JP2004219126A - 電流レンジを自動的に変更する方法 - Google Patents

電流レンジを自動的に変更する方法 Download PDF

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Publication number
JP2004219126A
JP2004219126A JP2003003951A JP2003003951A JP2004219126A JP 2004219126 A JP2004219126 A JP 2004219126A JP 2003003951 A JP2003003951 A JP 2003003951A JP 2003003951 A JP2003003951 A JP 2003003951A JP 2004219126 A JP2004219126 A JP 2004219126A
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JP
Japan
Prior art keywords
current
range
current range
value
compliance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003003951A
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English (en)
Japanese (ja)
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JP2004219126A5 (https=
Inventor
Junko Tsutsui
順子 筒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Japan Ltd
Original Assignee
Agilent Technologies Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Japan Ltd filed Critical Agilent Technologies Japan Ltd
Priority to JP2003003951A priority Critical patent/JP2004219126A/ja
Priority to US10/736,198 priority patent/US6911831B2/en
Publication of JP2004219126A publication Critical patent/JP2004219126A/ja
Publication of JP2004219126A5 publication Critical patent/JP2004219126A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/08—Circuits for altering the measuring range
    • G01R15/09—Autoranging circuits

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2003003951A 2003-01-10 2003-01-10 電流レンジを自動的に変更する方法 Pending JP2004219126A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2003003951A JP2004219126A (ja) 2003-01-10 2003-01-10 電流レンジを自動的に変更する方法
US10/736,198 US6911831B2 (en) 2003-01-10 2003-12-15 Method for automatically changing current ranges

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003003951A JP2004219126A (ja) 2003-01-10 2003-01-10 電流レンジを自動的に変更する方法

Publications (2)

Publication Number Publication Date
JP2004219126A true JP2004219126A (ja) 2004-08-05
JP2004219126A5 JP2004219126A5 (https=) 2005-11-04

Family

ID=32708930

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003003951A Pending JP2004219126A (ja) 2003-01-10 2003-01-10 電流レンジを自動的に変更する方法

Country Status (2)

Country Link
US (1) US6911831B2 (https=)
JP (1) JP2004219126A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9246323B2 (en) 2009-04-27 2016-01-26 Panasonic Intellectual Property Management Co., Ltd. Current controller and protection circuit

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005354825A (ja) * 2004-06-11 2005-12-22 Nissan Motor Co Ltd ハイブリッド車両のｓｏｃ演算装置
US7202676B2 (en) * 2005-02-28 2007-04-10 Keithley Instruments, Inc. Source measure circuit
US7521934B1 (en) 2006-10-16 2009-04-21 Yazaki North America, Inc. Battery current measurement with real time pre-gain adjust and programmable excitation source
US7906977B1 (en) * 2008-03-24 2011-03-15 Keithley Instruments, Inc. Dual output stage source measure circuit
US7812589B2 (en) 2008-08-28 2010-10-12 Qualitau, Inc. Modified current source (MCS) with seamless range switching
US8547120B1 (en) * 2009-05-13 2013-10-01 Keithley Instruments, Inc. High speed AC current source
US9207282B2 (en) * 2013-03-14 2015-12-08 Teradyne, Inc. Smooth vi mode crossover method at compliance limit threshold
US9568504B2 (en) 2013-03-15 2017-02-14 Milwaukee Electric Tool Corporation Digital multi-meter
US10228397B2 (en) 2015-11-20 2019-03-12 Keysight Technologies, Inc. Apparatus and associated methods for monitoring noise level of a signal

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3546582A (en) * 1968-01-15 1970-12-08 Ibm Computer controlled test system for performing functional tests on monolithic devices
US3875506A (en) * 1973-12-27 1975-04-01 Keithley Instruments Electronic protective circuit
JPS5875073A (ja) * 1981-10-29 1983-05-06 Yokogawa Hewlett Packard Ltd 直流特性測定システム
JPS58148507A (ja) 1982-02-26 1983-09-03 Yokogawa Hewlett Packard Ltd 複合制御増幅器
JP3273047B2 (ja) * 1991-07-26 2002-04-08 アジレント・テクノロジー株式会社 電流−電圧特性測定方法
JPH0894703A (ja) * 1994-09-20 1996-04-12 Mitsubishi Electric Corp 半導体電気的特性測定装置
JP3457091B2 (ja) 1995-03-17 2003-10-14 アジレント・テクノロジー株式会社 電圧電流特性測定装置
US6127836A (en) * 1996-07-22 2000-10-03 Micro Instrument Company Electronic test apparatus
US6069484A (en) * 1997-09-25 2000-05-30 Keithley Instruments, Inc. Source measure unit current preamplifier
US6262670B1 (en) * 1998-04-10 2001-07-17 Kevin R. Ballou Source measure unit having secondary feedback for eliminating transients during range changing
US6489797B1 (en) * 1999-07-15 2002-12-03 Ltx Corporation Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristics
WO2001067601A2 (de) * 2000-03-10 2001-09-13 Infineon Technologies Ag Test-schaltungsanordnung und verfahren zum testen einer vielzahl von transistoren

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9246323B2 (en) 2009-04-27 2016-01-26 Panasonic Intellectual Property Management Co., Ltd. Current controller and protection circuit
US9590414B2 (en) 2009-04-27 2017-03-07 Panasonic Intellectual Property Management Co., Ltd. Current controller and protection circuit

Also Published As

Publication number Publication date
US6911831B2 (en) 2005-06-28
US20040135591A1 (en) 2004-07-15

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