JP2005057281A5 - - Google Patents

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Publication number
JP2005057281A5
JP2005057281A5 JP2004223009A JP2004223009A JP2005057281A5 JP 2005057281 A5 JP2005057281 A5 JP 2005057281A5 JP 2004223009 A JP2004223009 A JP 2004223009A JP 2004223009 A JP2004223009 A JP 2004223009A JP 2005057281 A5 JP2005057281 A5 JP 2005057281A5
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JP
Japan
Prior art keywords
detector
ring
guard ring
anode
edge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2004223009A
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English (en)
Japanese (ja)
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JP2005057281A (ja
JP5016188B2 (ja
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Publication date
Priority claimed from US10/633,119 external-priority patent/US6928144B2/en
Application filed filed Critical
Publication of JP2005057281A publication Critical patent/JP2005057281A/ja
Publication of JP2005057281A5 publication Critical patent/JP2005057281A5/ja
Application granted granted Critical
Publication of JP5016188B2 publication Critical patent/JP5016188B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004223009A 2003-08-01 2004-07-30 フォト・エレクトロン直接変換検出器アレイ用のガードリング Expired - Fee Related JP5016188B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/633,119 US6928144B2 (en) 2003-08-01 2003-08-01 Guard ring for direct photo-to-electron conversion detector array
US10/633,119 2003-08-01

Publications (3)

Publication Number Publication Date
JP2005057281A JP2005057281A (ja) 2005-03-03
JP2005057281A5 true JP2005057281A5 (enExample) 2009-10-22
JP5016188B2 JP5016188B2 (ja) 2012-09-05

Family

ID=34080739

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004223009A Expired - Fee Related JP5016188B2 (ja) 2003-08-01 2004-07-30 フォト・エレクトロン直接変換検出器アレイ用のガードリング

Country Status (5)

Country Link
US (1) US6928144B2 (enExample)
JP (1) JP5016188B2 (enExample)
CN (1) CN100457036C (enExample)
DE (1) DE102004036316B4 (enExample)
NL (1) NL1026741C2 (enExample)

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WO2016167311A1 (ja) * 2015-04-15 2016-10-20 株式会社カネカ イオンビーム用の荷電変換膜
JP6185098B2 (ja) * 2016-02-12 2017-08-23 浜松ホトニクス株式会社 固体撮像装置
CN106324649B (zh) * 2016-08-31 2023-09-15 同方威视技术股份有限公司 半导体探测器
US10156645B2 (en) * 2016-12-23 2018-12-18 General Electric Company Systems and methods for sub-pixel location determination at sidewalls and corners of detectors
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CN110914714B (zh) * 2017-07-26 2024-02-27 深圳帧观德芯科技有限公司 制造和使用x射线检测器的方法
JP6873414B2 (ja) 2017-10-17 2021-05-19 株式会社リガク 処理装置、方法およびプログラム
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FR3105444B1 (fr) * 2019-12-24 2022-01-07 Commissariat Energie Atomique Procédé de détermination d'un biais affectant des pixels d'un détecteur pixellisé de rayonnement ionisant
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JP7534123B2 (ja) * 2020-05-12 2024-08-14 キヤノンメディカルシステムズ株式会社 Ｘ線検出器及びｘ線ｃｔ装置
US12046623B2 (en) 2020-08-07 2024-07-23 Redlen Technologies, Inc. Compound semiconductor x-ray detector tiles and method of dicing thereof
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CN113229833A (zh) * 2021-05-29 2021-08-10 西北工业大学 一种骨密度仪用的x射线探测器
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JP7734052B2 (ja) * 2021-11-18 2025-09-04 キヤノンメディカルシステムズ株式会社 直接変換型ｘ線検出器、ｘ線検出方法、およびｘ線コンピュータ断層撮影装置
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WO2023189717A1 (ja) * 2022-03-29 2023-10-05 株式会社ジャパンディスプレイ 検出装置

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