JP5162085B2 - 空間分解能を改善した固体x線検出器 - Google Patents
空間分解能を改善した固体x線検出器 Download PDFInfo
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- JP5162085B2 JP5162085B2 JP2005131325A JP2005131325A JP5162085B2 JP 5162085 B2 JP5162085 B2 JP 5162085B2 JP 2005131325 A JP2005131325 A JP 2005131325A JP 2005131325 A JP2005131325 A JP 2005131325A JP 5162085 B2 JP5162085 B2 JP 5162085B2
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- 239000007787 solid Substances 0.000 title claims description 8
- 230000000903 blocking effect Effects 0.000 claims description 9
- 230000005684 electric field Effects 0.000 claims description 6
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 6
- 229910052721 tungsten Inorganic materials 0.000 claims description 6
- 239000010937 tungsten Substances 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 4
- 229920002799 BoPET Polymers 0.000 claims description 3
- 239000005041 Mylar™ Substances 0.000 claims description 3
- 229910004613 CdTe Inorganic materials 0.000 claims description 2
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 description 25
- 239000013078 crystal Substances 0.000 description 23
- 239000002800 charge carrier Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 6
- 230000009977 dual effect Effects 0.000 description 5
- 238000013461 design Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 210000000988 bone and bone Anatomy 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000002360 explosive Substances 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 210000004872 soft tissue Anatomy 0.000 description 2
- 208000020084 Bone disease Diseases 0.000 description 1
- 208000001132 Osteoporosis Diseases 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000037182 bone density Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 235000013861 fat-free Nutrition 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000001727 in vivo Methods 0.000 description 1
- 238000003698 laser cutting Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 210000001519 tissue Anatomy 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
- G01T1/366—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry with semi-conductor detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14623—Optical shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14665—Imagers using a photoconductor layer
- H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/0296—Inorganic materials including, apart from doping material or other impurities, only AIIBVI compounds, e.g. CdS, ZnS, HgCdTe
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- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Molecular Biology (AREA)
- High Energy & Nuclear Physics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Life Sciences & Earth Sciences (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Toxicology (AREA)
- Measurement Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Light Receiving Elements (AREA)
Description
12 モノリシックCZT結晶
14 前面
15 ピクセル領域
16、18 X線フォトン
20 後面
22 陰極
23 軸線
24 陽極
25 ガター領域
30 ステアリング電極
31 バイアス電圧源
32 電界
34 電荷坦体
36 導線
38 電荷積分器
39 電荷坦体
40 処理用コンピュータ
44 タングステン・マスク
45 マリオン45
52 第1の底辺
54 走査方向
56 側壁
60、62 経路
Claims (8)
- 前面(14)及び後面(20)を持つモノリシック検出素子(12)と、
前記前面(14)の全体を覆うように前記前面上に直接設けられた少なくとも1つの陰極(22)と、
前記後面(20)の一部分のみを覆うように前記後面上に直接設けられた複数の陽極(24)であって、隣接する陽極の間に位置し、前記後面(20)の前記一部分以外の領域に対応するガター領域(25)によって電気的に分離されている複数の陽極(24)と、
前記陽極と整列した開口、及び前記ガター領域と整列した阻止要素(45)を持っていて、前記前面(14)側に設けられ、前記ガター領域の少なくとも一部分におけるX線を阻止するX線阻止マスク(44)と、
前記複数の陽極(24)を囲み、前記阻止マスク(44)と一致したパターンを有するステアリング電極(30)と、
を有し、
前記阻止マスク(44)は、前記ガター領域(25)におけるX線及び前記ガター領域(25)の側面に位置する領域におけるX線を阻止するように、前記ガター領域(25)よりも幅が広い、
固体X線検出器(10)。 - 前記陰極(22)と前記陽極(24)との間にバイアス電圧を印加して、電界を生成するバイアス電圧源(31)をさらに有する、請求項1記載の固体X線検出器。
- 前記モノリシック検出素子(12)はCZT、CdTe及びHgI2より成る群から選択される、請求項1または2に記載の固体X線検出器。
- 更に、前記モノリシック検出素子と前記X線阻止マスク(44)との間に配置された絶縁層(42)を含んでいる請求項1乃至3のいずれかに記載の固体X線検出器。
- 前記絶縁層(42)はマイラーのシートである、請求項4記載の固体X線検出器。
- 前記X線阻止マスク(44)はタングステンである、請求項1乃至5のいずれかに記載の固体X線検出器。
- 更に、前記陽極(24)の各々から独立の電流を読み取る読出し回路(40)を含んでいる請求項1乃至6のいずれかに記載の固体X線検出器。
- 前記陽極(24)は、直線的に縦及び横に配列されており、前記阻止マスク(44)は直線的な格子である、請求項1乃至7のいずれかに記載の固体X線検出器。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/838,893 | 2004-05-04 | ||
US10/838,893 US7145986B2 (en) | 2004-05-04 | 2004-05-04 | Solid state X-ray detector with improved spatial resolution |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005322909A JP2005322909A (ja) | 2005-11-17 |
JP5162085B2 true JP5162085B2 (ja) | 2013-03-13 |
Family
ID=35239449
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005131325A Expired - Fee Related JP5162085B2 (ja) | 2004-05-04 | 2005-04-28 | 空間分解能を改善した固体x線検出器 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7145986B2 (ja) |
JP (1) | JP5162085B2 (ja) |
FR (1) | FR2871293B1 (ja) |
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-
2004
- 2004-05-04 US US10/838,893 patent/US7145986B2/en not_active Expired - Lifetime
-
2005
- 2005-04-25 FR FR0504125A patent/FR2871293B1/fr not_active Expired - Fee Related
- 2005-04-28 JP JP2005131325A patent/JP5162085B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2005322909A (ja) | 2005-11-17 |
FR2871293B1 (fr) | 2008-06-13 |
US7145986B2 (en) | 2006-12-05 |
FR2871293A1 (fr) | 2005-12-09 |
US20050249331A1 (en) | 2005-11-10 |
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