JP2006343249A5 - - Google Patents
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- Publication number
- JP2006343249A5 JP2006343249A5 JP2005170265A JP2005170265A JP2006343249A5 JP 2006343249 A5 JP2006343249 A5 JP 2006343249A5 JP 2005170265 A JP2005170265 A JP 2005170265A JP 2005170265 A JP2005170265 A JP 2005170265A JP 2006343249 A5 JP2006343249 A5 JP 2006343249A5
- Authority
- JP
- Japan
- Prior art keywords
- probe
- shape
- measuring
- moving body
- gantry
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims 15
- 238000001514 detection method Methods 0.000 claims 5
- 238000000034 method Methods 0.000 claims 2
- 238000000926 separation method Methods 0.000 claims 2
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005170265A JP4500736B2 (ja) | 2005-06-10 | 2005-06-10 | 形状測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005170265A JP4500736B2 (ja) | 2005-06-10 | 2005-06-10 | 形状測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006343249A JP2006343249A (ja) | 2006-12-21 |
| JP2006343249A5 true JP2006343249A5 (enExample) | 2008-07-24 |
| JP4500736B2 JP4500736B2 (ja) | 2010-07-14 |
Family
ID=37640311
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005170265A Expired - Fee Related JP4500736B2 (ja) | 2005-06-10 | 2005-06-10 | 形状測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4500736B2 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5025444B2 (ja) * | 2007-12-12 | 2012-09-12 | キヤノン株式会社 | 三次元形状測定装置 |
| JP5179852B2 (ja) * | 2007-12-19 | 2013-04-10 | Ntn株式会社 | 軸受の回転精度の測定装置 |
| JP5438988B2 (ja) * | 2009-02-17 | 2014-03-12 | 株式会社ミツトヨ | 測定システムおよび干渉計 |
| JP2012237686A (ja) * | 2011-05-12 | 2012-12-06 | Canon Inc | 測定装置 |
| JP2014077692A (ja) * | 2012-10-10 | 2014-05-01 | Kosaka Laboratory Ltd | 触針式測定装置及び触針式測定装置による高さ測定方法 |
| JP6655888B2 (ja) * | 2014-08-20 | 2020-03-04 | キヤノン株式会社 | 計測装置、計測方法、および物品の製造方法 |
| JP6049786B2 (ja) * | 2015-03-05 | 2016-12-21 | 株式会社ミツトヨ | 測定プローブ |
| JP6039718B2 (ja) * | 2015-03-05 | 2016-12-07 | 株式会社ミツトヨ | 測定プローブ |
| JP6049785B2 (ja) * | 2015-03-05 | 2016-12-21 | 株式会社ミツトヨ | 測定プローブ |
| CN110388875B (zh) * | 2019-08-29 | 2021-04-06 | 合肥工业大学 | 能提高测量范围的微纳米三维接触式测量探头及控制方法 |
| JP7340761B2 (ja) * | 2019-10-28 | 2023-09-08 | パナソニックIpマネジメント株式会社 | 測定用プローブ |
| CN112066900B (zh) * | 2020-09-16 | 2022-04-29 | 江西财经大学 | 一种距离测量装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001317933A (ja) * | 2000-05-02 | 2001-11-16 | Ricoh Co Ltd | 形状測定装置 |
-
2005
- 2005-06-10 JP JP2005170265A patent/JP4500736B2/ja not_active Expired - Fee Related
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