MX2018002016A - Perfilador optico y metodos de uso del mismo. - Google Patents
Perfilador optico y metodos de uso del mismo.Info
- Publication number
- MX2018002016A MX2018002016A MX2018002016A MX2018002016A MX2018002016A MX 2018002016 A MX2018002016 A MX 2018002016A MX 2018002016 A MX2018002016 A MX 2018002016A MX 2018002016 A MX2018002016 A MX 2018002016A MX 2018002016 A MX2018002016 A MX 2018002016A
- Authority
- MX
- Mexico
- Prior art keywords
- light
- location values
- photosensor
- processor
- optical profiler
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
Se describe un perfilador óptico que incluye una fuente de luz configurada para proporcionar un punto de luz sobre una superficie de un objeto de interés. Un receptor de luz incluye un lente y un fotosensor que está configurado para recibir y formar la imagen de la luz proveniente de la superficie del objeto. Un dispositivo de cómputo de medición del perfil está conectado al fotosensor e incluye un procesador y una memoria conectada al procesador que está configurada para ser capaz de ejecutar las instrucciones programadas que comprenden y son almacenadas en la memoria para calcular una pluralidad de valores de posición para el punto de luz sobre la superficie del objeto, con base en la luz imaginada proveniente de la superficie del objeto, en donde cada uno de los valores de posición están asociados con un valor de rotación angular basado en una rotación del objeto alrededor de un eje rotacional. Un perfil del objeto es generado con base en los valores de posición calculados.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562208093P | 2015-08-21 | 2015-08-21 | |
| PCT/US2016/048060 WO2017035080A1 (en) | 2015-08-21 | 2016-08-22 | Optical profiler and methods of use thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MX2018002016A true MX2018002016A (es) | 2018-08-23 |
Family
ID=58100898
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2018002016A MX2018002016A (es) | 2015-08-21 | 2016-08-22 | Perfilador optico y metodos de uso del mismo. |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20170052024A1 (es) |
| JP (1) | JP2018523831A (es) |
| CN (1) | CN108027257A (es) |
| CA (1) | CA2995228A1 (es) |
| DE (1) | DE112016003805T5 (es) |
| MX (1) | MX2018002016A (es) |
| WO (1) | WO2017035080A1 (es) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6128219B2 (ja) * | 2013-07-19 | 2017-05-17 | 株式会社ニコン | 形状測定装置、構造物製造システム、形状測定方法、構造物製造方法、形状測定プログラム、及び記録媒体 |
| US10132618B2 (en) * | 2015-06-01 | 2018-11-20 | Nippon Steel & Sumitomo Metal Corporation | Method and device for inspecting crankshaft |
| GB2561238A (en) * | 2017-04-07 | 2018-10-10 | Univ Bath | Apparatus and method for monitoring objects in space |
| DE102017114873B4 (de) * | 2017-07-04 | 2019-05-29 | Schenck Rotec Gmbh | Verfahren und Vorrichtung zum dreidimensionalen Erfassen einer dreidimensionalen Oberfläche eines Werkstücks |
| US10408612B1 (en) | 2018-06-27 | 2019-09-10 | Toyota Motor Engineering & Manufacturing North America, Inc. | Apparatus for non-contact optical evaluation of camshaft lobe surface roughness |
| KR102773324B1 (ko) | 2019-01-08 | 2025-02-27 | 탑실 글로벌웨이퍼즈 에이에스 | 마킹 스캐너 |
| US12019150B2 (en) * | 2020-09-25 | 2024-06-25 | Rohde & Schwarz Gmbh & Co. Kg | Radar target simulation system and radar target simulation method |
| CN112325832A (zh) * | 2020-10-21 | 2021-02-05 | 广东省珠海市质量计量监督检测所 | 一种刀口尺棱边直线度的直接测量装置及方法 |
| CN113587846A (zh) * | 2021-08-01 | 2021-11-02 | 北京工业大学 | 一种基于坐标变换原理的小模数齿形检测方法 |
| JP7345765B2 (ja) * | 2021-08-18 | 2023-09-19 | 三菱電線工業株式会社 | リング状製品の寸法測定装置及びリング状製品の寸法測定方法 |
| US12529551B2 (en) | 2024-02-29 | 2026-01-20 | Rtx Corporation | Autonomous inspection of a surface topology of an airfoil of a gas turbine engine |
| US12523617B2 (en) * | 2024-02-29 | 2026-01-13 | Rtx Corporation | Autonomous inspection of a surface topology of an airfoil of a gas turbine engine |
Family Cites Families (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3583815A (en) * | 1969-05-01 | 1971-06-08 | Nasa | Angular displacement indicating gas bearing support system |
| US3918816A (en) * | 1974-04-22 | 1975-11-11 | Autech Corp | Tire inspection apparatus |
| US4993826A (en) * | 1987-11-25 | 1991-02-19 | Taunton Technologies, Inc. | Topography measuring apparatus |
| JPH01278019A (ja) * | 1988-04-28 | 1989-11-08 | Canon Inc | リソグラフィ用マスクの構造体 |
| US4906098A (en) * | 1988-05-09 | 1990-03-06 | Glass Technology Development Corporation | Optical profile measuring apparatus |
| JP2746511B2 (ja) * | 1993-03-04 | 1998-05-06 | 信越半導体株式会社 | 単結晶インゴットのオリエンテーションフラット幅測定方法 |
| GB2293291B (en) * | 1994-09-10 | 1998-05-06 | Taskdisk Ltd | Inspection system for electronic assemblies such as printed circuit boards |
| US5694214A (en) * | 1996-01-08 | 1997-12-02 | Hitachi Electronics Engineering Co., Ltd. | Surface inspection method and apparatus |
| US5953126A (en) * | 1996-10-17 | 1999-09-14 | Lucid Inc | Optical profilometry |
| US6666855B2 (en) * | 1999-09-14 | 2003-12-23 | Visx, Inc. | Methods and systems for laser calibration and eye tracker camera alignment |
| JP2001221747A (ja) * | 2000-02-03 | 2001-08-17 | Suntory Ltd | 液体充填用容器の撮像方法および装置 |
| US6577447B1 (en) * | 2000-10-20 | 2003-06-10 | Nikon Corporation | Multi-lens array of a wavefront sensor for reducing optical interference and method thereof |
| TWI220998B (en) * | 2001-02-13 | 2004-09-11 | Nikon Corp | Exposure method, exposure apparatus and manufacture method of the same |
| DE10119662C2 (de) * | 2001-04-20 | 2003-04-10 | Loh Optikmaschinen Ag | Verfahren zur Randbearbeitung von optischen Linsen |
| WO2004111624A2 (en) * | 2003-06-02 | 2004-12-23 | X-Ray Optical Systems, Inc. | Method and apparatus for implementing xanes analysis |
| DE10353961B4 (de) * | 2003-11-19 | 2005-09-22 | Carl Zeiss | Mikroskopiesystem und Verfahren zum Steuern eines Mikroskopiesystems |
| JP4874103B2 (ja) * | 2005-04-14 | 2012-02-15 | パナソニック株式会社 | 外観検査装置及び方法 |
| US7480040B2 (en) * | 2005-11-22 | 2009-01-20 | Owens-Brockway Glass Container Inc. | Method and apparatus for inspecting container sidewall contour |
| US7840431B2 (en) * | 2006-06-28 | 2010-11-23 | International Business Machines Corporation | Optimal group of service compositions |
| WO2008016066A1 (fr) * | 2006-07-31 | 2008-02-07 | Hoya Corporation | Dispositif et procédé de mesure de forme de lentille, procédé de production de lentille et procédé de production de lunettes |
| JP2008051556A (ja) * | 2006-08-22 | 2008-03-06 | Sii Nanotechnology Inc | 光学式変位検出機構及びそれを用いた表面情報計測装置 |
| US7684054B2 (en) * | 2006-08-25 | 2010-03-23 | Gii Acquisition, Llc | Profile inspection system for threaded and axial components |
| GB0625442D0 (en) * | 2006-12-20 | 2007-01-31 | Csl Surveys Stevenage Ltd | Profiling device |
| US7804442B2 (en) * | 2007-01-24 | 2010-09-28 | Reveal Imaging, Llc | Millimeter wave (MMW) screening portal systems, devices and methods |
| JP5179172B2 (ja) * | 2007-12-29 | 2013-04-10 | 株式会社ニデック | 眼鏡レンズ研削加工装置 |
| TWI387721B (zh) * | 2008-11-21 | 2013-03-01 | 財團法人工業技術研究院 | 三維形貌檢測裝置 |
| CN101629814B (zh) * | 2009-04-01 | 2011-01-12 | 北京理工大学 | 差动共焦瞄准触发式空心球体内外轮廓及壁厚测量方法与装置 |
| DE102010010340B4 (de) * | 2010-03-04 | 2013-11-28 | Schneider Gmbh & Co. Kg | Messanordnung zum Vermessen eines Brillengestells |
| JP5801796B2 (ja) * | 2010-03-31 | 2015-10-28 | Hoya株式会社 | レンズ形状測定装置 |
| EP2769176B1 (en) * | 2011-10-21 | 2015-11-04 | Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V. | Optical device and method for measuring a complexly formed object |
| US9913996B2 (en) * | 2012-11-05 | 2018-03-13 | Mitsubishi Electric Corporation | Three-dimensional image capture system and particle beam therapy system |
| US9486840B2 (en) * | 2013-05-24 | 2016-11-08 | Gii Acquisition, Llc | High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts |
| WO2014200589A2 (en) * | 2013-03-15 | 2014-12-18 | Leap Motion, Inc. | Determining positional information for an object in space |
| JP2016529473A (ja) * | 2013-06-13 | 2016-09-23 | ビーエーエスエフ ソシエタス・ヨーロピアBasf Se | 少なくとも1つの物体を光学的に検出する検出器 |
| EP2947417B1 (de) * | 2014-05-23 | 2019-12-18 | VOCO GmbH | Vorrichtung und Verfahren zum Erfassen einer 3D-Struktur eines Objekts |
| US9491863B2 (en) * | 2014-06-26 | 2016-11-08 | Align Technology, Inc. | Mounting system that maintains stability of optics as temperature changes |
| JP6269838B2 (ja) * | 2014-08-04 | 2018-01-31 | 日産自動車株式会社 | 自己位置算出装置及び自己位置算出方法 |
-
2016
- 2016-08-22 DE DE112016003805.4T patent/DE112016003805T5/de not_active Withdrawn
- 2016-08-22 CA CA2995228A patent/CA2995228A1/en not_active Abandoned
- 2016-08-22 JP JP2018509842A patent/JP2018523831A/ja active Pending
- 2016-08-22 US US15/243,498 patent/US20170052024A1/en not_active Abandoned
- 2016-08-22 WO PCT/US2016/048060 patent/WO2017035080A1/en not_active Ceased
- 2016-08-22 MX MX2018002016A patent/MX2018002016A/es unknown
- 2016-08-22 CN CN201680052681.3A patent/CN108027257A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2017035080A1 (en) | 2017-03-02 |
| CN108027257A (zh) | 2018-05-11 |
| US20170052024A1 (en) | 2017-02-23 |
| DE112016003805T5 (de) | 2018-05-24 |
| CA2995228A1 (en) | 2017-03-02 |
| JP2018523831A (ja) | 2018-08-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| MX2018002016A (es) | Perfilador optico y metodos de uso del mismo. | |
| NZ742532A (en) | Light field display metrology | |
| EP3552180A4 (en) | DISTANCE SENSOR INCLUDING ADJUSTABLE FOCUS IMAGING SENSOR | |
| EP3732658A4 (en) | AUTOMATIC IMAGE CORRECTION USING AUTOMATIC LEARNING | |
| EP3614902A4 (en) | TELEMETRY IN OPTICAL IMAGING | |
| BR112017021858A2 (pt) | lente oftálmica com microlentes graduadas. | |
| EP3248141A4 (en) | Multifunction fingerprint sensor having optical sensing against fingerprint spoofing | |
| DK3844948T3 (da) | Computervisionssystem med dybdedetektering | |
| EP3109696A4 (en) | OPTICAL IRRADIATOR AND IMAGE DISPLAY DEVICE THEREFOR | |
| EP3631683A4 (en) | ELECTRONIC DEVICE INCLUDING AN OPTICAL SENSOR | |
| EP3610221A4 (en) | ULTRA-LIGHT AND ULTRA-PRECISE PORTABLE COORDINATE MEASURING MACHINE | |
| FR3026031B1 (fr) | Dispositif de protection d'un capteur optique | |
| EP3306264A4 (en) | DEVICE FOR THREE-DIMENSIONAL MEASUREMENT | |
| EP2940504C0 (en) | OPTICAL SENSOR | |
| SG11201706232UA (en) | Optical metrology with reduced focus error sensitivity | |
| EP3367125A4 (en) | WIND MEASURING DEVICE | |
| EP3433655A4 (en) | OPTICAL ARRANGEMENTS WITH FRESNELLINE ELEMENTS | |
| FR3027006B1 (fr) | Dispositif de protection d’un capteur optique | |
| NZ730031A (en) | Distance measurement device for motion picture camera focus applications | |
| MX385851B (es) | Dispositivo de adquisicion de imagenes, metodo de adquisicion de imagenes y programa de correccion de imagenes. | |
| EP3472866A4 (en) | DYNAMIC WIDE IMAGE SENSOR | |
| DK3363752T3 (da) | Afstablerindretning med roterende bakkeaflastning | |
| MX2017014704A (es) | Vision del vehiculo. | |
| EP3622315A4 (en) | SEMICONDUCTOR LIGHT DISTANCE DETECTION AND TELEMETRY (LIDAR) SYSTEM | |
| IL237720B (en) | Cmos image sensor with backside biased substrate |