JP2004526952A - 自動化されたインプロセスによる同位体及び質量の分析 - Google Patents

自動化されたインプロセスによる同位体及び質量の分析 Download PDF

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Publication number
JP2004526952A
JP2004526952A JP2002560754A JP2002560754A JP2004526952A JP 2004526952 A JP2004526952 A JP 2004526952A JP 2002560754 A JP2002560754 A JP 2002560754A JP 2002560754 A JP2002560754 A JP 2002560754A JP 2004526952 A JP2004526952 A JP 2004526952A
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Japan
Prior art keywords
sample
species
automated
dilution mass
isotope dilution
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Pending
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JP2002560754A
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English (en)
Japanese (ja)
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JP2004526952A5 (enExample
Inventor
エム． キングストン，ハワード
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Metara Inc
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Metara Inc
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Publication of JP2004526952A publication Critical patent/JP2004526952A/ja
Publication of JP2004526952A5 publication Critical patent/JP2004526952A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D59/00—Separation of different isotopes of the same chemical element
    • B01D59/44—Separation by mass spectrography
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J9/00—Working-up of macromolecular substances to porous or cellular articles or materials; After-treatment thereof
    • C08J9/0004—Use of compounding ingredients, the chemical constitution of which is unknown, broadly defined, or irrelevant
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0009—Calibration of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2300/00—Characterised by the use of unspecified polymers
    • C08J2300/14—Water soluble or water swellable polymers, e.g. aqueous gels

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2002560754A 2001-01-29 2001-12-05 自動化されたインプロセスによる同位体及び質量の分析 Pending JP2004526952A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US26474801P 2001-01-29 2001-01-29
PCT/US2001/046539 WO2002060565A1 (en) 2001-01-29 2001-12-05 Automated in-process isotope and mass spectrometry

Publications (2)

Publication Number Publication Date
JP2004526952A true JP2004526952A (ja) 2004-09-02
JP2004526952A5 JP2004526952A5 (enExample) 2005-12-22

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Family Applications (1)

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JP2002560754A Pending JP2004526952A (ja) 2001-01-29 2001-12-05 自動化されたインプロセスによる同位体及び質量の分析

Country Status (6)

Country Link
EP (1) EP1355728A4 (enExample)
JP (1) JP2004526952A (enExample)
KR (1) KR20030079968A (enExample)
CN (1) CN100408151C (enExample)
CA (1) CA2434094A1 (enExample)
WO (1) WO2002060565A1 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010512515A (ja) * 2006-12-07 2010-04-22 アプライド アイソトープ テクノロジーズ，インコーポレイテッド 固相及び触媒で可能な自動同位体希釈並びに種別同位体希釈質量分析
JP6947463B1 (ja) * 2020-04-08 2021-10-13 ビーエルテック株式会社 流れ分析装置及び流れ分析方法
WO2021205953A1 (ja) * 2020-04-08 2021-10-14 ビーエルテック株式会社 流れ分析装置及び流れ分析方法
JP2023546992A (ja) * 2020-10-20 2023-11-08 デフィニテック，インコーポレイテッド 以前は検出できなかった量の定量化

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GB0218946D0 (en) 2002-08-14 2002-09-25 Thermo Electron Corp Diluting a sample
US7309608B2 (en) * 2003-09-30 2007-12-18 Hoa Duc Nguyen Method of analysis of aldehyde and ketone by mass spectrometry
KR100795875B1 (ko) * 2005-02-22 2008-01-21 한국원자력연구원 고분해능 원자포획-질량분석 방법
KR101068996B1 (ko) * 2008-09-18 2011-09-30 한국표준과학연구원 안정동위원소의 질량비를 이용한 동물의 월령 측정 방법
KR101107407B1 (ko) * 2010-06-24 2012-01-19 장명석 배수트랩
CN102608227B (zh) * 2012-02-23 2014-08-20 西安交通大学 细胞色谱与液相质谱二维联用分析仪的单片机阀控系统
GB201204723D0 (en) * 2012-03-19 2012-05-02 Micromass Ltd Improved time of flight quantitation using alternative characteristic ions
CN104006993B (zh) * 2014-05-26 2016-08-24 中国兵器工业集团第五三研究所 Id-icp-ms法燃油中硫含量的测试样品制备方法
CN104576289B (zh) * 2014-12-31 2017-08-25 聚光科技(杭州)股份有限公司 一种可调真空压力的电感耦合等离子体质谱仪
CN107064361B (zh) 2014-12-31 2020-03-27 同方威视技术股份有限公司 检测设备和检测方法
GB2551127B (en) * 2016-06-06 2020-01-08 Thermo Fisher Scient Bremen Gmbh Apparatus and method for static gas mass spectrometry
CN108760799A (zh) * 2018-03-23 2018-11-06 北京农业质量标准与检测技术研究中心 一种基于热导检测信号进行样品动态稀释的稳定同位素比值测定方法
EP3872500B1 (en) * 2018-10-25 2025-10-08 Hitachi High-Tech Corporation Automated analyzer
CN116264105B (zh) * 2022-06-16 2023-10-03 中国科学院大气物理研究所 一种适用于同位素化学分馏与大气化学传输模式耦合的算法
CN116087374B (zh) * 2023-04-11 2023-06-27 农业农村部环境保护科研监测所 一种用于农产品中痕量双酚类化合物的检测方法
CN117538406B (zh) * 2023-11-17 2024-07-19 中国地质大学（武汉） 一种基于同位素混合模型校正的激光微区同位素分析和校正方法

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US3796879A (en) * 1972-03-24 1974-03-12 Searle & Co Automated multiple sample processing for well type radioactivity counters
CN87212873U (zh) * 1987-11-19 1988-07-27 北京信通电脑技术公司 离子质谱计
US5414259A (en) * 1994-01-05 1995-05-09 Duquesne University Of The Holy Ghost Method of speciated isotope dilution mass spectrometry
EP1008167A4 (en) * 1997-03-14 2006-08-23 Univ George Washington DEVICE FOR THE CONTINUOUS CONTROL OF THE ISOTOPIC RATIO AFTER FLUORINE CHEMICAL REACTIONS
JPH1197321A (ja) * 1997-09-18 1999-04-09 Toshiba Corp 汚染源特定方法
US6790673B1 (en) * 1998-01-29 2004-09-14 Duquesne University Of The Holy Ghost Speciated isotope dilution mass spectrometry of reactive species and related methods
US6258605B1 (en) * 1999-03-26 2001-07-10 Neo Gen Screening, Inc. Clinical method for the genetic screening of newborns using tandem mass spectrometry
US6410914B1 (en) * 1999-03-05 2002-06-25 Bruker Daltonics Inc. Ionization chamber for atmospheric pressure ionization mass spectrometry
GB2349270B (en) * 1999-04-15 2002-02-13 Hitachi Ltd Mass analysis apparatus and method for mass analysis

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010512515A (ja) * 2006-12-07 2010-04-22 アプライド アイソトープ テクノロジーズ，インコーポレイテッド 固相及び触媒で可能な自動同位体希釈並びに種別同位体希釈質量分析
JP6947463B1 (ja) * 2020-04-08 2021-10-13 ビーエルテック株式会社 流れ分析装置及び流れ分析方法
WO2021205953A1 (ja) * 2020-04-08 2021-10-14 ビーエルテック株式会社 流れ分析装置及び流れ分析方法
KR20220108185A (ko) * 2020-04-08 2022-08-02 비엘 텍 케이.케이. 흐름 분석 장치 및 흐름 분석 방법
KR102561527B1 (ko) 2020-04-08 2023-07-28 비엘 텍 케이.케이. 흐름 분석 장치 및 흐름 분석 방법
US11906407B2 (en) 2020-04-08 2024-02-20 Bl Tec K.K. Flow analysis device and flow analysis method
JP2023546992A (ja) * 2020-10-20 2023-11-08 デフィニテック，インコーポレイテッド 以前は検出できなかった量の定量化

Also Published As

Publication number Publication date
KR20030079968A (ko) 2003-10-10
CN1575195A (zh) 2005-02-02
EP1355728A2 (en) 2003-10-29
CA2434094A1 (en) 2002-08-08
WO2002060565A1 (en) 2002-08-08
CN100408151C (zh) 2008-08-06
EP1355728A4 (en) 2005-01-12
WO2002060565A8 (en) 2002-10-03

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