JP2006186331A5 - - Google Patents

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Publication number
JP2006186331A5
JP2006186331A5 JP2005341420A JP2005341420A JP2006186331A5 JP 2006186331 A5 JP2006186331 A5 JP 2006186331A5 JP 2005341420 A JP2005341420 A JP 2005341420A JP 2005341420 A JP2005341420 A JP 2005341420A JP 2006186331 A5 JP2006186331 A5 JP 2006186331A5
Authority
JP
Japan
Prior art keywords
film
porous insulating
insulating film
connection hole
conductive film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2005341420A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006186331A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2005341420A priority Critical patent/JP2006186331A/ja
Priority claimed from JP2005341420A external-priority patent/JP2006186331A/ja
Publication of JP2006186331A publication Critical patent/JP2006186331A/ja
Publication of JP2006186331A5 publication Critical patent/JP2006186331A5/ja
Withdrawn legal-status Critical Current

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JP2005341420A 2004-11-30 2005-11-28 半導体装置の作製方法 Withdrawn JP2006186331A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005341420A JP2006186331A (ja) 2004-11-30 2005-11-28 半導体装置の作製方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004347810 2004-11-30
JP2005341420A JP2006186331A (ja) 2004-11-30 2005-11-28 半導体装置の作製方法

Publications (2)

Publication Number Publication Date
JP2006186331A JP2006186331A (ja) 2006-07-13
JP2006186331A5 true JP2006186331A5 (enExample) 2008-12-18

Family

ID=36739171

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005341420A Withdrawn JP2006186331A (ja) 2004-11-30 2005-11-28 半導体装置の作製方法

Country Status (1)

Country Link
JP (1) JP2006186331A (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5121178B2 (ja) * 2006-07-24 2013-01-16 京セラ株式会社 弾性表面波装置及び通信装置
JP2011159885A (ja) * 2010-02-02 2011-08-18 Toshiba Corp 薄膜の製造方法
JP5702173B2 (ja) * 2011-01-31 2015-04-15 ルネサスエレクトロニクス株式会社 半導体装置の製造方法および多孔質絶縁層の改質方法
JP6163820B2 (ja) * 2013-03-27 2017-07-19 日本ゼオン株式会社 エッチング方法
KR20160024872A (ko) * 2013-06-27 2016-03-07 피코순 오와이 위조-방지 서명
KR102437416B1 (ko) * 2015-08-28 2022-08-30 삼성전자주식회사 3차원 반도체 메모리 장치

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3951044B2 (ja) * 2002-03-13 2007-08-01 セイコーエプソン株式会社 成膜方法、並びにその方法を用いて製造したデバイス
JP2004241758A (ja) * 2003-01-17 2004-08-26 Advanced Lcd Technologies Development Center Co Ltd 配線金属層の形成方法および配線金属層
JP2004259753A (ja) * 2003-02-24 2004-09-16 Fujitsu Ltd 半導体装置およびその製造方法

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