JP2006503495A5 - - Google Patents

Download PDF

Info

Publication number
JP2006503495A5
JP2006503495A5 JP2004545220A JP2004545220A JP2006503495A5 JP 2006503495 A5 JP2006503495 A5 JP 2006503495A5 JP 2004545220 A JP2004545220 A JP 2004545220A JP 2004545220 A JP2004545220 A JP 2004545220A JP 2006503495 A5 JP2006503495 A5 JP 2006503495A5
Authority
JP
Japan
Prior art keywords
capacitor
voltage
signal
plate
interval
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004545220A
Other languages
English (en)
Japanese (ja)
Other versions
JP4256846B2 (ja
JP2006503495A (ja
Filing date
Publication date
Priority claimed from US10/272,045 external-priority patent/US7167121B2/en
Application filed filed Critical
Publication of JP2006503495A publication Critical patent/JP2006503495A/ja
Publication of JP2006503495A5 publication Critical patent/JP2006503495A5/ja
Application granted granted Critical
Publication of JP4256846B2 publication Critical patent/JP4256846B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2004545220A 2002-10-16 2003-07-29 アナログ／ディジタル変換に使用する電荷再分配による電圧基準生成の方法および装置 Expired - Fee Related JP4256846B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/272,045 US7167121B2 (en) 2002-10-16 2002-10-16 Method and apparatus for split reference sampling
PCT/US2003/023455 WO2004036756A1 (en) 2002-10-16 2003-07-29 Method and apparatus for voltage reference generation by charge redistribution for use in analog to digital conversion

Publications (3)

Publication Number Publication Date
JP2006503495A JP2006503495A (ja) 2006-01-26
JP2006503495A5 true JP2006503495A5 (enExample) 2006-09-14
JP4256846B2 JP4256846B2 (ja) 2009-04-22

Family

ID=32092562

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004545220A Expired - Fee Related JP4256846B2 (ja) 2002-10-16 2003-07-29 アナログ／ディジタル変換に使用する電荷再分配による電圧基準生成の方法および装置

Country Status (8)

Country Link
US (1) US7167121B2 (enExample)
EP (1) EP1552615B1 (enExample)
JP (1) JP4256846B2 (enExample)
CN (1) CN100466476C (enExample)
AT (1) ATE377293T1 (enExample)
AU (1) AU2003259260A1 (enExample)
DE (1) DE60317226T2 (enExample)
WO (1) WO2004036756A1 (enExample)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040131131A1 (en) * 2003-01-03 2004-07-08 Peach Charles T. Double-sampled, sample-and-hold circuit with downconversion
US7023372B1 (en) * 2005-02-09 2006-04-04 Analog Devices, Inc. Method and apparatus for segmented, switched analog/digital converter
US8704581B2 (en) * 2007-04-23 2014-04-22 Qualcomm Incorporated Switched capacitor integration and summing circuits
DE102007033689B4 (de) * 2007-07-19 2009-03-19 Texas Instruments Deutschland Gmbh Analog-Digital-Wandler mit sukzessivem Approximationsregister und großem Eingangsbereich
US7675452B2 (en) 2008-05-01 2010-03-09 Analog Devices, Inc. Successive approximation register analog to digital converter with improved immunity to time varying noise
US8330436B2 (en) 2008-06-30 2012-12-11 Intel Corporation Series and parallel hybrid switched capacitor networks for IC power delivery
EP2173031B1 (en) * 2008-10-01 2012-06-06 Austriamicrosystems AG Amplifier arrangement, measurement arrangement and signal processing method
US7834793B2 (en) * 2008-11-26 2010-11-16 Analog Devices, Inc. Self-timed clocked analog to digital converter
CN101753114B (zh) * 2008-12-15 2012-09-26 财团法人工业技术研究院 滤波降频装置与通信接收器
DE102009004564B4 (de) * 2009-01-14 2013-08-22 Texas Instruments Deutschland Gmbh ADC mit energiesparender Abtastung
JP5310222B2 (ja) * 2009-04-20 2013-10-09 富士通株式会社 電荷分配型デジタル・アナログ変換器及びそれを有する逐次比較型アナログ・デジタル変換器
KR101409657B1 (ko) * 2009-09-04 2014-06-18 후지쯔 가부시끼가이샤 스위치드 커패시터 회로, ａｄ 변환 회로, 스위치드 커패시터 회로군, 및 ａｄ 변환 회로군
US8004448B2 (en) * 2009-11-16 2011-08-23 Analog Devices, Inc. Dual DAC structure for charge redistributed ADC
US8159382B2 (en) * 2009-11-27 2012-04-17 Texas Instruments Incorporated Low power converter and shutdown SAR ADC architecture
FR2965427B1 (fr) * 2010-09-28 2013-06-21 St Microelectronics Sa Convertisseur analogique-numerique a approximations successives compact
CN102480293B (zh) * 2010-11-25 2014-11-05 盛群半导体股份有限公司 模数转换装置
US8487659B2 (en) 2011-04-22 2013-07-16 Analog Devices, Inc. Comparator with adaptive timing
US20130002468A1 (en) * 2011-06-28 2013-01-03 International Business Machines Corporation Analog-digital converter
US8456348B2 (en) * 2011-09-22 2013-06-04 National Taiwan Normal University SAR ADC capable of reducing energy consumption
US8471740B2 (en) * 2011-11-14 2013-06-25 Analog Devices, Inc. Reducing the effect of non-linear kick-back in switched capacitor networks
US8471755B1 (en) * 2012-01-24 2013-06-25 Synopsys, Inc. Dynamic biasing in switched capacitor stages using frame capacitors
US8779957B2 (en) 2012-08-02 2014-07-15 Qualcomm Incorporated Low distortion feed-forward delta-sigma modulator
CN104124970B (zh) * 2013-04-28 2017-06-09 瑞昱半导体股份有限公司 可编程放大输入信号振幅的sar模拟数字转换器及其方法
US8836565B1 (en) * 2013-09-27 2014-09-16 Mediatek Inc. Analog to digital converter and signal converting method
KR20160115483A (ko) * 2015-03-27 2016-10-06 에스케이하이닉스 주식회사 반도체 장치
CN106160745B (zh) * 2015-03-31 2019-05-24 智原微电子(苏州)有限公司 模拟数字转换装置及其初始化方法
JP6690015B2 (ja) * 2015-12-17 2020-04-28 サーキット シード エルエルシー スケーラブル集積データ変換器
US9667266B1 (en) * 2016-02-19 2017-05-30 Analog Devices, Inc. VDD-referenced sampling
JP2017192099A (ja) * 2016-04-15 2017-10-19 ローム株式会社 逐次比較型ａ／ｄコンバータ
US12094524B2 (en) * 2020-01-30 2024-09-17 Texas Instruments Incorporated Computation in-memory using 6-transistor bit cells

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4578772A (en) * 1981-09-18 1986-03-25 Fujitsu Limited Voltage dividing circuit
SE452830B (sv) * 1985-12-02 1987-12-14 Ellemtel Utvecklings Ab Anordning for att omvandla en analog, balanserad signal (v?71i?71n?71+,v?71i?71n?71-) till en digital signal genom laddningsomfordelning i ett antal kapacitiva element
US5412387A (en) * 1993-04-06 1995-05-02 Analog Devices, Inc. Error reduction in switched capacitor digital-to-analog converter systems by balanced sampling
US5495200A (en) * 1993-04-06 1996-02-27 Analog Devices, Inc. Double sampled biquad switched capacitor filter
US5323158A (en) * 1993-04-06 1994-06-21 Analog Devices, Inc. Switched capacitor one-bit digital-to-analog converter
US5424670A (en) * 1994-01-24 1995-06-13 Analog Devices, Inc. Precision switched capacitor ratio system
US5479130A (en) * 1994-02-15 1995-12-26 Analog Devices, Inc. Auto-zero switched-capacitor integrator
US5453710A (en) * 1994-05-10 1995-09-26 Analog Devices, Inc. Quasi-passive switched-capacitor (SC) delay line
US5563597A (en) * 1994-06-06 1996-10-08 Analog Devices, Inc. Switched-capacitor one-bit digital-to-analog converter with low sensitivity to op-amp offset voltage
WO1996037951A1 (en) * 1995-05-23 1996-11-28 Analog Devices, Inc. Switched capacitor offset suppression
US6037887A (en) * 1996-03-06 2000-03-14 Burr-Brown Corporation Programmable gain for delta sigma analog-to-digital converter
US5872469A (en) * 1996-04-05 1999-02-16 Analog Devices, Inc. Switched capacitor circuit adapted to store charge on a sampling capacitor related to a sample for an analog signal voltage and to subsequently transfer such stored charge
IES80452B2 (en) * 1997-01-22 1998-07-29 Univ Cork Reduction of comparator power requirement in a switched capacitor adc
JP3852721B2 (ja) 1997-07-31 2006-12-06 旭化成マイクロシステム株式会社 Ｄ／ａ変換器およびデルタシグマ型ｄ／ａ変換器
US6040793A (en) * 1998-03-18 2000-03-21 Analog Devices, Inc. Switched-capacitor sigma-delta analog-to-digital converter with input voltage overload protection
EP1039642B1 (en) * 1999-03-24 2004-03-03 STMicroelectronics S.r.l. Analog-digital converter with single-ended input
US6707403B1 (en) * 2002-11-12 2004-03-16 Analog Devices, Inc. Analog to digital converter with a calibration circuit for compensating for coupling capacitor errors, and a method for calibrating the analog to digital converter

Similar Documents

Publication Publication Date Title
JP2006503495A5 (enExample)
JP2005502093A5 (enExample)
US6456220B1 (en) Analog-to-digital converter for processing differential and single-ended inputs
KR101926605B1 (ko) 멀티 입력채널을 가지는 샘플 앤 홀드 회로 및 이를 이용한 아날로그 디지털 변환기
US6437720B1 (en) Code independent charge transfer scheme for switched-capacitor digital-to-analog converter
CN102721893B (zh) 具有流水线化的电容感测的电路、装置和方法
EP0611165B1 (en) Programmable switched capacitor circuit
JP5769256B2 (ja) 容量−電圧インタフェース回路及び関連する動作方法
EP1341377A3 (en) Signal processing device for image pickup apparatus
US20060164279A1 (en) Sample and hold apparatus
US20210044301A1 (en) Analog-to-digital converter having quantization error duplicate mechanism
CA2355871A1 (en) Linear sampling switch
JPH03183214A (ja) 多重チャネルアナログ／ディジタル変換器
US5872469A (en) Switched capacitor circuit adapted to store charge on a sampling capacitor related to a sample for an analog signal voltage and to subsequently transfer such stored charge
JP4433702B2 (ja) 固体撮像装置およびその駆動方法
AU2003265045A1 (en) Active current mode sampling circuit
JP2022096272A5 (enExample)
JP2001111424A (ja) Ａ／ｄ変換方法
JP4974214B2 (ja) Ａ／ｄ変換器
JPH05209936A (ja) 直流レベル発生装置
JP3176860B2 (ja) 信号伝達回路、信号伝達方法、ａ／ｄ変換器および固体撮像素子
CN115901907A (zh) 纳米孔测序电路单元及基因测序装置
CN106911332B (zh) 应用于adc的参考电压产生电路
JP2005079942A5 (enExample)
TWI307580B (en) Isolated conversion apparatus for analog signal