JP2005521874A - レーザ脱離およびマルチプルリアクションモニタリングを用いる小分子のハイスループット定量のための方法およびシステム - Google Patents

レーザ脱離およびマルチプルリアクションモニタリングを用いる小分子のハイスループット定量のための方法およびシステム Download PDF

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JP2005521874A
JP2005521874A JP2003580837A JP2003580837A JP2005521874A JP 2005521874 A JP2005521874 A JP 2005521874A JP 2003580837 A JP2003580837 A JP 2003580837A JP 2003580837 A JP2003580837 A JP 2003580837A JP 2005521874 A JP2005521874 A JP 2005521874A
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laser
ions
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pulse rate
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JP2005521874A5 (enExample
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コーヴェイ、トーマス、アール．
コア、ジョン、ジェイ．
フィッシャー、ウィリアム、エイチ．
チャウ、トゥン
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エムディーエス シエックス
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/0481—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for collisional cooling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2003580837A 2002-03-28 2003-03-27 レーザ脱離およびマルチプルリアクションモニタリングを用いる小分子のハイスループット定量のための方法およびシステム Withdrawn JP2005521874A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US36819502P 2002-03-28 2002-03-28
PCT/IB2003/001915 WO2003083448A2 (en) 2002-03-28 2003-03-27 Method and system for high-throughput quantitation of small molecules using laser desorption and multiple-reaction-monitoring

Related Child Applications (1)

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JP2009170646A Division JP2009282038A (ja) 2002-03-28 2009-07-21 レーザ脱離およびマルチプルリアクションモニタリングを用いる小分子のハイスループット定量のための方法およびシステム

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JP2005521874A true JP2005521874A (ja) 2005-07-21
JP2005521874A5 JP2005521874A5 (enExample) 2009-11-12

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JP2003580837A Withdrawn JP2005521874A (ja) 2002-03-28 2003-03-27 レーザ脱離およびマルチプルリアクションモニタリングを用いる小分子のハイスループット定量のための方法およびシステム
JP2009170646A Pending JP2009282038A (ja) 2002-03-28 2009-07-21 レーザ脱離およびマルチプルリアクションモニタリングを用いる小分子のハイスループット定量のための方法およびシステム

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US (2) US20060151691A1 (enExample)
EP (1) EP1488446A2 (enExample)
JP (2) JP2005521874A (enExample)
AU (1) AU2003230093A1 (enExample)
CA (1) CA2477835C (enExample)
WO (1) WO2003083448A2 (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007128694A (ja) * 2005-11-02 2007-05-24 Shimadzu Corp 質量分析装置
JP2007127653A (ja) * 2005-11-04 2007-05-24 Agilent Technol Inc Ｍａｌｄｉのためのレーザ集束及びスポット撮像を一体に組み込むための装置
JP2009518631A (ja) * 2005-12-07 2009-05-07 エムディーエス インコーポレイテッド ドゥーイング ビジネス スルー イッツ エムディーエス サイエックス ディヴィジョン 質量分析計を用いた複合基質の自動分析
JP2009544122A (ja) * 2006-07-19 2009-12-10 エムディーエス アナリティカル テクノロジーズ， ア ビジネス ユニット オブ エムディーエス インコーポレイテッド， ドゥーイング ビジネス スルー イッツ サイエックス ディビジョン 共鳴励起イオン移動を提供するために質量分析計を動作する方法
WO2012105087A1 (ja) * 2011-01-31 2012-08-09 株式会社 島津製作所 三連四重極型質量分析装置

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US7405397B2 (en) * 2002-03-28 2008-07-29 Mds Sciex Inc. Laser desorption ion source with ion guide coupling for ion mass spectroscopy
US7388194B2 (en) * 2002-03-28 2008-06-17 Mds Sciex Inc. Method and system for high-throughput quantitation using laser desorption and multiple-reaction-monitoring
GB0305796D0 (en) * 2002-07-24 2003-04-16 Micromass Ltd Method of mass spectrometry and a mass spectrometer
JP2007538262A (ja) * 2004-05-19 2007-12-27 アプレラ コーポレイション 質量分析を使用する発現の定量化
US20070054345A1 (en) * 2004-05-19 2007-03-08 Hunter Christie L Expression quantification using mass spectrometry
US20080206737A1 (en) * 2004-05-19 2008-08-28 Hunter Christie L Expression quantification using mass spectrometry
US20070037286A1 (en) * 2005-02-09 2007-02-15 Subhasish Purkayastha Thyroxine-containing compound analysis methods
US20060183238A1 (en) 2005-02-09 2006-08-17 Applera Corporation Amine-containing compound analysis methods
US7750312B2 (en) * 2006-03-07 2010-07-06 Dh Technologies Development Pte. Ltd. Method and apparatus for generating ions for mass analysis
US20070287160A1 (en) * 2006-04-21 2007-12-13 Chou Judy H Methods for high throughput screening of cell lines
EP2047243A4 (en) * 2006-07-19 2011-11-23 Mds Analytical Tech Bu Mds Inc DYNAMIC PICTURE PATTERN FOR USE WITH MALDI-MS
JP5227556B2 (ja) * 2007-09-06 2013-07-03 株式会社日立製作所 分析装置
US9274248B2 (en) * 2009-01-21 2016-03-01 Schlumberger Technology Corporation Downhole mass spectrometry
ES2676829T3 (es) 2012-01-10 2018-07-25 Expression Pathology, Inc. Ensayo de SRM/MRM para la proteína receptor de insulina
CN103227096B (zh) * 2012-01-30 2016-06-22 华中师范大学 一种激光诱导电子捕获质谱解析离解脂质分子方法
EP2924425B1 (en) * 2012-11-22 2019-09-11 Shimadzu Corporation Tandem quadrupole mass spectrometer
US8624181B1 (en) * 2013-03-15 2014-01-07 Agilent Technologies, Inc. Controlling ion flux into time-of-flight mass spectrometers
CN105209896B (zh) * 2013-05-21 2019-06-28 Dh科技发展私人贸易有限公司 使用质谱法的物种检测
WO2016125120A1 (en) * 2015-02-06 2016-08-11 Dh Technologies Development Pte. Ltd. Lipid screening platform allowing a complete solution for lipidomics research
KR102618817B1 (ko) 2020-09-22 2023-12-27 세메스 주식회사 제조 공장에서 반송 차량을 제어하는 방법, 차량 제어 장치, 및 물품 반송 시스템

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002502084A (ja) * 1998-01-23 2002-01-22 ユニヴァーシティー オブ マニトーバ パルスイオン源及びイオン運動を制動するための輸送デバイスを備えた分析計並びにその使用方法

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US6331702B1 (en) * 1999-01-25 2001-12-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
US6348688B1 (en) * 1998-02-06 2002-02-19 Perseptive Biosystems Tandem time-of-flight mass spectrometer with delayed extraction and method for use
US6507019B2 (en) * 1999-05-21 2003-01-14 Mds Inc. MS/MS scan methods for a quadrupole/time of flight tandem mass spectrometer
DE60044899D1 (de) 1999-06-11 2010-10-14 Applied Biosystems Llc Maldi ionenquelle mit gasimpuls, vorrichtung und verfahren zur ermittlung des molekulargewichtes labilen moleküle
DE10027794A1 (de) * 2000-06-07 2001-12-13 Basf Ag Verfahren zur Analyse Enzym-katalysierter Umsetzungen mit MALDI-TOF-Massenspektrometrie
US6747274B2 (en) * 2001-07-31 2004-06-08 Agilent Technologies, Inc. High throughput mass spectrometer with laser desorption ionization ion source

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002502084A (ja) * 1998-01-23 2002-01-22 ユニヴァーシティー オブ マニトーバ パルスイオン源及びイオン運動を制動するための輸送デバイスを備えた分析計並びにその使用方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007128694A (ja) * 2005-11-02 2007-05-24 Shimadzu Corp 質量分析装置
JP2007127653A (ja) * 2005-11-04 2007-05-24 Agilent Technol Inc Ｍａｌｄｉのためのレーザ集束及びスポット撮像を一体に組み込むための装置
JP2009518631A (ja) * 2005-12-07 2009-05-07 エムディーエス インコーポレイテッド ドゥーイング ビジネス スルー イッツ エムディーエス サイエックス ディヴィジョン 質量分析計を用いた複合基質の自動分析
JP2009544122A (ja) * 2006-07-19 2009-12-10 エムディーエス アナリティカル テクノロジーズ， ア ビジネス ユニット オブ エムディーエス インコーポレイテッド， ドゥーイング ビジネス スルー イッツ サイエックス ディビジョン 共鳴励起イオン移動を提供するために質量分析計を動作する方法
WO2012105087A1 (ja) * 2011-01-31 2012-08-09 株式会社 島津製作所 三連四重極型質量分析装置

Also Published As

Publication number Publication date
AU2003230093A1 (en) 2003-10-13
JP2009282038A (ja) 2009-12-03
WO2003083448A3 (en) 2003-12-31
US20030213901A1 (en) 2003-11-20
CA2477835A1 (en) 2003-10-09
AU2003230093A8 (en) 2003-10-13
US20060151691A1 (en) 2006-07-13
US6930305B2 (en) 2005-08-16
EP1488446A2 (en) 2004-12-22
WO2003083448A2 (en) 2003-10-09
CA2477835C (en) 2011-11-22

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