891246B
(zh)
*
|
2016-06-23 |
2018-11-16 |
北京至一恒盛技术服务有限公司 |
一种x射线荧光探测装置
|
|
WO2018053272A1
(en)
|
2016-09-15 |
2018-03-22 |
University Of Washington |
X-ray spectrometer and methods for use
|
|
WO2018102792A1
(en)
|
2016-12-02 |
2018-06-07 |
Ningbo Infinite Materials Technology Co., Ltd |
X-ray diffraction and x-ray spectroscopy method and related apparatus
|
|
CN106770392B
(zh)
*
|
2016-12-16 |
2020-04-10 |
中国科学院长春光学精密机械与物理研究所 |
一种近边x射线吸收谱仪
|
|
EP3602020B1
(en)
*
|
2017-03-22 |
2023-12-27 |
Sigray Inc. |
Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
|
|
CN108132484B
(zh)
*
|
2017-12-12 |
2020-02-14 |
中国计量科学研究院 |
一种可调节单晶单色器的调节方法
|
|
US11193884B2
(en)
|
2018-07-02 |
2021-12-07 |
The Research Foundation For The State University Of New York |
System and method for structural characterization of materials by supervised machine learning-based analysis of their spectra
|
|
FI131496B1
(en)
*
|
2018-10-19 |
2025-05-23 |
Commw Scient Ind Res Org |
Energy-dispersive X-ray diffraction analyzer with an improved reflection geometry
|
|
CN110793982B
(zh)
*
|
2019-11-21 |
2022-03-04 |
山东建筑大学 |
一种纳米晶化动力学过程的高能x射线表征方法
|
|
WO2021237237A1
(en)
|
2020-05-18 |
2021-11-25 |
Sigray, Inc. |
System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
|
|
CN111650226B
(zh)
*
|
2020-05-27 |
2023-08-25 |
中国科学院上海应用物理研究所 |
一种基于实验室x射线源的中能x射线吸收谱仪
|
|
JP7640682B2
(ja)
|
2020-09-17 |
2025-03-05 |
シグレイ、インコーポレイテッド |
Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法
|
|
WO2022126071A1
(en)
|
2020-12-07 |
2022-06-16 |
Sigray, Inc. |
High throughput 3d x-ray imaging system using a transmission x-ray source
|
|
US12480892B2
(en)
|
2020-12-07 |
2025-11-25 |
Sigray, Inc. |
High throughput 3D x-ray imaging system using a transmission x-ray source
|
|
US12360067B2
(en)
|
2022-03-02 |
2025-07-15 |
Sigray, Inc. |
X-ray fluorescence system and x-ray source with electrically insulative target material
|
|
DE112023001408T5
(de)
|
2022-03-15 |
2025-02-13 |
Sigray, Inc. |
System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
|
|
CN119173759A
(zh)
|
2022-05-02 |
2024-12-20 |
斯格瑞公司 |
X射线顺序阵列波长色散光谱仪
|
|
WO2024173256A1
(en)
|
2023-02-16 |
2024-08-22 |
Sigray, Inc. |
X-ray detector system with at least two stacked flat bragg diffractors
|
|
US12181423B1
(en)
|
2023-09-07 |
2024-12-31 |
Sigray, Inc. |
Secondary image removal using high resolution x-ray transmission sources
|
|
WO2025101530A1
(en)
*
|
2023-11-07 |
2025-05-15 |
Sigray, Inc. |
System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
|
|
US12429436B2
(en)
|
2024-01-08 |
2025-09-30 |
Sigray, Inc. |
X-ray analysis system with focused x-ray beam and non-x-ray microscope
|
|
WO2025155719A1
(en)
|
2024-01-18 |
2025-07-24 |
Sigray, Inc. |
Sequential array of x-ray imaging detectors
|
|
US12431256B2
(en)
|
2024-02-15 |
2025-09-30 |
Sigray, Inc. |
System and method for generating a focused x-ray beam
|