JP4607223B2 - エレクトロスプレー質量分析を用いたマイクロアレイの読取りのためのサンプリングプローブ - Google Patents
エレクトロスプレー質量分析を用いたマイクロアレイの読取りのためのサンプリングプローブ Download PDFInfo
- Publication number
- JP4607223B2 JP4607223B2 JP2009053183A JP2009053183A JP4607223B2 JP 4607223 B2 JP4607223 B2 JP 4607223B2 JP 2009053183 A JP2009053183 A JP 2009053183A JP 2009053183 A JP2009053183 A JP 2009053183A JP 4607223 B2 JP4607223 B2 JP 4607223B2
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- Prior art keywords
- probe
- analyte
- spot
- array
- spots
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0404—Capillaries used for transferring samples or ions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
- H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/165—Electrospray ionisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
- G01N2035/00099—Characterised by type of test elements
- G01N2035/00158—Elements containing microarrays, i.e. "biochip"
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
流動工程は溶離溶媒を流す前に洗浄溶媒を流す工程を含んでもよい。その方法は溶離溶媒を流す前に、少なくとも1種の試薬をスポットに流す工程を含んでもよい。
1.Mann, M.; Wilm. M. 「Error−Tolerant Identification of Peptides in Sequence Databases by Peptide Sequence Tags」 Anal. Chem. 1994, 66, 4390−4399.
2.Cargile, B. J.;McLuckey, S. A.;Stephenson, Jr. J. L. 「Identification of Bacteriophage MS2 Coat Protein from E. Coil Lysates via Ion Trap Collisional Activation of Intact Protein Ions」Anal. Chem. 2001, 73,1277−1285.
Claims (3)
- 表面アレイ上、または表面アレイ内に配置された被分析物を分析する方法において、
少なくとも1種の被分析物を保持するスポットを少なくとも1個含む表面アレイを用意する工程と、
溶離溶媒が前記被分析物の少なくとも一部を前記スポットから送出するように、少なくとも1種の溶離溶媒を前記スポット全体に流動させる工程と、
エレクトロスプレーイオン源を用いて、前記送出される被分析物の少なくとも一部を複数のイオン断片にイオン化する工程と、
前記複数のイオン断片を分析して前記被分析物を分析する工程とを備え、
前記スポットの周囲に密閉された囲いを形成するように適合された多軸表面接触プローブを含む少なくとも1個のプローブが前記流動工程で用いられ、
前記表面接触プローブは前記密閉された囲いを形成するためのオーリングシールを含む方法。 - 分析のために複数のスポットを含む表面アレイから試料を得る自動サンプリングシステムにおいて、
少なくとも1種の被分析物を有する前記複数のスポットの内の関連するスポットに少なくとも1種の溶離溶媒を流すための入口を含む少なくとも1個のプローブであって、前記被分析物を前記スポットから送出するための出口を更に含む前記少なくとも1個のプローブと、
前記スポットに対して前記プローブを移動させて前記スポットのいずれかをサンプリングする自動位置決めシステムと、
前記被分析物を受けて、前記被分析物からイオンを発生するために前記プローブに流動連通するインプットを有するエレクトロスプレーイオン源と、
前記エレクトロスプレーイオン源のために前記イオンを受けて前記イオンを分析するための構造とを備え、
前記プローブは前記スポットの周囲に密閉された囲いを形成するように適合された多軸表面接触プローブを含み、
前記表面接触プローブは前記密閉された囲いを形成するためのオーリングシールを含む、前記自動サンプリングシステム。 - 分析のためにスポットの表面アレイから試料を得るための多軸サンプリングプローブであって、
少なくとも1種の溶離溶媒を少なくとも1種の被分析物を有する複数のスポットのそれぞれに流すための入口と、前記測定物質を前記スポットから送出するための出口とを含み、前記スポットの周囲の密閉された囲いを形成するためのオーリングシールを含む前記多軸サンプリングプローブ。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/123,629 US6803566B2 (en) | 2002-04-16 | 2002-04-16 | Sampling probe for microarray read out using electrospray mass spectrometry |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003586909A Division JP4308026B2 (ja) | 2002-04-16 | 2003-04-09 | 表面アレイ上、または表面アレイ内に配置された被分析物を同定する方法、及び分析のために表面アレイから試料を得る自動サンプリングシステム |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009133868A JP2009133868A (ja) | 2009-06-18 |
JP4607223B2 true JP4607223B2 (ja) | 2011-01-05 |
Family
ID=28790772
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003586909A Expired - Lifetime JP4308026B2 (ja) | 2002-04-16 | 2003-04-09 | 表面アレイ上、または表面アレイ内に配置された被分析物を同定する方法、及び分析のために表面アレイから試料を得る自動サンプリングシステム |
JP2009053183A Expired - Lifetime JP4607223B2 (ja) | 2002-04-16 | 2009-03-06 | エレクトロスプレー質量分析を用いたマイクロアレイの読取りのためのサンプリングプローブ |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003586909A Expired - Lifetime JP4308026B2 (ja) | 2002-04-16 | 2003-04-09 | 表面アレイ上、または表面アレイ内に配置された被分析物を同定する方法、及び分析のために表面アレイから試料を得る自動サンプリングシステム |
Country Status (9)
Country | Link |
---|---|
US (1) | US6803566B2 (ja) |
EP (1) | EP1497847B1 (ja) |
JP (2) | JP4308026B2 (ja) |
AT (1) | ATE331297T1 (ja) |
AU (1) | AU2003228472A1 (ja) |
CA (1) | CA2482546C (ja) |
DE (1) | DE60306355T2 (ja) |
MX (1) | MXPA04010136A (ja) |
WO (1) | WO2003090249A2 (ja) |
Families Citing this family (46)
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TW200600777A (en) * | 2004-02-23 | 2006-01-01 | Metara Inc | Multiple electrospray probe interface for mass spectrometry |
US7883858B2 (en) * | 2005-01-27 | 2011-02-08 | Institute For Systems Biology | Methods for identifying and monitoring drug side effects |
US7295026B2 (en) * | 2005-06-03 | 2007-11-13 | Ut-Battelle, Llc | Automated position control of a surface array relative to a liquid microjunction surface sampler |
US7411182B2 (en) * | 2006-01-19 | 2008-08-12 | Georgia Tech Research Corp | Reverse-taylor cone ionization systems and methods of use thereof |
WO2009032904A1 (en) * | 2007-09-05 | 2009-03-12 | Government Of The United States Of America, Represented By The Secretary, Department Of Health And Human Services | Probe and method for obtaining three-dimensional compositional maps of a biological sample |
US7995216B2 (en) * | 2008-07-02 | 2011-08-09 | Ut-Battelle, Llc | Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis |
US8117929B2 (en) * | 2008-07-02 | 2012-02-21 | Ut-Battelle, Llc | Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor |
US7798867B2 (en) | 2008-11-12 | 2010-09-21 | Interconnect Devices, Inc. | Environmentally sealed contact |
WO2010093943A1 (en) * | 2009-02-12 | 2010-08-19 | Ibis Biosciences, Inc. | Ionization probe assemblies |
US20100224013A1 (en) * | 2009-03-05 | 2010-09-09 | Van Berkel Gary J | Method and system for formation and withdrawal of a sample from a surface to be analyzed |
WO2010114976A1 (en) | 2009-04-01 | 2010-10-07 | Prosolia, Inc. | Method and system for surface sampling |
US8097845B2 (en) * | 2010-03-11 | 2012-01-17 | Battelle Memorial Institute | Focused analyte spray emission apparatus and process for mass spectrometric analysis |
JP5596402B2 (ja) * | 2010-04-19 | 2014-09-24 | 株式会社日立ハイテクノロジーズ | 分析装置、イオン化装置及び分析方法 |
US9063047B2 (en) | 2010-05-07 | 2015-06-23 | Ut-Battelle, Llc | System and method for extracting a sample from a surface |
US8486703B2 (en) | 2010-09-30 | 2013-07-16 | Ut-Battelle, Llc | Surface sampling concentration and reaction probe |
US8637813B2 (en) | 2010-10-01 | 2014-01-28 | Ut-Battelle, Llc | System and method for laser assisted sample transfer to solution for chemical analysis |
US8519330B2 (en) * | 2010-10-01 | 2013-08-27 | Ut-Battelle, Llc | Systems and methods for laser assisted sample transfer to solution for chemical analysis |
US8506307B2 (en) | 2010-12-02 | 2013-08-13 | Interconnect Devices, Inc. | Electrical connector with embedded shell layer |
US9140633B2 (en) * | 2011-06-03 | 2015-09-22 | Ut-Battelle, Llc | Enhanced spot preparation for liquid extractive sampling and analysis |
US9024254B2 (en) | 2011-06-03 | 2015-05-05 | Purdue Research Foundation | Enclosed desorption electrospray ionization probes and method of use thereof |
JP5955033B2 (ja) * | 2012-03-01 | 2016-07-20 | キヤノン株式会社 | イオン化方法、質量分析方法、抽出方法及び精製方法 |
US9176028B2 (en) | 2012-10-04 | 2015-11-03 | Ut-Battelle, Llc | Ball assisted device for analytical surface sampling |
WO2014179417A1 (en) * | 2013-05-01 | 2014-11-06 | Ut-Battelle, Llc | Afm fluid delivery/liquid extraction surface sampling/electrostatic spray cantilever probe |
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US10000789B2 (en) | 2014-06-17 | 2018-06-19 | The Board Of Regents Of The University Of Oklahoma | Cellular probe device, system and analysis method |
US9595428B2 (en) | 2014-06-17 | 2017-03-14 | The Board Of Regents Of The University Oklahoma | Cellular probe device, system and analysis method |
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JP6670315B2 (ja) * | 2015-01-12 | 2020-03-18 | アドヴィオン インコーポレーテッドAdvion Inc. | 表面抽出インタフェース |
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JP2020091173A (ja) | 2018-12-05 | 2020-06-11 | 山善株式会社 | 薄層クロマトグラフ分取方法及び薄層クロマトグラフ用分取装置 |
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US5245185A (en) * | 1991-11-05 | 1993-09-14 | Georgia Tech Research Corporation | Interface device and process to couple planar electrophoresis with spectroscopic methods of detection |
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2002
- 2002-04-16 US US10/123,629 patent/US6803566B2/en not_active Expired - Lifetime
-
2003
- 2003-04-09 DE DE60306355T patent/DE60306355T2/de not_active Expired - Lifetime
- 2003-04-09 WO PCT/US2003/010835 patent/WO2003090249A2/en active IP Right Grant
- 2003-04-09 CA CA2482546A patent/CA2482546C/en not_active Expired - Lifetime
- 2003-04-09 AT AT03726226T patent/ATE331297T1/de not_active IP Right Cessation
- 2003-04-09 EP EP03726226A patent/EP1497847B1/en not_active Expired - Lifetime
- 2003-04-09 AU AU2003228472A patent/AU2003228472A1/en not_active Abandoned
- 2003-04-09 JP JP2003586909A patent/JP4308026B2/ja not_active Expired - Lifetime
- 2003-04-09 MX MXPA04010136A patent/MXPA04010136A/es unknown
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2009
- 2009-03-06 JP JP2009053183A patent/JP4607223B2/ja not_active Expired - Lifetime
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US5245185A (en) * | 1991-11-05 | 1993-09-14 | Georgia Tech Research Corporation | Interface device and process to couple planar electrophoresis with spectroscopic methods of detection |
Also Published As
Publication number | Publication date |
---|---|
WO2003090249A2 (en) | 2003-10-30 |
DE60306355D1 (de) | 2006-08-03 |
CA2482546C (en) | 2011-10-04 |
AU2003228472A8 (en) | 2003-11-03 |
EP1497847A2 (en) | 2005-01-19 |
WO2003090249A3 (en) | 2004-02-12 |
MXPA04010136A (es) | 2005-03-07 |
JP2009133868A (ja) | 2009-06-18 |
JP2005523456A (ja) | 2005-08-04 |
US20030193020A1 (en) | 2003-10-16 |
US6803566B2 (en) | 2004-10-12 |
EP1497847B1 (en) | 2006-06-21 |
DE60306355T2 (de) | 2007-07-05 |
AU2003228472A1 (en) | 2003-11-03 |
JP4308026B2 (ja) | 2009-08-05 |
ATE331297T1 (de) | 2006-07-15 |
CA2482546A1 (en) | 2003-10-30 |
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