MX2018002016A - Perfilador optico y metodos de uso del mismo. - Google Patents
Perfilador optico y metodos de uso del mismo.Info
- Publication number
- MX2018002016A MX2018002016A MX2018002016A MX2018002016A MX2018002016A MX 2018002016 A MX2018002016 A MX 2018002016A MX 2018002016 A MX2018002016 A MX 2018002016A MX 2018002016 A MX2018002016 A MX 2018002016A MX 2018002016 A MX2018002016 A MX 2018002016A
- Authority
- MX
- Mexico
- Prior art keywords
- light
- location values
- photosensor
- processor
- optical profiler
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
Se describe un perfilador óptico que incluye una fuente de luz configurada para proporcionar un punto de luz sobre una superficie de un objeto de interés. Un receptor de luz incluye un lente y un fotosensor que está configurado para recibir y formar la imagen de la luz proveniente de la superficie del objeto. Un dispositivo de cómputo de medición del perfil está conectado al fotosensor e incluye un procesador y una memoria conectada al procesador que está configurada para ser capaz de ejecutar las instrucciones programadas que comprenden y son almacenadas en la memoria para calcular una pluralidad de valores de posición para el punto de luz sobre la superficie del objeto, con base en la luz imaginada proveniente de la superficie del objeto, en donde cada uno de los valores de posición están asociados con un valor de rotación angular basado en una rotación del objeto alrededor de un eje rotacional. Un perfil del objeto es generado con base en los valores de posición calculados.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201562208093P | 2015-08-21 | 2015-08-21 | |
PCT/US2016/048060 WO2017035080A1 (en) | 2015-08-21 | 2016-08-22 | Optical profiler and methods of use thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2018002016A true MX2018002016A (es) | 2018-08-23 |
Family
ID=58100898
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2018002016A MX2018002016A (es) | 2015-08-21 | 2016-08-22 | Perfilador optico y metodos de uso del mismo. |
Country Status (7)
Country | Link |
---|---|
US (1) | US20170052024A1 (es) |
JP (1) | JP2018523831A (es) |
CN (1) | CN108027257A (es) |
CA (1) | CA2995228A1 (es) |
DE (1) | DE112016003805T5 (es) |
MX (1) | MX2018002016A (es) |
WO (1) | WO2017035080A1 (es) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3023736B1 (en) * | 2013-07-19 | 2018-03-28 | Nikon Corporation | Device, method and program for shape measurement, as well as structural object production system |
MX2017015182A (es) * | 2015-06-01 | 2018-04-20 | Nippon Steel & Sumitomo Metal Corp | Metodo y dispositivo para inspeccionar cigüeñal. |
GB2561238A (en) * | 2017-04-07 | 2018-10-10 | Univ Bath | Apparatus and method for monitoring objects in space |
DE102017114873B4 (de) * | 2017-07-04 | 2019-05-29 | Schenck Rotec Gmbh | Verfahren und Vorrichtung zum dreidimensionalen Erfassen einer dreidimensionalen Oberfläche eines Werkstücks |
US10408612B1 (en) | 2018-06-27 | 2019-09-10 | Toyota Motor Engineering & Manufacturing North America, Inc. | Apparatus for non-contact optical evaluation of camshaft lobe surface roughness |
WO2020144212A1 (en) | 2019-01-08 | 2020-07-16 | Topsil Globalwafers A/S | A marking scanner |
US20220099824A1 (en) * | 2020-09-25 | 2022-03-31 | Rohde & Schwarz Gmbh & Co. Kg | Radar target simulation system and radar target simulation method |
CN113587846A (zh) * | 2021-08-01 | 2021-11-02 | 北京工业大学 | 一种基于坐标变换原理的小模数齿形检测方法 |
JP7345765B2 (ja) | 2021-08-18 | 2023-09-19 | 三菱電線工業株式会社 | リング状製品の寸法測定装置及びリング状製品の寸法測定方法 |
Family Cites Families (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3583815A (en) * | 1969-05-01 | 1971-06-08 | Nasa | Angular displacement indicating gas bearing support system |
US3918816A (en) * | 1974-04-22 | 1975-11-11 | Autech Corp | Tire inspection apparatus |
US4993826A (en) * | 1987-11-25 | 1991-02-19 | Taunton Technologies, Inc. | Topography measuring apparatus |
JPH01278019A (ja) * | 1988-04-28 | 1989-11-08 | Canon Inc | リソグラフィ用マスクの構造体 |
US4906098A (en) * | 1988-05-09 | 1990-03-06 | Glass Technology Development Corporation | Optical profile measuring apparatus |
JP2746511B2 (ja) * | 1993-03-04 | 1998-05-06 | 信越半導体株式会社 | 単結晶インゴットのオリエンテーションフラット幅測定方法 |
GB2293291B (en) * | 1994-09-10 | 1998-05-06 | Taskdisk Ltd | Inspection system for electronic assemblies such as printed circuit boards |
US5694214A (en) * | 1996-01-08 | 1997-12-02 | Hitachi Electronics Engineering Co., Ltd. | Surface inspection method and apparatus |
US5953126A (en) * | 1996-10-17 | 1999-09-14 | Lucid Inc | Optical profilometry |
US6666855B2 (en) * | 1999-09-14 | 2003-12-23 | Visx, Inc. | Methods and systems for laser calibration and eye tracker camera alignment |
JP2001221747A (ja) * | 2000-02-03 | 2001-08-17 | Suntory Ltd | 液体充填用容器の撮像方法および装置 |
US6577447B1 (en) * | 2000-10-20 | 2003-06-10 | Nikon Corporation | Multi-lens array of a wavefront sensor for reducing optical interference and method thereof |
TWI220999B (en) * | 2001-02-13 | 2004-09-11 | Nikon Corp | Measuring method of image formation characteristic, exposure method, exposure apparatus and its adjustment method, manufacture method of device, and recording medium |
DE10119662C2 (de) * | 2001-04-20 | 2003-04-10 | Loh Optikmaschinen Ag | Verfahren zur Randbearbeitung von optischen Linsen |
EP1634065A2 (en) * | 2003-06-02 | 2006-03-15 | X-Ray Optical Systems, Inc. | Method and apparatus for implementing xanes analysis |
DE10353961B4 (de) * | 2003-11-19 | 2005-09-22 | Carl Zeiss | Mikroskopiesystem und Verfahren zum Steuern eines Mikroskopiesystems |
DE112006000841T5 (de) * | 2005-04-14 | 2008-02-28 | Matsushita Electric Industrial Co., Ltd., Kadoma | Vorrichtung und Verfahren zum Prüfen der äußeren Erscheinung |
US7480040B2 (en) * | 2005-11-22 | 2009-01-20 | Owens-Brockway Glass Container Inc. | Method and apparatus for inspecting container sidewall contour |
US7840431B2 (en) * | 2006-06-28 | 2010-11-23 | International Business Machines Corporation | Optimal group of service compositions |
JP5043013B2 (ja) * | 2006-07-31 | 2012-10-10 | Hoya株式会社 | レンズ形状測定装置及び方法、並びに眼鏡レンズの製造方法 |
JP2008051556A (ja) * | 2006-08-22 | 2008-03-06 | Sii Nanotechnology Inc | 光学式変位検出機構及びそれを用いた表面情報計測装置 |
US7684054B2 (en) * | 2006-08-25 | 2010-03-23 | Gii Acquisition, Llc | Profile inspection system for threaded and axial components |
GB0625442D0 (en) * | 2006-12-20 | 2007-01-31 | Csl Surveys Stevenage Ltd | Profiling device |
US7804442B2 (en) * | 2007-01-24 | 2010-09-28 | Reveal Imaging, Llc | Millimeter wave (MMW) screening portal systems, devices and methods |
JP5179172B2 (ja) * | 2007-12-29 | 2013-04-10 | 株式会社ニデック | 眼鏡レンズ研削加工装置 |
TWI387721B (zh) * | 2008-11-21 | 2013-03-01 | Ind Tech Res Inst | 三維形貌檢測裝置 |
CN101629814B (zh) * | 2009-04-01 | 2011-01-12 | 北京理工大学 | 差动共焦瞄准触发式空心球体内外轮廓及壁厚测量方法与装置 |
DE102010010340B4 (de) * | 2010-03-04 | 2013-11-28 | Schneider Gmbh & Co. Kg | Messanordnung zum Vermessen eines Brillengestells |
US9714824B2 (en) * | 2010-03-31 | 2017-07-25 | Hoya Corporation | Lens shape measurement device |
WO2013056861A1 (en) * | 2011-10-21 | 2013-04-25 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Optical device and method for measuring a complexly formed object |
CN104780973A (zh) * | 2012-11-05 | 2015-07-15 | 三菱电机株式会社 | 三维图像拍摄系统及粒子射线治疗装置 |
US9486840B2 (en) * | 2013-05-24 | 2016-11-08 | Gii Acquisition, Llc | High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts |
US9702977B2 (en) * | 2013-03-15 | 2017-07-11 | Leap Motion, Inc. | Determining positional information of an object in space |
CN109521397B (zh) * | 2013-06-13 | 2023-03-28 | 巴斯夫欧洲公司 | 用于光学地检测至少一个对象的检测器 |
EP2947417B1 (de) * | 2014-05-23 | 2019-12-18 | VOCO GmbH | Vorrichtung und Verfahren zum Erfassen einer 3D-Struktur eines Objekts |
US9491863B2 (en) * | 2014-06-26 | 2016-11-08 | Align Technology, Inc. | Mounting system that maintains stability of optics as temperature changes |
BR112017002129B1 (pt) * | 2014-08-04 | 2022-01-04 | Nissan Motor Co., Ltd | Aparelho de cálculo de autoposição e método de cálculo de autoposição |
-
2016
- 2016-08-22 DE DE112016003805.4T patent/DE112016003805T5/de not_active Withdrawn
- 2016-08-22 CN CN201680052681.3A patent/CN108027257A/zh active Pending
- 2016-08-22 US US15/243,498 patent/US20170052024A1/en not_active Abandoned
- 2016-08-22 WO PCT/US2016/048060 patent/WO2017035080A1/en active Application Filing
- 2016-08-22 CA CA2995228A patent/CA2995228A1/en not_active Abandoned
- 2016-08-22 JP JP2018509842A patent/JP2018523831A/ja active Pending
- 2016-08-22 MX MX2018002016A patent/MX2018002016A/es unknown
Also Published As
Publication number | Publication date |
---|---|
WO2017035080A1 (en) | 2017-03-02 |
JP2018523831A (ja) | 2018-08-23 |
DE112016003805T5 (de) | 2018-05-24 |
US20170052024A1 (en) | 2017-02-23 |
CA2995228A1 (en) | 2017-03-02 |
CN108027257A (zh) | 2018-05-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
MX2018002016A (es) | Perfilador optico y metodos de uso del mismo. | |
NZ742532A (en) | Light field display metrology | |
EP3248141A4 (en) | Multifunction fingerprint sensor having optical sensing against fingerprint spoofing | |
SG10201708623PA (en) | Processing an image to identify a metric associated with the image and/or to determine a value for the metric | |
EP3552180A4 (en) | DISTANCE SENSOR WITH IMAGING SENSOR WITH ADJUSTABLE FOCUS | |
DK3844948T3 (da) | Computervisionssystem med dybdedetektering | |
FR3026031B1 (fr) | Dispositif de protection d'un capteur optique | |
TWM490015U (en) | Imaging lens and imaging apparatus equipped with the imaging lens | |
NZ713004A (en) | Apparatus and method of monitoring moving objects | |
NZ730031A (en) | Distance measurement device for motion picture camera focus applications | |
MX2017014704A (es) | Vision del vehiculo. | |
FR3041248B1 (fr) | Appareil de soin avec guide de lumiere | |
FR3027006B1 (fr) | Dispositif de protection d’un capteur optique | |
BR112017021042A2 (pt) | método de medição, e terminal | |
IL253670A0 (en) | Optical metrology with reduced focusing error sensitivity | |
EP3475987A4 (en) | IMAGE SENSOR BASED ON AVALANCHE PHOTODIODS | |
ES2968291T3 (es) | Detección basada en fibra óptica de alta sensibilidad | |
EP3153843A4 (en) | Polarization sensitive optical image measurement system, and program loaded into said system | |
EP3252514A4 (en) | Imaging lens, imaging device using same, and distance measuring system | |
EP2756921A3 (en) | Eyeglass lens processing apparatus and processing control data generating program | |
EP3659064A4 (en) | OPTICAL FINGERPRINT SENSOR WITH SCREED LIGHT DETECTION | |
BR112014023224A8 (pt) | aparelho de captura de imagem | |
MX358091B (es) | Dispositivo de inspección del ángulo del eje óptico. | |
MX2018000903A (es) | Determinacion de la posicion de un dispositivo en un vehiculo. | |
TW201614223A (en) | Wafer edge inspection with trajectory following edge profile |