JP2005322908A - 食違い配置の検出区域を有するモノリシックx線検出器 - Google Patents
食違い配置の検出区域を有するモノリシックx線検出器 Download PDFInfo
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- JP2005322908A JP2005322908A JP2005131323A JP2005131323A JP2005322908A JP 2005322908 A JP2005322908 A JP 2005322908A JP 2005131323 A JP2005131323 A JP 2005131323A JP 2005131323 A JP2005131323 A JP 2005131323A JP 2005322908 A JP2005322908 A JP 2005322908A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
- G01T1/366—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry with semi-conductor detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
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- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Measurement Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
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Abstract
【解決手段】 複数の列で食違い配置のピクセル(15)を使用するモノリシック固体検出器(12)は、ピクセル寸法の減縮を必要とすることなく空間分解能を改善する。CZTモノリスの平行四辺形の形状により、モノリス相互の間に効率の悪い区域を生じることなく一次元でタイリングが可能になる。走査装置(10,10’)は非矩形の形状を持つ検出器(12)の線形配列を使用し、走査範囲内で不感域が生じないように食違い配置の検出素子列が使用される。
【選択図】 図2
Description
12 モノリシックCZT結晶
14 前面
15 ピクセル領域
16、18 X線フォトン
20 後面
22 陰極
23 軸線
24 陽極
25 ガター領域
30 ステアリング電極
31 バイアス電圧源
32 電界
34 電荷坦体
36 導線
38 電荷積分器
39 電荷坦体
40 処理用コンピュータ
52 第1の底辺
54 走査方向
56 側壁
60、62 経路
Claims (10)
- 前面(14)及び後面(20)を持つモノリシック検出器素子(12)と、
前記前面(14)上の少なくとも1つの電極(22)と、
前記後面(20)上に配置された少なくとも2列の電極(24)であって、その各列が軸線に沿って相隔たる独立の検出領域(15)を規定しており、また相異なる列の検出領域(15)の中心が、列に沿って測ったとき、互いに対してずれている、当該少なくとも2列の電極(24)と、
を有している固体X線検出器(10,10’)。 - 前記ずれは前記軸線に沿った検出領域(15)の幅の半分である、請求項1記載の固体X線検出器(10,10’)。
- 前記独立の検出領域(15)は平行四辺形を画成する周縁を有している、請求項1記載の固体X線検出器(10,10’)。
- 前記列の端にあるモノリシック検出器素子(12)の少なくとも1つの端部は前記平行四辺形の一辺に平行であり、複数のモノリシック検出器素子(12)は端と端とをつなげて配列して、実質的にギャップを生じること無く又はこれらのモノリシック検出器素子(12)の中心間隔を変えること無く検出領域(15)の列を延長させることができる、請求項3記載の固体X線検出器(10,10’)。
- 前記独立の検出領域(15)は矩形を画成する周縁を有している、請求項1記載の固体X線検出器(10,10’)。
- 前記列の端にある検出領域(15)の面積が、前記列の端にない検出領域(15)の面積よりも小さく、また、複数のモノリシック検出器素子(12)は端と端とをつなげて配列して、これらの検出器素子(12)の中心間隔を変えること無く検出領域(15)の列を延長させることができる、請求項5記載の固体X線検出器(10,10’)。
- 前記列の端にある検出素子(15)は、台形の周縁を持つように前記列に対して角度をなして切断されている、請求項6記載の固体X線検出器(10,10’)。
- 更に、各々の前記電極(24)から独立の電流を読み取る読出し回路(40)を含んでいる請求項1記載の固体X線検出器(10,10’)。
- 前記後面(20)上の前記電極(24)はガター領域(25)によって電気的に分離されており、また、X線を受け取る際、第1列の前記ガター領域(25)内に入るX線は、前記固体X線検出器(10,10’)が前記列に対して直角な経路(54)に沿って掃引されるときに第2列内の非ガター領域に入るように構成されている、請求項1記載の固体X線検出器(10,10’)。
- 前記モノリシック検出器素子(12)はCZT、CdTe及びHgI2 より成る群から選択される、請求項1記載の固体X線検出器(10,10’)。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/838,892 US7196332B2 (en) | 2004-05-04 | 2004-05-04 | Monolithic x-ray detector with staggered detection areas |
US10/838,892 | 2004-05-04 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2005322908A true JP2005322908A (ja) | 2005-11-17 |
JP2005322908A5 JP2005322908A5 (ja) | 2008-06-19 |
JP5095921B2 JP5095921B2 (ja) | 2012-12-12 |
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Application Number | Title | Priority Date | Filing Date |
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JP2005131323A Expired - Fee Related JP5095921B2 (ja) | 2004-05-04 | 2005-04-28 | 食違い配置の検出区域を有するモノリシックx線検出器 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7196332B2 (ja) |
JP (1) | JP5095921B2 (ja) |
DE (1) | DE102005019975A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107771058A (zh) * | 2015-01-26 | 2018-03-06 | 伊利诺斯工具制品有限公司 | 线性检测器阵列的间隙分辨率 |
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US7551712B2 (en) * | 2006-04-20 | 2009-06-23 | General Electric Company | CT detector with non-rectangular cells |
US7638776B2 (en) * | 2006-08-21 | 2009-12-29 | Endicott Interconnect Technologies, Inc. | Staggered array imaging system using pixilated radiation detectors |
JP4344761B2 (ja) * | 2007-06-15 | 2009-10-14 | シャープ株式会社 | 固体撮像装置およびそれを備えた電子機器 |
JP4344760B2 (ja) * | 2007-06-15 | 2009-10-14 | シャープ株式会社 | 固体撮像装置およびそれを備えた電子機器 |
CN101911299B (zh) * | 2007-12-28 | 2014-06-04 | 皇家飞利浦电子股份有限公司 | X射线半导体成像器像素的电隔离 |
US9202961B2 (en) | 2009-02-02 | 2015-12-01 | Redlen Technologies | Imaging devices with solid-state radiation detector with improved sensitivity |
US8614423B2 (en) * | 2009-02-02 | 2013-12-24 | Redlen Technologies, Inc. | Solid-state radiation detector with improved sensitivity |
US8295570B2 (en) * | 2009-09-10 | 2012-10-23 | General Electric Company | Methods and apparatus for measuring body circumference |
US8300911B1 (en) | 2009-09-10 | 2012-10-30 | General Electric Company | Methods and apparatus for measuring visceral fat mass |
US8280138B2 (en) * | 2009-09-10 | 2012-10-02 | General Electric Company | System and method for performing bone densitometer measurements |
US8165266B2 (en) * | 2009-09-10 | 2012-04-24 | General Electric Company | Transverse scanning bone densitometer and detector used in same |
US20110060247A1 (en) * | 2009-09-10 | 2011-03-10 | General Electric Company | Methods and apparatus for measuring bone lengths |
US8884228B2 (en) | 2012-01-27 | 2014-11-11 | Savannah River Nuclear Solutions, Llc | Modification of solid state CdZnTe (CZT) radiation detectors with high sensitivity or high resolution operation |
US9508618B2 (en) * | 2014-04-11 | 2016-11-29 | Globalfoundries Inc. | Staggered electrical frame structures for frame area reduction |
EP3161522B1 (en) * | 2014-12-05 | 2018-02-28 | Koninklijke Philips N.V. | X-ray detector device for inclined angle x-ray radiation |
ITUA20163149A1 (it) * | 2016-05-04 | 2017-11-04 | Xnext S R L | Rivelatore, apparecchiatura e metodo per l’esecuzione di un controllo radiografico non invasivo di oggetti |
CN106324649B (zh) * | 2016-08-31 | 2023-09-15 | 同方威视技术股份有限公司 | 半导体探测器 |
SE2050777A1 (en) | 2020-06-26 | 2021-07-13 | Direct Conv Ab | Sensor unit, radiation detector, method of manufacturing sensor unit, and method of using sensor unit |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57141178A (en) * | 1981-02-26 | 1982-09-01 | Toshiba Corp | Solid-state image pickup device |
JPH01114741A (ja) * | 1987-10-28 | 1989-05-08 | Fuji Electric Co Ltd | 半導体回折x線検出素子 |
JPH02305063A (ja) * | 1989-05-18 | 1990-12-18 | Matsushita Electric Ind Co Ltd | イメージセンサ |
JP2002158343A (ja) * | 2000-11-21 | 2002-05-31 | Canon Inc | 放射線検出装置及びその製造方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5021663B1 (en) * | 1988-08-12 | 1997-07-01 | Texas Instruments Inc | Infrared detector |
US5841832A (en) | 1991-02-13 | 1998-11-24 | Lunar Corporation | Dual-energy x-ray detector providing spatial and temporal interpolation |
US5841833A (en) | 1991-02-13 | 1998-11-24 | Lunar Corporation | Dual-energy x-ray detector providing spatial and temporal interpolation |
US5436458A (en) * | 1993-12-06 | 1995-07-25 | Minnesota Mining And Manufacturing Company | Solid state radiation detection panel having tiled photosensitive detectors arranged to minimize edge effects between tiles |
JP3776485B2 (ja) * | 1995-09-18 | 2006-05-17 | 東芝医用システムエンジニアリング株式会社 | X線診断装置 |
US6037595A (en) | 1995-10-13 | 2000-03-14 | Digirad Corporation | Radiation detector with shielding electrode |
US5677539A (en) * | 1995-10-13 | 1997-10-14 | Digirad | Semiconductor radiation detector with enhanced charge collection |
US6410922B1 (en) * | 1995-11-29 | 2002-06-25 | Konstantinos Evangelos Spartiotis | Forming contacts on semiconductor substrates for radiation detectors and imaging devices |
US5889313A (en) * | 1996-02-08 | 1999-03-30 | University Of Hawaii | Three-dimensional architecture for solid state radiation detectors |
-
2004
- 2004-05-04 US US10/838,892 patent/US7196332B2/en active Active
-
2005
- 2005-04-27 DE DE102005019975A patent/DE102005019975A1/de not_active Ceased
- 2005-04-28 JP JP2005131323A patent/JP5095921B2/ja not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57141178A (en) * | 1981-02-26 | 1982-09-01 | Toshiba Corp | Solid-state image pickup device |
JPH01114741A (ja) * | 1987-10-28 | 1989-05-08 | Fuji Electric Co Ltd | 半導体回折x線検出素子 |
JPH02305063A (ja) * | 1989-05-18 | 1990-12-18 | Matsushita Electric Ind Co Ltd | イメージセンサ |
JP2002158343A (ja) * | 2000-11-21 | 2002-05-31 | Canon Inc | 放射線検出装置及びその製造方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107771058A (zh) * | 2015-01-26 | 2018-03-06 | 伊利诺斯工具制品有限公司 | 线性检测器阵列的间隙分辨率 |
CN107771058B (zh) * | 2015-01-26 | 2020-11-24 | 伊利诺斯工具制品有限公司 | 线性检测器阵列的间隙分辨率 |
Also Published As
Publication number | Publication date |
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US20050247882A1 (en) | 2005-11-10 |
US7196332B2 (en) | 2007-03-27 |
DE102005019975A1 (de) | 2005-11-24 |
JP5095921B2 (ja) | 2012-12-12 |
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