AU2001271195A1 - Method and arrangement relating to x-ray imaging - Google Patents

Method and arrangement relating to x-ray imaging

Info

Publication number
AU2001271195A1
AU2001271195A1 AU2001271195A AU7119501A AU2001271195A1 AU 2001271195 A1 AU2001271195 A1 AU 2001271195A1 AU 2001271195 A AU2001271195 A AU 2001271195A AU 7119501 A AU7119501 A AU 7119501A AU 2001271195 A1 AU2001271195 A1 AU 2001271195A1
Authority
AU
Australia
Prior art keywords
ray imaging
arrangement relating
relating
arrangement
imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001271195A
Inventor
Mats Danielsson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Digital Mammography Sweden AB
Original Assignee
Mamea Imaging AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SE0002612A external-priority patent/SE522707C2/en
Application filed by Mamea Imaging AB filed Critical Mamea Imaging AB
Publication of AU2001271195A1 publication Critical patent/AU2001271195A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/1462—Coatings
    • H01L27/14623—Optical shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
AU2001271195A 2000-07-10 2001-07-10 Method and arrangement relating to x-ray imaging Abandoned AU2001271195A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US21764300P 2000-07-10 2000-07-10
SE0002612 2000-07-10
SE0002612A SE522707C2 (en) 2000-07-10 2000-07-10 Detecting entire signal from any photon converting in detector in X-ray detecting arrangement for X-ray imaging in radiography
US60217643 2000-07-10
PCT/SE2001/001609 WO2002004983A1 (en) 2000-07-10 2001-07-10 Method and arrangement relating to x-ray imaging

Publications (1)

Publication Number Publication Date
AU2001271195A1 true AU2001271195A1 (en) 2002-01-21

Family

ID=26655178

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001271195A Abandoned AU2001271195A1 (en) 2000-07-10 2001-07-10 Method and arrangement relating to x-ray imaging

Country Status (3)

Country Link
US (1) US6586742B2 (en)
AU (1) AU2001271195A1 (en)
WO (1) WO2002004983A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002022842A (en) * 2000-07-07 2002-01-23 Canon Inc X-ray image detector
AU2003273659A1 (en) * 2002-10-07 2004-04-23 Sunnybrook And Women's College Health Sciences Centre High quantum efficiency x-ray detector for portal imaging
US7145986B2 (en) * 2004-05-04 2006-12-05 General Electric Company Solid state X-ray detector with improved spatial resolution
DE102004048962B4 (en) * 2004-10-07 2006-09-21 Siemens Ag Digital x-ray imaging device or method for recording x-ray images in a digital x-ray imaging device
DE102005037860A1 (en) * 2005-08-10 2007-02-22 Deutsches Elektronen-Synchrotron Desy X-ray detector module
US10575800B2 (en) * 2017-03-08 2020-03-03 Prismatic Sensors Ab Increased spatial resolution for photon-counting edge-on x-ray detectors

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4618380A (en) * 1985-06-18 1986-10-21 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method of fabricating an imaging X-ray spectrometer
US4937453A (en) * 1987-05-06 1990-06-26 Nelson Robert S X-ray detector for radiographic imaging
US5156810A (en) * 1989-06-15 1992-10-20 Biocircuits Corporation Biosensors employing electrical, optical and mechanical signals
US5117114A (en) * 1989-12-11 1992-05-26 The Regents Of The University Of California High resolution amorphous silicon radiation detectors
US5268569A (en) * 1992-07-22 1993-12-07 Minnesota Mining And Manufacturing Company Imaging system having optimized electrode geometry and processing
WO1996041213A1 (en) * 1995-06-07 1996-12-19 Massachusetts Institute Of Technology X-ray detector and method for measuring energy of individual x-ray photons for improved imaging of subjects using reduced dose
US5627377A (en) * 1995-09-07 1997-05-06 Santa Barbara Research Center Single carrier-type solid-state radiation detector device
JPH0998970A (en) * 1995-10-06 1997-04-15 Canon Inc X-ray photographing equipment

Also Published As

Publication number Publication date
US20020117626A1 (en) 2002-08-29
WO2002004983A1 (en) 2002-01-17
US6586742B2 (en) 2003-07-01

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