JP2004354367A - 頭部付きネジの検査装置、検査方法及びパンチの欠け検出方法 - Google Patents
頭部付きネジの検査装置、検査方法及びパンチの欠け検出方法 Download PDFInfo
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- JP2004354367A JP2004354367A JP2004035348A JP2004035348A JP2004354367A JP 2004354367 A JP2004354367 A JP 2004354367A JP 2004035348 A JP2004035348 A JP 2004035348A JP 2004035348 A JP2004035348 A JP 2004035348A JP 2004354367 A JP2004354367 A JP 2004354367A
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- screw
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- General Physics & Mathematics (AREA)
- Immunology (AREA)
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
【解決手段】頭部付きネジWを頭部が上になる姿勢にして位置決め保持する検査部1と、この検査部の直上に配置するCCDカメラ2と、検査部1とCCDカメラ2との間に配置する環状光源3と、CCDカメラの画像を処理し、処理画像に基づいて良否判定を行う判別装置4とで検査装置10を構成し、環状光源3によりネジの操作穴Aを影ができないように照らしてCCDカメラで操作穴の穴底を鮮明に写すようにした。ネジWの頭頂面の検査も行える。
【選択図】図1
Description
検査対象の頭部付きネジを頭部がCCDカメラの側を向く姿勢にして位置決め保持する検査部と、この検査部に保持されたネジの頭部に対面させるCCDカメラと、前記検査部とCCDカメラとの間にCCDカメラの視野を取り囲むように配置する環状光源と、CCDカメラの画像を処理し、処理画像に基づいて良否判定を行う判別装置とを有し、前記環状光源から検査部に置かれたネジの頭部に斜め前方から光を照射してネジの頭頂部を前記CCDカメラで写し、得られた画像を処理して前記判別装置でネジの頭部に形成された操作穴又はネジの頭頂面の良否判定を行うようにした頭部付きネジの検査装置を提供する。
放射状に伸びる周方向に定ピッチで配置された溝を上面の外周部に有し、その溝に検査対象の頭部付きネジを水平向きに、かつ、頭部が外周側になる姿勢にして受け入れ、垂直軸を支点に回転して前記溝に受け入れた頭部付きネジを検査部に搬送するターンテーブルと、前記判別装置により良否判定がなされた頭部付きネジを、良品、不良品に分けて前記切り欠溝から取り出す払出し部とをさらに備えさせたものなどが、効率的な検査を行えて好ましい。
2 CCDカメラ
3 環状光源
4 判別装置
5、25 回転テーブル
6 供給部
7 長さ検査部
8 払出し部
9 ガイドプレート
10、20 検査装置
W 頭部付きネジ
A 操作穴
B 欠陥
C センターライン
a 検査エリア
Claims (5)
- 検査対象の頭部付きネジを頭部がCCDカメラの側を向く姿勢にして検査部に位置決め保持し、この頭部付きネジの頭部に前記検査部よりもCCDカメラ側にカメラの視野を取り囲むように配置した環状光源から照明光を照射し、この状態で前記カメラにより検査部に配置した前記ネジの頭頂部を写し、得られた画像を処理し、処理後の情報に基づいて前記ネジの頭部に形成された操作穴又はネジの頭頂面の良否判定を行う頭部付きネジの検査方法。
- 検査対象の頭部付きネジを頭部がCCDカメラの側を向く姿勢にして位置決め保持する検査部と、この検査部に保持されたネジの頭部に対面させるCCDカメラと、前記検査部とCCDカメラとの間にCCDカメラの視野を取り囲むように配置する環状光源と、CCDカメラの画像を処理し、処理画像に基づいて良否判定を行う判別装置とを有し、前記環状光源から検査部に置かれたネジの頭部に斜め前方から光を照射してネジの頭頂部を前記CCDカメラで写し、得られた画像を処理して前記判別装置でネジの頭部に形成された操作穴又はネジの頭頂面の良否判定を行うようにした頭部付きネジの検査装置。
- 外周に定ピッチで設けた切り欠溝に検査対象の頭部付きネジを頭部が上を向く姿勢にして受け入れ、垂直軸を支点に回転して前記切り欠溝に受け入れた頭部付きネジを検査部に搬送するターンテーブルと、前記判別装置により良否判定がなされた頭部付きネジを、良品、不良品に分けて前記切り欠溝から取り出す払出し部とをさらに備えさせた請求項2に記載の頭部付きネジの検査装置。
- 放射状に伸びる周方向に定ピッチで配置された溝を上面の外周部に有し、その溝に検査対象の頭部付きネジを水平向きに、かつ、頭部が外周側になる姿勢にして受け入れ、垂直軸を支点に回転して前記溝に受け入れた頭部付きネジを検査部に搬送するターンテーブルと、前記判別装置により良否判定がなされた頭部付きネジを、良品、不良品に分けて前記切り欠溝から取り出す払出し部とをさらに備えさせた請求項2に記載の頭部付きネジの検査装置。
- 頭部加工工程から送られてくる頭部付きネジの操作穴又は頭頂面の検査を請求項2〜4のいずれかに記載の検査装置を用いて行い、その操作穴又は頭頂面に設定した検査エリアに不良があり、かつ同一検査エリアの不良検出が複数のネジについて連続してなされたときに、ネジの頭部を加工するヘッダのパンチに欠けが発生したと判断するヘッダのパンチの欠け検出方法。
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JP2004035348A JP4437672B2 (ja) | 2003-05-06 | 2004-02-12 | 頭部付きネジの検査方法 |
US10/837,714 US7173692B2 (en) | 2003-05-06 | 2004-05-04 | Device and method for optically inspecting operating holes formed in heads of screws |
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JP2003127940 | 2003-05-06 | ||
JP2004035348A JP4437672B2 (ja) | 2003-05-06 | 2004-02-12 | 頭部付きネジの検査方法 |
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JP2004354367A true JP2004354367A (ja) | 2004-12-16 |
JP4437672B2 JP4437672B2 (ja) | 2010-03-24 |
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Cited By (6)
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KR101038739B1 (ko) * | 2010-11-30 | 2011-06-02 | 주식회사 서울금속 | 나사 검사 장비 |
KR101039099B1 (ko) | 2010-11-30 | 2011-06-03 | 주식회사 서울금속 | 나사 이송 장치 |
JP4816817B2 (ja) * | 2009-12-17 | 2011-11-16 | 住友金属工業株式会社 | 管状品の検査装置 |
WO2012070743A1 (ko) * | 2010-11-25 | 2012-05-31 | 주식회사 서울금속 | 부품 공급장치 및 부품 검사장비 |
JP2013221922A (ja) * | 2012-04-19 | 2013-10-28 | Dai Ichi High Frequency Co Ltd | 鉄筋端部測定装置及び鉄筋端部測定方法 |
JPWO2014171285A1 (ja) * | 2013-04-18 | 2017-02-23 | 株式会社ユタカ | 軸体の良否検査装置 |
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US7154080B1 (en) * | 2005-01-13 | 2006-12-26 | Dick Rauth | System and method for detecting the efficacy of machined parts |
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US10094785B2 (en) | 2011-05-17 | 2018-10-09 | Gii Acquisition, Llc | Method and system for optically inspecting headed manufactured parts |
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US10088431B2 (en) | 2011-05-17 | 2018-10-02 | Gii Acquisition, Llc | Method and system for optically inspecting headed manufactured parts |
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US5165551A (en) * | 1990-03-30 | 1992-11-24 | Automation Associates, Inc. | Apparatus and method for detecting defects in an article |
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US6761126B2 (en) * | 2001-05-21 | 2004-07-13 | Nylok Corporation | Apparatus for application of polymer resin onto threaded fasteners |
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2004
- 2004-02-12 JP JP2004035348A patent/JP4437672B2/ja not_active Expired - Lifetime
- 2004-05-04 US US10/837,714 patent/US7173692B2/en active Active
Cited By (7)
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JP4816817B2 (ja) * | 2009-12-17 | 2011-11-16 | 住友金属工業株式会社 | 管状品の検査装置 |
WO2012070743A1 (ko) * | 2010-11-25 | 2012-05-31 | 주식회사 서울금속 | 부품 공급장치 및 부품 검사장비 |
KR101038739B1 (ko) * | 2010-11-30 | 2011-06-02 | 주식회사 서울금속 | 나사 검사 장비 |
KR101039099B1 (ko) | 2010-11-30 | 2011-06-03 | 주식회사 서울금속 | 나사 이송 장치 |
JP2013221922A (ja) * | 2012-04-19 | 2013-10-28 | Dai Ichi High Frequency Co Ltd | 鉄筋端部測定装置及び鉄筋端部測定方法 |
JPWO2014171285A1 (ja) * | 2013-04-18 | 2017-02-23 | 株式会社ユタカ | 軸体の良否検査装置 |
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Also Published As
Publication number | Publication date |
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JP4437672B2 (ja) | 2010-03-24 |
US7173692B2 (en) | 2007-02-06 |
US20040223143A1 (en) | 2004-11-11 |
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