JP2005523456A5 - - Google Patents

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Publication number
JP2005523456A5
JP2005523456A5 JP2003586909A JP2003586909A JP2005523456A5 JP 2005523456 A5 JP2005523456 A5 JP 2005523456A5 JP 2003586909 A JP2003586909 A JP 2003586909A JP 2003586909 A JP2003586909 A JP 2003586909A JP 2005523456 A5 JP2005523456 A5 JP 2005523456A5
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JP
Japan
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JP2003586909A
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JP4308026B2 (ja
JP2005523456A (ja
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Priority claimed from US10/123,629 external-priority patent/US6803566B2/en
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Publication of JP2005523456A publication Critical patent/JP2005523456A/ja
Publication of JP2005523456A5 publication Critical patent/JP2005523456A5/ja
Application granted granted Critical
Publication of JP4308026B2 publication Critical patent/JP4308026B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2003586909A 2002-04-16 2003-04-09 表面アレイ上、または表面アレイ内に配置された被分析物を同定する方法、及び分析のために表面アレイから試料を得る自動サンプリングシステム Expired - Lifetime JP4308026B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/123,629 US6803566B2 (en) 2002-04-16 2002-04-16 Sampling probe for microarray read out using electrospray mass spectrometry
PCT/US2003/010835 WO2003090249A2 (en) 2002-04-16 2003-04-09 Sampling probe microarray read out using electrospray mass spectrometry

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2009053183A Division JP4607223B2 (ja) 2002-04-16 2009-03-06 エレクトロスプレー質量分析を用いたマイクロアレイの読取りのためのサンプリングプローブ

Publications (3)

Publication Number Publication Date
JP2005523456A JP2005523456A (ja) 2005-08-04
JP2005523456A5 true JP2005523456A5 (ja) 2009-02-26
JP4308026B2 JP4308026B2 (ja) 2009-08-05

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ID=28790772

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2003586909A Expired - Lifetime JP4308026B2 (ja) 2002-04-16 2003-04-09 表面アレイ上、または表面アレイ内に配置された被分析物を同定する方法、及び分析のために表面アレイから試料を得る自動サンプリングシステム
JP2009053183A Expired - Lifetime JP4607223B2 (ja) 2002-04-16 2009-03-06 エレクトロスプレー質量分析を用いたマイクロアレイの読取りのためのサンプリングプローブ

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2009053183A Expired - Lifetime JP4607223B2 (ja) 2002-04-16 2009-03-06 エレクトロスプレー質量分析を用いたマイクロアレイの読取りのためのサンプリングプローブ

Country Status (9)

Country Link
US (1) US6803566B2 (ja)
EP (1) EP1497847B1 (ja)
JP (2) JP4308026B2 (ja)
AT (1) ATE331297T1 (ja)
AU (1) AU2003228472A1 (ja)
CA (1) CA2482546C (ja)
DE (1) DE60306355T2 (ja)
MX (1) MXPA04010136A (ja)
WO (1) WO2003090249A2 (ja)

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US7995216B2 (en) * 2008-07-02 2011-08-09 Ut-Battelle, Llc Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis
US8117929B2 (en) * 2008-07-02 2012-02-21 Ut-Battelle, Llc Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor
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US20100224013A1 (en) 2009-03-05 2010-09-09 Van Berkel Gary J Method and system for formation and withdrawal of a sample from a surface to be analyzed
WO2010114976A1 (en) 2009-04-01 2010-10-07 Prosolia, Inc. Method and system for surface sampling
US8097845B2 (en) 2010-03-11 2012-01-17 Battelle Memorial Institute Focused analyte spray emission apparatus and process for mass spectrometric analysis
JP5596402B2 (ja) * 2010-04-19 2014-09-24 株式会社日立ハイテクノロジーズ 分析装置、イオン化装置及び分析方法
CN103038857B (zh) * 2010-05-07 2016-01-20 Ut-巴特勒有限责任公司 从表面提取样品的系统和方法
US8486703B2 (en) 2010-09-30 2013-07-16 Ut-Battelle, Llc Surface sampling concentration and reaction probe
US8637813B2 (en) 2010-10-01 2014-01-28 Ut-Battelle, Llc System and method for laser assisted sample transfer to solution for chemical analysis
US8519330B2 (en) * 2010-10-01 2013-08-27 Ut-Battelle, Llc Systems and methods for laser assisted sample transfer to solution for chemical analysis
US8506307B2 (en) 2010-12-02 2013-08-13 Interconnect Devices, Inc. Electrical connector with embedded shell layer
US9024254B2 (en) 2011-06-03 2015-05-05 Purdue Research Foundation Enclosed desorption electrospray ionization probes and method of use thereof
WO2012167259A1 (en) * 2011-06-03 2012-12-06 Ut-Battelle, Llc Enhanced spot preparation for liquid extractive sampling and analysis
JP5955033B2 (ja) * 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
US9176028B2 (en) 2012-10-04 2015-11-03 Ut-Battelle, Llc Ball assisted device for analytical surface sampling
WO2014179417A1 (en) * 2013-05-01 2014-11-06 Ut-Battelle, Llc Afm fluid delivery/liquid extraction surface sampling/electrostatic spray cantilever probe
JP2015032463A (ja) * 2013-08-02 2015-02-16 キヤノン株式会社 質量分析装置、質量分析方法および画像化システム
US9595428B2 (en) 2014-06-17 2017-03-14 The Board Of Regents Of The University Oklahoma Cellular probe device, system and analysis method
US10000789B2 (en) 2014-06-17 2018-06-19 The Board Of Regents Of The University Of Oklahoma Cellular probe device, system and analysis method
JP5971289B2 (ja) * 2014-08-20 2016-08-17 株式会社 イアス 基板局所の自動分析装置及び分析方法
JP2015052787A (ja) * 2014-09-22 2015-03-19 デクセリアルズ株式会社 光学体およびその製造方法
US9390901B2 (en) 2014-10-31 2016-07-12 Ut-Battelle, Llc System and method for liquid extraction electrospray-assisted sample transfer to solution for chemical analysis
WO2016115111A1 (en) * 2015-01-12 2016-07-21 Advion Inc. Surface extraction interface
JP6566660B2 (ja) * 2015-03-04 2019-08-28 山善株式会社 薄層クロマトグラフ用分取装置
US9632066B2 (en) 2015-04-09 2017-04-25 Ut-Battelle, Llc Open port sampling interface
US10060838B2 (en) 2015-04-09 2018-08-28 Ut-Battelle, Llc Capture probe
JP6823235B2 (ja) * 2016-07-12 2021-02-03 山善株式会社 薄層クロマトグラフ分取方法及び薄層クロマトグラフ用分取装置
CN113834869A (zh) * 2016-09-02 2021-12-24 得克萨斯大学体系董事会 收集探针及其使用方法
EP3526811A4 (en) * 2016-10-14 2020-06-17 DH Technologies Development Pte. Ltd. METHODS AND SYSTEMS FOR INCREASING THE SENSITIVITY OF DIRECT SCAN INTERFACES FOR MASS SPECTROMETRIC ANALYSIS
CA3083260A1 (en) 2017-11-27 2019-05-31 Board Of Regents, The University Of Texas System Minimally invasive collection probe and methods for the use thereof
US11125657B2 (en) 2018-01-30 2021-09-21 Ut-Battelle, Llc Sampling probe
JP2020091173A (ja) 2018-12-05 2020-06-11 山善株式会社 薄層クロマトグラフ分取方法及び薄層クロマトグラフ用分取装置
EP3914891A4 (en) * 2019-01-25 2022-09-28 Board of Regents, The University of Texas System DEVICE AND METHOD FOR CLEANING AND/OR REPLACING MEDICAL DEVICES
EP3918625A1 (en) * 2019-02-01 2021-12-08 DH Technologies Development Pte. Ltd. System for monitoring and controlling the composition of charged droplets for optimum ion emission
CN110068606B (zh) * 2019-04-11 2021-11-23 东华理工大学 一种金属材料微区分析方法
US20220208538A1 (en) * 2019-05-31 2022-06-30 Purdue Research Foundation Integrated microfluidic probe (imfp) and methods of use thereof
JP2022550750A (ja) * 2019-09-30 2022-12-05 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 質量分析システムおよび方法における使用のための内部サンプリング伴うサンプリングプローブ
EP4154299A1 (en) * 2020-05-22 2023-03-29 DH Technologies Development Pte. Ltd. High flowrate flushing for open port sampling probe
EP4297063A1 (en) * 2022-06-20 2023-12-27 Masarykova Univerzita Method of counting nanoparticle tags in solid samples

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