JP2005512151A - カタジオプトリック縮小対物レンズ - Google Patents
カタジオプトリック縮小対物レンズ Download PDFInfo
- Publication number
- JP2005512151A JP2005512151A JP2003551585A JP2003551585A JP2005512151A JP 2005512151 A JP2005512151 A JP 2005512151A JP 2003551585 A JP2003551585 A JP 2003551585A JP 2003551585 A JP2003551585 A JP 2003551585A JP 2005512151 A JP2005512151 A JP 2005512151A
- Authority
- JP
- Japan
- Prior art keywords
- lens
- region
- projection objective
- image
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000009467 reduction Effects 0.000 title description 14
- 230000003287 optical effect Effects 0.000 claims abstract description 106
- 230000002093 peripheral effect Effects 0.000 claims abstract description 19
- 238000003384 imaging method Methods 0.000 claims description 24
- 230000007246 mechanism Effects 0.000 claims description 19
- 238000005286 illumination Methods 0.000 claims description 13
- 238000004519 manufacturing process Methods 0.000 claims description 13
- 238000005452 bending Methods 0.000 claims description 12
- 230000005540 biological transmission Effects 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 9
- 239000000758 substrate Substances 0.000 claims description 8
- 238000010276 construction Methods 0.000 claims description 5
- 238000001393 microlithography Methods 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims description 4
- 238000004026 adhesive bonding Methods 0.000 claims description 2
- 238000007373 indentation Methods 0.000 claims description 2
- 239000011248 coating agent Substances 0.000 abstract description 5
- 238000000576 coating method Methods 0.000 abstract description 5
- 238000013461 design Methods 0.000 description 26
- 239000000463 material Substances 0.000 description 21
- 238000012937 correction Methods 0.000 description 17
- 230000000694 effects Effects 0.000 description 10
- 230000008901 benefit Effects 0.000 description 9
- 230000004075 alteration Effects 0.000 description 7
- 230000005499 meniscus Effects 0.000 description 7
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 5
- 229910001634 calcium fluoride Inorganic materials 0.000 description 5
- 210000001747 pupil Anatomy 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 238000005498 polishing Methods 0.000 description 3
- 238000007493 shaping process Methods 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 239000012780 transparent material Substances 0.000 description 2
- 206010010071 Coma Diseases 0.000 description 1
- WTCJLALIGFSROU-UHFFFAOYSA-I [Ca+2].[F-].[Li+].[Ca+2].[F-].[F-].[F-].[F-] Chemical compound [Ca+2].[F-].[Li+].[Ca+2].[F-].[F-].[F-].[F-] WTCJLALIGFSROU-UHFFFAOYSA-I 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- IEPNMLJMIRCTIV-UHFFFAOYSA-H aluminum;lithium;strontium;hexafluoride Chemical compound [Li+].[F-].[F-].[F-].[F-].[F-].[F-].[Al+3].[Sr+2] IEPNMLJMIRCTIV-UHFFFAOYSA-H 0.000 description 1
- OYLGJCQECKOTOL-UHFFFAOYSA-L barium fluoride Chemical compound [F-].[F-].[Ba+2] OYLGJCQECKOTOL-UHFFFAOYSA-L 0.000 description 1
- 229910001632 barium fluoride Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000001010 compromised effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003702 image correction Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 1
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 1
- 238000012634 optical imaging Methods 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0892—Catadioptric systems specially adapted for the UV
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70225—Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70275—Multiple projection paths, e.g. array of projection systems, microlens projection systems or tandem projection systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US33927501P | 2001-12-10 | 2001-12-10 | |
| PCT/EP2002/008037 WO2003050587A2 (de) | 2001-12-10 | 2002-07-19 | Katadioptrisches reduktionsobjektiv |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005512151A true JP2005512151A (ja) | 2005-04-28 |
| JP2005512151A5 JP2005512151A5 (enExample) | 2006-01-05 |
Family
ID=23328263
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003551585A Pending JP2005512151A (ja) | 2001-12-10 | 2002-07-19 | カタジオプトリック縮小対物レンズ |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP1456705A2 (enExample) |
| JP (1) | JP2005512151A (enExample) |
| AU (1) | AU2002317875A1 (enExample) |
| WO (1) | WO2003050587A2 (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007013179A (ja) * | 2005-07-01 | 2007-01-18 | Carl Zeiss Smt Ag | リソグラフィ投影対物レンズの補正方法およびリソグラフィ投影対物レンズ |
| JP2008545153A (ja) * | 2005-07-01 | 2008-12-11 | カール・ツァイス・エスエムティー・アーゲー | 複数の投影対物レンズを備えた投影露光装置 |
| JP2013042155A (ja) * | 2009-08-13 | 2013-02-28 | Carl Zeiss Smt Gmbh | 反射屈折投影対物系 |
| JP2017102481A (ja) * | 2004-05-17 | 2017-06-08 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 中間像を有するカタジオプトリック投影対物レンズ |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6995930B2 (en) | 1999-12-29 | 2006-02-07 | Carl Zeiss Smt Ag | Catadioptric projection objective with geometric beam splitting |
| EP1690139B1 (en) | 2003-12-02 | 2009-01-14 | Carl Zeiss SMT AG | Projection optical system |
| US7218453B2 (en) | 2005-02-04 | 2007-05-15 | Carl Zeiss Smt Ag | Projection system, in particular for a microlithographic projection exposure apparatus |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5581379A (en) * | 1993-02-15 | 1996-12-03 | Omron Corporation | Rectangular based convex microlenses surrounded within a frame and method of making |
| JP3747951B2 (ja) * | 1994-11-07 | 2006-02-22 | 株式会社ニコン | 反射屈折光学系 |
| KR0179138B1 (ko) * | 1995-12-01 | 1999-04-15 | 구자홍 | 대물렌즈 |
| DE69720641T2 (de) * | 1996-10-23 | 2004-04-08 | Konica Corp. | Verfahren zur Aufzeichnung und Wiedergabe eines optischen Aufzeichnungsträgers, Objektivlinse sowie Herstellungsmethode der Objektivlinse |
| EP0989434B1 (en) * | 1998-07-29 | 2006-11-15 | Carl Zeiss SMT AG | Catadioptric optical system and exposure apparatus having the same |
| JP3967851B2 (ja) * | 1999-08-11 | 2007-08-29 | フジノン株式会社 | フライアイレンズの位置決め構造 |
| US7301605B2 (en) * | 2000-03-03 | 2007-11-27 | Nikon Corporation | Projection exposure apparatus and method, catadioptric optical system and manufacturing method of devices |
| JP4116224B2 (ja) * | 2000-03-23 | 2008-07-09 | ローム株式会社 | レンズアレイの製造方法 |
-
2002
- 2002-07-19 EP EP02747468A patent/EP1456705A2/de not_active Withdrawn
- 2002-07-19 JP JP2003551585A patent/JP2005512151A/ja active Pending
- 2002-07-19 WO PCT/EP2002/008037 patent/WO2003050587A2/de not_active Ceased
- 2002-07-19 AU AU2002317875A patent/AU2002317875A1/en not_active Abandoned
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017102481A (ja) * | 2004-05-17 | 2017-06-08 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 中間像を有するカタジオプトリック投影対物レンズ |
| JP2007013179A (ja) * | 2005-07-01 | 2007-01-18 | Carl Zeiss Smt Ag | リソグラフィ投影対物レンズの補正方法およびリソグラフィ投影対物レンズ |
| JP2008545153A (ja) * | 2005-07-01 | 2008-12-11 | カール・ツァイス・エスエムティー・アーゲー | 複数の投影対物レンズを備えた投影露光装置 |
| JP2012168550A (ja) * | 2005-07-01 | 2012-09-06 | Carl Zeiss Smt Gmbh | 複数の投影対物レンズを備えた投影露光装置 |
| JP2013042155A (ja) * | 2009-08-13 | 2013-02-28 | Carl Zeiss Smt Gmbh | 反射屈折投影対物系 |
| US8873137B2 (en) | 2009-08-13 | 2014-10-28 | Carl Zeiss Smt Gmbh | Catadioptric projection objective |
| US9279969B2 (en) | 2009-08-13 | 2016-03-08 | Carl Zeiss Smt Gmbh | Catadioptric projection objective |
| US9726870B2 (en) | 2009-08-13 | 2017-08-08 | Carl Zeiss Smt Gmbh | Catadioptric projection objective |
| US10042146B2 (en) | 2009-08-13 | 2018-08-07 | Carl Zeiss Smt Gmbh | Catadioptric projection objective |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1456705A2 (de) | 2004-09-15 |
| WO2003050587A3 (de) | 2003-11-13 |
| WO2003050587A2 (de) | 2003-06-19 |
| AU2002317875A1 (en) | 2003-06-23 |
| AU2002317875A8 (en) | 2003-06-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050701 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050701 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20080227 |
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| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080311 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20080805 |