JP2005534921A5 - - Google Patents

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Publication number
JP2005534921A5
JP2005534921A5 JP2004526172A JP2004526172A JP2005534921A5 JP 2005534921 A5 JP2005534921 A5 JP 2005534921A5 JP 2004526172 A JP2004526172 A JP 2004526172A JP 2004526172 A JP2004526172 A JP 2004526172A JP 2005534921 A5 JP2005534921 A5 JP 2005534921A5
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JP
Japan
Prior art keywords
crystal
curved
optical
crystals
ray source
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Pending
Application number
JP2004526172A
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English (en)
Japanese (ja)
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JP2005534921A (ja
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Publication date
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Priority claimed from PCT/US2003/023412 external-priority patent/WO2004013867A2/en
Publication of JP2005534921A publication Critical patent/JP2005534921A/ja
Publication of JP2005534921A5 publication Critical patent/JP2005534921A5/ja
Pending legal-status Critical Current

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JP2004526172A 2002-08-02 2003-07-25 Ｘ線を方向付けるための光学デバイス及びその方法 Pending JP2005534921A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40080902P 2002-08-02 2002-08-02
PCT/US2003/023412 WO2004013867A2 (en) 2002-08-02 2003-07-25 An optical device for directing x-rays having a plurality of optical crystals

Publications (2)

Publication Number Publication Date
JP2005534921A JP2005534921A (ja) 2005-11-17
JP2005534921A5 true JP2005534921A5 (https=) 2006-08-31

Family

ID=31495884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004526172A Pending JP2005534921A (ja) 2002-08-02 2003-07-25 Ｘ線を方向付けるための光学デバイス及びその方法

Country Status (7)

Country Link
US (1) US7035374B2 (https=)
EP (1) EP1527461B1 (https=)
JP (1) JP2005534921A (https=)
AT (1) ATE488011T1 (https=)
AU (1) AU2003256831A1 (https=)
DE (1) DE60334910D1 (https=)
WO (1) WO2004013867A2 (https=)

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JP5031215B2 (ja) * 2004-09-21 2012-09-19 ジョルダン バレー アプライド ラディエイション リミテッド 多機能ｘ線分析システム
JP4121146B2 (ja) * 2005-06-24 2008-07-23 株式会社リガク 双晶解析装置
WO2007016484A2 (en) 2005-08-01 2007-02-08 The Research Foundation Of State University Of New York X-ray imaging systems employing point-focusing, curved monochromating optics
JP5315251B2 (ja) * 2006-11-16 2013-10-16 エックス−レイ オプティカル システムズ インコーポレーテッド それぞれの結晶方位を持つ多層を有するｘ線集束光学系及びこの光学系を形成する方法
JP2008191547A (ja) * 2007-02-07 2008-08-21 Japan Atomic Energy Agency 多層膜不等間隔溝凹面回折格子及び同分光装置
US20090041198A1 (en) * 2007-08-07 2009-02-12 General Electric Company Highly collimated and temporally variable x-ray beams
JP2010014418A (ja) * 2008-07-01 2010-01-21 Japan Atomic Energy Agency 多層膜回折格子分光装置
JP5344123B2 (ja) * 2008-07-18 2013-11-20 独立行政法人 宇宙航空研究開発機構 Ｘ線反射体、ｘ線反射装置およびｘ線反射鏡作成方法
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US8130904B2 (en) * 2009-01-29 2012-03-06 The Invention Science Fund I, Llc Diagnostic delivery service
US8130908B2 (en) * 2009-02-23 2012-03-06 X-Ray Optical Systems, Inc. X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
US20100310041A1 (en) * 2009-06-03 2010-12-09 Adams William L X-Ray System and Methods with Detector Interior to Focusing Element
US8537967B2 (en) * 2009-09-10 2013-09-17 University Of Washington Short working distance spectrometer and associated devices, systems, and methods
US8058621B2 (en) * 2009-10-26 2011-11-15 General Electric Company Elemental composition detection system and method
US8243878B2 (en) 2010-01-07 2012-08-14 Jordan Valley Semiconductors Ltd. High-resolution X-ray diffraction measurement with enhanced sensitivity
US8687766B2 (en) 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
US8437450B2 (en) 2010-12-02 2013-05-07 Jordan Valley Semiconductors Ltd. Fast measurement of X-ray diffraction from tilted layers
US8781070B2 (en) 2011-08-11 2014-07-15 Jordan Valley Semiconductors Ltd. Detection of wafer-edge defects
EP2745101B1 (en) 2011-08-15 2019-11-06 X-Ray Optical Systems, Inc. X-ray analysis apparatus
CN103946693B (zh) 2011-10-06 2017-05-03 X射线光学系统公司 可移除式x‑射线分析仪用的可移动型运输及屏蔽装置
CN107731337B (zh) 2011-10-26 2019-11-19 X射线光学系统公司 X射线分析引擎和分析仪的支撑结构及高度对准的单色x射线光学器件
CN104272424A (zh) * 2012-02-28 2015-01-07 X射线光学系统公司 具有使用多材料x 射线管阳极和单色光学装置产生的多激励能带的x射线分析器
KR101316794B1 (ko) 2012-06-25 2013-10-11 한국과학기술연구원 극소각 중성자 산란 장치의 중성자 집속 장치
WO2015027225A1 (en) 2013-08-23 2015-02-26 The Schepens Eye Research Institute, Inc. Spatial modeling of visual fields
US9726624B2 (en) 2014-06-18 2017-08-08 Bruker Jv Israel Ltd. Using multiple sources/detectors for high-throughput X-ray topography measurement
WO2016108235A1 (en) * 2014-12-30 2016-07-07 Convergent R.N.R Ltd New constructions of x-ray lenses for converging x-rays
US11250968B2 (en) 2014-12-30 2022-02-15 Convergent R.N.R. Ltd. Constructions of x-ray lenses for converging x-rays
JP6069609B2 (ja) * 2015-03-26 2017-02-01 株式会社リガク 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法
US10677744B1 (en) * 2016-06-03 2020-06-09 U.S. Department Of Energy Multi-cone x-ray imaging Bragg crystal spectrometer
JP7418208B2 (ja) * 2016-09-15 2024-01-19 ユニバーシティ オブ ワシントン Ｘ線分光計及びその使用方法
FR3079035B1 (fr) * 2018-03-14 2022-10-28 Alpyx Dispositif optique pour rayons x
JP7394464B2 (ja) * 2018-07-04 2023-12-08 株式会社リガク 蛍光ｘ線分析装置
WO2021059271A1 (en) * 2019-09-24 2021-04-01 Convergent R.N.R Ltd X-ray optical arrangement
US11874239B2 (en) * 2022-03-11 2024-01-16 Uchicago Argonne, Llc Advanced X-ray emission spectrometers
US12247934B2 (en) 2022-07-29 2025-03-11 X-Ray Optical Systems, Inc. Polarized, energy dispersive x-ray fluorescence system and method
CN115791855B (zh) * 2022-11-14 2025-03-18 中国科学院上海光学精密机械研究所 基于弯晶耦合的背光x射线衍射成像装置
CN115963126B (zh) * 2022-12-30 2026-03-06 国创科学仪器(苏州)有限公司 实验室谱仪

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