JP2004163395A - 多ポート通過、反射、線路較正及び測定を行なう方法及び装置 - Google Patents

多ポート通過、反射、線路較正及び測定を行なう方法及び装置 Download PDF

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JP2004163395A
JP2004163395A JP2003132583A JP2003132583A JP2004163395A JP 2004163395 A JP2004163395 A JP 2004163395A JP 2003132583 A JP2003132583 A JP 2003132583A JP 2003132583 A JP2003132583 A JP 2003132583A JP 2004163395 A JP2004163395 A JP 2004163395A
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measurement
reflection
port
ports
line
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JP2004163395A5 (enExample
Inventor
Ali Boudiaf
アリ・ボウディアフ
Vahe Adamian
ヴァヘ・アダミアン
Peter Phillips
ピーター・フィリップス
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication of JP2004163395A5 publication Critical patent/JP2004163395A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2003132583A 2002-11-14 2003-05-12 多ポート通過、反射、線路較正及び測定を行なう方法及び装置 Pending JP2004163395A (ja)

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US10/294,317 US6853198B2 (en) 2002-11-14 2002-11-14 Method and apparatus for performing multiport through-reflect-line calibration and measurement

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JP2004163395A true JP2004163395A (ja) 2004-06-10
JP2004163395A5 JP2004163395A5 (enExample) 2006-06-29

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JP2003132583A Pending JP2004163395A (ja) 2002-11-14 2003-05-12 多ポート通過、反射、線路較正及び測定を行なう方法及び装置

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US (1) US6853198B2 (enExample)
JP (1) JP2004163395A (enExample)
DE (2) DE10314811B4 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006201172A (ja) * 2005-01-18 2006-08-03 Agilent Technol Inc 最少接続のマルチポートスルー−リフレクト−ライン（Ｔｈｒｏｕｇｈ−Ｒｅｆｌｅｃｔ−Ｌｉｎｅ）較正および測定を行うための方法および装置
JP2022160356A (ja) * 2021-04-06 2022-10-19 ローム株式会社 周波数特性測定装置

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JP4274462B2 (ja) * 2003-09-18 2009-06-10 株式会社アドバンテスト 誤差要因取得用装置、方法、プログラムおよび記録媒体
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US7068046B2 (en) * 2004-11-18 2006-06-27 Anritsu Company Calibration techniques for simplified high-frequency multiport differential measurements
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US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
US8706438B2 (en) * 2010-02-01 2014-04-22 Teledyne Lecroy, Inc. Time domain network analyzer
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JP6055215B2 (ja) * 2012-06-29 2016-12-27 キーサイト テクノロジーズ， インク． インピーダンス測定方法及び測定装置
CN103076589B (zh) * 2013-01-29 2015-08-05 绍兴电力局 一种数字万用表自动检定装置及其检定方法
CN104569885B (zh) * 2013-10-21 2017-07-25 哈尔滨飞机工业集团有限责任公司 一种实现同步发送器/解析器现场校准的方法
US10794837B2 (en) 2017-07-12 2020-10-06 Rohde & Schwarz Gmbh & Co. Kg On-wafer calibration device
US10938490B1 (en) * 2018-10-31 2021-03-02 Christos Tsironis Calibration method for coupler-tuner assembly
CN111983431B (zh) * 2020-08-31 2022-11-15 中电科思仪科技股份有限公司 一种提高矢量网络分析仪端口反射系数模拟精度的方法
CN112051534B (zh) * 2020-08-31 2023-08-25 中电科思仪科技股份有限公司 一种提高微波网络测量与校准精度的外置式装置及方法
CN112986888B (zh) * 2021-04-25 2021-08-06 武汉磐电科技股份有限公司 一种变压器短路阻抗测试仪的检定方法及检定装置
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006201172A (ja) * 2005-01-18 2006-08-03 Agilent Technol Inc 最少接続のマルチポートスルー−リフレクト−ライン（Ｔｈｒｏｕｇｈ−Ｒｅｆｌｅｃｔ−Ｌｉｎｅ）較正および測定を行うための方法および装置
JP2022160356A (ja) * 2021-04-06 2022-10-19 ローム株式会社 周波数特性測定装置

Also Published As

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US6853198B2 (en) 2005-02-08
US20040095145A1 (en) 2004-05-20
DE20305226U1 (de) 2003-05-28
DE10314811A1 (de) 2004-06-03
DE10314811B4 (de) 2005-08-18

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