JP2005507128A5 - - Google Patents

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Publication number
JP2005507128A5
JP2005507128A5 JP2003540877A JP2003540877A JP2005507128A5 JP 2005507128 A5 JP2005507128 A5 JP 2005507128A5 JP 2003540877 A JP2003540877 A JP 2003540877A JP 2003540877 A JP2003540877 A JP 2003540877A JP 2005507128 A5 JP2005507128 A5 JP 2005507128A5
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JP
Japan
Prior art keywords
positive
model
numerical data
performance characteristics
computer
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Pending
Application number
JP2003540877A
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English (en)
Japanese (ja)
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JP2005507128A (ja
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Publication date
Priority claimed from GBGB0126104.9A external-priority patent/GB0126104D0/en
Application filed filed Critical
Publication of JP2005507128A publication Critical patent/JP2005507128A/ja
Publication of JP2005507128A5 publication Critical patent/JP2005507128A5/ja
Pending legal-status Critical Current

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JP2003540877A 2001-10-31 2002-10-31 物理的および非物理的なシステムのポジノミナルモデル化、サイジング、最適化および制御 Pending JP2005507128A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0126104.9A GB0126104D0 (en) 2001-10-31 2001-10-31 Electronic circuit modeling sizing and optimisation
PCT/BE2002/000164 WO2003038686A2 (en) 2001-10-31 2002-10-31 Posynomial modeling, sizing, optimization and control of physical and non-physical systems

Publications (2)

Publication Number Publication Date
JP2005507128A JP2005507128A (ja) 2005-03-10
JP2005507128A5 true JP2005507128A5 (enExample) 2006-01-05

Family

ID=9924853

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003540877A Pending JP2005507128A (ja) 2001-10-31 2002-10-31 物理的および非物理的なシステムのポジノミナルモデル化、サイジング、最適化および制御

Country Status (7)

Country Link
US (1) US7162402B2 (enExample)
EP (1) EP1440396A2 (enExample)
JP (1) JP2005507128A (enExample)
CA (1) CA2464935A1 (enExample)
GB (1) GB0126104D0 (enExample)
IL (1) IL161675A0 (enExample)
WO (1) WO2003038686A2 (enExample)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
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US20030191611A1 (en) * 2002-04-05 2003-10-09 Hershenson Maria Del Mar Behavioral circuit modeling for geometric programming
US20040054515A1 (en) * 2002-09-18 2004-03-18 Todi Rajat Kumar Methods and systems for modeling the performance of a processor
US20090077508A1 (en) * 2004-01-28 2009-03-19 Rubin Daniel I Accelerated life testing of semiconductor chips
US7458052B1 (en) 2004-08-30 2008-11-25 Gradient Design Automation, Inc. Method and apparatus for normalizing thermal gradients over semiconductor chip designs
US7353471B1 (en) * 2004-08-05 2008-04-01 Gradient Design Automation Inc. Method and apparatus for using full-chip thermal analysis of semiconductor chip designs to compute thermal conductance
US7194711B2 (en) * 2004-01-28 2007-03-20 Gradient Design Automation Inc. Method and apparatus for full-chip thermal analysis of semiconductor chip designs
US20090048801A1 (en) * 2004-01-28 2009-02-19 Rajit Chandra Method and apparatus for generating thermal test vectors
US7203920B2 (en) * 2004-01-28 2007-04-10 Gradient Design Automation Inc. Method and apparatus for retrofitting semiconductor chip performance analysis tools with full-chip thermal analysis capabilities
US7401304B2 (en) * 2004-01-28 2008-07-15 Gradient Design Automation Inc. Method and apparatus for thermal modeling and analysis of semiconductor chip designs
US7383520B2 (en) * 2004-08-05 2008-06-03 Gradient Design Automation Inc. Method and apparatus for optimizing thermal management system performance using full-chip thermal analysis of semiconductor chip designs
US20090224356A1 (en) * 2004-01-28 2009-09-10 Rajit Chandra Method and apparatus for thermally aware design improvement
WO2007070879A1 (en) * 2005-12-17 2007-06-21 Gradient Design Automation, Inc. Simulation of ic temperature distributions using an adaptive 3d grid
US7472363B1 (en) * 2004-01-28 2008-12-30 Gradient Design Automation Inc. Semiconductor chip design having thermal awareness across multiple sub-system domains
US8286111B2 (en) * 2004-03-11 2012-10-09 Gradient Design Automation Inc. Thermal simulation using adaptive 3D and hierarchical grid mechanisms
US8019580B1 (en) 2007-04-12 2011-09-13 Gradient Design Automation Inc. Transient thermal analysis
US7350164B2 (en) * 2004-06-04 2008-03-25 Carnegie Mellon University Optimization and design method for configurable analog circuits and devices
US8818784B1 (en) * 2004-06-23 2014-08-26 Cypress Semiconductor Corporation Hardware description language (HDL) incorporating statistically derived data and related methods
US7458041B2 (en) * 2004-09-30 2008-11-25 Magma Design Automation, Inc. Circuit optimization with posynomial function F having an exponent of a first design parameter
US7669150B2 (en) * 2004-10-29 2010-02-23 Xigmix, Inc. Statistical optimization and design method for analog and digital circuits
WO2007079238A2 (en) * 2005-12-30 2007-07-12 Saudi Arabian Oil Company Computational method for sizing three-phase separators
US7844926B1 (en) * 2006-01-31 2010-11-30 Oracle America, Inc. Specification window violation identification with application in semiconductor device design
US8332188B2 (en) * 2006-03-03 2012-12-11 Solido Design Automation Inc. Modeling of systems using canonical form functions and symbolic regression
US7353473B2 (en) * 2006-05-04 2008-04-01 International Business Machines Corporation Modeling small mosfets using ensemble devices
US7844927B2 (en) * 2007-01-19 2010-11-30 Globalfoundries Inc. Method for quality assured semiconductor device modeling
US20080312885A1 (en) * 2007-06-12 2008-12-18 Justsystems Evans Research, Inc. Hybrid method for simulation optimization
US8001515B2 (en) * 2007-12-21 2011-08-16 National Semiconductor Corporation Simultaneous optimization of analog design parameters using a cost function of responses
US8443329B2 (en) * 2008-05-16 2013-05-14 Solido Design Automation Inc. Trustworthy structural synthesis and expert knowledge extraction with application to analog circuit design
EP2194756B1 (en) * 2008-12-02 2016-07-27 Whirlpool Corporation A method for controlling the induction heating system of a cooking appliance
KR101794069B1 (ko) * 2010-05-26 2017-12-04 삼성전자주식회사 반도체 제조설비 및 그의 시즈닝 공정 최적화 방법
PL2753991T3 (pl) * 2011-09-10 2017-08-31 Abb Schweiz Ag Układ i sposób dla identyfikacji systemu instalacji przemysłowej lub procesu
US9323870B2 (en) 2012-05-01 2016-04-26 Advanced Micro Devices, Inc. Method and apparatus for improved integrated circuit temperature evaluation and IC design
CN102968064B (zh) * 2012-12-10 2015-10-28 上海市电力公司 一种发电机励磁系统模型的动态自动更新方法
US10169507B2 (en) * 2016-11-29 2019-01-01 Taiwan Semiconductor Manufacturing Co., Ltd. Variation-aware circuit simulation
CN109670138B (zh) * 2019-01-28 2023-02-03 三峡大学 基于分数Zener模型的植物油纸绝缘状态评估方法
CN116151172B (zh) * 2023-04-18 2023-07-04 中国电子科技集团公司信息科学研究院 Mems器件模型构建方法、装置及设计方法

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US5392221A (en) * 1991-06-12 1995-02-21 International Business Machines Corporation Procedure to minimize total power of a logic network subject to timing constraints
US6269277B1 (en) * 1998-07-27 2001-07-31 The Leland Stanford Junior University Board Of Trustees System and method for designing integrated circuits
US6295635B1 (en) * 1998-11-17 2001-09-25 Agilent Technologies, Inc. Adaptive Multidimensional model for general electrical interconnection structures by optimizing orthogonal expansion parameters
CN1160776C (zh) * 1999-03-01 2004-08-04 松下电器产业株式会社 晶体管最优化方法、集成电路布局设计方法及其相应装置
US6311145B1 (en) * 1999-06-17 2001-10-30 The Board Of Trustees Of The Leland Stanford Junior University Optimal design of an inductor and inductor circuit
US7065727B2 (en) * 2001-04-25 2006-06-20 Barcelona Design, Inc. Optimal simultaneous design and floorplanning of integrated circuit

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