CN1829910B - 实现xanes分析的方法和设备 - Google Patents

实现xanes分析的方法和设备 Download PDF

Info

Publication number
CN1829910B
CN1829910B CN2004800219329A CN200480021932A CN1829910B CN 1829910 B CN1829910 B CN 1829910B CN 2004800219329 A CN2004800219329 A CN 2004800219329A CN 200480021932 A CN200480021932 A CN 200480021932A CN 1829910 B CN1829910 B CN 1829910B
Authority
CN
China
Prior art keywords
ray
rays
sample
energy
optics
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2004800219329A
Other languages
English (en)
Chinese (zh)
Other versions
CN1829910A (zh
Inventor
陈泽武
沃尔特·吉布森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
X-Ray Optical Systems Inc
Original Assignee
X-Ray Optical Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by X-Ray Optical Systems Inc filed Critical X-Ray Optical Systems Inc
Publication of CN1829910A publication Critical patent/CN1829910A/zh
Application granted granted Critical
Publication of CN1829910B publication Critical patent/CN1829910B/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN2004800219329A 2003-06-02 2004-06-02 实现xanes分析的方法和设备 Expired - Fee Related CN1829910B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US47514803P 2003-06-02 2003-06-02
US60/475,148 2003-06-02
PCT/US2004/017454 WO2004111624A2 (en) 2003-06-02 2004-06-02 Method and apparatus for implementing xanes analysis

Publications (2)

Publication Number Publication Date
CN1829910A CN1829910A (zh) 2006-09-06
CN1829910B true CN1829910B (zh) 2012-05-23

Family

ID=33551526

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2004800219329A Expired - Fee Related CN1829910B (zh) 2003-06-02 2004-06-02 实现xanes分析的方法和设备

Country Status (5)

Country Link
US (1) US7206375B2 (cg-RX-API-DMAC7.html)
EP (1) EP1634065A2 (cg-RX-API-DMAC7.html)
JP (1) JP4723487B2 (cg-RX-API-DMAC7.html)
CN (1) CN1829910B (cg-RX-API-DMAC7.html)
WO (1) WO2004111624A2 (cg-RX-API-DMAC7.html)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0321039D0 (en) * 2003-09-09 2003-10-08 Council Cent Lab Res Councils Ionising particle analyser
JP2006313132A (ja) * 2005-05-09 2006-11-16 Fujitsu Ltd 試料分析方法およびｘ線分析装置
JP4908119B2 (ja) * 2005-10-19 2012-04-04 株式会社リガク 蛍光ｘ線分析装置
CA2643894A1 (en) * 2006-02-27 2007-09-07 University Of Rochester Phase contrast cone-beam ct imaging
JP5315251B2 (ja) * 2006-11-16 2013-10-16 エックス−レイ オプティカル システムズ インコーポレーテッド それぞれの結晶方位を持つ多層を有するｘ線集束光学系及びこの光学系を形成する方法
US8068582B2 (en) * 2007-02-23 2011-11-29 Passport Systems, Inc. Methods and systems for the directing and energy filtering of X-rays for non-intrusive inspection
JP5455904B2 (ja) * 2007-08-03 2014-03-26 パルセータ，エルエルシー エネルギー分散型放射線分光分析システムにおけるパイルアップ検出方法、当該方法を実行するパルスプロセッサ、および、パイルアップを検出するエネルギー分散型放射線分光分析システム
WO2009020866A1 (en) * 2007-08-03 2009-02-12 Pulsetor, Llc Adapting a high-performance pulse processor to an existing spectrometry system
CA2732754C (en) * 2007-08-03 2015-12-08 Pulsetor, Llc Digital pulse processor slope correction
US7807973B2 (en) * 2008-08-01 2010-10-05 Pulsetor, Llc Pileup rejection in an energy-dispersive radiation spectrometry system
US8130904B2 (en) 2009-01-29 2012-03-06 The Invention Science Fund I, Llc Diagnostic delivery service
US8041008B2 (en) * 2009-01-29 2011-10-18 The Invention Science Fund I, Llc Diagnostic delivery service
US20100310041A1 (en) * 2009-06-03 2010-12-09 Adams William L X-Ray System and Methods with Detector Interior to Focusing Element
WO2011125829A1 (ja) * 2010-03-31 2011-10-13 Hoya株式会社 レンズ形状測定装置
JP5256332B2 (ja) 2010-12-16 2013-08-07 住友ゴム工業株式会社 劣化解析方法
US8693626B2 (en) * 2011-06-17 2014-04-08 Uop Llc Solid material characterization with X-ray spectra in both transmission and fluoresence modes
US9851342B2 (en) 2011-11-04 2017-12-26 Sumitomo Rubber Industries, Ltd. Deterioration analyzing method
US9364191B2 (en) 2013-02-11 2016-06-14 University Of Rochester Method and apparatus of spectral differential phase-contrast cone-beam CT and hybrid cone-beam CT
US10012606B1 (en) * 2014-06-24 2018-07-03 Kla-Tencor Corporation X-ray based metrology with primary and secondary illumination sources
CN104267055B (zh) * 2014-10-10 2016-12-07 中国科学院高能物理研究所 同步辐射能量稳定装置及方法
JP6069609B2 (ja) * 2015-03-26 2017-02-01 株式会社リガク 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法
US9494536B1 (en) 2015-06-01 2016-11-15 Chevron U.S.A. Inc. Methods for predicting corrosion rate of crude oil derived samples using X-ray absorption spectroscopy
MX2018002016A (es) * 2015-08-21 2018-08-23 Adcole Corp Perfilador optico y metodos de uso del mismo.
US10677744B1 (en) * 2016-06-03 2020-06-09 U.S. Department Of Energy Multi-cone x-ray imaging Bragg crystal spectrometer
CN105891246B (zh) * 2016-06-23 2018-11-16 北京至一恒盛技术服务有限公司 一种x射线荧光探测装置
WO2018053272A1 (en) 2016-09-15 2018-03-22 University Of Washington X-ray spectrometer and methods for use
WO2018102792A1 (en) 2016-12-02 2018-06-07 Ningbo Infinite Materials Technology Co., Ltd X-ray diffraction and x-ray spectroscopy method and related apparatus
CN106770392B (zh) * 2016-12-16 2020-04-10 中国科学院长春光学精密机械与物理研究所 一种近边x射线吸收谱仪
EP3602020B1 (en) * 2017-03-22 2023-12-27 Sigray Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
CN108132484B (zh) * 2017-12-12 2020-02-14 中国计量科学研究院 一种可调节单晶单色器的调节方法
US11193884B2 (en) 2018-07-02 2021-12-07 The Research Foundation For The State University Of New York System and method for structural characterization of materials by supervised machine learning-based analysis of their spectra
FI131496B1 (en) * 2018-10-19 2025-05-23 Commw Scient Ind Res Org Energy-dispersive X-ray diffraction analyzer with an improved reflection geometry
CN110793982B (zh) * 2019-11-21 2022-03-04 山东建筑大学 一种纳米晶化动力学过程的高能x射线表征方法
WO2021237237A1 (en) 2020-05-18 2021-11-25 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
CN111650226B (zh) * 2020-05-27 2023-08-25 中国科学院上海应用物理研究所 一种基于实验室x射线源的中能x射线吸收谱仪
JP7640682B2 (ja) 2020-09-17 2025-03-05 シグレイ、インコーポレイテッド Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法
WO2022126071A1 (en) 2020-12-07 2022-06-16 Sigray, Inc. High throughput 3d x-ray imaging system using a transmission x-ray source
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
CN119173759A (zh) 2022-05-02 2024-12-20 斯格瑞公司 X射线顺序阵列波长色散光谱仪
WO2024173256A1 (en) 2023-02-16 2024-08-22 Sigray, Inc. X-ray detector system with at least two stacked flat bragg diffractors
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
WO2025101530A1 (en) * 2023-11-07 2025-05-15 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
US12429436B2 (en) 2024-01-08 2025-09-30 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
US12431256B2 (en) 2024-02-15 2025-09-30 Sigray, Inc. System and method for generating a focused x-ray beam

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4642811A (en) * 1984-06-12 1987-02-10 Northwestern University EXAFS spectrometer
JPH0618700A (ja) * 1991-06-20 1994-01-28 Jeol Ltd Ｘ線モノクロメータ
JP3245475B2 (ja) * 1993-02-19 2002-01-15 理学電機株式会社 Ｅｘａｆｓ測定装置
EP0884736B1 (en) * 1997-06-11 2004-01-28 Istituto Nazionale Di Fisica Nucleare Multi-stepped diffractor constructed with constant step width angle (multi-stepped monochromator)
JP2001021507A (ja) * 1999-07-05 2001-01-26 Rigaku Corp Ｘａｆｓ測定装置
JP3488843B2 (ja) * 1999-08-26 2004-01-19 理学電機株式会社 Ｘ線分光装置及びｘａｆｓ測定装置
JP3661998B2 (ja) * 2001-03-19 2005-06-22 株式会社半導体理工学研究センター Ｘ線を用いた半導体装置の評価方法および評価装置
JP3729341B2 (ja) * 2001-11-12 2005-12-21 株式会社島津製作所 蛍光ｘ線分析装置

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
A.Bianconi and M.Dell＇Ariccia.Multiple-scattering resonances and structural effects in the X-ray-absorption near-edge of FeII hexacyanide complexes.Physical Review B26 12.1982,26(12),6502-6508.
A.Bianconi and M.Dell＇Ariccia.Multiple-scattering resonances and structural effects in the X-ray-absorption near-edge of FeII hexacyanide complexes.Physical Review B26 12.1982,26(12),6502-6508. *
Antonio Bianconi.Surface X-Ray Absorption Spectroscopy: Surface EXAFSand Surface XANES.Applications of Surface Science6.1980,6392-418. *

Also Published As

Publication number Publication date
WO2004111624A2 (en) 2004-12-23
CN1829910A (zh) 2006-09-06
JP4723487B2 (ja) 2011-07-13
US7206375B2 (en) 2007-04-17
US20060120508A1 (en) 2006-06-08
EP1634065A2 (en) 2006-03-15
JP2006526789A (ja) 2006-11-24
WO2004111624A3 (en) 2005-03-10

Similar Documents

Publication Publication Date Title
JP4723487B2 (ja) Ｘ線吸収端近傍構造解析を実行するためのｘａｎｅｓ解析システム及びその方法
US6934359B2 (en) Wavelength dispersive XRF system using focusing optic for excitation and a focusing monochromator for collection
US9449780B2 (en) X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics
US9048001B2 (en) XRF system having multiple excitation energy bands in highly aligned package
US20190011379A1 (en) Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
US10256002B2 (en) Support structure and highly aligned monochromatic X-ray optics for X-ray analysis engines and analyzers
JP6851107B2 (ja) Ｘ線分析装置
US7991116B2 (en) Monochromatic x-ray micro beam for trace element mapping
KR20020060705A (ko) Ｘ선 측정 및 검사용 복합체
EP3602020B1 (en) Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
Chevallier et al. X-ray microprobes
Wang et al. Research on a laboratory monochromatic micro X-ray fluorescence spectrometer based on polycapillary X-ray lenses and flat crystal
CN109187589B (zh) 一种大焦斑共聚焦x射线光谱分析装置
Lennie et al. A novel facility using a Laue focusing monochromator for high-pressure diffraction at the SRS, Daresbury, UK
Wittry et al. X-ray crystal spectrometers and monochromators in microanalysis
JPH08220027A (ja) 蛍光ｘ線分析装置
MacDowell et al. Progress toward submicron hard x-ray imaging using elliptically bent mirrors and its applications
AA et al. Progress towards sub-micron hard x-ray imaging using elliptically bent mirrors and its applications
JPH1172447A (ja) Ｘ線回折装置
HK1070984B (en) An x-ray fluorescence spectroscopy system and an xrf spectroscopy method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20120523

Termination date: 20170602