JP2005055438A - 改良された直通路・反射路・線路計測較正を用いて試験対象デバイスを計測する方法及び装置 - Google Patents

改良された直通路・反射路・線路計測較正を用いて試験対象デバイスを計測する方法及び装置 Download PDF

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JP2005055438A
JP2005055438A JP2004224295A JP2004224295A JP2005055438A JP 2005055438 A JP2005055438 A JP 2005055438A JP 2004224295 A JP2004224295 A JP 2004224295A JP 2004224295 A JP2004224295 A JP 2004224295A JP 2005055438 A JP2005055438 A JP 2005055438A
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measurement
path
port
reflection
straight path
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JP2005055438A5 (https=
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Vahe Adamian
ヴァーエ・アダミアン
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Agilent Technologies Inc
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Agilent Technologies Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2004224295A 2003-08-05 2004-07-30 改良された直通路・反射路・線路計測較正を用いて試験対象デバイスを計測する方法及び装置 Pending JP2005055438A (ja)

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US10/635,395 US7068049B2 (en) 2003-08-05 2003-08-05 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration

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JP2005055438A true JP2005055438A (ja) 2005-03-03
JP2005055438A5 JP2005055438A5 (https=) 2007-09-13

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US (1) US7068049B2 (https=)
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* Cited by examiner, † Cited by third party
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JP2006201172A (ja) * 2005-01-18 2006-08-03 Agilent Technol Inc 最少接続のマルチポートスルー−リフレクト−ライン（Ｔｈｒｏｕｇｈ−Ｒｅｆｌｅｃｔ−Ｌｉｎｅ）較正および測定を行うための方法および装置
JP2018125389A (ja) * 2017-01-31 2018-08-09 国立研究開発法人産業技術総合研究所 電気的中点におけるｒｆプローブシステムの校正技術

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006201172A (ja) * 2005-01-18 2006-08-03 Agilent Technol Inc 最少接続のマルチポートスルー−リフレクト−ライン（Ｔｈｒｏｕｇｈ−Ｒｅｆｌｅｃｔ−Ｌｉｎｅ）較正および測定を行うための方法および装置
JP2018125389A (ja) * 2017-01-31 2018-08-09 国立研究開発法人産業技術総合研究所 電気的中点におけるｒｆプローブシステムの校正技術

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US7068049B2 (en) 2006-06-27
DE102004034879B4 (de) 2006-09-28
US20050030047A1 (en) 2005-02-10
DE102004034879A1 (de) 2005-03-03

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