JP2005171320A - Electrolytic peeling solution and electrolytic peeling method for copper - Google Patents

Electrolytic peeling solution and electrolytic peeling method for copper Download PDF

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JP2005171320A
JP2005171320A JP2003413387A JP2003413387A JP2005171320A JP 2005171320 A JP2005171320 A JP 2005171320A JP 2003413387 A JP2003413387 A JP 2003413387A JP 2003413387 A JP2003413387 A JP 2003413387A JP 2005171320 A JP2005171320 A JP 2005171320A
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copper
electrolytic
stripping solution
electrolytic stripping
silver
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JP4264338B2 (en
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Yoko Ogiwara
陽子 荻原
Masao Nakazawa
昌夫 中澤
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Shinko Electric Industries Co Ltd
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Shinko Electric Industries Co Ltd
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Priority to JP2003413387A priority Critical patent/JP4264338B2/en
Priority to KR1020040082415A priority patent/KR20050058184A/en
Priority to TW093132148A priority patent/TWI385283B/en
Priority to CNA2004100860305A priority patent/CN1626703A/en
Priority to US10/971,898 priority patent/US20050126926A1/en
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F5/00Electrolytic stripping of metallic layers or coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

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  • Chemical Kinetics & Catalysis (AREA)
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  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Electroplating Methods And Accessories (AREA)
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an electrolytic peeling solution free of cyanide compounds and capable of remarkably elongating its service life compared with that of a cyanide compound-containing electrolytic peeling solution, and to provide an electrolytic peeling method for copper. <P>SOLUTION: In a copper plating film formed on the circumferential face of a member, the part of the copper plating film exposed from a silver plating film partially covering the copper plating film is electrolytically peeled with the electrolytic peeling solution for copper. The electrolytic peeling solution is free of cyanide compounds and comprises a copper compound or an aromatic nitro compound as an oxidizing agent for copper, and further, its pH is controlled to 9 to 12. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

本発明は銅の電解剥離液及び銅の電解剥離方法に関し、更に詳細には、部材全面に形成した銅めっき皮膜を部分的に覆う銀めっき皮膜から露出する銅めっき皮膜を電解剥離によって剥離する銅の電解剥離液及び電解剥離方法に関する。   The present invention relates to a copper electrolytic stripping solution and a copper electrolytic stripping method. More specifically, the present invention relates to a copper that strips a copper plating film exposed from a silver plating film partially covering the copper plating film formed on the entire surface of the member by electrolytic stripping. The present invention relates to an electrolytic stripping solution and an electrolytic stripping method.

半導体装置に用いるリードフレームでは、図1に示す様に、鉄−ニッケル合金(42合金)等の鉄系合金材から成るリードフレーム10を構成するインナーリード12,12・・の各ダイパッド14側の先端部(以下、単に先端部と称する)に、ダイパッド14に搭載された半導体素子に一端部が接続された金ワイヤの他端部が接続されるボンディング部12aが形成される。
かかるボンディング部12aは、銀めっき皮膜が形成されており、金ワイヤの他端部が接続される。
In the lead frame used in the semiconductor device, as shown in FIG. 1, the inner leads 12, 12,... Constituting the lead frame 10 made of an iron-based alloy material such as an iron-nickel alloy (42 alloy) are arranged on the die pad 14 side. A bonding portion 12a is formed at the tip portion (hereinafter, simply referred to as the tip portion) to which the other end portion of the gold wire having one end portion connected to the semiconductor element mounted on the die pad 14 is connected.
The bonding part 12a is formed with a silver plating film and is connected to the other end of the gold wire.

図1に示す様に、鉄系合金から成るリードフレーム10の各インナーリード12の先端部に、銀めっき皮膜が形成されたボンディング部12aを形成する際には、リードフレーム10の全周に電解銅めっきによって銅めっき皮膜を形成する。
かかる銅めっき皮膜が形成されたリードフレーム10を、図2(a)に示す様に、インナーリード12の先端部20にボンディング部12aを形成する部分の銅めっき皮膜16のみが露出するように、ゴム製のマスク板18a,18bの間に挟み込み、露出した銅めっき皮膜16上に銀めっき皮膜を形成する電解銀めっきを施す。
次いで、電解銀めっきが終了した後、マスク板18a,18bを除去すると、図2(b)に示す様に、インナーリード12の先端部20のボンディング部12aを形成する部分のみに、部分銀めっき皮膜22が形成される。
その後、リードフレーム10を電解剥離液に浸漬し、リードフレーム10を陽極とする電解剥離によって、部分銀めっき皮膜22で覆われることなく露出する銅めっき皮膜16を除去することによって、図2(c)に示す様に、インナーリード12の先端部20のボンディング部12aを形成する部分のみに、銅めっき皮膜16と部分銀めっき皮膜22とから成るボンディング部12aが形成される。
As shown in FIG. 1, when forming a bonding portion 12 a on which a silver plating film is formed at the tip of each inner lead 12 of a lead frame 10 made of an iron-based alloy, the entire circumference of the lead frame 10 is electrolyzed. A copper plating film is formed by copper plating.
As shown in FIG. 2A, the lead frame 10 on which the copper plating film is formed is exposed so that only the portion of the copper plating film 16 that forms the bonding portion 12a is exposed at the tip 20 of the inner lead 12. Electrolytic silver plating that forms a silver plating film on the exposed copper plating film 16 is applied between the rubber mask plates 18a and 18b.
Next, after the electrolytic silver plating is completed, when the mask plates 18a and 18b are removed, as shown in FIG. 2 (b), only the portion where the bonding portion 12a of the tip portion 20 of the inner lead 12 is formed is partially silver plated. A film 22 is formed.
Thereafter, the lead frame 10 is dipped in an electrolytic stripping solution, and the copper plating film 16 exposed without being covered with the partial silver plating film 22 is removed by electrolytic stripping using the lead frame 10 as an anode, whereby FIG. ), A bonding portion 12a composed of a copper plating film 16 and a partial silver plating film 22 is formed only on the portion of the tip portion 20 of the inner lead 12 where the bonding portion 12a is to be formed.

ところで、マスク板18a,18bの間にリードフレーム10を挟み込んで、露出した銅めっき皮膜16上に銀めっき皮膜を形成する際に、マスク板18a,18bの歪み等によって、図2(b)に示す様に、マスク板18a,18bで覆われていた部分にも、電解銀めっき液が洩れ込むことに因る薄い銀めっき皮膜24(以下、洩れ銀24と称することがある)が形成される。この洩れ銀24も、銅めっき皮膜16の電解剥離によって除去され、図2(c)に示す様に、インナーリード12の先端部20のボンディング部12aを形成する部分のみに、部分銀めっき皮膜22が形成される。
この様に、部分銀めっき皮膜22を実質的に剥離せずに洩れ銀24及び銅めっき皮膜16を電解剥離する際には、下記特許文献1に記載されている様に、シアン系化合物を含有する電解剥離液が用いられている。
特開昭59−31900号公報(第2頁〜第3頁)
By the way, when the lead frame 10 is sandwiched between the mask plates 18a and 18b and a silver plating film is formed on the exposed copper plating film 16, due to the distortion of the mask plates 18a and 18b, etc., FIG. As shown, a thin silver plating film 24 (hereinafter sometimes referred to as leakage silver 24) due to leakage of the electrolytic silver plating solution is also formed on the portions covered with the mask plates 18a and 18b. . The leaked silver 24 is also removed by electrolytic peeling of the copper plating film 16, and as shown in FIG. 2C, the partial silver plating film 22 is formed only on the portion where the bonding portion 12a of the tip portion 20 of the inner lead 12 is formed. Is formed.
As described above, when the leakage silver 24 and the copper plating film 16 are electrolytically peeled without substantially peeling off the partial silver plating film 22, as described in Patent Document 1 below, a cyanide compound is contained. An electrolytic stripping solution is used.
JP 59-31900 A (pages 2 to 3)

特許文献1に記載されている様に、シアン系化合物を含有する電解剥離液に、インナーリード12の先端部20のみに、部分銀めっき皮膜22が形成されているリードフレーム10を浸漬し、このリードフレーム10を陽極とすると共に、ステンレス板を陰極とする銅の電解剥離を施すことによって、部分銀めっき皮膜22を実質的に剥離せずに洩れ銀24及び銅めっき皮膜16を電解剥離することができる。
しかし、シアン系化合物を含有する電解剥離液を継続して用い続けていると、比較的短時間で、洩れ銀24及び銅めっき皮膜16の電解剥離の際に、銅めっき皮膜16及び洩れ銀24の剥離速度が低下する。このため、かかる電解剥離液は、頻繁と交換することを要する。
また、シアン系化合物を含有する電解剥離液は、その安全性の面から、交換等の際に、特別の注意を要する。
そこで、本発明の課題は、シアン系化合物が無添加の電解剥離液であって、シアン系化合物を含有する電解剥離液に比較して、その寿命を大幅に延長し得る銅の電解剥離液及び電解剥離方法を提供することにある。
As described in Patent Document 1, the lead frame 10 on which the partial silver plating film 22 is formed is immersed only in the tip portion 20 of the inner lead 12 in an electrolytic stripping solution containing a cyanide compound. By performing electrolytic stripping of copper using the lead frame 10 as an anode and a stainless plate as a cathode, the leakage silver 24 and the copper plating film 16 are electrolytically stripped without substantially stripping the partial silver plating film 22. Can do.
However, if the electrolytic stripping solution containing a cyanide compound is continuously used, the copper plating film 16 and the leakage silver 24 can be removed during the electrolytic stripping of the leakage silver 24 and the copper plating film 16 in a relatively short time. The peeling speed of the is reduced. For this reason, this electrolytic stripper requires frequent replacement.
In addition, the electrolytic stripping solution containing a cyanide compound requires special attention when it is replaced from the viewpoint of safety.
Therefore, an object of the present invention is an electrolytic stripping solution to which a cyanide compound is not added, and a copper electrolytic stripping solution that can greatly extend its life compared to an electrolytic stripping solution containing a cyanide compound and It is to provide an electrolytic stripping method.

本発明者等は、前記課題を達成すべく検討した結果、シアン系化合物が無添加の電解剥離液であって、銅の酸化剤として、芳香族ニトロ化合物を添加した銅の電解剥離液を用い、図2(b)に示す、インナーリード12の先端部20のみに部分銀めっき皮膜22が形成されているリードフレーム10に電解剥離を施すことにより、部分銀めっき皮膜22を実質的に剥離することなく洩れ銀24及び銅めっき皮膜16を電解剥離できることを見出した。
更に、この電解剥離液の寿命は、シアン系化合物を含有する電解剥離液に比較して長いことも見出し、本発明に到達した。
As a result of investigations to achieve the above-mentioned problems, the present inventors have used an electrolytic stripping solution containing no cyanide compound, and using a copper electrolytic stripping solution containing an aromatic nitro compound as an oxidizing agent for copper. The partial silver plating film 22 is substantially peeled by performing electrolytic peeling on the lead frame 10 in which the partial silver plating film 22 is formed only on the tip 20 of the inner lead 12 shown in FIG. It has been found that the leakage silver 24 and the copper plating film 16 can be electrolytically stripped without any problems.
Furthermore, it has been found that the lifetime of this electrolytic stripper is longer than that of an electrolytic stripper containing a cyanide compound, and has reached the present invention.

すなわち、本発明は、部材全面に形成した銅めっき皮膜を部分的に覆う銀めっき皮膜から露出する銅めっき皮膜を電解剥離によって剥離する銅の電解剥離液において、該電解剥離液は、シアン系化合物が無添加の電解剥離液であって、銅の酸化剤としての銅化合物又は芳香族ニトロ化合物が含有されていると共に、pHが9〜12に調整されていることを特徴とする銅の電解剥離液にある。
また、本発明は、部材全面に形成した銅めっき皮膜を部分的に覆う銀めっき皮膜から露出する銅めっき皮膜を電解剥離によって剥離する際に、該電解剥離に用いる銅の電解剥離液として、前述した銅の電解剥離液を用い、前記銅の電解剥離液中に浸漬した前記部材を陽極とすることを特徴とする銅の電解剥離方法でもある。
That is, the present invention relates to a copper electrolytic stripping solution for stripping a copper plating film exposed from a silver plating film partially covering the copper plating film formed on the entire surface of the member by electrolytic stripping, wherein the electrolytic stripping solution is a cyanide compound. Is an electrolytic stripping solution containing no additive, and contains a copper compound or aromatic nitro compound as an oxidizing agent for copper, and has a pH adjusted to 9 to 12 and is electrolytically stripped of copper In the liquid.
Further, the present invention provides the copper electrolytic stripping solution used for the electrolytic stripping as described above when stripping the copper plated coating exposed from the silver plated coating partially covering the copper plated coating formed on the entire surface of the member by electrolytic stripping. It is also a copper electrolytic stripping method characterized by using the copper electrolytic stripping solution thus obtained and using the member immersed in the copper electrolytic stripping solution as an anode.

かかる本発明において、電解剥離液中に含有している銅の酸化剤としては、銅アンモニウム錯体が好ましい。この銅アンモニウム錯体は、電解剥離液にアンモニウム源としてのアンモニア水又はアンモニウム塩と、銅源としての硫酸銅、炭酸銅、シュウ酸銅又は水酸化銅とを添加することによって形成できる。
この様な、銅の酸化剤としての銅化合物又は芳香族ニトロ化合物が含有されている電解剥離液に、リン酸及びその塩、クエン酸や酒石酸等の有機酸及びその塩、炭酸塩、炭酸水素塩、グルタミン酸やアスパラギン酸等のアミノカルボン酸及びその塩から成る群から選ばれた少なくとも一種の化合物を添加することによって、電解剥離液の電気伝導度の調整を図ることができる。
また、電解剥離液には、銀の剥離剤として、銀と反応して錯体を形成する化合物を添加することにより、洩れ銀等を迅速に剥離できる。この銀と反応して錯体を形成する化合物としては、ピリジンカルボン酸、チオシアン酸塩、ジメチルヒダントイン又はコハク酸イミドを用いることができる。
更に、電解剥離液には、界面活性剤を添加することによって、電解剥離を施す部材の電解剥離液に対する濡れ性を向上できる。かかる界面活性剤としては、ポリオキシエチレン鎖を有する界面活性剤又はフッ素系界面活性剤を好適に用いることができる。
かかる本発明に係る銅の電解剥離液を用いる部材としては、鉄系合金材から成るリードフレームを好適に用いることができ、電解剥離を施す際には、電解剥離中に金属が溶出することのない金属から成る電極を陰極に用いることが好ましい。
In the present invention, the copper oxidant contained in the electrolytic stripper is preferably a copper ammonium complex. This copper ammonium complex can be formed by adding ammonia water or an ammonium salt as an ammonium source and copper sulfate, copper carbonate, copper oxalate or copper hydroxide as a copper source to the electrolytic stripping solution.
In such an electrolytic stripping solution containing a copper compound or aromatic nitro compound as an oxidizing agent for copper, phosphoric acid and its salt, organic acid such as citric acid and tartaric acid and its salt, carbonate, hydrogen carbonate By adding at least one compound selected from the group consisting of salts, aminocarboxylic acids such as glutamic acid and aspartic acid, and salts thereof, the electrical conductivity of the electrolytic stripping solution can be adjusted.
Moreover, leakage silver etc. can be rapidly peeled by adding the compound which reacts with silver and forms a complex as a silver peeling agent to an electrolytic stripping solution. As a compound that reacts with silver to form a complex, pyridinecarboxylic acid, thiocyanate, dimethylhydantoin, or succinimide can be used.
Furthermore, the wettability with respect to the electrolytic stripping solution of the member to be electrolytically stripped can be improved by adding a surfactant to the electrolytic stripping solution. As such a surfactant, a surfactant having a polyoxyethylene chain or a fluorosurfactant can be suitably used.
As a member using the copper electrolytic stripping solution according to the present invention, a lead frame made of an iron-based alloy material can be suitably used. When electrolytic stripping is performed, metal is eluted during electrolytic stripping. It is preferable to use an electrode made of no metal for the cathode.

従来から用いられているシアン系化合物が添加された電解剥離液の寿命が短い原因は、次のように考えられる。
電解剥離液中のシアン系化合物は、電解剥離処理量に伴なって電解剥離液中の銀濃度が次第に上昇する。この電解剥離液中の銀濃度が上昇すると、電解剥離液中の銀イオンは剥離する銅めっき皮膜の銅と置換反応を惹起し、銅の剥離速度を低下させる。
更に、シアン系化合物は、銀とも容易に錯体を形成し易いため、銅めっき皮膜の剥離と共に、部分銀めっき皮膜も剥離する。このため、銅めっき皮膜の剥離を終了したとき、部分銀めっき皮膜の表面を粗面化して、外観を損ね易い。
The reason for the short life of the electrolytic stripping solution to which a cyan compound conventionally used is added is considered as follows.
In the cyan compound in the electrolytic stripping solution, the silver concentration in the electrolytic stripping solution gradually increases with the amount of electrolytic stripping treatment. When the silver concentration in the electrolytic stripping solution increases, the silver ions in the electrolytic stripping solution cause a substitution reaction with the copper of the copper plating film to be stripped, thereby reducing the copper stripping rate.
Furthermore, since a cyanide compound easily forms a complex with silver, the partial silver plating film peels off together with the peeling of the copper plating film. For this reason, when peeling of a copper plating film is complete | finished, the surface of a partial silver plating film is roughened and it is easy to impair an external appearance.

これに対し、本発明に係る電解剥離液は、シアン系化合物が無添加の電解剥離液であって、銅の酸化剤としての銅化合物又は芳香族ニトロ化合物が含有されている。
この様に、本発明に係る電解剥離液には、銀と錯体を形成し易いシアン系化合物が添加されていないため、その電解剥離の際に、部分銀めっき皮膜よりも銅めっき皮膜を選択的に剥離できる。
但し、本発明に係る電解剥離液でも、銅めっき皮膜の剥離速度に比較して遅いが、銅めっき皮膜上に形成された洩れ銀を剥離できる。
かかる部分銀めっき皮膜や洩れ銀等から本発明に係る電解剥離液中に溶出された銀イオンは、電解剥離液中に一定量は錯体として存在するものの、多くは陰極等に析出して電解剥離液中の銀濃度の高濃度化を抑制できる。
その結果、本発明に係る電解剥離液によれば、電解剥離液中の銀の蓄積に起因する銅めっき皮膜の剥離速度の低下や部分銀めっき皮膜の外観の粗面化を防止でき、シアン系化合物が添加された従来の電解剥離液に比較して、その寿命を大幅に延長できる。
On the other hand, the electrolytic stripping solution according to the present invention is an electrolytic stripping solution to which a cyanide compound is not added, and contains a copper compound or an aromatic nitro compound as an oxidizing agent for copper.
Thus, since the cyanide compound that easily forms a complex with silver is not added to the electrolytic stripping solution according to the present invention, a copper plating film is more selective than a partial silver plating film during the electrolytic stripping. Can be peeled off.
However, even with the electrolytic stripping solution according to the present invention, the leakage silver formed on the copper plating film can be stripped although it is slower than the stripping rate of the copper plating film.
Although a certain amount of silver ions eluted in the electrolytic stripping solution according to the present invention from such a partial silver plating film or leaked silver is present as a complex in the electrolytic stripping solution, many of them are deposited on the cathode or the like and electrolytic stripped. An increase in the silver concentration in the liquid can be suppressed.
As a result, according to the electrolytic stripping solution of the present invention, it is possible to prevent a decrease in the stripping rate of the copper plating film and roughening of the appearance of the partial silver plating film due to the accumulation of silver in the electrolytic stripping solution, Compared with the conventional electrolytic stripping solution to which the compound is added, the lifetime can be greatly extended.

本発明に係る電解剥離液は、シアン系化合物が無添加の電解剥離液であって、銅の酸化剤としての銅化合物又は芳香族ニトロ化合物を含有していることが肝要である。
この銅の酸化剤としての銅化合物は、銅アンモニウム錯体が好適である。かかる銅アンモニウム錯体は、アンモニウム源としてのアンモニア水又はアンモニウム塩と、銅源としての硫酸銅、炭酸銅、シュウ酸銅又は水酸化銅とを電解剥離液に添加することによって形成できる。
この様なアンモニウム源と銅源とを添加した電解剥離液中に形成される銅アンモニウム錯体は、[Cu(NH422+、[Cu(NH442+及び[Cu(NH462+の1種又は2種以上から成る。
また、芳香族ニトロ化合物としては、クロロニトロ安息香酸、2−クロロ−4−ニトロ安息香酸、オルトニトロ安息香酸、メタニトロ安息香酸、パラニトロ安息香酸、パラニトロ安息香酸エチル、パラニトロ安息香酸ナトリウムを好適に用いることができる。
ここで、銅の酸化剤としての銅化合物又は芳香族ニトロ化合物を含有しているものの、シアン系化合物が添加された電解剥離液では、部分銀めっきの外見が良好であっても、電解剥離液の寿命の延長を図ることができない。
The electrolytic stripping solution according to the present invention is an electrolytic stripping solution to which a cyanide compound is not added, and it is important that it contains a copper compound or an aromatic nitro compound as a copper oxidizing agent.
The copper compound as the copper oxidizing agent is preferably a copper ammonium complex. Such a copper ammonium complex can be formed by adding ammonia water or an ammonium salt as an ammonium source and copper sulfate, copper carbonate, copper oxalate or copper hydroxide as a copper source to the electrolytic stripping solution.
The copper ammonium complex formed in the electrolytic stripping solution to which such an ammonium source and a copper source are added is [Cu (NH 4 ) 2 ] 2+ , [Cu (NH 4 ) 4 ] 2+ and [Cu ( It consists of one or more of NH 4 ) 6 ] 2+ .
As the aromatic nitro compound, chloronitrobenzoic acid, 2-chloro-4-nitrobenzoic acid, orthonitrobenzoic acid, metanitrobenzoic acid, paranitrobenzoic acid, ethyl paranitrobenzoate, sodium paranitrobenzoate are preferably used. it can.
Here, an electrolytic stripping solution containing a copper compound or an aromatic nitro compound as a copper oxidant, to which a cyanide compound is added, can be used even if the appearance of partial silver plating is good. It is not possible to extend the lifespan.

更に、本発明に係る電解剥離液では、pHが9〜12に調整されていることを要する。かかるpHの調整は、銅アンモニウム錯体を形成する化合物として添加する、アンモニウム源としてのアンモニア水によって調整してもよく、水酸化ナトリウム等のpH調整剤を用いてもよい。
ここで、電解剥離液のpHが9未満の場合、或いは電解剥離液のpHが12を越える場合には、銅めっき皮膜の剥離速度が低下する。
Furthermore, in the electrolytic stripping solution according to the present invention, the pH needs to be adjusted to 9-12. Such pH adjustment may be carried out with ammonia water as an ammonium source added as a compound that forms a copper ammonium complex, or a pH regulator such as sodium hydroxide may be used.
Here, when the pH of the electrolytic stripping solution is less than 9, or when the pH of the electrolytic stripping solution exceeds 12, the stripping rate of the copper plating film decreases.

かかる本発明に係る電解剥離液には、リン酸及びその塩、クエン酸や酒石酸等の有機酸及びその塩、炭酸塩、炭酸水素塩、グリシン、グルタミン酸及びアスパラギン酸から成る群から選ばれた少なくとも一種の化合物を添加することによって、電解剥離液の電気伝導度の調整を図ることができる。
ここで用いるリン酸及びその塩としては、電解剥離液の電気伝導度の調整に有効であり、リン酸、メタリン酸、オルトリン酸及びこれらのアンモニウム塩、カリウム塩、ナトリウム塩(具体的には、リン酸二水素アンモニウム、リン酸水素二アンモニウム、リン酸三アンモニウム、リン酸水素二カリウム、リン酸二水素一カリウム、リン酸水素二ナトリウム、リン酸二水素ナトリウム、ピロリン酸カリウムを挙げることができる)を用いることができる。かかる化合物のうち、リン酸、リン酸二水素アンモニウム、リン酸水素二アンモニウム、リン酸三アンモニウム、リン酸水素二カリウム、リン酸二水素一カリウム、リン酸水素二ナトリウム、リン酸二水素ナトリウムを好適に用いることができる。
The electrolytic stripping solution according to the present invention includes at least selected from the group consisting of phosphoric acid and salts thereof, organic acids such as citric acid and tartaric acid and salts thereof, carbonates, hydrogencarbonates, glycine, glutamic acid and aspartic acid. By adding a kind of compound, the electrical conductivity of the electrolytic stripping solution can be adjusted.
As phosphoric acid and its salt used here, it is effective in adjusting the electric conductivity of the electrolytic stripping solution, and phosphoric acid, metaphosphoric acid, orthophosphoric acid and their ammonium salts, potassium salts, sodium salts (specifically, Ammonium dihydrogen phosphate, diammonium hydrogen phosphate, triammonium phosphate, dipotassium hydrogen phosphate, monopotassium dihydrogen phosphate, disodium hydrogen phosphate, sodium dihydrogen phosphate, potassium pyrophosphate ) Can be used. Among such compounds, phosphoric acid, ammonium dihydrogen phosphate, diammonium hydrogen phosphate, triammonium phosphate, dipotassium hydrogen phosphate, monopotassium dihydrogen phosphate, disodium hydrogen phosphate, sodium dihydrogen phosphate It can be used suitably.

また、有機酸及びその塩は、電解剥離液の電気伝導度の調整に有効であり、ギ酸、酢酸、シュウ酸、プロピオン酸、酪酸、吉草酸、クエン酸、乳酸、酒石酸、コハク酸、安息香酸、ベンゼンスルホン酸及びこれらのアンモニウム塩、カリウム塩、ナトリウム塩(具体的には、ギ酸アンモニウム、ギ酸カリウム、酢酸アンモニウム、酢酸カリウム、シュウ酸水素アンモニウム、クエン酸二水素アンモニウム、クエン酸水素二アンモニウム、クエン酸三アンモニウム、クエン酸二水素カリウム、クエン酸三カリウム、酒石酸アンモニウム、酒石酸カリウム、コハク酸アンモニウム、コハク酸カリウムを挙げることができる)を用いることができる。かかる有機酸及びその塩のうち、ギ酸、クエン酸、酒石酸、コハク酸、ギ酸アンモニウム、クエン酸二水素アンモニウム、クエン酸水素二アンモニウム、クエン酸三アンモニウム、クエン酸二水素カリウム、クエン酸三カリウム、酒石酸アンモニウム、酒石酸カリウム、コハク酸アンモニウム、コハク酸カリウムを好適に用いることができる。   In addition, organic acids and their salts are effective in adjusting the electrical conductivity of the electrolytic stripping solution. Formic acid, acetic acid, oxalic acid, propionic acid, butyric acid, valeric acid, citric acid, lactic acid, tartaric acid, succinic acid, benzoic acid Benzenesulfonic acid and ammonium salts, potassium salts and sodium salts thereof (specifically, ammonium formate, potassium formate, ammonium acetate, potassium acetate, ammonium hydrogen oxalate, ammonium dihydrogen citrate, diammonium hydrogen citrate, And triammonium citrate, potassium dihydrogen citrate, tripotassium citrate, ammonium tartrate, potassium tartrate, ammonium succinate, and potassium succinate). Among such organic acids and salts thereof, formic acid, citric acid, tartaric acid, succinic acid, ammonium formate, ammonium dihydrogen citrate, diammonium hydrogen citrate, triammonium citrate, potassium dihydrogen citrate, tripotassium citrate, Ammonium tartrate, potassium tartrate, ammonium succinate, and potassium succinate can be suitably used.

更に、炭酸塩、炭酸水素塩は、電解剥離液の電気伝導度の調整に有効であり、炭酸アンモニウム、炭酸水素アンモニウム、炭酸カリウム、炭酸水素カリウム、炭酸ナトリウム、炭酸水素ナトリウムを挙げることができる。かかる化合物のうち、炭酸アンモニウム、炭酸水素アンモニウム、炭酸カリウム、炭酸水素カリウムを好適に用いることができる。
また、グルタミン酸やアスパラギン酸等のアミノカルボン酸及びその塩も、電解剥離液の電気伝導度の調整に有効であり、グリシン、グルタミン酸、アスパラギン酸、システイン、メチオニン、スレオニン、セリン、アルギニン及びこれらのアンモニウム塩、カリウム塩、ナトリウム塩を挙げることができる。これらの化合物のうち、グリシン、グルタミン酸、アスパラギン酸を好適に用いることができる。
尚、剥離対象の銅めっき皮膜及び洩れ銀の各表面の電解剥離液に対する濡れ性を向上すべく、界面活性剤として、例えばポリオキシエチレン鎖を有する界面活性剤又はフッ素系界面活性剤を添加してもよい。
Furthermore, carbonates and hydrogen carbonates are effective in adjusting the electric conductivity of the electrolytic stripping solution, and examples thereof include ammonium carbonate, ammonium hydrogen carbonate, potassium carbonate, potassium hydrogen carbonate, sodium carbonate, and sodium hydrogen carbonate. Of these compounds, ammonium carbonate, ammonium hydrogen carbonate, potassium carbonate, and potassium hydrogen carbonate can be suitably used.
In addition, aminocarboxylic acids such as glutamic acid and aspartic acid and salts thereof are also effective in adjusting the electric conductivity of the electrolytic stripping solution, and are glycine, glutamic acid, aspartic acid, cysteine, methionine, threonine, serine, arginine and their ammonium. Examples thereof include salts, potassium salts, and sodium salts. Of these compounds, glycine, glutamic acid, and aspartic acid can be suitably used.
In addition, in order to improve the wettability with respect to the electrolytic stripping solution on each surface of the copper plating film and leakage silver to be peeled, for example, a surfactant having a polyoxyethylene chain or a fluorosurfactant is added. May be.

この様な、本発明に係る電解剥離液を用い、図2(b)に示す洩れ銀24が銅めっき皮膜16上に形成されたリードフレーム10を電解剥離する際に、図2(b)に示す洩れ銀24を剥離しつつ、銅めっき皮膜16を剥離できる。
この際に、洩れ銀24の剥離速度を更に向上したい場合には、銀の剥離剤として、銀と反応して錯体を形成する化合物、例えばピリジンカルボン酸、チオシアン酸塩、ジメチルヒダントイン又はコハク酸イミドを添加してもよい。
When electrolytic leakage of the lead frame 10 in which the leakage silver 24 shown in FIG. 2 (b) is formed on the copper plating film 16 using the electrolytic stripping solution according to the present invention is shown in FIG. 2 (b). The copper plating film 16 can be peeled while peeling the leaked silver 24 shown.
At this time, when it is desired to further improve the peeling rate of the leaked silver 24, a compound that reacts with silver to form a complex, such as pyridinecarboxylic acid, thiocyanate, dimethylhydantoin, or succinimide, as a silver release agent. May be added.

以上、説明してきた本発明に係る電解剥離液を用いて、図2(b)に示すリードフレーム10の洩れ銀24及び銅めっき皮膜16を電解剥離する際には、電解剥離液が貯留された剥離槽内に浸漬した陽極としてのリードフレーム10と陰極との間に直流電流を流すことによって、洩れ銀24及び銅めっき皮膜16を電解剥離できる。
かかる電解剥離の際に、陰極としては、電解剥離中に金属が溶出することのない金属から成る電極、例えば白金やステンレスから成る電極を好適に用いることができる。この様に、電解剥離中に金属が溶出することのない金属から成る電極を陰極に用いることによって、電解剥離液中に銀イオンを陰極に析出させることができ、電解剥離液中の銀濃度を低濃度に抑制でき且つ銀の回収を容易に行うことができる。
尚、この電解剥離では、電流密度を0.01〜20A/dm2、好ましくは0.1〜10A/dm2程度とし、処理時間としては2〜30秒程度とすることが好ましい。
As described above, the electrolytic stripper was stored when electrolytically stripping the leaked silver 24 and the copper plating film 16 of the lead frame 10 shown in FIG. 2B using the electrolytic stripper according to the present invention described above. The leakage silver 24 and the copper plating film 16 can be electrolytically peeled by passing a direct current between the lead frame 10 as the anode immersed in the peeling tank and the cathode.
In such electrolytic stripping, as the cathode, an electrode made of a metal that does not elute during electrolytic stripping, for example, an electrode made of platinum or stainless steel can be suitably used. Thus, by using an electrode made of a metal that does not elute during electrolytic stripping as a cathode, silver ions can be deposited on the cathode in the electrolytic stripper, and the silver concentration in the electrolytic stripper can be reduced. It can be suppressed to a low concentration and silver can be easily recovered.
In this electrolytic stripping, current density 0.01~20A / dm 2, preferably between 0.1 to 10 A / dm 2 about, preferably about 2 to 30 seconds treatment time.

鉄−ニッケル合金(42合金)から成るリードフレーム10の全面に電解銅めっきによって、厚さ0.1〜0.2μmの銅めっき皮膜16を形成した後、図2(a)に示す様に、インナーリード12の先端部20にボンディング部12aを形成する部分の銅めっき皮膜16のみが露出するように、ゴム製のマスク板18a,18bの間に挟み込み、露出した銅めっき皮膜16上に、電解銀めっきによって厚さ3〜6μmの部分銀めっき皮膜22形成した。
次いで、マスク板18a,18bを除去すると、図2(b)に示す様に、インナーリード12の先端部20のボンディング部12aを形成する部分に、部分銀めっき皮膜22が形成されていた。
唯、マスク板18a,18bで覆われていた部分にも、図2(b)に示す様に、洩れ銀24が所々に形成されていた。
After forming a copper plating film 16 having a thickness of 0.1 to 0.2 μm by electrolytic copper plating on the entire surface of the lead frame 10 made of iron-nickel alloy (42 alloy), as shown in FIG. The inner lead 12 is sandwiched between the rubber mask plates 18a and 18b so that only the portion of the copper plating film 16 that forms the bonding portion 12a is exposed at the tip 20 of the inner lead 12, and the exposed copper plating film 16 is electrolyzed. A partial silver plating film 22 having a thickness of 3 to 6 μm was formed by silver plating.
Next, when the mask plates 18a and 18b were removed, as shown in FIG. 2B, the partial silver plating film 22 was formed on the portion where the bonding portion 12a of the tip portion 20 of the inner lead 12 was formed.
However, as shown in FIG. 2 (b), leaked silver 24 was also formed in places in the portions covered with the mask plates 18a and 18b.

かかるリードフレーム10を、下記表1に示す電解剥離液を貯留した剥離槽内に浸漬し、陽極としてのリードフレーム10と白金電極から成る陰極との間に直流電流を流して、洩れ銀24及び銅めっき皮膜16に対して電解剥離を施した。

Figure 2005171320
The lead frame 10 is immersed in a stripping tank in which an electrolytic stripping solution shown in Table 1 below is stored, and a direct current is passed between the lead frame 10 as an anode and a cathode made of a platinum electrode. Electrolytic peeling was performed on the copper plating film 16.
Figure 2005171320

かかる電解剥離の際に、使用した電解剥離液、電流密度及び処理時間を下記表2に示す。また、電解剥離の結果についても下記表2に併せて示す。表2に示す各水準では、露出している銅めっき皮膜16及び洩れ銀24の残存、部分銀めっき皮膜22の変色及びリードフレーム10を形成する42合金の腐食は認められなかった。

Figure 2005171320
表2から明らかな様に、No.1〜12の水準では、部分銀めっき皮膜22の斑及び光沢変化がなく良好な結果であった。これに対し、No.13の水準では、部分銀めっき皮膜22の斑及び光沢変化が認められた。 Table 2 below shows the electrolytic stripping solution, current density, and processing time used during the electrolytic stripping. The results of electrolytic stripping are also shown in Table 2 below. At each level shown in Table 2, the exposed copper plating film 16 and leakage silver 24 remained, discoloration of the partial silver plating film 22, and corrosion of the 42 alloy forming the lead frame 10 were not observed.
Figure 2005171320
As is clear from Table 2, at the levels of No. 1 to No. 12, there were no spots and gloss changes of the partial silver plating film 22, and the results were good. On the other hand, at the level of No. 13, spots and gloss changes of the partial silver plating film 22 were observed.

表1の電解剥離液5を用いて銅と銀とを所定量処理した後に銅及び銀の剥離速度を測定した。この剥離速度は、予め銅と銀とを等量づつ所定量処理した電解剥離液5に、陽極として浸漬した銅板又は銀板に対し、表2のNo.7の電解剥離条件下で電解剥離を施した後、銅板又は銀板の重量減を測定して得たものである。
電解剥離液5に予め処理する銅と銀との処理量を変更して測定した、銅及び銀の剥離速度についての結果を図3に示す。
図3から明らかな様に、銅及び銀の処理量が増加しても、銅及び銀の処理量がゼロ(建浴直後)における銅及び銀の剥離速度に比較して、銅の剥離速度はやや速くなる傾向にあり、銀の剥離速度はやや低下傾向にあるものの、略同一速度である。
この様に、電解剥離液5では、銅及び銀の処理量が増加しても、建浴直後の電解剥離液5と同程度の銅及び銀の剥離速度を維持でき、電解剥離液5の交換間隔を長くできる。
Copper and silver were treated with a predetermined amount using the electrolytic stripping solution 5 shown in Table 1, and then the stripping rate of copper and silver was measured. This stripping rate is obtained by subjecting the electrolytic stripping solution 5 in which copper and silver are treated in equal amounts in advance to a copper plate or silver plate immersed as an anode to electrolytic stripping under the electrolytic stripping conditions of No. 7 in Table 2. After the application, the weight loss of the copper plate or silver plate is measured.
The result about the peeling speed | rate of copper and silver which changed and measured the processing amount of the copper and silver previously processed to the electrolytic stripping solution 5 is shown in FIG.
As is clear from FIG. 3, even when the treatment amount of copper and silver is increased, the removal rate of copper is higher than the removal rate of copper and silver when the treatment amount of copper and silver is zero (immediately after the bath). Although it tends to be slightly faster and the silver peeling rate tends to decrease slightly, it is almost the same rate.
Thus, in the electrolytic stripping solution 5, even when the amount of copper and silver processed increases, the copper stripping rate and the silver stripping rate can be maintained at the same level as the electrolytic stripping solution 5 immediately after the bathing bath. The interval can be lengthened.

比較例Comparative example

表1の電解剥離液9を用いて、実施例2と同様にして、表2のNo.12※の電解剥離条件下での電解剥離における銅及び銀の剥離速度についての結果を図4に示す。
図4から明らかな様に、銅及び銀の処理量がゼロ(建浴直後)における銅及び銀の剥離速度は良好であるものの、銅及び銀の処理量の増加に伴なって銅の剥離速度は急激に低下し、その後は略一定値となる。
かかる現象は、シアン化合物が、銅及び銀の各々と錯体を形成し易いことに起因しているものと考えられる。つまり、シアン化合物を含有する電解剥離液は、当初は、銅のみならず、銀の剥離能力も非常に高いが、電解剥離液中の銀濃度が上昇すると、電解剥離液中の銀イオンは剥離する銅めっき皮膜の銅と置換反応を惹起し、銅の剥離速度を低下させることにあると考えられる。
かかる図4から明らかな様に、建浴直後の電解剥離液9が呈する銅及び銀の剥離速度を維持するには、電解剥離液9を頻繁に交換することを要する。
Using the electrolytic stripping solution 9 of Table 1, the results of the copper and silver stripping rates in the electrolytic stripping under the electrolytic stripping conditions of No. 12 * in Table 2 are shown in FIG. .
As is clear from FIG. 4, although the copper and silver stripping rates are zero (immediately after building bath), the copper and silver stripping rates are good, but the copper stripping rate increases as the copper and silver throughput increases. Decreases rapidly, and then becomes a substantially constant value.
Such a phenomenon is considered to be caused by the fact that the cyan compound easily forms a complex with each of copper and silver. In other words, the electrolytic stripping solution containing cyanide initially has a very high stripping ability not only for copper but also for silver, but when the silver concentration in the electrolytic stripping solution increases, the silver ions in the electrolytic stripping solution are stripped. It is thought that this causes the substitution reaction with copper of the copper plating film to be reduced, thereby reducing the copper peeling rate.
As is apparent from FIG. 4, it is necessary to frequently replace the electrolytic stripping solution 9 in order to maintain the copper and silver stripping rate exhibited by the electrolytic stripping solution 9 immediately after the building bath.

電解剥離を施す部材としてのリードフレームを説明する部分平面図である。It is a fragmentary top view explaining the lead frame as a member which performs electrolytic peeling. 図1に示すリードフレームに施す部分銀めっき及び洩れ銀について説明する部分断面図である。It is a fragmentary sectional view explaining the partial silver plating and leakage silver which are given to the lead frame shown in FIG. 本発明に係る電解剥離液について、銅と銀とを所定量処理した電解剥離液の呈する銅及び銀の剥離速度を測定したグラフである。It is the graph which measured the peeling rate of copper and silver which the electrolytic stripping solution which processed copper and silver the predetermined amount about the electrolytic stripping solution which concerns on this invention. シアン化合物を添加した電解剥離液について、銅と銀とを所定量処理した電解剥離液の呈する銅及び銀の剥離速度を測定したグラフである。It is the graph which measured the peeling rate of the copper and silver which the electrolytic stripping solution which processed copper and silver predetermined amount about the electrolytic stripping solution which added the cyanide compound.

符号の説明Explanation of symbols

10 リードフレーム
12 インナーリード
12a ボンディング部
14 ダイパッド
16 銅めっき皮膜
20 インナーリードの先端部
22 部分銀めっき皮膜
24 洩れ銀
DESCRIPTION OF SYMBOLS 10 Lead frame 12 Inner lead 12a Bonding part 14 Die pad 16 Copper plating film 20 End part 22 of inner lead Partial silver plating film 24 Leakage silver

Claims (11)

部材全面に形成した銅めっき皮膜を部分的に覆う銀めっき皮膜から露出する銅めっき皮膜を電解剥離によって剥離する銅の電解剥離液において、
該電解剥離液は、シアン系化合物が無添加の電解剥離液であって、銅の酸化剤としての銅化合物又は芳香族ニトロ化合物が含有されていると共に、pHが9〜12に調整されていることを特徴とする銅の電解剥離液。
In the copper electrolytic stripping solution for stripping the copper plating film exposed from the silver plating film partially covering the copper plating film formed on the entire surface of the member by electrolytic stripping,
The electrolytic stripper is an electrolytic stripper to which no cyanide compound is added, and contains a copper compound or an aromatic nitro compound as an oxidizing agent for copper, and the pH is adjusted to 9-12. An electrolytic stripping solution for copper.
銅化合物が、銅アンモニウム錯体であって、前記銅アンモニウム錯体は、電解剥離液に添加されたアンモニウム源としてのアンモニア水又はアンモニウム塩と、銅源としての硫酸銅、炭酸銅、シュウ酸銅又は水酸化銅とから形成されている請求項1記載の銅の電解剥離液。   The copper compound is a copper ammonium complex, and the copper ammonium complex is ammonia water or an ammonium salt added to the electrolytic stripping solution and copper sulfate, copper carbonate, copper oxalate or water as the copper source. The electrolytic stripping solution for copper according to claim 1, which is formed from copper oxide. 電解剥離液には、リン酸及びその塩、クエン酸や酒石酸等の有機酸及びその塩、炭酸塩、炭酸水素塩、グルタミン酸やアスパラギン酸等のアミノカルボン酸及びその塩から成る群から選ばれた少なくとも一種の化合物が添加されている請求項1又は請求項2記載の銅の電解剥離液。   The electrolytic stripper was selected from the group consisting of phosphoric acid and its salts, organic acids such as citric acid and tartaric acid and their salts, carbonates, bicarbonates, aminocarboxylic acids such as glutamic acid and aspartic acid and their salts The copper electrolytic stripping solution according to claim 1 or 2, wherein at least one compound is added. 電解剥離液には、銀の剥離剤として、銀と反応して錯体を形成する化合物が添加されている請求項1〜3のいずれか一項記載の銅の電解剥離液。   The electrolytic stripping solution according to any one of claims 1 to 3, wherein a compound that reacts with silver to form a complex is added to the electrolytic stripping solution as a silver stripping agent. 銀と反応して錯体を形成する化合物が、ピリジンカルボン酸、チオシアン酸塩、ジメチルヒダントイン又はコハク酸イミドである請求項4記載の銅の電解剥離液。   The copper electrolytic stripping solution according to claim 4, wherein the compound that reacts with silver to form a complex is pyridinecarboxylic acid, thiocyanate, dimethylhydantoin, or succinimide. 電解剥離液には、界面活性剤が添加されている請求項1〜5のいずれか一項記載の銅の電解剥離液。   The electrolytic stripping solution of copper according to any one of claims 1 to 5, wherein a surfactant is added to the electrolytic stripping solution. 界面活性剤が、ポリオキシエチレン鎖を有する界面活性剤又はフッ素系界面活性剤である請求項6記載の銅の電解剥離液。   The copper electrolytic stripping solution according to claim 6, wherein the surfactant is a surfactant having a polyoxyethylene chain or a fluorosurfactant. 部材が、鉄系合金材から成るリードフレームである請求項1〜7のいずれか一項記載の銅の電解剥離液。   The copper electrolytic stripping solution according to claim 1, wherein the member is a lead frame made of an iron-based alloy material. 部材全面に形成した銅めっき皮膜を部分的に覆う銀めっき皮膜から露出する銅めっき皮膜を電解剥離によって剥離する際に、
該電解剥離に用いる銅の電解剥離液として、請求項1記載の銅の電解剥離液を用い、前記銅の電解剥離液中に浸漬した前記部材を陽極とすることを特徴とする銅の電解剥離方法。
When peeling the copper plating film exposed from the silver plating film partially covering the copper plating film formed on the entire surface of the member by electrolytic peeling,
A copper electrolytic stripping solution according to claim 1, wherein the member immersed in the copper electrolytic stripping solution is used as an anode. Method.
陰極には、電解剥離液中に金属が溶出することのない金属から成る電極を用いる請求項9記載の銅の電解剥離方法。   10. The method of electrolytic stripping of copper according to claim 9, wherein the cathode is an electrode made of a metal that does not elute into the electrolytic stripping solution. 部材を、鉄系合金材から成るリードフレームとする請求項9又は請求項10記載の銅の電解剥離方法。   11. The copper electrolytic stripping method according to claim 9 or 10, wherein the member is a lead frame made of an iron-based alloy material.
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