JP2004069428A5 - - Google Patents

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Publication number
JP2004069428A5
JP2004069428A5 JP2002227569A JP2002227569A JP2004069428A5 JP 2004069428 A5 JP2004069428 A5 JP 2004069428A5 JP 2002227569 A JP2002227569 A JP 2002227569A JP 2002227569 A JP2002227569 A JP 2002227569A JP 2004069428 A5 JP2004069428 A5 JP 2004069428A5
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JP
Japan
Prior art keywords
atomic
force microscope
light
light beam
irradiation
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Pending
Application number
JP2002227569A
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English (en)
Japanese (ja)
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JP2004069428A (ja
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Priority to JP2002227569A priority Critical patent/JP2004069428A/ja
Priority claimed from JP2002227569A external-priority patent/JP2004069428A/ja
Publication of JP2004069428A publication Critical patent/JP2004069428A/ja
Publication of JP2004069428A5 publication Critical patent/JP2004069428A5/ja
Pending legal-status Critical Current

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JP2002227569A 2002-08-05 2002-08-05 原子及び分子間力顕微鏡 Pending JP2004069428A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002227569A JP2004069428A (ja) 2002-08-05 2002-08-05 原子及び分子間力顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002227569A JP2004069428A (ja) 2002-08-05 2002-08-05 原子及び分子間力顕微鏡

Publications (2)

Publication Number Publication Date
JP2004069428A JP2004069428A (ja) 2004-03-04
JP2004069428A5 true JP2004069428A5 (enExample) 2005-06-30

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ID=32014555

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002227569A Pending JP2004069428A (ja) 2002-08-05 2002-08-05 原子及び分子間力顕微鏡

Country Status (1)

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JP (1) JP2004069428A (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1023440C2 (nl) * 2003-05-16 2004-11-17 Univ Amsterdam Werkwijze en inrichting voor het vormen van een afbeelding van een object.
EP1760454A4 (en) * 2004-06-24 2008-09-03 Olympus Corp PHOTOMETRIC FLUORESCENT METHOD
US8418261B2 (en) 2008-06-27 2013-04-09 Nippon Telegraph And Telephone Corporation Stage for scanning probe microscopy and sample observation method
CN102331317B (zh) * 2011-06-02 2013-06-19 南京航空航天大学 球膜振动量微纳牛力检测系统与方法及应用
JP2013228249A (ja) * 2012-04-25 2013-11-07 Olympus Corp 走査型プローブ顕微鏡と光学顕微鏡を組み合わせた複合型顕微鏡、その制御装置、制御方法および制御プログラム、および、記憶媒体
CN103207035B (zh) * 2013-05-14 2015-07-15 南京因艾生生物科技有限公司 一种用于测量分子间作用力的力谱仪
DE112016006502T5 (de) * 2016-02-26 2018-12-13 Olympus Corporation Beobachtungsverfahren unter Verwendung eines zusammengesetzten Mikroskops, umfassend ein gestürztes Lichtmikroskop und ein Rasterkraftmikroskop, Programm zum Ausführen des Beobachtungsverfahrens und zusammengesetztes Mikroskop
CN110132923B (zh) * 2019-05-31 2020-09-29 中国科学院长春应用化学研究所 结构光照明可控示踪超分辨显微成像方法
WO2021187383A1 (ja) * 2020-03-14 2021-09-23 株式会社片岡製作所 細胞培養器具の加工装置
CN120178491B (zh) * 2025-05-20 2025-11-11 吉林大学 一种显微成像的方法、装置、设备、系统和存储介质

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