JP2006261606A - 露光装置、露光方法及びデバイス製造方法 - Google Patents
露光装置、露光方法及びデバイス製造方法 Download PDFInfo
- Publication number
- JP2006261606A JP2006261606A JP2005080587A JP2005080587A JP2006261606A JP 2006261606 A JP2006261606 A JP 2006261606A JP 2005080587 A JP2005080587 A JP 2005080587A JP 2005080587 A JP2005080587 A JP 2005080587A JP 2006261606 A JP2006261606 A JP 2006261606A
- Authority
- JP
- Japan
- Prior art keywords
- liquid
- space
- substrate
- exposure apparatus
- optical system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/42—Projection printing apparatus, e.g. enlarger, copying camera for automatic sequential copying of the same original
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005080587A JP2006261606A (ja) | 2005-03-18 | 2005-03-18 | 露光装置、露光方法及びデバイス製造方法 |
| US11/375,203 US7561249B2 (en) | 2005-03-18 | 2006-03-15 | Exposure apparatus, exposure method, and device manufacturing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005080587A JP2006261606A (ja) | 2005-03-18 | 2005-03-18 | 露光装置、露光方法及びデバイス製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2006261606A true JP2006261606A (ja) | 2006-09-28 |
| JP2006261606A5 JP2006261606A5 (enExample) | 2008-08-28 |
Family
ID=37009938
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005080587A Withdrawn JP2006261606A (ja) | 2005-03-18 | 2005-03-18 | 露光装置、露光方法及びデバイス製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7561249B2 (enExample) |
| JP (1) | JP2006261606A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008139913A1 (ja) * | 2007-05-10 | 2008-11-20 | Nikon Corporation | 露光方法及び露光用平板 |
| JP2009200492A (ja) * | 2008-02-19 | 2009-09-03 | Asml Netherlands Bv | リソグラフィ装置及び方法 |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006261606A (ja) | 2005-03-18 | 2006-09-28 | Canon Inc | 露光装置、露光方法及びデバイス製造方法 |
| JP2006269942A (ja) * | 2005-03-25 | 2006-10-05 | Canon Inc | 露光装置及びデバイス製造方法 |
| US7385673B2 (en) * | 2005-06-10 | 2008-06-10 | International Business Machines Corporation | Immersion lithography with equalized pressure on at least projection optics component and wafer |
| US7969548B2 (en) * | 2006-05-22 | 2011-06-28 | Asml Netherlands B.V. | Lithographic apparatus and lithographic apparatus cleaning method |
| JP2008218653A (ja) * | 2007-03-02 | 2008-09-18 | Canon Inc | 露光装置及びデバイス製造方法 |
| US8654306B2 (en) * | 2008-04-14 | 2014-02-18 | Nikon Corporation | Exposure apparatus, cleaning method, and device fabricating method |
| US20110222030A1 (en) * | 2010-03-09 | 2011-09-15 | Nanya Technology Corporation | Immersion lithographic apparatuses |
| US20120062858A1 (en) * | 2010-04-02 | 2012-03-15 | Nikon Corporation | Cleaning method, device manufacturing method, exposure apparatus, and device manufacturing system |
| JP5241862B2 (ja) | 2011-01-01 | 2013-07-17 | キヤノン株式会社 | 露光装置及びデバイスの製造方法 |
| US20130016041A1 (en) * | 2011-07-13 | 2013-01-17 | Kuo-Ching Chiang | High Resolution Mouse |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06124873A (ja) | 1992-10-09 | 1994-05-06 | Canon Inc | 液浸式投影露光装置 |
| JP2753930B2 (ja) * | 1992-11-27 | 1998-05-20 | キヤノン株式会社 | 液浸式投影露光装置 |
| AU2747999A (en) | 1998-03-26 | 1999-10-18 | Nikon Corporation | Projection exposure method and system |
| SG121822A1 (en) | 2002-11-12 | 2006-05-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| EP1598855B1 (en) * | 2003-02-26 | 2015-04-22 | Nikon Corporation | Exposure apparatus and method, and method of producing apparatus |
| US6954256B2 (en) * | 2003-08-29 | 2005-10-11 | Asml Netherlands B.V. | Gradient immersion lithography |
| JP4492539B2 (ja) * | 2003-09-29 | 2010-06-30 | 株式会社ニコン | 液浸型光学系及び投影露光装置、並びにデバイス製造方法 |
| US7880860B2 (en) * | 2004-12-20 | 2011-02-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP2006261606A (ja) | 2005-03-18 | 2006-09-28 | Canon Inc | 露光装置、露光方法及びデバイス製造方法 |
| JP2006269942A (ja) | 2005-03-25 | 2006-10-05 | Canon Inc | 露光装置及びデバイス製造方法 |
-
2005
- 2005-03-18 JP JP2005080587A patent/JP2006261606A/ja not_active Withdrawn
-
2006
- 2006-03-15 US US11/375,203 patent/US7561249B2/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008139913A1 (ja) * | 2007-05-10 | 2008-11-20 | Nikon Corporation | 露光方法及び露光用平板 |
| JP2009200492A (ja) * | 2008-02-19 | 2009-09-03 | Asml Netherlands Bv | リソグラフィ装置及び方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US7561249B2 (en) | 2009-07-14 |
| US20060209281A1 (en) | 2006-09-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20080311 |
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| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20080311 |
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| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20080711 |
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| A761 | Written withdrawal of application |
Free format text: JAPANESE INTERMEDIATE CODE: A761 Effective date: 20100217 |