JP2004508721A5 - - Google Patents

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Publication number
JP2004508721A5
JP2004508721A5 JP2002524238A JP2002524238A JP2004508721A5 JP 2004508721 A5 JP2004508721 A5 JP 2004508721A5 JP 2002524238 A JP2002524238 A JP 2002524238A JP 2002524238 A JP2002524238 A JP 2002524238A JP 2004508721 A5 JP2004508721 A5 JP 2004508721A5
Authority
JP
Japan
Prior art keywords
active layer
hall effect
substrate
effect sensor
silicon carbide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002524238A
Other languages
English (en)
Japanese (ja)
Other versions
JP5049449B2 (ja
JP2004508721A (ja
Filing date
Publication date
Priority claimed from FR0011087A external-priority patent/FR2813443B1/fr
Application filed filed Critical
Publication of JP2004508721A publication Critical patent/JP2004508721A/ja
Publication of JP2004508721A5 publication Critical patent/JP2004508721A5/ja
Application granted granted Critical
Publication of JP5049449B2 publication Critical patent/JP5049449B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2002524238A 2000-08-30 2001-08-30 ホール効果センサ Expired - Fee Related JP5049449B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR00/11087 2000-08-30
FR0011087A FR2813443B1 (fr) 2000-08-30 2000-08-30 Capteur a effet hall
PCT/FR2001/002703 WO2002019442A1 (fr) 2000-08-30 2001-08-30 Capteur a effet hall

Publications (3)

Publication Number Publication Date
JP2004508721A JP2004508721A (ja) 2004-03-18
JP2004508721A5 true JP2004508721A5 (enExample) 2011-12-22
JP5049449B2 JP5049449B2 (ja) 2012-10-17

Family

ID=8853827

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002524238A Expired - Fee Related JP5049449B2 (ja) 2000-08-30 2001-08-30 ホール効果センサ

Country Status (15)

Country Link
US (1) US6734514B2 (enExample)
EP (1) EP1314211B1 (enExample)
JP (1) JP5049449B2 (enExample)
KR (1) KR100837912B1 (enExample)
AT (1) ATE327574T1 (enExample)
AU (2) AU8779101A (enExample)
CA (1) CA2421077C (enExample)
CY (1) CY1105327T1 (enExample)
DE (1) DE60119937T2 (enExample)
DK (1) DK1314211T3 (enExample)
ES (1) ES2265440T3 (enExample)
FR (1) FR2813443B1 (enExample)
PT (1) PT1314211E (enExample)
WO (1) WO2002019442A1 (enExample)
ZA (1) ZA200301625B (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6879012B2 (en) * 2002-06-21 2005-04-12 The Regents Of The University Of California Giant planar hall effect in epitaxial ferromagnetic semiconductor devices
KR100821630B1 (ko) 2004-05-17 2008-04-16 주식회사 엘지화학 전극 및 이의 제조방법
JP4980052B2 (ja) * 2004-05-17 2012-07-18 エルジー・ケム・リミテッド 電極及びその製造方法
EP1924342A1 (en) * 2005-08-05 2008-05-28 FUJIFILM Manufacturing Europe B.V. Porous membrane and recording medium comprising same
JP2009503225A (ja) * 2005-08-05 2009-01-29 フジフィルム マニュファクチャリング ユーロプ ビー.ブイ. 多孔質膜及びこれを含有する記録媒体
DE602006006071D1 (de) * 2005-08-05 2009-05-14 Fujifilm Mfg Europe Bv Poröse membran und aufzeichnungsmedium sowie herstellungsverfahren dafür
WO2007018421A1 (en) * 2005-08-05 2007-02-15 Fujifilm Manufacturing Europe B.V. Porous membrane and recording medium comprising same
EP1924344A1 (en) * 2005-08-05 2008-05-28 FUJIFILM Manufacturing Europe B.V. Porous membrane and recording medium comprising same
WO2007018426A1 (en) * 2005-08-05 2007-02-15 Fujifilm Manufacturing Europe B.V. Porous membrane and recording medium comprising same
US9588134B2 (en) * 2012-05-10 2017-03-07 Infineon Technologies Ag Increased dynamic range sensor
US9362485B2 (en) 2013-03-14 2016-06-07 Robert Bosch Gmbh Vertical hall effect sensor with offset reduction using depletion regions
KR102116147B1 (ko) * 2014-03-06 2020-05-28 매그나칩 반도체 유한회사 매립형 마그네틱 센서
US11605778B2 (en) 2019-02-07 2023-03-14 Lake Shore Cryotronics, Inc. Hall effect sensor with low offset and high level of stability
CN120063335B (zh) * 2025-02-17 2025-10-03 安徽大学 一种基于室温平面霍尔效应的角度传感器件及其制备方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5572091A (en) * 1978-11-24 1980-05-30 Victor Co Of Japan Ltd Hall element
GB2081934B (en) * 1980-08-08 1984-03-07 Ass Eng Ltd Automatic speed control systems
JP2884707B2 (ja) * 1990-05-21 1999-04-19 住友電気工業株式会社 ホール素子
JP3214505B2 (ja) * 1991-09-13 2001-10-02 株式会社デンソー 半導体装置の製造方法
US5536953A (en) * 1994-03-08 1996-07-16 Kobe Steel Usa Wide bandgap semiconductor device including lightly doped active region

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