JP2004038140A5 - - Google Patents

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Publication number
JP2004038140A5
JP2004038140A5 JP2003054131A JP2003054131A JP2004038140A5 JP 2004038140 A5 JP2004038140 A5 JP 2004038140A5 JP 2003054131 A JP2003054131 A JP 2003054131A JP 2003054131 A JP2003054131 A JP 2003054131A JP 2004038140 A5 JP2004038140 A5 JP 2004038140A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003054131A
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JP2004038140A (ja
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Publication date
Application filed filed Critical
Publication of JP2004038140A publication Critical patent/JP2004038140A/ja
Publication of JP2004038140A5 publication Critical patent/JP2004038140A5/ja
Pending legal-status Critical Current

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JP2003054131A 2002-03-01 2003-02-28 フォトレジスト組成物 Pending JP2004038140A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US36112302P 2002-03-01 2002-03-01

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2010153102A Division JP4616931B2 (ja) 2002-03-01 2010-07-05 フォトレジスト組成物

Publications (2)

Publication Number Publication Date
JP2004038140A JP2004038140A (ja) 2004-02-05
JP2004038140A5 true JP2004038140A5 (ja) 2006-03-09

Family

ID=27734779

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2003054131A Pending JP2004038140A (ja) 2002-03-01 2003-02-28 フォトレジスト組成物
JP2010153102A Expired - Fee Related JP4616931B2 (ja) 2002-03-01 2010-07-05 フォトレジスト組成物

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2010153102A Expired - Fee Related JP4616931B2 (ja) 2002-03-01 2010-07-05 フォトレジスト組成物

Country Status (5)

Country Link
US (1) US7220486B2 (ja)
EP (1) EP1341041A3 (ja)
JP (2) JP2004038140A (ja)
KR (1) KR100998068B1 (ja)
TW (1) TW200401164A (ja)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
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EP0537524A1 (en) * 1991-10-17 1993-04-21 Shipley Company Inc. Radiation sensitive compositions and methods
US6740464B2 (en) * 2000-01-14 2004-05-25 Fuji Photo Film Co., Ltd. Lithographic printing plate precursor
TW200403522A (en) * 2002-03-01 2004-03-01 Shipley Co Llc Photoresist compositions
TW200401164A (en) 2002-03-01 2004-01-16 Shipley Co Llc Photoresist compositions
JP2004004703A (ja) * 2002-04-03 2004-01-08 Sumitomo Chem Co Ltd ポジ型レジスト組成物
US8012670B2 (en) 2002-04-11 2011-09-06 Rohm And Haas Electronic Materials Llc Photoresist systems
KR100576477B1 (ko) * 2003-10-06 2006-05-10 주식회사 하이닉스반도체 포토레지스트 세정액 조성물 및 이를 이용한 패턴 형성방법
EP2336829B1 (en) * 2009-12-15 2019-01-23 Rohm and Haas Electronic Materials LLC Photoresists and methods for use thereof
JP5964615B2 (ja) * 2011-03-28 2016-08-03 住友化学株式会社 ポジ型レジスト組成物
US8728714B2 (en) * 2011-11-17 2014-05-20 Micron Technology, Inc. Methods for adhering materials, for enhancing adhesion between materials, and for patterning materials, and related semiconductor device structures
CN104460232B (zh) * 2013-09-24 2019-11-15 住友化学株式会社 光致抗蚀剂组合物
JP6237551B2 (ja) * 2014-09-18 2017-11-29 信越化学工業株式会社 レジスト組成物及びパターン形成方法
KR102239212B1 (ko) * 2018-12-14 2021-04-12 주식회사 엘지화학 포토폴리머 조성물

Family Cites Families (32)

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US3772102A (en) * 1969-10-27 1973-11-13 Gen Electric Method of transferring a desired pattern in silicon to a substrate layer
US4587196A (en) * 1981-06-22 1986-05-06 Philip A. Hunt Chemical Corporation Positive photoresist with cresol-formaldehyde novolak resin and photosensitive naphthoquinone diazide
EP0537524A1 (en) * 1991-10-17 1993-04-21 Shipley Company Inc. Radiation sensitive compositions and methods
JP3224602B2 (ja) * 1992-07-10 2001-11-05 東京応化工業株式会社 感光性基材及びそれを用いたレジストパターン形成方法
US5879856A (en) * 1995-12-05 1999-03-09 Shipley Company, L.L.C. Chemically amplified positive photoresists
EP0789279B2 (en) * 1996-02-09 2004-12-08 Wako Pure Chemical Industries Ltd Polymer and resist material
JP3919887B2 (ja) 1996-07-24 2007-05-30 東京応化工業株式会社 化学増幅型ポジ型レジスト組成物
US5945248A (en) * 1996-07-24 1999-08-31 Tokyo Ohka Kogyo Co., Ltd. Chemical-sensitization positive-working photoresist composition
JP3695024B2 (ja) * 1996-11-14 2005-09-14 Ｊｓｒ株式会社 半導体デバイス製造用感放射線性樹脂組成物
TW574628B (en) 1996-12-10 2004-02-01 Morton Int Inc High resolution positive acting dry film photoresist
IL141803A0 (en) * 1998-09-23 2002-03-10 Du Pont Photoresists, polymers and processes for microlithography
TWI224241B (en) * 1999-04-28 2004-11-21 Jsr Corp Positive resist composition
JP2001013688A (ja) * 1999-04-28 2001-01-19 Jsr Corp 感放射線性樹脂組成物
KR20020012206A (ko) * 1999-05-04 2002-02-15 메리 이. 보울러 플루오르화 중합체, 포토레지스트 및 마이크로리소그래피방법
US6319655B1 (en) * 1999-06-11 2001-11-20 Electron Vision Corporation Modification of 193 nm sensitive photoresist materials by electron beam exposure
JP4424632B2 (ja) 1999-07-13 2010-03-03 三菱レイヨン株式会社 化学増幅型レジスト組成物およびレジストパターン形成方法
KR100535149B1 (ko) * 1999-08-17 2005-12-07 주식회사 하이닉스반도체 신규의 포토레지스트용 공중합체 및 이를 이용한 포토레지스트조성물
US6692888B1 (en) * 1999-10-07 2004-02-17 Shipley Company, L.L.C. Copolymers having nitrile and alicyclic leaving groups and photoresist compositions comprising same
EP1240554A2 (en) * 1999-11-17 2002-09-18 E.I. Du Pont De Nemours And Company Nitrile/fluoroalcohol polymer-containing photoresists and associated processes for microlithography
US6306554B1 (en) * 2000-05-09 2001-10-23 Shipley Company, L.L.C. Polymers containing oxygen and sulfur alicyclic units and photoresist compositions comprising same
US7132214B2 (en) * 2000-09-08 2006-11-07 Shipley Company, L.L.C. Polymers and photoresist compositions for short wavelength imaging
AU2001288865A1 (en) * 2000-09-08 2002-03-22 Shipley Company, L.L.C. Polymers and photoresist compositions comprising electronegative groups
WO2002021214A2 (en) * 2000-09-08 2002-03-14 Shipley Company, L.L.C. Use of acetal/ketal polymers in photoresist compositions suitable for short wave imaging
US6844270B2 (en) * 2000-11-26 2005-01-18 Shipley Company, L.L.C. Polymers and photoresist compositions for short wavelength imaging
US6509134B2 (en) * 2001-01-26 2003-01-21 International Business Machines Corporation Norbornene fluoroacrylate copolymers and process for the use thereof
US6787286B2 (en) * 2001-03-08 2004-09-07 Shipley Company, L.L.C. Solvents and photoresist compositions for short wavelength imaging
JP2003020335A (ja) * 2001-05-01 2003-01-24 Jsr Corp ポリシロキサンおよび感放射線性樹脂組成物
JP2003122007A (ja) * 2001-10-09 2003-04-25 Fuji Photo Film Co Ltd ポジ型レジスト組成物
JP2003241386A (ja) * 2001-12-13 2003-08-27 Fuji Photo Film Co Ltd ポジ型レジスト組成物
JP3890979B2 (ja) * 2001-12-27 2007-03-07 住友化学株式会社 化学増幅型ポジ型レジスト組成物
TW200403522A (en) * 2002-03-01 2004-03-01 Shipley Co Llc Photoresist compositions
TW200401164A (en) 2002-03-01 2004-01-16 Shipley Co Llc Photoresist compositions

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